JP4836958B2 - 基板を保持する回転式装置 - Google Patents
基板を保持する回転式装置 Download PDFInfo
- Publication number
- JP4836958B2 JP4836958B2 JP2007539532A JP2007539532A JP4836958B2 JP 4836958 B2 JP4836958 B2 JP 4836958B2 JP 2007539532 A JP2007539532 A JP 2007539532A JP 2007539532 A JP2007539532 A JP 2007539532A JP 4836958 B2 JP4836958 B2 JP 4836958B2
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- support
- support device
- support surface
- edge region
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 239000000758 substrate Substances 0.000 title claims description 76
- 239000012530 fluid Substances 0.000 claims description 29
- 238000010438 heat treatment Methods 0.000 claims description 26
- 238000005507 spraying Methods 0.000 claims description 11
- 239000007921 spray Substances 0.000 claims description 9
- 229910052782 aluminium Inorganic materials 0.000 claims description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 2
- 229910052751 metal Inorganic materials 0.000 claims description 2
- 239000002184 metal Substances 0.000 claims description 2
- 239000002904 solvent Substances 0.000 description 12
- 238000004140 cleaning Methods 0.000 description 5
- 238000011109 contamination Methods 0.000 description 5
- 239000011248 coating agent Substances 0.000 description 3
- 238000000576 coating method Methods 0.000 description 3
- 239000000969 carrier Substances 0.000 description 2
- 239000004922 lacquer Substances 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 238000007796 conventional method Methods 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 229910001092 metal group alloy Inorganic materials 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 239000002966 varnish Substances 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67063—Apparatus for fluid treatment for etching
- H01L21/67075—Apparatus for fluid treatment for etching for wet etching
- H01L21/6708—Apparatus for fluid treatment for etching for wet etching using mainly spraying means, e.g. nozzles
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B11/00—Cleaning flexible or delicate articles by methods or apparatus specially adapted thereto
- B08B11/02—Devices for holding articles during cleaning
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B3/00—Cleaning by methods involving the use or presence of liquid or steam
- B08B3/02—Cleaning by the force of jets or sprays
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6838—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping with gripping and holding devices using a vacuum; Bernoulli devices
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Coating Apparatus (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Cleaning Or Drying Semiconductors (AREA)
Description
2 支持装置
3 加熱装置
4 流体供給装置
5 パイプライン
6 孔
7 開口
8 ノズル
11 面
21 支持面
22 部分
23 環状溝
24 縁部領域
Claims (13)
- 平坦な基板(1)を保持及び回転、特に、基板の露出面をスプレーコーティングによって処理する装置において、
軸(A)の回りに回転できると共に、軸(A)に垂直に延在する支持面(21)上に基板(1)を載置及び保持する支持装置(2)と、支持装置(2)を回転させる回転装置と、支持面(21)に対向する基板(1)の面(11)において支持面(21)から半径方向に外方へ突出する部分に流体を供給する流体供給装置(4)とを備え、又、支持面(21)の直径が基板の直径より小さく、
支持装置(2)と同軸の縁部領域(24)を更に備え、縁部領域(24)の直径が基板(1)の直径より大きく、縁部領域(24)と支持装置(2)の基板(1)に対向する面が、同面であると共に基板(1)の全面を覆う第1位置(図3(a))と、基板(1)に対向する縁部領域(24)の面が基板(1)から離隔した第2位置(図3(b)及び図3(c))との間で、支持装置(2)が縁部領域(24)に対して軸方向に移動させられる装置。 - 支持装置(2)が、支持面(21)に対して段を付けるように、支持面(21)の周囲に設けられた段付き縁部(22)を含むと共に、大略半径方向の孔(6)と開口(7)が、段付き縁部(22)の領域内に形成された請求項1に記載の装置。
- 流体供給装置(4)が、支持装置(2)の支持面(21)と反対の側に、軸(A)と同軸な環状溝(23)を有し、更に、環状溝(23)が、供給ライン(5)を介して流体を導入すると共に、大略半径方向の孔(6)を介して開口(7)と連通する請求項2に記載の装置。
- 支持装置(2)の回転中に流体供給装置を作動させることができる請求項1乃至3のいずれかに記載の装置。
- 支持装置(2)を加熱する加熱装置(3)を備える請求項1乃至4のいずれかに記載の装置。
- 支持装置(2)が回転していない時に加熱装置(3)を支持装置(2)に当接させ得る請求項5に記載の装置。
- 加熱装置(3)と支持装置(2)が同軸に配置された請求項5又は6に記載の装置。
- 加熱装置(3)が、接触面により支持装置(2)を加熱するように、軸方向に移動自在である請求項7に記載の装置。
- 流体供給装置が、移動自在のスプレーヘッド(4’)として形成された請求項1乃至8のいずれかに記載の装置。
- 段付き縁部(22)の高さ(H)が約0.2mmである請求項2又は3に記載の装置。
- 段付き縁部(22)の半径方向幅が、約5mmである請求項2、3と10のいずれかに記載の装置。
- 支持装置(2)が、金属、好ましくは、アルミニウムから成る請求項1乃至11のいずれかに記載の装置。
- 支持面(21)の直径が、約143mmである請求項1乃至12のいずれかに記載の装置。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102004053139A DE102004053139A1 (de) | 2004-11-03 | 2004-11-03 | Drehbare Vorrichtung zum Halten eines Substrats |
DE102004053139.0 | 2004-11-03 | ||
PCT/EP2005/011776 WO2006048287A1 (de) | 2004-11-03 | 2005-11-03 | Drehbare vorrichtung zum halten eines substrats |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2008518767A JP2008518767A (ja) | 2008-06-05 |
JP4836958B2 true JP4836958B2 (ja) | 2011-12-14 |
Family
ID=35985504
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2007539532A Expired - Fee Related JP4836958B2 (ja) | 2004-11-03 | 2005-11-03 | 基板を保持する回転式装置 |
Country Status (6)
Country | Link |
---|---|
US (1) | US7950347B2 (ja) |
EP (1) | EP1829084B1 (ja) |
JP (1) | JP4836958B2 (ja) |
KR (1) | KR101089189B1 (ja) |
DE (1) | DE102004053139A1 (ja) |
WO (1) | WO2006048287A1 (ja) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB0919059D0 (en) * | 2009-10-30 | 2009-12-16 | Sencon Europ Ltd | Application and inspection system |
JP2023013349A (ja) * | 2021-07-15 | 2023-01-26 | 株式会社Screenホールディングス | 基板洗浄装置、基板洗浄システム、基板処理システム、基板洗浄方法および基板処理方法 |
Citations (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57201564A (en) * | 1981-06-01 | 1982-12-10 | Dainippon Printing Co Ltd | Coating method |
JPS61294819A (ja) * | 1985-06-21 | 1986-12-25 | Nec Corp | 塗布装置 |
JPS6415925A (en) * | 1987-07-09 | 1989-01-19 | Nec Corp | Applicator for semiconductor device |
JPH02133475A (ja) * | 1988-11-14 | 1990-05-22 | Hitachi Maxell Ltd | 塗膜補強剤 |
JPH03230518A (ja) * | 1990-02-05 | 1991-10-14 | Nec Corp | 薬液塗布装置 |
JPH04354560A (ja) * | 1991-06-03 | 1992-12-08 | Tokyo Ohka Kogyo Co Ltd | スピンナー |
JPH05343383A (ja) * | 1992-06-04 | 1993-12-24 | Tokyo Ohka Kogyo Co Ltd | 裏面洗浄装置 |
JPH06216018A (ja) * | 1993-01-18 | 1994-08-05 | Tokyo Electron Ltd | 塗布装置 |
JPH06224113A (ja) * | 1993-01-26 | 1994-08-12 | Tokyo Electron Ltd | 塗布装置 |
JPH0851064A (ja) * | 1994-08-08 | 1996-02-20 | Dainippon Screen Mfg Co Ltd | 基板裏面洗浄方法 |
JPH08139007A (ja) * | 1994-11-04 | 1996-05-31 | Hitachi Ltd | 洗浄方法および装置 |
JPH09153474A (ja) * | 1995-11-30 | 1997-06-10 | Dainippon Screen Mfg Co Ltd | 基板洗浄ユニット |
JPH1085652A (ja) * | 1996-09-18 | 1998-04-07 | Dainippon Printing Co Ltd | 基板回転装置 |
JPH11128808A (ja) * | 1997-10-27 | 1999-05-18 | Dainippon Screen Mfg Co Ltd | 回転式塗布装置および回転式塗布方法 |
JP2004022783A (ja) * | 2002-06-17 | 2004-01-22 | Sharp Corp | 処理装置 |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02133475U (ja) * | 1989-04-10 | 1990-11-06 | ||
US5580607A (en) * | 1991-07-26 | 1996-12-03 | Tokyo Electron Limited | Coating apparatus and method |
JPH0785891B2 (ja) | 1993-01-18 | 1995-09-20 | オリエンタル建設株式会社 | 中空pc鋼棒を利用した引張プレストレスの導入方法 |
JPH07284715A (ja) * | 1994-04-15 | 1995-10-31 | Dainippon Screen Mfg Co Ltd | 処理液塗布装置及び処理液塗布方法 |
JP2590438B2 (ja) * | 1994-06-30 | 1997-03-12 | 工業技術院長 | 薄膜形成方法および薄膜形成装置 |
JP4087000B2 (ja) * | 1999-03-08 | 2008-05-14 | 日鉱金属株式会社 | レードル及びレードルのライニング方法 |
US6558053B2 (en) | 2001-04-19 | 2003-05-06 | Dainippon Screen Mfg. Co., Ltd. | Substrate processing apparatus |
JP4075527B2 (ja) * | 2002-08-28 | 2008-04-16 | 日本電気株式会社 | レジスト塗布方法およびレジスト塗布装置 |
-
2004
- 2004-11-03 DE DE102004053139A patent/DE102004053139A1/de not_active Withdrawn
-
2005
- 2005-11-03 JP JP2007539532A patent/JP4836958B2/ja not_active Expired - Fee Related
- 2005-11-03 US US11/718,572 patent/US7950347B2/en not_active Expired - Fee Related
- 2005-11-03 WO PCT/EP2005/011776 patent/WO2006048287A1/de active Application Filing
- 2005-11-03 KR KR1020077012607A patent/KR101089189B1/ko active IP Right Grant
- 2005-11-03 EP EP05811027A patent/EP1829084B1/de not_active Not-in-force
Patent Citations (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57201564A (en) * | 1981-06-01 | 1982-12-10 | Dainippon Printing Co Ltd | Coating method |
JPS61294819A (ja) * | 1985-06-21 | 1986-12-25 | Nec Corp | 塗布装置 |
JPS6415925A (en) * | 1987-07-09 | 1989-01-19 | Nec Corp | Applicator for semiconductor device |
JPH02133475A (ja) * | 1988-11-14 | 1990-05-22 | Hitachi Maxell Ltd | 塗膜補強剤 |
JPH03230518A (ja) * | 1990-02-05 | 1991-10-14 | Nec Corp | 薬液塗布装置 |
JPH04354560A (ja) * | 1991-06-03 | 1992-12-08 | Tokyo Ohka Kogyo Co Ltd | スピンナー |
JPH05343383A (ja) * | 1992-06-04 | 1993-12-24 | Tokyo Ohka Kogyo Co Ltd | 裏面洗浄装置 |
JPH06216018A (ja) * | 1993-01-18 | 1994-08-05 | Tokyo Electron Ltd | 塗布装置 |
JPH06224113A (ja) * | 1993-01-26 | 1994-08-12 | Tokyo Electron Ltd | 塗布装置 |
JPH0851064A (ja) * | 1994-08-08 | 1996-02-20 | Dainippon Screen Mfg Co Ltd | 基板裏面洗浄方法 |
JPH08139007A (ja) * | 1994-11-04 | 1996-05-31 | Hitachi Ltd | 洗浄方法および装置 |
JPH09153474A (ja) * | 1995-11-30 | 1997-06-10 | Dainippon Screen Mfg Co Ltd | 基板洗浄ユニット |
JPH1085652A (ja) * | 1996-09-18 | 1998-04-07 | Dainippon Printing Co Ltd | 基板回転装置 |
JPH11128808A (ja) * | 1997-10-27 | 1999-05-18 | Dainippon Screen Mfg Co Ltd | 回転式塗布装置および回転式塗布方法 |
JP2004022783A (ja) * | 2002-06-17 | 2004-01-22 | Sharp Corp | 処理装置 |
Also Published As
Publication number | Publication date |
---|---|
DE102004053139A1 (de) | 2006-06-01 |
US20090000544A1 (en) | 2009-01-01 |
KR101089189B1 (ko) | 2011-12-05 |
EP1829084B1 (de) | 2012-07-25 |
JP2008518767A (ja) | 2008-06-05 |
KR20070089690A (ko) | 2007-08-31 |
US7950347B2 (en) | 2011-05-31 |
WO2006048287A1 (de) | 2006-05-11 |
EP1829084A1 (de) | 2007-09-05 |
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