JP4795548B2 - 液晶表示基板検査方法 - Google Patents

液晶表示基板検査方法 Download PDF

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Publication number
JP4795548B2
JP4795548B2 JP2001052809A JP2001052809A JP4795548B2 JP 4795548 B2 JP4795548 B2 JP 4795548B2 JP 2001052809 A JP2001052809 A JP 2001052809A JP 2001052809 A JP2001052809 A JP 2001052809A JP 4795548 B2 JP4795548 B2 JP 4795548B2
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Japan
Prior art keywords
wiring
inspection
gate
liquid crystal
switching element
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Expired - Fee Related
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JP2001052809A
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English (en)
Japanese (ja)
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JP2002258231A5 (enExample
JP2002258231A (ja
Inventor
真一 星野
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Japan Display Central Inc
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Toshiba Mobile Display Co Ltd
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Application filed by Toshiba Mobile Display Co Ltd filed Critical Toshiba Mobile Display Co Ltd
Priority to JP2001052809A priority Critical patent/JP4795548B2/ja
Publication of JP2002258231A publication Critical patent/JP2002258231A/ja
Publication of JP2002258231A5 publication Critical patent/JP2002258231A5/ja
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Publication of JP4795548B2 publication Critical patent/JP4795548B2/ja
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  • Liquid Crystal (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
JP2001052809A 2001-02-27 2001-02-27 液晶表示基板検査方法 Expired - Fee Related JP4795548B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2001052809A JP4795548B2 (ja) 2001-02-27 2001-02-27 液晶表示基板検査方法

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JP2001052809A JP4795548B2 (ja) 2001-02-27 2001-02-27 液晶表示基板検査方法

Publications (3)

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JP2002258231A JP2002258231A (ja) 2002-09-11
JP2002258231A5 JP2002258231A5 (enExample) 2008-04-03
JP4795548B2 true JP4795548B2 (ja) 2011-10-19

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JP2001052809A Expired - Fee Related JP4795548B2 (ja) 2001-02-27 2001-02-27 液晶表示基板検査方法

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20190095463A (ko) * 2016-12-23 2019-08-14 센젠 차이나 스타 옵토일렉트로닉스 테크놀로지 컴퍼니 리미티드 디스플레이 장치 및 그 순색 화면 검사 방법

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101010182B1 (ko) * 2003-11-28 2011-01-20 엘지디스플레이 주식회사 검사회로를 구비한 액정표시소자
CN100449360C (zh) * 2006-04-11 2009-01-07 友达光电股份有限公司 激光断路的布线结构
JP4570633B2 (ja) * 2007-03-07 2010-10-27 三菱電機株式会社 画像表示装置
JP5585102B2 (ja) * 2010-02-01 2014-09-10 カシオ計算機株式会社 アクティブマトリクス型表示パネル用基板とこれを用いた液晶表示パネル
JP5570246B2 (ja) * 2010-02-26 2014-08-13 三菱電機株式会社 液晶表示装置
CN102540508B (zh) * 2010-12-30 2015-02-04 上海天马微电子有限公司 液晶显示装置的线路检测结构及检测方法
CN103676232A (zh) * 2013-11-25 2014-03-26 深圳市华星光电技术有限公司 走线结构及该走线结构的断路修复方法、液晶面板
WO2015122365A1 (ja) * 2014-02-17 2015-08-20 凸版印刷株式会社 薄膜トランジスタアレイ装置、ｅｌ装置、センサ装置、薄膜トランジスタアレイ装置の駆動方法、ｅｌ装置の駆動方法、および、センサ装置の駆動方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3667548B2 (ja) * 1998-03-27 2005-07-06 シャープ株式会社 アクティブマトリクス型液晶表示パネル及びその検査方法
JP4128677B2 (ja) * 1998-11-24 2008-07-30 東芝松下ディスプレイテクノロジー株式会社 液晶表示装置の検査方法
JP2001033813A (ja) * 1999-07-16 2001-02-09 Matsushita Electric Ind Co Ltd 液晶表示装置の検査方法

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20190095463A (ko) * 2016-12-23 2019-08-14 센젠 차이나 스타 옵토일렉트로닉스 테크놀로지 컴퍼니 리미티드 디스플레이 장치 및 그 순색 화면 검사 방법
KR102174624B1 (ko) * 2016-12-23 2020-11-06 티씨엘 차이나 스타 옵토일렉트로닉스 테크놀로지 컴퍼니 리미티드 디스플레이 장치 및 그 순색 화면 검사 방법

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Publication number Publication date
JP2002258231A (ja) 2002-09-11

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