TW200710398A - Exchanging apparatus for work table receiving display-use substrate and testing device for display-use substrate - Google Patents

Exchanging apparatus for work table receiving display-use substrate and testing device for display-use substrate

Info

Publication number
TW200710398A
TW200710398A TW095112316A TW95112316A TW200710398A TW 200710398 A TW200710398 A TW 200710398A TW 095112316 A TW095112316 A TW 095112316A TW 95112316 A TW95112316 A TW 95112316A TW 200710398 A TW200710398 A TW 200710398A
Authority
TW
Taiwan
Prior art keywords
work table
display
use substrate
testing device
exchanging apparatus
Prior art date
Application number
TW095112316A
Other languages
English (en)
Chinese (zh)
Other versions
TWI304886B (ko
Inventor
Shinji Hujiwara
Takeshi Saitou
Original Assignee
Nihon Micronics Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nihon Micronics Kk filed Critical Nihon Micronics Kk
Publication of TW200710398A publication Critical patent/TW200710398A/zh
Application granted granted Critical
Publication of TWI304886B publication Critical patent/TWI304886B/zh

Links

Classifications

    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
TW095112316A 2005-04-28 2006-04-07 Exchanging apparatus for work table receiving display-use substrate and testing device for display-use substrate TW200710398A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005132091A JP4768309B2 (ja) 2005-04-28 2005-04-28 表示用基板を受けるワークテーブルの交換装置及び表示用基板の検査装置

Publications (2)

Publication Number Publication Date
TW200710398A true TW200710398A (en) 2007-03-16
TWI304886B TWI304886B (ko) 2009-01-01

Family

ID=37475507

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095112316A TW200710398A (en) 2005-04-28 2006-04-07 Exchanging apparatus for work table receiving display-use substrate and testing device for display-use substrate

Country Status (3)

Country Link
JP (1) JP4768309B2 (ko)
KR (1) KR100754846B1 (ko)
TW (1) TW200710398A (ko)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107678191B (zh) * 2016-08-02 2024-02-27 北京清大天达光电科技股份有限公司 一种载体开合机构
KR102503000B1 (ko) * 2017-09-08 2023-02-23 주식회사 탑 엔지니어링 카메라 모듈용 소켓
KR102478405B1 (ko) * 2021-12-09 2022-12-16 주식회사 윈체 창호용 자동 이동작업대
KR102598883B1 (ko) * 2022-11-30 2023-11-06 한화시스템 주식회사 안테나 시험 장치 및 안테나 시험 방법
KR102598884B1 (ko) * 2022-11-30 2023-11-06 한화시스템 주식회사 안테나 시험 장치 및 안테나 시험 방법
KR102573634B1 (ko) * 2023-03-17 2023-09-01 주식회사 새광이엔지 전장 및 전폭 검사 장치
KR102583855B1 (ko) * 2023-03-17 2023-09-27 주식회사 새광이엔지 평탄도 검사를 포함한 멀티 검사 장치

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3673022B2 (ja) * 1996-06-24 2005-07-20 株式会社日本マイクロニクス 液晶表示パネルの検査装置
JPH1010153A (ja) * 1996-06-26 1998-01-16 Nippon Maikuronikusu:Kk プローブユニットの保管庫およびそれを用いる検査システム
JPH1114956A (ja) * 1997-06-23 1999-01-22 Micronics Japan Co Ltd 液晶パネル用検査ステージ
JP3958852B2 (ja) * 1997-12-22 2007-08-15 株式会社日本マイクロニクス 被測定基板の検査装置
US6486927B1 (en) * 1999-11-19 2002-11-26 De & T Co., Ltd. Liquid crystal display test system
JP2003270155A (ja) * 2002-03-15 2003-09-25 Olympus Optical Co Ltd 基板保持装置及び検査装置

Also Published As

Publication number Publication date
JP2006308450A (ja) 2006-11-09
KR100754846B1 (ko) 2007-09-04
TWI304886B (ko) 2009-01-01
KR20060113396A (ko) 2006-11-02
JP4768309B2 (ja) 2011-09-07

Similar Documents

Publication Publication Date Title
TW200710398A (en) Exchanging apparatus for work table receiving display-use substrate and testing device for display-use substrate
SG126883A1 (en) Lithographic apparatus and positioning apparatus
SG137828A1 (en) Metrology tool, system comprising a lithographic apparatus and a metrology tool, and a method for determining a parameter of a substrate
WO2011065589A3 (en) Substrate carrier device, substrate carrying method, substrate supporting member, substrate holding device, exposure apparatus, exposure method and device manufacturing method
TW200706464A (en) Transformation station for a packaging production machine
TW200734263A (en) Substrate exchange apparatus and substrate processing apparatus, and substrate inspection apparatus
TW200732671A (en) Probe card transfer assist apparatus and inspection equipment using the same
TW200634850A (en) Working device and working method
MY147294A (en) A method and device for aligning components
TW200712501A (en) Method and apparatus for cleaning a probe card
TW200707120A (en) Lithographic apparatus and device manufacturing method utilizing movement of clean air to reduce contamination
DK1727677T3 (da) Automatisk monteringssystem
GB201211553D0 (en) Baby carriage and accommodating mechanism thereof
MX2013012659A (es) Maquina herramienta.
SG169308A1 (en) Crane device and method
MX2012000444A (es) Dispositivo y metodo para arreglar un componente sobre un soporte del componente.
TW200717589A (en) Data representation relating to a non-sampled workpiece
ATE536952T1 (de) Werkzeugmaschine
TW201144829A (en) Testing apparatus and machine for preventing electromagnetic interference
TW200505602A (en) Inspection system for rolled products of a milling station
SG169317A1 (en) Sorting apparatus for semiconductor device
AR090351A1 (es) Sistema y metodo para realizar calibracion sobre tablero de un conjunto de herramientas de alineacion
CN202622889U (zh) 印制电路板的钻定位孔装置
CN203323685U (zh) 链式运输机链条托板定位检测工具
DE502006000431D1 (de) Wafertisch zum bereitstellen von elektrischen bauelementen und vorrichtung zum bestücken von substraten mit den bauelementen