JP4799391B2 - 改良型のフラッシュアナログデジタルコンバータ - Google Patents

改良型のフラッシュアナログデジタルコンバータ Download PDF

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Publication number
JP4799391B2
JP4799391B2 JP2006340442A JP2006340442A JP4799391B2 JP 4799391 B2 JP4799391 B2 JP 4799391B2 JP 2006340442 A JP2006340442 A JP 2006340442A JP 2006340442 A JP2006340442 A JP 2006340442A JP 4799391 B2 JP4799391 B2 JP 4799391B2
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analog
input
resistors
digital converter
resistor
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Japanese (ja)
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JP2007208964A (ja
JP2007208964A5 (enExample
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スタージャ セハット
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マーベル ワールド トレード リミテッド
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    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03MCODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12Analogue/digital converters
    • H03M1/34Analogue value compared with reference values
    • H03M1/36Analogue value compared with reference values simultaneously only, i.e. parallel type
    • H03M1/361Analogue value compared with reference values simultaneously only, i.e. parallel type having a separate comparator and reference value for each quantisation level, i.e. full flash converter type
    • H03M1/362Analogue value compared with reference values simultaneously only, i.e. parallel type having a separate comparator and reference value for each quantisation level, i.e. full flash converter type the reference values being generated by a resistive voltage divider
    • H03M1/363Analogue value compared with reference values simultaneously only, i.e. parallel type having a separate comparator and reference value for each quantisation level, i.e. full flash converter type the reference values being generated by a resistive voltage divider the voltage divider taps being held in a floating state, e.g. by feeding the divider by current sources
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03MCODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10Calibration or testing
    • H03M1/1009Calibration
    • H03M1/1014Calibration at one point of the transfer characteristic, i.e. by adjusting a single reference value, e.g. bias or gain error
    • H03M1/1019Calibration at one point of the transfer characteristic, i.e. by adjusting a single reference value, e.g. bias or gain error by storing a corrected or correction value in a digital look-up table

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  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Analogue/Digital Conversion (AREA)
  • Manipulation Of Pulses (AREA)
JP2006340442A 2006-01-18 2006-12-18 改良型のフラッシュアナログデジタルコンバータ Expired - Fee Related JP4799391B2 (ja)

Applications Claiming Priority (6)

Application Number Priority Date Filing Date Title
US75986906P 2006-01-18 2006-01-18
US60/759869 2006-01-18
US77302906P 2006-02-14 2006-02-14
US60/773029 2006-02-14
US11/384855 2006-03-20
US11/384,855 US7212144B1 (en) 2006-01-18 2006-03-20 Flash ADC

Publications (3)

Publication Number Publication Date
JP2007208964A JP2007208964A (ja) 2007-08-16
JP2007208964A5 JP2007208964A5 (enExample) 2010-02-12
JP4799391B2 true JP4799391B2 (ja) 2011-10-26

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JP2006340442A Expired - Fee Related JP4799391B2 (ja) 2006-01-18 2006-12-18 改良型のフラッシュアナログデジタルコンバータ

Country Status (7)

Country Link
US (3) US7212144B1 (enExample)
EP (1) EP1814233B1 (enExample)
JP (1) JP4799391B2 (enExample)
CN (1) CN101005285B (enExample)
DE (1) DE602006009894D1 (enExample)
SG (1) SG134209A1 (enExample)
TW (1) TWI403093B (enExample)

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US20080174353A1 (en) * 2007-01-18 2008-07-24 John Thomas Badar Path delay adjustment circuitry using programmable driver
US20080191920A1 (en) * 2007-02-12 2008-08-14 Sangbeom Park Low-voltage drop reference generation circuit for A/D converter
FR2913833B1 (fr) * 2007-03-16 2009-06-12 E2V Semiconductors Soc Par Act Convertisseur analogique-numerique parallele a double echelle statique
US20090021271A1 (en) * 2007-07-20 2009-01-22 Infineon Technologies Austria Ag Measuring the On-Resistance of a Transistor Load Path
US7768432B2 (en) * 2008-06-05 2010-08-03 Mediatek Inc. Analog-to-digital conversion devices and analog-to-digital conversion stages thereof
JP2010124449A (ja) * 2008-10-21 2010-06-03 Renesas Electronics Corp アナログデジタル変換回路
US9449719B2 (en) * 2008-12-19 2016-09-20 Seagate Technology Llc Solid-state storage device including a high resolution analog-to-digital converter
TWI450500B (zh) * 2009-01-17 2014-08-21 Univ Nat Taiwan 時脈率減半之高速類比數位轉換器
ATE543259T1 (de) * 2009-01-26 2012-02-15 Fujitsu Semiconductor Ltd Abtastung
US8362937B2 (en) 2009-06-12 2013-01-29 Taiwan Semiconductor Manufacturing Company, Ltd. Integrated circuits for converting analog signals to digital signals, systems, and operating methods thereof
US7936298B2 (en) * 2009-09-18 2011-05-03 Mediatek Singapore Pte. Ltd. Integrated circuit and electronic device comprising threshold generation circuitry and method therefor
GB0916883D0 (en) * 2009-09-25 2009-11-11 St Microelectronics Ltd Ambient light detection
US8479024B2 (en) 2010-08-31 2013-07-02 Dell Products L.P. System and method for customizing information handling system internal power source and service offerings based on usage profiles
US8874728B2 (en) 2010-08-31 2014-10-28 Dell Products L.P. System and method for customizing information handling system product and service offerings based on usage profiles
JP2012165125A (ja) * 2011-02-04 2012-08-30 Hitachi Ltd キャリブレーション回路およびアナログ−デジタル変換器
US9244179B2 (en) * 2011-12-06 2016-01-26 The Board Of Trustees Of The Leland Stanford Junior University Time-based digitizer for PET photodetector
US8878712B2 (en) 2013-03-14 2014-11-04 Analog Devices Technology Flash ADC shuffling
CN103226538A (zh) * 2013-05-14 2013-07-31 苏州文芯微电子科技有限公司 一种基于高速串行通讯总线驱动器的阻抗匹配电路
JP2015090414A (ja) * 2013-11-06 2015-05-11 シナプティクス・ディスプレイ・デバイス株式会社 表示駆動回路および表示装置
US9417272B1 (en) * 2013-12-11 2016-08-16 Ion E. Opris Binary coded, arbitrarily shaped received signal strength indicator
JP6580847B2 (ja) * 2015-03-25 2019-09-25 ラピスセミコンダクタ株式会社 半導体装置
CN106301376B (zh) * 2015-06-03 2019-12-06 中国科学院深圳先进技术研究院 一种比较器偏置电流可调的低功耗逐次逼近型模数转换器
JP6874578B2 (ja) * 2017-07-26 2021-05-19 富士通株式会社 アレイセンサおよび撮像装置
US11855641B2 (en) * 2020-07-07 2023-12-26 Infineon Technologies LLC Integrated resistor network and method for fabricating the same
JP7647165B2 (ja) * 2021-02-26 2025-03-18 セイコーエプソン株式会社 A/dコンバーター、デジタル出力温度センサー、回路装置及び発振器
US12191877B2 (en) * 2022-08-30 2025-01-07 Texas Instruments Incorporated Multi-bit voltage-to-delay conversion in data converter circuitry
US20250076911A1 (en) * 2023-08-28 2025-03-06 Apple Inc. Voltage regulator circuit with reduced leakage in off-state

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JPS61245718A (ja) * 1985-04-24 1986-11-01 Iwatsu Electric Co Ltd デイジタル−アナログ変換器
JPH03212025A (ja) * 1990-01-17 1991-09-17 Canon Inc 直並列アナログ・ディジタル変換装置
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JP3621358B2 (ja) * 2001-05-25 2005-02-16 Necマイクロシステム株式会社 コンパレータ及びアナログディジタルコンバータ
JP4692979B2 (ja) * 2001-08-30 2011-06-01 ルネサスエレクトロニクス株式会社 Ad変換器
US6885236B2 (en) * 2002-06-14 2005-04-26 Broadcom Corporation Reference ladder having improved feedback stability
US6882294B2 (en) * 2003-08-06 2005-04-19 Telasic Communications, Inc. Resistive ladder, summing node circuit, and trimming method for a subranging analog to digital converter
DE10342057B4 (de) * 2003-09-11 2005-10-20 Infineon Technologies Ag Halbleiter-Schaltungsanordnung und Continuous-Time-Sigma-Delta-Modulatorschaltung
US7154421B2 (en) * 2003-12-12 2006-12-26 Telasic Communications, Inc. DNL/INL trim techniques for comparator based analog to digital converters
US7053690B2 (en) * 2004-07-08 2006-05-30 Oki Electric Industry Co., Ltd. Voltage generating circuit with two resistor ladders
JP4738867B2 (ja) * 2004-10-22 2011-08-03 ルネサスエレクトロニクス株式会社 表示装置用駆動装置
US7212144B1 (en) * 2006-01-18 2007-05-01 Marvell World Trade Ltd. Flash ADC

Also Published As

Publication number Publication date
DE602006009894D1 (de) 2009-12-03
CN101005285A (zh) 2007-07-25
US20070200746A1 (en) 2007-08-30
US7212144B1 (en) 2007-05-01
CN101005285B (zh) 2012-09-05
TWI403093B (zh) 2013-07-21
TW200729741A (en) 2007-08-01
US7760127B2 (en) 2010-07-20
US7605739B2 (en) 2009-10-20
JP2007208964A (ja) 2007-08-16
EP1814233A1 (en) 2007-08-01
SG134209A1 (en) 2007-08-29
EP1814233B1 (en) 2009-10-21
US20090237286A1 (en) 2009-09-24

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