JP4806537B2 - テスト回路及びマスク制御回路 - Google Patents

テスト回路及びマスク制御回路 Download PDF

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Publication number
JP4806537B2
JP4806537B2 JP2005127862A JP2005127862A JP4806537B2 JP 4806537 B2 JP4806537 B2 JP 4806537B2 JP 2005127862 A JP2005127862 A JP 2005127862A JP 2005127862 A JP2005127862 A JP 2005127862A JP 4806537 B2 JP4806537 B2 JP 4806537B2
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signal
circuit
mask
test
path
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JP2005127862A
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Japanese (ja)
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JP2006308302A (ja
JP2006308302A5 (enrdf_load_stackoverflow
Inventor
健 中山
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Renesas Electronics Corp
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Renesas Electronics Corp
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Priority to JP2005127862A priority Critical patent/JP4806537B2/ja
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  • Semiconductor Integrated Circuits (AREA)
  • Tests Of Electronic Circuits (AREA)
JP2005127862A 2005-04-26 2005-04-26 テスト回路及びマスク制御回路 Expired - Fee Related JP4806537B2 (ja)

Priority Applications (1)

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JP2005127862A JP4806537B2 (ja) 2005-04-26 2005-04-26 テスト回路及びマスク制御回路

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005127862A JP4806537B2 (ja) 2005-04-26 2005-04-26 テスト回路及びマスク制御回路

Publications (3)

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JP2006308302A JP2006308302A (ja) 2006-11-09
JP2006308302A5 JP2006308302A5 (enrdf_load_stackoverflow) 2010-09-02
JP4806537B2 true JP4806537B2 (ja) 2011-11-02

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JP2005127862A Expired - Fee Related JP4806537B2 (ja) 2005-04-26 2005-04-26 テスト回路及びマスク制御回路

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JP (1) JP4806537B2 (enrdf_load_stackoverflow)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPWO2009084424A1 (ja) 2007-12-28 2011-05-19 日本電気株式会社 半導体テスト装置、半導体装置および試験方法
US8434042B2 (en) 2008-12-26 2013-04-30 Renesas Electronics Corporation Method and software for designing semiconductor integrated circuit including observation circuit for detecting circuit failure

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11133120A (ja) * 1997-10-31 1999-05-21 Mitsubishi Electric Corp 半導体デバイスのテストパターン生成方法および半導体デバイスのテストパターン生成プログラムを記録したコンピュータで読取り可能な記録媒体
JP2001249164A (ja) * 2000-03-03 2001-09-14 Hitachi Ltd 組み込み型自己テスト回路内臓ｌｓｉ
JP2002148309A (ja) * 2000-11-13 2002-05-22 Hitachi Ltd 半導体集積回路
JP2003344493A (ja) * 2002-05-24 2003-12-03 Mitsubishi Electric Corp 半導体デバイス評価装置
JP2004170244A (ja) * 2002-11-20 2004-06-17 Matsushita Electric Ind Co Ltd 組み込み自己検査回路
JP2005017067A (ja) * 2003-06-25 2005-01-20 Matsushita Electric Ind Co Ltd 自己テスト回路内蔵の半導体集積回路およびその故障診断方法

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JP2006308302A (ja) 2006-11-09

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