JP2019207338A - 観察装置、対物レンズ - Google Patents
観察装置、対物レンズ Download PDFInfo
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- JP2019207338A JP2019207338A JP2018102977A JP2018102977A JP2019207338A JP 2019207338 A JP2019207338 A JP 2019207338A JP 2018102977 A JP2018102977 A JP 2018102977A JP 2018102977 A JP2018102977 A JP 2018102977A JP 2019207338 A JP2019207338 A JP 2019207338A
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- light
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/645—Specially adapted constructive features of fluorimeters
- G01N21/6456—Spatial resolved fluorescence measurements; Imaging
- G01N21/6458—Fluorescence microscopy
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/0052—Optical details of the image generation
- G02B21/0064—Optical details of the image generation multi-spectral or wavelength-selective arrangements, e.g. wavelength fan-out, chromatic profiling
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/0052—Optical details of the image generation
- G02B21/0076—Optical details of the image generation arrangements using fluorescence or luminescence
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/02—Objectives
- G02B21/04—Objectives involving mirrors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/061—Sources
- G01N2201/06113—Coherent sources; lasers
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B2207/00—Coding scheme for general features or characteristics of optical elements and systems of subclass G02B, but not including elements and systems which would be classified in G02B6/00 and subgroups
- G02B2207/114—Two photon or multiphoton effect
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Health & Medical Sciences (AREA)
- Optics & Photonics (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Life Sciences & Earth Sciences (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
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- Spectroscopy & Molecular Physics (AREA)
- Microscoopes, Condenser (AREA)
Abstract
Description
0.75<θ2/θ1<1.33
0.75<θ2/θ1<1.33
0.75<θ2/θ1<1.33 ・・・ (1)
θ1=(n2−n1)/(λ2−λ1) ・・・ (2)
θ2=(n3−n2)/(λ3−λ2) ・・・ (3)
[表1]
面番号 曲率半径 間隔 屈折率 アッベ数
1 12.283 2.8 1.65754 38.15
2 18.641 8.297 1
3 15.305 2.2 1.60085 44.27
4 8.001 5.773 1
5 -6.077 2.162 1.72789 52.64
6 -35.204 10.0246 1.49126 81.14
7 -10.942 0.27 1
8 21.880 1.9 1.72789 52.64
9 12.629 9.664 1.43436 94.97
10 -13.715 1.9 1.65754 38.15
11 -43.993 0.592 1
12 17.894 9 1.43436 94.93
13 -15.172 1.9 1.65754 38.15
14 -126.656 4 1.49126 81.14
15 -24.204 1.183 1
16 13.634 3.6 1.56178 71.3
17 36.526 0.477 1
18 6.861 5.709 1.75821 49.6
19 5.990 1.15 1.45182 67.83
[表2]
面番号 曲率半径 間隔 屈折率 アッベ数
1 12.418 2.801 1.63775 42.41
2 19.904 8.296 1
3 15.697 2.199 1.6134 44.27
4 8.024 5.774 1
5 -6.103 2.164 1.741 52.64
6 -35.291 10.026 1.497 81.54
7 -11.044 0.271 1
8 22.116 1.899 1.741 52.64
9 13.053 9.662 1.43875 94.97
10 -13.068 1.898 1.63775 42.41
11 -43.867 0.590 1
12 18.374 8.997 1.43875 94.93
13 -15.618 1.900 1.63775 42.41
14 1881.700 3.998 1.497 81.54
15 -25.518 1.182 1
16 13.995 3.600 1.59522 67.74
17 37.102 0.477 1
18 6.927 5.708 1.7725 49.6
19 5.998 1.150 1.45852 67.83
2、5、7、12、303 ミラー
3、4 プリズム
6 音響光学素子
8 ビームエキスパンダ
9 スキャナ
10、11、15、17、
19、401、403 レンズ
13、16 ダイクロイックミラー
18、20 PMT
30 制御装置
100、200、300、400 多光子励起顕微鏡
301、302 グレーティング
402 光ファイバ
Claims (6)
- パルス光を出射する光源と、
前記パルス光を試料へ照射する対物レンズと、を備え、
前記対物レンズの導光部である光学素子は、706.52nmである光の波長をλ1、1529.6nmである光の波長をλ2、2325.4nmである光の波長をλ3とし、λ1、λ2、λ3に対する媒質の屈折率をn1、n2、n3とし、θ1=(n2−n1)/(λ2−λ1)、θ2=(n3−n2)/(λ3−λ2)としたとき、θ1、θ2について以下の条件式を満たす前記媒質からなることを特徴とする観察装置。
0.75<θ2/θ1<1.33 - 前記パルス光を走査するスキャナを備え、
前記スキャナと前記対物レンズの間に配置された光学素子が、前記条件式を満たす前記媒質からなることを特徴とする請求項1記載の観察装置。 - 前記観察装置中に配置された光学素子が、前記条件式を満たす前記媒質からなることを特徴とする請求項1または請求項2記載の観察装置。
- 前記観察装置は、顕微鏡であることを特徴とする請求項1乃至請求項3のいずれか1項記載の観察装置。
- 前記観察装置は、多光子励起顕微鏡であることを特徴とする請求項1乃至請求項3のいずれか1項記載の観察装置。
- 導光部である光学素子を含み、
706.52nmである光の波長をλ1、1529.6nmである光の波長をλ2、2325.4nmである光の波長をλ3とし、λ1、λ2、λ3に対する媒質の屈折率をn1、n2、n3とし、θ1=(n2−n1)/(λ2−λ1)、θ2=(n3−n2)/(λ3−λ2)としたとき、前記光学素子が、θ1、θ2について以下の条件式を満たす前記媒質からなることを特徴とする対物レンズ。
0.75<θ2/θ1<1.33
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JP2018102977A JP2019207338A (ja) | 2018-05-30 | 2018-05-30 | 観察装置、対物レンズ |
US16/423,801 US10890744B2 (en) | 2018-05-30 | 2019-05-28 | Observation apparatus and objective |
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JP2018102977A JP2019207338A (ja) | 2018-05-30 | 2018-05-30 | 観察装置、対物レンズ |
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JP2019207338A true JP2019207338A (ja) | 2019-12-05 |
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JP (1) | JP2019207338A (ja) |
Families Citing this family (3)
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CN111504978B (zh) * | 2020-05-13 | 2021-03-30 | 华中科技大学 | 脉冲型延时色散光谱测量方法和装置及光谱成像方法和装置 |
US11808568B2 (en) * | 2021-02-05 | 2023-11-07 | Shangqing Liu | Method of inner light layer illumination by multi-beam interference and apparatuses for imaging in turbid media |
US20220258277A1 (en) * | 2021-02-12 | 2022-08-18 | Joyce Liu | Laser Beam Processing Apparatuses and Correspondent Method Using Multi-beam Interference |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH11218490A (ja) * | 1996-06-04 | 1999-08-10 | Carl Zeiss Jena Gmbh | 短パルスレーザビームを顕微鏡ビーム行程へ結合するための装置 |
JP2006065023A (ja) * | 2004-08-27 | 2006-03-09 | Olympus Corp | 顕微鏡対物レンズ |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
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DE3733823A1 (de) * | 1987-10-07 | 1989-04-20 | Zeiss Carl Fa | Verfahren zur kompensation des einflusses von umweltparametern auf die abbildungseigenschaften eines optischen systems |
US5995281A (en) | 1997-04-09 | 1999-11-30 | Carl Zeiss Jena Gmbh | Device for coupling the radiation of short-pulse lasers in an optical beam path of a microscope |
US7176428B2 (en) | 2004-03-12 | 2007-02-13 | Olympus Corporation | Laser-based, multiphoton-excitation-type optical examination apparatus |
JP4309787B2 (ja) | 2004-03-12 | 2009-08-05 | オリンパス株式会社 | 多光子励起型測定装置 |
JP4869734B2 (ja) | 2005-04-25 | 2012-02-08 | オリンパス株式会社 | 多光子励起走査型レーザ顕微鏡 |
JP4939855B2 (ja) | 2006-06-29 | 2012-05-30 | オリンパス株式会社 | 照明装置およびレーザ走査型顕微鏡 |
JP2014220404A (ja) * | 2013-05-09 | 2014-11-20 | ソニー株式会社 | 半導体レーザ装置組立体 |
EP2908159B1 (en) | 2014-02-13 | 2016-08-31 | Deutsches Elektronen-Synchrotron DESY | Chirped dichroic mirror and a source for broadband light pulses |
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- 2018-05-30 JP JP2018102977A patent/JP2019207338A/ja active Pending
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- 2019-05-28 US US16/423,801 patent/US10890744B2/en active Active
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH11218490A (ja) * | 1996-06-04 | 1999-08-10 | Carl Zeiss Jena Gmbh | 短パルスレーザビームを顕微鏡ビーム行程へ結合するための装置 |
JP2006065023A (ja) * | 2004-08-27 | 2006-03-09 | Olympus Corp | 顕微鏡対物レンズ |
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US10890744B2 (en) | 2021-01-12 |
US20190369377A1 (en) | 2019-12-05 |
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