JP4796142B2 - 積層可能な半導体テストシステム用の可搬式マニピュレータ - Google Patents
積層可能な半導体テストシステム用の可搬式マニピュレータ Download PDFInfo
- Publication number
- JP4796142B2 JP4796142B2 JP2008523984A JP2008523984A JP4796142B2 JP 4796142 B2 JP4796142 B2 JP 4796142B2 JP 2008523984 A JP2008523984 A JP 2008523984A JP 2008523984 A JP2008523984 A JP 2008523984A JP 4796142 B2 JP4796142 B2 JP 4796142B2
- Authority
- JP
- Japan
- Prior art keywords
- test head
- lead screw
- link
- lead
- manipulator
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000012360 testing method Methods 0.000 title claims description 122
- 239000004065 semiconductor Substances 0.000 title description 5
- 238000013519 translation Methods 0.000 claims description 13
- 230000007246 mechanism Effects 0.000 claims description 5
- 238000005096 rolling process Methods 0.000 claims description 2
- 238000013461 design Methods 0.000 description 8
- 230000001360 synchronised effect Effects 0.000 description 7
- 238000000034 method Methods 0.000 description 5
- 230000002829 reductive effect Effects 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 3
- 238000005452 bending Methods 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 238000012937 correction Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 230000004886 head movement Effects 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 230000036961 partial effect Effects 0.000 description 2
- 230000001960 triggered effect Effects 0.000 description 2
- 230000002730 additional effect Effects 0.000 description 1
- 230000002411 adverse Effects 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 230000000712 assembly Effects 0.000 description 1
- 238000000429 assembly Methods 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 238000003745 diagnosis Methods 0.000 description 1
- 230000005484 gravity Effects 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000003032 molecular docking Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 230000008439 repair process Effects 0.000 description 1
- 230000002441 reversible effect Effects 0.000 description 1
- 230000006641 stabilisation Effects 0.000 description 1
- 238000011105 stabilization Methods 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
- G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Manipulator (AREA)
Description
Claims (5)
- プローバに対してテストヘッドを配置するための装置であって、
フレームと、
第1及び第2の細長いリードスクリュー(elongate lead screws)であって、各リードスクリューは、一端が前記フレームに枢着(pivotably coupled)され、第1リードスクリューは、第1ピボット軸の周りでピボット運動でき、第2リードスクリューは、第1ピボット軸に平行に延びる第2ピボット軸の周りでピボット運動でき、第1及び第2のリードスクリューは、第1及び第2の各回転軸の周りで回転可能であり、第1回転軸は、第1ピボット軸に垂直に延び、又、第2回転軸は、第2ピボット軸に垂直に延びるような第1及び第2のリードスクリューと、
前記第1リードスクリューに回転可能に結合された第1端部、及び前記第2リードスクリューに回転可能に結合された第2端部を有するリンクと、
前記第1回転軸の周りで第1及び第2の互いに逆の方向に前記第1リードスクリューを回転すると共に、前記第2回転軸の周りで第1及び第2の互いに逆の方向に前記第2リードスクリューを回転するために、前記第1及び第2のリードスクリューに結合された少なくとも1つのアクチュエータと、
前記リンクに結合され且つ前記テストヘッドを支持するようにされたアームと、
を備え、前記第1及び第2のリードスクリューを前記第1方向に回転すると、前記リンクを前記第1及び第2のリードスクリューに対して並進移動させ、前記テストヘッドを前記フレームに対して並進移動させると共に、前記第1リードスクリューを前記第1方向に回転し且つ前記第2リードスクリューを前記第2方向に回転すると、前記リンクを前記第1及び第2のリードスクリューに対して回転し、前記テストヘッドを前記フレームに対してピボット運動させるようにした装置。 - 前記少なくとも1つのアクチュエータは、前記第1リードスクリューに結合された第1アクチュエータと、前記第2リードスクリューに結合された第2アクチュエータを含む、請求項1に記載の装置。
- 前記アームは、前記テストヘッドを前記アームに沿って第1及び第2の互いに逆の方向に移動するための並進移動メカニズムを含む、請求項1に記載の装置。
- 前記並進移動メカニズムは、直線的ガイドレールを含む、請求項3に記載の装置。
- 前記リードスクリューは、ローリング要素スクリュー(rolling element screws)である、請求項1に記載の装置。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/192,631 | 2005-07-29 | ||
US11/192,631 US7312604B2 (en) | 2005-07-29 | 2005-07-29 | Portable manipulator for stackable semiconductor test system |
PCT/US2006/028283 WO2007015952A2 (en) | 2005-07-29 | 2006-07-19 | Portable manipulator for stackable semiconductor test system |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2009503854A JP2009503854A (ja) | 2009-01-29 |
JP2009503854A5 JP2009503854A5 (ja) | 2009-07-02 |
JP4796142B2 true JP4796142B2 (ja) | 2011-10-19 |
Family
ID=37693630
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2008523984A Expired - Fee Related JP4796142B2 (ja) | 2005-07-29 | 2006-07-19 | 積層可能な半導体テストシステム用の可搬式マニピュレータ |
Country Status (6)
Country | Link |
---|---|
US (2) | US7312604B2 (ja) |
JP (1) | JP4796142B2 (ja) |
KR (1) | KR101265230B1 (ja) |
CN (1) | CN101258413A (ja) |
TW (1) | TWI394220B (ja) |
WO (1) | WO2007015952A2 (ja) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101769942B (zh) * | 2008-12-31 | 2012-08-29 | 京元电子股份有限公司 | 电子元件翻转测试装置及测试方法 |
JP5559654B2 (ja) * | 2010-10-06 | 2014-07-23 | 株式会社Synax | Icハンドラ及びic検査装置 |
CN103454458B (zh) * | 2013-09-10 | 2016-04-27 | 嘉兴景焱智能装备技术有限公司 | 芯片角度翻转装置 |
JP6267928B2 (ja) | 2013-10-29 | 2018-01-24 | 東京エレクトロン株式会社 | ウエハ検査装置の整備用台車及びウエハ検査装置の整備方法 |
US9726718B2 (en) * | 2014-05-30 | 2017-08-08 | Skyworks Solutions, Inc. | Modular test fixture |
KR101490286B1 (ko) | 2014-10-21 | 2015-02-04 | 주식회사 아이티엔티 | 일체형 자동 테스트 장치 |
US10094854B2 (en) * | 2015-10-23 | 2018-10-09 | Teradyne, Inc. | Manipulator in automatic test equipment |
KR102653657B1 (ko) | 2016-02-12 | 2024-04-03 | (주)테크윙 | 반도체소자 테스트용 핸들러 |
KR102221204B1 (ko) | 2016-10-10 | 2021-03-03 | 레이드-애쉬맨 매뉴팩추어링 인코포레이티드 | 매니퓰레이터 |
CN110615121A (zh) * | 2019-10-31 | 2019-12-27 | 苏州富强科技有限公司 | 一种开关导通测试装置 |
US11498207B2 (en) | 2021-01-08 | 2022-11-15 | Teradyne, Inc. | Test head manipulator configured to address uncontrolled test head rotation |
KR102706340B1 (ko) * | 2021-10-06 | 2024-09-12 | 주식회사 쎄믹스 | 그룹 프로버용 냉매 공급 장치 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5960206A (ja) * | 1982-08-25 | 1984-04-06 | インテスト・コ−ポレ−シヨン | 試験装置用電子試験ヘツド位置決め装置 |
JPH07147305A (ja) * | 1993-11-25 | 1995-06-06 | Tokyo Electron Ltd | 被検査体のテスト装置 |
JPH0864645A (ja) * | 1994-08-17 | 1996-03-08 | Tokyo Electron Ltd | プローブ装置 |
JPH09148388A (ja) * | 1995-11-16 | 1997-06-06 | Tokyo Electron Ltd | プローブ装置 |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4572942A (en) * | 1982-08-03 | 1986-02-25 | Church John G | Gas-metal-arc welding process |
US5149029A (en) * | 1982-08-25 | 1992-09-22 | Intest Corporation | Electronic test head positioner for test systems |
US4973015A (en) * | 1987-09-17 | 1990-11-27 | Schlumberger Technologies, Inc. | Manipulator apparatus for test head support and orientation |
US5241870A (en) * | 1991-07-22 | 1993-09-07 | Intest Corporation | Test head manipulator |
US5600258A (en) * | 1993-09-15 | 1997-02-04 | Intest Corporation | Method and apparatus for automated docking of a test head to a device handler |
US5506512A (en) * | 1993-11-25 | 1996-04-09 | Tokyo Electron Limited | Transfer apparatus having an elevator and prober using the same |
KR960019641A (ko) * | 1994-11-24 | 1996-06-17 | 오우라 히로시 | 테스트·헤드 접속 장치를 장비한 반도체 시험 장치 |
US5912555A (en) * | 1995-04-10 | 1999-06-15 | Tokyo Electron Limited | Probe apparatus |
US6888343B1 (en) * | 1999-01-13 | 2005-05-03 | Intest Ip Corporation | Test head manipulator |
US6396257B1 (en) * | 2000-04-26 | 2002-05-28 | Credence Systems Corporation | Test head manipulator for semiconductor tester with manual assist for vertical test head movement |
US6838868B1 (en) * | 2000-11-07 | 2005-01-04 | Teradyne, Inc. | Test head actuation system with positioning and compliant modes |
US6766996B1 (en) * | 2001-07-16 | 2004-07-27 | Reid-Ashman Manufacturing, Inc. | Manipulator |
US6646431B1 (en) * | 2002-01-22 | 2003-11-11 | Elite E/M, Inc. | Test head manipulator |
-
2005
- 2005-07-29 US US11/192,631 patent/US7312604B2/en not_active Expired - Fee Related
-
2006
- 2006-07-19 JP JP2008523984A patent/JP4796142B2/ja not_active Expired - Fee Related
- 2006-07-19 CN CNA2006800326103A patent/CN101258413A/zh active Pending
- 2006-07-19 WO PCT/US2006/028283 patent/WO2007015952A2/en active Application Filing
- 2006-07-25 TW TW095127136A patent/TWI394220B/zh not_active IP Right Cessation
-
2007
- 2007-12-21 US US11/963,702 patent/US20080100322A1/en not_active Abandoned
-
2008
- 2008-02-28 KR KR1020087004851A patent/KR101265230B1/ko active IP Right Grant
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5960206A (ja) * | 1982-08-25 | 1984-04-06 | インテスト・コ−ポレ−シヨン | 試験装置用電子試験ヘツド位置決め装置 |
JPH07147305A (ja) * | 1993-11-25 | 1995-06-06 | Tokyo Electron Ltd | 被検査体のテスト装置 |
JPH0864645A (ja) * | 1994-08-17 | 1996-03-08 | Tokyo Electron Ltd | プローブ装置 |
JPH09148388A (ja) * | 1995-11-16 | 1997-06-06 | Tokyo Electron Ltd | プローブ装置 |
Also Published As
Publication number | Publication date |
---|---|
TW200711021A (en) | 2007-03-16 |
US20070024296A1 (en) | 2007-02-01 |
CN101258413A (zh) | 2008-09-03 |
KR101265230B1 (ko) | 2013-05-24 |
JP2009503854A (ja) | 2009-01-29 |
US20080100322A1 (en) | 2008-05-01 |
WO2007015952A3 (en) | 2007-07-12 |
KR20080036620A (ko) | 2008-04-28 |
WO2007015952A2 (en) | 2007-02-08 |
US7312604B2 (en) | 2007-12-25 |
TWI394220B (zh) | 2013-04-21 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP4796142B2 (ja) | 積層可能な半導体テストシステム用の可搬式マニピュレータ | |
JP2878169B2 (ja) | デバイスハンドラーへの試験ヘッドの自動ドッキング方法及び装置 | |
JP6933475B2 (ja) | メンテナンス機構 | |
US7707907B2 (en) | Planar parallel mechanism and method | |
US6307386B1 (en) | Modular mechanical fixturing and automated handling of printed circuit assemblies on automated test equipment | |
US5949002A (en) | Manipulator for automatic test equipment with active compliance | |
US6057695A (en) | Method and apparatus for automated docking of a test head to a device handler | |
JP5270246B2 (ja) | 表面性状測定機および測定方法 | |
TW498480B (en) | Checking device for substrate conveyer | |
CN108621124A (zh) | 保持机构、转移装置、搬运机器人系统和机器人搬运方法 | |
CN114664720A (zh) | 晶圆校正系统及半导体工艺设备 | |
US6766996B1 (en) | Manipulator | |
US6646431B1 (en) | Test head manipulator | |
JP2001009765A (ja) | 昇降ユニット及びロボット装置 | |
CN112577668A (zh) | 一种非规则结构体质心测量装置及方法 | |
TW202248622A (zh) | 對多鉸鏈裝置進行負載測量的方法及設備 | |
JPH0833433B2 (ja) | プローブ装置 | |
Ming et al. | An automated wafer-handling system based on the integrated circuit equipments | |
CN113375921B (zh) | 一种笔记本电脑转轴耐久测试机 | |
US6722215B2 (en) | Manipulator apparatus with low-cost compliance | |
JP5465848B2 (ja) | 昇降傾斜調整装置 | |
CN111256987A (zh) | 一种谐波减速器力矩标定机构 | |
CN215356695U (zh) | 一种双并联机器人组合的激光加工设备 | |
US20240270511A1 (en) | Probe card gripper and transfer device comprising same | |
JP4962880B2 (ja) | 多関節ロボット及び生産設備の製造方法 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20090512 |
|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20090512 |
|
A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20091105 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20110404 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20110629 |
|
TRDD | Decision of grant or rejection written | ||
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20110725 |
|
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20110728 |
|
R150 | Certificate of patent or registration of utility model |
Ref document number: 4796142 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20140805 Year of fee payment: 3 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
LAPS | Cancellation because of no payment of annual fees |