JP4768309B2 - 表示用基板を受けるワークテーブルの交換装置及び表示用基板の検査装置 - Google Patents

表示用基板を受けるワークテーブルの交換装置及び表示用基板の検査装置 Download PDF

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Publication number
JP4768309B2
JP4768309B2 JP2005132091A JP2005132091A JP4768309B2 JP 4768309 B2 JP4768309 B2 JP 4768309B2 JP 2005132091 A JP2005132091 A JP 2005132091A JP 2005132091 A JP2005132091 A JP 2005132091A JP 4768309 B2 JP4768309 B2 JP 4768309B2
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JP
Japan
Prior art keywords
work table
frame
display substrate
receiving
transfer
Prior art date
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Active
Application number
JP2005132091A
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English (en)
Japanese (ja)
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JP2006308450A (ja
Inventor
慎治 藤原
齋藤  健
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Micronics Japan Co Ltd
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Micronics Japan Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by Micronics Japan Co Ltd filed Critical Micronics Japan Co Ltd
Priority to JP2005132091A priority Critical patent/JP4768309B2/ja
Priority to TW095112316A priority patent/TW200710398A/zh
Priority to KR1020060032547A priority patent/KR100754846B1/ko
Publication of JP2006308450A publication Critical patent/JP2006308450A/ja
Application granted granted Critical
Publication of JP4768309B2 publication Critical patent/JP4768309B2/ja
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    • GPHYSICS
    • G09EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09GARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306Details
    • G02F1/1309Repairing; Testing
JP2005132091A 2005-04-28 2005-04-28 表示用基板を受けるワークテーブルの交換装置及び表示用基板の検査装置 Active JP4768309B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2005132091A JP4768309B2 (ja) 2005-04-28 2005-04-28 表示用基板を受けるワークテーブルの交換装置及び表示用基板の検査装置
TW095112316A TW200710398A (en) 2005-04-28 2006-04-07 Exchanging apparatus for work table receiving display-use substrate and testing device for display-use substrate
KR1020060032547A KR100754846B1 (ko) 2005-04-28 2006-04-11 표시용 기판을 받는 워크 테이블의 교환장치 및 표시용기판의 검사장치

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005132091A JP4768309B2 (ja) 2005-04-28 2005-04-28 表示用基板を受けるワークテーブルの交換装置及び表示用基板の検査装置

Publications (2)

Publication Number Publication Date
JP2006308450A JP2006308450A (ja) 2006-11-09
JP4768309B2 true JP4768309B2 (ja) 2011-09-07

Family

ID=37475507

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2005132091A Active JP4768309B2 (ja) 2005-04-28 2005-04-28 表示用基板を受けるワークテーブルの交換装置及び表示用基板の検査装置

Country Status (3)

Country Link
JP (1) JP4768309B2 (ko)
KR (1) KR100754846B1 (ko)
TW (1) TW200710398A (ko)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107678191B (zh) * 2016-08-02 2024-02-27 北京清大天达光电科技股份有限公司 一种载体开合机构
KR102503000B1 (ko) * 2017-09-08 2023-02-23 주식회사 탑 엔지니어링 카메라 모듈용 소켓
KR102478405B1 (ko) * 2021-12-09 2022-12-16 주식회사 윈체 창호용 자동 이동작업대
KR102598884B1 (ko) * 2022-11-30 2023-11-06 한화시스템 주식회사 안테나 시험 장치 및 안테나 시험 방법
KR102598883B1 (ko) * 2022-11-30 2023-11-06 한화시스템 주식회사 안테나 시험 장치 및 안테나 시험 방법
KR102583855B1 (ko) * 2023-03-17 2023-09-27 주식회사 새광이엔지 평탄도 검사를 포함한 멀티 검사 장치
KR102573634B1 (ko) * 2023-03-17 2023-09-01 주식회사 새광이엔지 전장 및 전폭 검사 장치

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3673022B2 (ja) * 1996-06-24 2005-07-20 株式会社日本マイクロニクス 液晶表示パネルの検査装置
JPH1010153A (ja) * 1996-06-26 1998-01-16 Nippon Maikuronikusu:Kk プローブユニットの保管庫およびそれを用いる検査システム
JPH1114956A (ja) * 1997-06-23 1999-01-22 Micronics Japan Co Ltd 液晶パネル用検査ステージ
JP3958852B2 (ja) * 1997-12-22 2007-08-15 株式会社日本マイクロニクス 被測定基板の検査装置
US6486927B1 (en) * 1999-11-19 2002-11-26 De & T Co., Ltd. Liquid crystal display test system
JP2003270155A (ja) * 2002-03-15 2003-09-25 Olympus Optical Co Ltd 基板保持装置及び検査装置

Also Published As

Publication number Publication date
TW200710398A (en) 2007-03-16
TWI304886B (ko) 2009-01-01
KR100754846B1 (ko) 2007-09-04
JP2006308450A (ja) 2006-11-09
KR20060113396A (ko) 2006-11-02

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