JP4841204B2 - 半導体装置 - Google Patents
半導体装置 Download PDFInfo
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- JP4841204B2 JP4841204B2 JP2005252002A JP2005252002A JP4841204B2 JP 4841204 B2 JP4841204 B2 JP 4841204B2 JP 2005252002 A JP2005252002 A JP 2005252002A JP 2005252002 A JP2005252002 A JP 2005252002A JP 4841204 B2 JP4841204 B2 JP 4841204B2
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- 239000004065 semiconductor Substances 0.000 title claims description 30
- 238000009792 diffusion process Methods 0.000 claims description 52
- 239000003990 capacitor Substances 0.000 claims description 45
- 239000000758 substrate Substances 0.000 claims description 15
- 238000010586 diagram Methods 0.000 description 27
- 102100029203 F-box only protein 8 Human genes 0.000 description 4
- 101100334493 Homo sapiens FBXO8 gene Proteins 0.000 description 4
- 101100537375 Homo sapiens TMEM107 gene Proteins 0.000 description 4
- 102100036728 Transmembrane protein 107 Human genes 0.000 description 4
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 4
- 229920005591 polysilicon Polymers 0.000 description 4
- 230000007257 malfunction Effects 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
- 230000000087 stabilizing effect Effects 0.000 description 2
- 230000001629 suppression Effects 0.000 description 2
- 230000000295 complement effect Effects 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 229910044991 metal oxide Inorganic materials 0.000 description 1
- 150000004706 metal oxides Chemical class 0.000 description 1
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/77—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
- H01L21/78—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
- H01L21/82—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components
- H01L21/822—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components the substrate being a semiconductor, using silicon technology
- H01L21/8232—Field-effect technology
- H01L21/8234—MIS technology, i.e. integration processes of field effect transistors of the conductor-insulator-semiconductor type
- H01L21/8238—Complementary field-effect transistors, e.g. CMOS
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- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/40—Electrodes ; Multistep manufacturing processes therefor
- H01L29/41—Electrodes ; Multistep manufacturing processes therefor characterised by their shape, relative sizes or dispositions
- H01L29/417—Electrodes ; Multistep manufacturing processes therefor characterised by their shape, relative sizes or dispositions carrying the current to be rectified, amplified or switched
- H01L29/41725—Source or drain electrodes for field effect devices
- H01L29/41758—Source or drain electrodes for field effect devices for lateral devices with structured layout for source or drain region, i.e. the source or drain region having cellular, interdigitated or ring structure or being curved or angular
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- H01L21/77—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
- H01L21/78—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
- H01L21/82—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components
- H01L21/822—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components the substrate being a semiconductor, using silicon technology
- H01L21/8222—Bipolar technology
- H01L21/8228—Complementary devices, e.g. complementary transistors
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier
- H01L27/0203—Particular design considerations for integrated circuits
- H01L27/0207—Geometrical layout of the components, e.g. computer aided design; custom LSI, semi-custom LSI, standard cell technique
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
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- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier
- H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being a semiconductor body
- H01L27/08—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being a semiconductor body including only semiconductor components of a single kind
- H01L27/085—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being a semiconductor body including only semiconductor components of a single kind including field-effect components only
- H01L27/088—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being a semiconductor body including only semiconductor components of a single kind including field-effect components only the components being field-effect transistors with insulated gate
- H01L27/092—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being a semiconductor body including only semiconductor components of a single kind including field-effect components only the components being field-effect transistors with insulated gate complementary MIS field-effect transistors
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier
- H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being a semiconductor body
- H01L27/06—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration
- H01L27/0611—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration integrated circuits having a two-dimensional layout of components without a common active region
- H01L27/0617—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration integrated circuits having a two-dimensional layout of components without a common active region comprising components of the field-effect type
- H01L27/0629—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration integrated circuits having a two-dimensional layout of components without a common active region comprising components of the field-effect type in combination with diodes, or resistors, or capacitors
Description
図2から図7を参照して、本発明による半導体装置の第1の実施の形態が説明される。
図2は、本発明による半導体装置の第1の実施の形態におけるレイアウト図である。
図3は、回路領域においてCMOSインバータを形成するPチャネル型MOSトランジスタと、デカップリング容量セルを形成するPチャネル型MOSトランジスタDC1の断面構造図である。
図4は、回路領域においてCMOSインバータを形成するNチャネル型MOSトランジスタと、デカップリング容量セルを形成するNチャネル型MOSトランジスタDC2の断面構造図である。
図5は、デカップリング容量を形成するPチャネル型MOSトランジスタDC3と、Tap領域90の断面構造図である。
図6は、デカップリング容量を形成するNチャネル型MOSトランジスタDC4と、Tap領域91の断面構造図である。
図8から図10を参照して、本発明による半導体装置の第2の実施の形態が説明される。
図8は、本発明による半導体装置の第2の実施の形態におけるレイアウト図である。
図9は、デカップリング容量を形成するPチャネル型MOSトランジスタDC3’と、Tap領域90の断面構造図である。
図10は、デカップリング容量を形成するNチャネル型MOSトランジスタDC4’と、Tap領域91の断面構造図である。
図11を参照して、本発明による半導体装置の第3の実施の形態が説明される。
図11は、本発明による半導体装置の第3の実施の形態におけるレイアウト図である。
第3の実施の形態におけるTap領域90及びTap領域91は、回路領域と接続する電源VDD又はグランドGNDとは別系統の電源又はグランドに接続される電源配線70又は接地配線80に接続される構成である。
20、200:P型ウェル
30、31、32、33、34、300、310、320:ゲート電極(ポリシリコンゲート)
40、41、70、400、410:電源配線
50、51、80、500、510:接地配線
41、42、43、51、52、53、60、410、420、430、510、520、530、600:配線
90、91、900、910:Tap領域
11、15、110、150:P型拡散層
12、14、120、140:N型拡散層
13、130:コンタクトホール
16:ゲート絶縁膜
17:絶縁膜
VDD:電源(電源電位)
GND:グランド(接地電位)
1、P1、P2、P3、DC1、DC3、P10、P20、P30、DC10、DC30:Pチャネル型MOSトランジスタ
2、N1、N2、N3、DC2、DC4、N10、N20、N30、DC20、DC40:Nチャネル型MOSトランジスタ
Claims (6)
- 複数のCMOS基本セルが並べられた、CMOS基本セル列と、
前記CMOS基本セル列に並設され、前記CMOS基本セル列に接続された第1の電源配線と、
前記CMOS基本セル列に並設され、前記CMOS基本セル列に接続された第1の接地配線と、
前記第1の電源配線の直下に設けられた第1のデカップリング容量と、前記第1の接地配線の直下に設けられた第2のデカップリング容量とを備え、
前記第1のデカップリング容量は、ゲート電極が前記第1の接地配線に接続され、ソース・ドレイン拡散層が前記第1の電源配線に接続されたPチャネル型MOSトランジスタによって形成され、
前記第2のデカップリング容量は、ゲート電極が前記第1の電源配線に接続され、ソース・ドレイン拡散層が前記第1の接地配線に接続されたNチャネル型MOSトランジスタによって形成された、
前記第1のデカップリング容量を構成する、前記Pチャネル型MOSトランジスタのソース・ドレイン拡散層の一方は、前記第1の電源配線に接続され、他方は開放され、
前記第2のデカップリング容量を構成する、前記Nチャネル型MOSトランジスタのソース・ドレイン拡散層の一方は、前記第1の接地配線に接続され、他方は開放されている
半導体装置。 - 請求項1に記載の半導体装置において、
前記CMOS基本セル列の端のCMOS基本セルを構成するPチャネル型MOSトランジスタに隣接して設けられた第3のデカップリング容量と、
前記CMOS基本セル列の端のCMOS基本セルを構成するNチャネル型MOSトランジスタに隣接して設けられた第4のデカップリング容量とを更に具備し、
前記第3のデカップリング容量は、ゲート電極が前記第1の接地配線に接続され、ソース・ドレイン拡散層が前記第1の電源配線に接続されるPチャネル型MOSトランジスタによって形成され、
前記第4のデカップリング容量は、ゲート電極が前記第1の電源配線に接続され、ソース・ドレイン拡散層が前記第1の接地配線に接続されるNチャネル型MOSトランジスタによって形成される
半導体装置。 - 請求項1又は2に記載の半導体装置において、
前記第1の電源配線の直下に設けられ、N型基板を前記第1の電源配線に接続して前記N型基板の電位を固定するN型拡散層と、
前記第1の接地配線の直下に設けられ、P型基板を前記第1の接地配線に接続して前記P型基板の電位を固定するP型拡散層とを更に備える
半導体装置。 - 請求項1又は2に記載の半導体装置において、
前記第1の電源配線に並設され、N型基板の電位を固定する第2の電源配線と、
前記第1の接地配線に並設され、P型基板の電位を固定する第2の接地配線とを更に備える
半導体装置。 - 請求項4に記載の半導体装置において、
前記第1の電源配線は、前記CMOS基本セル列に隣接して設けられ、前記第2の電源配線は、前記第1の電源配線に隣接して設けられており、
前記第1の接地配線は、前記CMOS基本セル列に隣接して設けられ、前記第2の接地配線は、前記第1の接地配線に隣接して設けられている
半導体装置。 - 請求項4に記載の半導体装置において、
前記第2の電源配線は、前記CMOS基本セル列に隣接して設けられ、前記第1の電源配線は、前記第2の電源配線に隣接して設けられており、
前記第2の接地配線は、前記CMOS基本セル列に隣接して設けられ、前記第1の接地配線は、前記第2の接地配線に隣接して設けられている
半導体装置。
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005252002A JP4841204B2 (ja) | 2005-08-31 | 2005-08-31 | 半導体装置 |
US11/510,648 US7638821B2 (en) | 2005-08-31 | 2006-08-28 | Integrated circuit incorporating decoupling capacitor under power and ground lines |
KR1020060083082A KR100788222B1 (ko) | 2005-08-31 | 2006-08-30 | 전원 및 접지배선 아래에 디커플링 캐패시터를 구비하는집적 회로 |
Applications Claiming Priority (1)
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JP2005252002A JP4841204B2 (ja) | 2005-08-31 | 2005-08-31 | 半導体装置 |
Publications (2)
Publication Number | Publication Date |
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JP2007067207A JP2007067207A (ja) | 2007-03-15 |
JP4841204B2 true JP4841204B2 (ja) | 2011-12-21 |
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JP2005252002A Expired - Fee Related JP4841204B2 (ja) | 2005-08-31 | 2005-08-31 | 半導体装置 |
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US (1) | US7638821B2 (ja) |
JP (1) | JP4841204B2 (ja) |
KR (1) | KR100788222B1 (ja) |
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JP2008235300A (ja) * | 2007-03-16 | 2008-10-02 | Sanyo Electric Co Ltd | 半導体装置 |
KR100958801B1 (ko) * | 2007-04-30 | 2010-05-24 | 주식회사 하이닉스반도체 | 리저브 캐패시터를 구비하는 반도체 장치 및 그의 레이아웃방법 |
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JP5653001B2 (ja) | 2009-03-16 | 2015-01-14 | ピーエスフォー ルクスコ エスエイアールエルPS4 Luxco S.a.r.l. | 半導体装置及び半導体装置の補償容量の配置方法 |
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US8946856B2 (en) * | 2012-10-30 | 2015-02-03 | Silicon Laboratories Inc. | Decoupling capacitors for integrated circuits |
JP5962535B2 (ja) * | 2013-02-18 | 2016-08-03 | 株式会社デンソー | 半導体集積回路 |
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JP2786467B2 (ja) | 1989-03-15 | 1998-08-13 | 沖電気工業株式会社 | Cmos半導体集積回路 |
JPH05198742A (ja) * | 1992-01-20 | 1993-08-06 | Nec Ic Microcomput Syst Ltd | 半導体集積回路装置 |
US5618744A (en) * | 1992-09-22 | 1997-04-08 | Fujitsu Ltd. | Manufacturing method and apparatus of a semiconductor integrated circuit device |
US5631492A (en) * | 1994-01-21 | 1997-05-20 | Motorola | Standard cell having a capacitor and a power supply capacitor for reducing noise and method of formation |
JP3641511B2 (ja) * | 1995-06-16 | 2005-04-20 | 株式会社ルネサステクノロジ | 半導体装置 |
JP2001007293A (ja) * | 1999-06-25 | 2001-01-12 | Mitsubishi Electric Corp | 半導体集積回路装置 |
KR100351452B1 (ko) * | 1999-12-30 | 2002-09-09 | 주식회사 하이닉스반도체 | 디커플링 커패시터 구조를 갖는 반도체소자 |
JP2001351979A (ja) * | 2000-06-05 | 2001-12-21 | Fujitsu Ltd | 半導体装置設計支援装置 |
JP3612313B2 (ja) * | 2002-08-14 | 2005-01-19 | 株式会社東芝 | 半導体集積回路装置 |
JP2005116587A (ja) | 2003-10-03 | 2005-04-28 | Matsushita Electric Ind Co Ltd | 半導体装置 |
JP4161892B2 (ja) | 2003-12-04 | 2008-10-08 | ソニー株式会社 | 半導体装置 |
JP2005175003A (ja) | 2003-12-08 | 2005-06-30 | Matsushita Electric Ind Co Ltd | デカップリングコンデンサ及び半導体集積回路 |
-
2005
- 2005-08-31 JP JP2005252002A patent/JP4841204B2/ja not_active Expired - Fee Related
-
2006
- 2006-08-28 US US11/510,648 patent/US7638821B2/en not_active Expired - Fee Related
- 2006-08-30 KR KR1020060083082A patent/KR100788222B1/ko not_active IP Right Cessation
Also Published As
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US20070045770A1 (en) | 2007-03-01 |
JP2007067207A (ja) | 2007-03-15 |
KR20070026165A (ko) | 2007-03-08 |
KR100788222B1 (ko) | 2007-12-26 |
US7638821B2 (en) | 2009-12-29 |
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