JP4791350B2 - テストヘッドの位置決め用リストジョイント - Google Patents

テストヘッドの位置決め用リストジョイント Download PDF

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Publication number
JP4791350B2
JP4791350B2 JP2006503025A JP2006503025A JP4791350B2 JP 4791350 B2 JP4791350 B2 JP 4791350B2 JP 2006503025 A JP2006503025 A JP 2006503025A JP 2006503025 A JP2006503025 A JP 2006503025A JP 4791350 B2 JP4791350 B2 JP 4791350B2
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JP
Japan
Prior art keywords
load
link
test head
base
axis
Prior art date
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Expired - Fee Related
Application number
JP2006503025A
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English (en)
Japanese (ja)
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JP2006516733A (ja
JP2006516733A5 (enExample
Inventor
ヘンリー・エム・アクーカ
クリストファー・エル・ウエスト
チャールズ・ナッペン
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Intest Corp
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Intest Corp
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Publication date
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Publication of JP2006516733A5 publication Critical patent/JP2006516733A5/ja
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Classifications

    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B25—HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
    • B25J—MANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
    • B25J9/00—Programme-controlled manipulators
    • B25J9/02—Programme-controlled manipulators characterised by movement of the arms, e.g. cartesian coordinate type
    • B25J9/04—Programme-controlled manipulators characterised by movement of the arms, e.g. cartesian coordinate type by rotating at least one arm, excluding the head movement itself, e.g. cylindrical coordinate type or polar coordinate type
    • B25J9/041—Cylindrical coordinate type
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B25—HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
    • B25J—MANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
    • B25J15/00—Gripping heads and other end effectors
    • B25J15/0004—Gripping heads and other end effectors with provision for adjusting the gripped object in the hand
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B25—HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
    • B25J—MANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
    • B25J15/00—Gripping heads and other end effectors
    • B25J15/0019—End effectors other than grippers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T403/00—Joints and connections
    • Y10T403/32—Articulated members
    • Y10T403/32008—Plural distinct articulation axes

Landscapes

  • Engineering & Computer Science (AREA)
  • Robotics (AREA)
  • Mechanical Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Pivots And Pivotal Connections (AREA)
  • Manipulator (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Microscoopes, Condenser (AREA)
  • Adjustment Of The Magnetic Head Position Track Following On Tapes (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Adornments (AREA)
  • Finger-Pressure Massage (AREA)
JP2006503025A 2003-01-28 2004-01-26 テストヘッドの位置決め用リストジョイント Expired - Fee Related JP4791350B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US44298803P 2003-01-28 2003-01-28
US60/442,988 2003-01-28
PCT/US2004/002103 WO2004070400A1 (en) 2003-01-28 2004-01-26 Wrist joint for positioning a test head

Publications (3)

Publication Number Publication Date
JP2006516733A JP2006516733A (ja) 2006-07-06
JP2006516733A5 JP2006516733A5 (enExample) 2007-08-23
JP4791350B2 true JP4791350B2 (ja) 2011-10-12

Family

ID=32850764

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2006503025A Expired - Fee Related JP4791350B2 (ja) 2003-01-28 2004-01-26 テストヘッドの位置決め用リストジョイント

Country Status (9)

Country Link
US (1) US8444107B2 (enExample)
EP (1) EP1601980B1 (enExample)
JP (1) JP4791350B2 (enExample)
CN (1) CN1745310B (enExample)
AT (1) ATE493666T1 (enExample)
DE (2) DE04705321T1 (enExample)
MY (1) MY144275A (enExample)
TW (1) TWI266056B (enExample)
WO (1) WO2004070400A1 (enExample)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102005019564B4 (de) 2005-04-27 2007-10-31 Hubertus Heigl Handhabungsvorrichtung zum Positionieren eines Testkopfs, insbesondere an einer Prüfeinrichtung
JP5085534B2 (ja) 2005-04-27 2012-11-28 エイアー テスト システムズ 電子デバイスを試験するための装置
TWI490513B (zh) * 2006-12-29 2015-07-01 Intest Corp 用於使負載沿平移軸線平移之負載定位系統以及使負載達到平衡之方法
US7800382B2 (en) 2007-12-19 2010-09-21 AEHR Test Ststems System for testing an integrated circuit of a device and its method of use
US8030957B2 (en) 2009-03-25 2011-10-04 Aehr Test Systems System for testing an integrated circuit of a device and its method of use
WO2013063674A1 (en) 2011-11-04 2013-05-10 Titan Medical Inc. Apparatus and method for controlling an end-effector assembly
EP2773277B1 (en) 2011-11-04 2016-03-02 Titan Medical Inc. Apparatus for controlling an end-effector assembly
EP2785267B1 (en) * 2011-11-30 2022-01-12 Titan Medical Inc. Apparatus and method for supporting a robotic arm
WO2013141869A1 (en) * 2012-03-22 2013-09-26 Satterfield Johnny A Video arm assembly
TWI782508B (zh) 2016-01-08 2022-11-01 美商艾爾測試系統 電子測試器中裝置之熱控制的方法與系統
KR20250122540A (ko) 2017-03-03 2025-08-13 에어 테스트 시스템즈 카트리지, 테스트 피스 및 하나 이상의 전자 디바이스들을 테스팅하는 방법
CA3177788A1 (en) * 2020-06-22 2021-12-30 James E. Welton Packaging testing device
KR20230082672A (ko) 2020-10-07 2023-06-08 에어 테스트 시스템즈 일렉트로닉스 테스터
CN112376686B (zh) * 2021-01-05 2021-09-14 安徽一品小院建筑科技有限公司 一种装配式混凝土结构通用钢榫连接节点及其施工方法
TWI770993B (zh) * 2021-05-07 2022-07-11 南亞科技股份有限公司 測試裝置
US12440291B2 (en) 2022-12-27 2025-10-14 Conavi Medical Inc. Systems and methods for unpowered release and retraction of robotic tools in a robotic surgical system

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6188318U (enExample) * 1984-11-14 1986-06-09
JP2002512691A (ja) * 1997-04-30 2002-04-23 クリーダンス システムズ コーポレイション テスト装置用ケーブルトレイ組立体

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2481717A (en) * 1946-03-19 1949-09-13 Blair Hosea Tilting tripod head
US4194437A (en) * 1978-03-09 1980-03-25 Rosheim Mark E Hydraulic servo mechanism
IT1162493B (it) * 1979-10-22 1987-04-01 Sante Zelli Perfezionamenti ai dispositivi di rullaggio per le vie di corsa di veicoli particolarmente per carrelli per riprese cinetelevisive
US4527942A (en) * 1982-08-25 1985-07-09 Intest Corporation Electronic test head positioner for test systems
US4705447A (en) * 1983-08-11 1987-11-10 Intest Corporation Electronic test head positioner for test systems
EP0188613A1 (de) * 1984-08-07 1986-07-30 Klaus Walter Schwenkarmsystem
JPH04101763U (ja) * 1991-02-12 1992-09-02 株式会社椿本チエイン 吊下搬送装置のハンガー傾動機構
JPH08168480A (ja) * 1994-12-19 1996-07-02 Toshiba Corp Ｘ線診断装置
JP3618136B2 (ja) * 1995-04-03 2005-02-09 株式会社日立メディコ Ｘ線ｃｔ装置
JPH09238931A (ja) * 1996-03-13 1997-09-16 Toshiba Corp Ｘ線診断装置
US5971348A (en) * 1996-10-03 1999-10-26 Corning Incorporated Adjustable stand for a cantilevered load
US6023173A (en) * 1997-04-30 2000-02-08 Credence Systems Corporation Manipulator with expanded range of motion
AU2610200A (en) 1999-01-29 2000-08-18 Intertool Machines Ltd. Universal sharpening apparatus employing pair of arcuate bearings
DE29906613U1 (de) 1999-04-14 2000-08-24 Merten GmbH & Co. KG, 51674 Wiehl Fernbedienungsgerät
US6837125B1 (en) * 1999-07-14 2005-01-04 Teradyne, Inc. Automatic test manipulator with support internal to test head
US6838868B1 (en) 2000-11-07 2005-01-04 Teradyne, Inc. Test head actuation system with positioning and compliant modes
JP2002159480A (ja) 2000-11-22 2002-06-04 Hitachi Medical Corp 医用ｘ線装置
WO2003005045A1 (de) 2001-07-05 2003-01-16 Heigl, Cornelia Handhabungsvorrichtung, insbesondere zum positionieren eines testkopfs an einer prüfeinrichtung
US6828774B2 (en) * 2002-02-27 2004-12-07 Teradyne, Inc. Rear-mounted gimbal for supporting test head

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6188318U (enExample) * 1984-11-14 1986-06-09
JP2002512691A (ja) * 1997-04-30 2002-04-23 クリーダンス システムズ コーポレイション テスト装置用ケーブルトレイ組立体

Also Published As

Publication number Publication date
ATE493666T1 (de) 2011-01-15
EP1601980A1 (en) 2005-12-07
WO2004070400A1 (en) 2004-08-19
CN1745310A (zh) 2006-03-08
EP1601980B1 (en) 2010-12-29
WO2004070400B1 (en) 2004-11-25
DE602004030768D1 (de) 2011-02-10
MY144275A (en) 2011-08-29
HK1078934A1 (en) 2006-03-24
JP2006516733A (ja) 2006-07-06
US8444107B2 (en) 2013-05-21
TW200506371A (en) 2005-02-16
TWI266056B (en) 2006-11-11
CN1745310B (zh) 2010-10-13
US20060255222A1 (en) 2006-11-16
DE04705321T1 (de) 2006-08-31

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