JP4761026B2 - Element transfer device, element transfer method, and display device manufacturing method - Google Patents

Description

  The present invention relates to an element transfer device, an element transfer method, and a display device manufacturing method that can easily transfer (transfer) a plurality of elements formed on a substrate to another substrate.

  In the conventional embedded transfer technology, a position sensor and each of the first and second substrates are supported by a first substrate on which a plurality of elements are formed and a second substrate to which the plurality of elements are transferred (transferred). Depending on the mechanical accuracy of the stage, the first substrate and the second substrate must be brought into contact with each other while keeping the parallelism as much as possible, and the plurality of elements must be transferred (transferred) to the second substrate (for example, Patent Documents 1 and 2).

  For this reason, as shown in FIG. 13 (1), transfer defects occur as the parallelism accuracy between the first substrate 51 and the second substrate 52 becomes worse. As shown in FIG. 13B, the lower the height of the element 55, the lower the transfer defect. Further, as shown in FIG. 13 (3), as the first substrate 51 becomes larger, the transfer defect occurred. Further, as shown in FIG. 14 (4), the poorer the flatness, parallelism, waviness, etc. of the second substrate 52, the more transfer defects occurred. This defect also occurs in the first substrate 51 as well. Further, as shown in FIG. 14 (5), when the tilt adjustment is performed with the stage 100 in order to prevent this transfer failure, the larger the rotational center O is from the element 55, the larger the position shift occurs. To prevent this, a complicated, expensive and low-throughput stage mechanism is required. For example, a method in which a substrate is pressed between two substrates with a spherical spacer having very high dimensional accuracy is employed (for example, see Non-Patent Documents 1 and 2). However, the method of sandwiching and pressing the spherical spacer is not appropriate because there is no place to insert the spacer when the transfer area of the second substrate is larger than the first substrate.

JP 2004-273596 A JP 2004-281630 A Bond aligner BA6, [online], 2002, SUSS Microtech Co., Ltd., homepage, site map, product introduction, substrate bonder / aligner, BA6 bond aligner, [March 31, 2005 search], Internet <URL: http : //www.suss.jp/html/ba6.html> SUSS Microtech Co., Ltd. (formerly Carl Sousse Japan Co., Ltd.) “Board Bonder / Aligner, BA6 Bond Aligner Brochure” 2002

The problem to be solved is to bury a plurality of elements attached to the adhesive layer formed on the first substrate in an adhesive layer (for example, an uncured resin layer) formed on the second substrate, In the technique of transferring the element from the first substrate side to the second substrate side, the element on the first substrate cannot be embedded by being brought into contact with the second substrate.

The element transfer apparatus of the present invention is an element transfer apparatus that bonds a plurality of elements bonded to a first substrate to a second substrate and separates the first substrate from the plurality of elements bonded to the second substrate side. there are a first substrate supporting unit which applies pressing the second substrate side by floating the first substrate by applying pressing by fluid pressure to the first substrate back side by mounting the first substrate, wherein a second substrate supporting section for supporting the second substrate disposed to face the first substrate is supported the first substrate placed on the first substrate supporting portion to the second substrate supporting section And a substrate transfer unit that transfers the substrate to a predetermined position directly below the second substrate.

In the element transfer device, the first substrate support unit lifts the first substrate from the first substrate support unit by pressing the back side of the first substrate placed thereon with fluid pressure. 2 Press to the substrate side. As a result, the first substrate is uniformly pressed by the pressure of the fluid, so that when the plurality of elements on the first substrate come into contact with the second substrate side , each element adheres to the second substrate with equal pressure. Pressed against the layer and glued.

  Even if the first substrate support part and the second substrate support part are not sufficiently parallel, the first substrate is floated by the fluid pressure, so that the element on the first substrate contacts the second substrate side. When doing so, the first substrate presses the adhesive layer of the second substrate with a uniform force through the element. Therefore, even if a plurality of elements are distributed in the plane of the first substrate, each element is pressed and bonded to the adhesive layer of the second substrate with equal pressure.

  Even when the height of the element is low, the first substrate is levitated by the fluid pressure, so when a part of the element on the first substrate comes into contact with the second substrate side, that point is used as a fulcrum. The first substrate is floated and the remaining elements are brought into contact with the adhesive layer. For this reason, the first substrate presses the adhesive layer of the second substrate with a uniform force through the element. Therefore, even if a plurality of elements are distributed in the plane of the first substrate, each element is pressed and bonded to the adhesive layer of the second substrate with equal pressure.

  In addition, even when the area of the first substrate is as large as the second substrate and there are elements over a wide area of the first substrate, the first substrate is levitated by the fluid pressure, so the elements on the first substrate When a part of the first substrate comes into contact with the second substrate side, the first substrate is levitated using the point as a fulcrum and the remaining elements are brought into contact with the adhesive layer. For this reason, the first substrate presses the adhesive layer of the second substrate with a uniform force through the element. Therefore, even if a plurality of elements are distributed in the plane of the first substrate, each element is pressed and bonded to the adhesive layer of the second substrate with equal pressure.

  Further, even when the second substrate is warped or wavy, for example, the back surface of the first substrate is uniformly pressed by the pressure of the fluid, so that some of the elements on the first substrate are on the second substrate side. When the contact is made, the first substrate tilts to press the element on the first substrate toward the second substrate with the point serving as a fulcrum and following the surface shape of the second substrate. For this reason, the first substrate presses the adhesive layer of the second substrate with a uniform force through the element. Therefore, even if a plurality of elements are distributed in the plane of the first substrate, each element is pressed and bonded to the adhesive layer of the second substrate with equal pressure.

In the element transfer method of the present invention, a plurality of elements on a first substrate are bonded to an adhesive layer formed on a second substrate, and the first substrate is separated from the plurality of elements bonded to the second substrate side. An element transfer method , wherein a plurality of elements on the first substrate placed on a first substrate support are brought close to the second substrate or brought into contact with a part of the adhesive layer. a contact step, wherein by pressure pressing the first substrate rear surface side flow body pressure by applying pressing by floating the first substrate to the second substrate side, the element adhering the plurality of elements in the adhesive layer bonding And a substrate separation step of separating the first substrate from the plurality of elements in a state where the plurality of elements are bonded to the adhesive layer.

In the element transfer method, after the element on the first substrate is brought close to the second substrate or brought into contact with a part of the adhesive layer by the element approach / contact process, the first pressure is applied by the fluid pressure by the element adhesion process. In order to float one substrate and push it up to the second substrate side, each of the plurality of elements on the first substrate receives an equal force and is bonded to the adhesive layer. That is, the element of the first substrate can be bonded to the second substrate side with the first substrate parallel to the second substrate. Moreover, the element is bonded to the second substrate side by bringing the element on the first substrate close to the second substrate or in contact with a part of the adhesive layer on the second substrate side by the element approach / contact process. Accurately guided to position.

Further, in the above-described device transfer method, the first substrate because the pressure pushing on the second substrate side is floated by the pressure of the fluid, it is possible to cope with the following situations.

  Even when the parallel alignment between the first substrate support portion and the second substrate support portion is insufficient, the back surface of the first substrate is uniformly pressed by the fluid pressure, so that the elements on the first substrate are second. When contacting the substrate side, the first substrate presses the adhesive layer of the second substrate through the element with a uniform force. Therefore, even if a plurality of elements are distributed in the plane of the first substrate, each element is pressed and bonded to the adhesive layer of the second substrate with equal pressure.

  Further, even when the height of the element is low, the back surface of the first substrate is uniformly pressed by the pressure of the fluid, so that when a part of the element on the first substrate contacts the second substrate side, that point As a fulcrum, the first substrate is levitated and the remaining elements are brought into contact with the adhesive layer. For this reason, the first substrate presses the adhesive layer of the second substrate with a uniform force through the element. Therefore, even if a plurality of elements are distributed in the plane of the first substrate, each element is pressed and bonded to the adhesive layer of the second substrate with equal pressure.

  Further, even when the area of the first substrate is as large as that of the second substrate and there are elements over a wide range of the first substrate, the first substrate back surface is uniformly pressed by the pressure of the fluid. When a part of the elements on the substrate comes into contact with the second substrate side, the first substrate is levitated using the point as a fulcrum, and the remaining elements are in contact with the adhesive layer. For this reason, the first substrate presses the adhesive layer of the second substrate with a uniform force through the element. Therefore, even if a plurality of elements are distributed in the plane of the first substrate, each element is pressed and bonded to the adhesive layer of the second substrate with equal pressure.

  Further, even when the second substrate is warped or wavy, for example, the back surface of the first substrate is uniformly pressed by the pressure of the fluid, so that some of the elements on the first substrate are on the second substrate side. When the contact is made, the first substrate tilts to press the element on the first substrate toward the second substrate with the point serving as a fulcrum and following the surface shape of the second substrate. For this reason, the first substrate presses the adhesive layer of the second substrate with a uniform force through the element. Therefore, even if a plurality of elements are distributed in the plane of the first substrate, each element is pressed and bonded to the adhesive layer of the second substrate with equal pressure.

  For this reason, the element is uniformly bonded to the adhesive layer of the second substrate, and the first substrate does not contact the second substrate side when the element is bonded. No damage is caused by the first substrate.

Method of manufacturing a display device of the present invention, a plurality of light emitting elements on the first substrate is adhered to the adhesive layer formed on the second substrate, the first from the plurality of light emitting devices bonded to the second substrate side using the device transfer method for separating the substrate, a manufacturing method of a display device arranged mounting a plurality of light emitting elements, the device transfer method, the said plurality of light emitting elements on the first substrate second substrate the second substrate closer or the element toward or contacting step to a state where the brought into contact with a portion of the adhesive layer, by floating the first substrate by applying pressing the first substrate rear surface side flow in body pressure by applying push to the side, away the plurality of light emitting elements and the element bonding step for bonding to the adhesive layer, the first substrate a plurality of light emitting elements in a state adhered to the adhesive layer from said plurality of light emitting element substrate And a separation step.

In the manufacturing method of the display device, the plurality of light emitting elements on the first substrate are bonded to the second substrate serving as the substrate of the display device by the element transfer method of the present invention. Is obtained. That is, since the plurality of light emitting elements on the first substrate are pressed against the adhesive layer of the second substrate with a uniform force, the first substrate and the second substrate are not in contact with each other, Each light emitting element is evenly bonded to an adhesive layer formed on the second substrate.

The element transfer apparatus of the present invention, first substrate support for pressurizing press first substrate rear surface side of the first substrate is placed on the second substrate side by floating the first substrate by applying pressing hydraulically Since the plurality of elements on the first substrate can be pressed toward the second substrate following the surface state of the first substrate on the side to which the elements of the second substrate are bonded, the first substrate can be pressed on the first substrate. The plurality of elements can be evenly bonded to the second substrate side. In addition, since the first substrate and the second substrate are parallel to each other, the substrates do not come into contact with each other, and the plurality of elements on the first substrate side are pressed against the second substrate side without damaging the second substrate. There is an advantage that you can. Therefore, the yield in the element transfer technology can be improved.

In the element transfer method of the present invention, the plurality of elements on the first substrate are brought close to the second substrate or brought into contact with a part of the adhesive layer, and then the first substrate is levitated by the pressure of the fluid. Since the second substrate and the first substrate are pushed up toward the two substrates, the second substrate and the first substrate can be made parallel, and a plurality of elements on the first substrate can be evenly bonded to the adhesive layer. In addition, since the element on the first substrate is brought close to the second substrate or brought into contact with a part of the adhesive layer on the second substrate side, the element is hardly displaced in the bonding position on the second substrate side. Can guide you. Therefore, all of the plurality of elements can be bonded to the adhesive layer at a uniform depth, for example, parallel to the second substrate. At this time, since the first substrate and the second substrate are parallel, the substrates do not contact each other. For this reason, there is an advantage that the element on the first substrate side can be pressed against the second substrate side without damaging the second substrate. Therefore, the yield in the element transfer technology can be improved.

In the method for manufacturing a display device of the present invention, when the plurality of light emitting elements on the first substrate side are transferred to the second substrate side, the first substrate and the second substrate are held in parallel. Will not touch. For this reason, there is an advantage that a plurality of light emitting elements on the first substrate side can be pressed against the second substrate side without damaging the second substrate. Therefore, it is possible to improve the yield when manufacturing the display device using the element transfer technique.

  An adhesive layer (for example, an uncured resin layer) formed on the second substrate by holding the element on which the element is mounted in parallel with the second substrate on which the element is transferred is held in parallel. The first substrate is made parallel to the second substrate by levitation of the first substrate by pressing the back surface side of the first substrate with fluid pressure and pressing the second substrate side against the second substrate. It is realized by doing. Details thereof will be described below.

  An example of an embodiment according to the element transfer apparatus of the present invention will be described with reference to the schematic configuration diagram of FIG.

  As shown in FIG. 1A, the element transfer apparatus 1 places the first substrate 51 and lifts the first substrate 51 by pressing the back side of the first substrate 51 with fluid pressure. The first substrate support unit 11 that presses against the second substrate 52 side, the second substrate support unit 12 that supports the second substrate 52 disposed so as to face the first substrate 51, and the first substrate support unit 11 A substrate transfer unit 41 is provided that transfers the placed first substrate 51 to a predetermined position directly below the second substrate 52 supported by the second substrate support unit 12.

  FIG. 1 (2) is an enlarged cross-sectional view of the first substrate support 11 in FIG. 1 (1), and a large number of holes 14 for supplying and evacuating are formed in the first substrate support 11. This is an example. The air supply is for supplying a gas for floating the first substrate 51, and the evacuation is for evacuating the first substrate 51 to the first substrate support 11.

  The holes 14 are evenly distributed over the entire first substrate placement surface of the first substrate support 11. For example, various distribution states such as a radial and concentric distribution from the center of the substrate placement surface of the first substrate support 11, a grid pattern on the substrate placement surface of the first substrate support 11, etc. Can be adopted. In short, when fluid (for example, gas) is sprayed from the holes 14 to the first substrate 51 side, the distance between the substrate placement surface of the first substrate support 11 and the back surface of the first substrate 51 is the same at any position. Holes are formed so that the first substrate 51 can be levitated so as to have a distance.

  Moreover, although the 1st board | substrate mounting surface of the 1st board | substrate support part 11 needs to be formed flat, the surface does not need to be a mirror surface. Rather, it is preferable not to be a mirror surface. That is, when the back surface of the first substrate 51 is formed as a mirror surface when formed on the mirror surface, the substrate placement surface of the first substrate support portion 11 and the back surface of the first substrate 51 are mirror surfaces. Therefore, the first substrate 51 may not be easily levitated even if it is adsorbed and fluid (for example, gas) is blown out from the hole 14. Therefore, it is preferable that the substrate mounting surface of the first substrate support portion 11 has a surface roughness that makes it difficult for the first substrate 51 to be naturally adsorbed, allows vacuum adsorption, and prevents the back surface of the first substrate 51 from being damaged.

  Further, the first substrate mounting surface of the first substrate support portion 11 may have a configuration in which a large number of pins (not shown) having the same height are arranged and the first substrate 51 is mounted on the numerous pins. Good. The height of the pin may be several tens of μm to several 100 μm. Accordingly, when a fluid (gas) is blown out from the hole 14, the first substrate 51 can easily float from the substrate placement surface of the first substrate support 11. In this case, it is preferable to form the pin tip in a flat surface and form the hole 14 in the pin tip surface.

  The fluid to be blown out from the first substrate support 11 is preferably a gas. For example, air, nitrogen, or an inert gas is used. For example, the inert gas includes a rare gas.

  The first substrate 51 is a substrate having a flatness of about 40 mm to 200 mm (8 inches) in diameter and excellent parallelism between the substrate display and the back surface of the substrate. As a substrate material, a glass substrate, a silicon substrate, a ceramic substrate, or the like can be used. As the second substrate 52, a substrate having a flatness and a parallelism between the substrate display and the back surface of the substrate having a diameter or a length of one side of a rectangle of about 75 mm (3 inches) to 2 m or more is used. As the substrate material, a glass substrate, a semiconductor substrate, a plastic substrate, a ceramic substrate, or the like can be used depending on the application.

On the surface of the first substrate 51, an adhesive layer 53 to which the element 55 to be transferred to the second substrate 52 side is bonded is formed. The adhesive layer 53 is formed of a resin coating film, a resin film, or the like, and has an adhesive property that the surface side adheres the element 55. An adhesive layer 54 for adhering the element 55 is formed on the surface of the second substrate 52 (the surface facing the first substrate 51). The adhesive layer 54 has a stronger force for adhering the element 55 than the adhesive layer 53 , and is made of an uncured resin layer, for example. As this uncured resin layer, a resist resin having a strong force for holding the LED molding element 55 formed by spin coating, printing or laminating can be used. On the other hand, as the adhesive layer 53, for example, a laminate obtained by laminating a slightly-adhesive silicone rubber film through a double-sided adhesive material can be used. Alternatively, any material may be used as long as it has an adhesive force weaker than that of the adhesive layer 54, such as an acrylic adhesive material or a resin film instead of the silicone film. The forming method is not limited to film lamination, and may be a forming method by spin coating or stamping (printing).

  The substrate transport unit 41 mainly includes a coarse movement stage 42 and a fine movement stage 43. As the coarse movement stage 42, basically, a stage that can move quickly in a long distance (for example, about several tens of cm to 2 m) in, for example, the x, y, z, and θ directions is used. As a result, the first substrate 51 can be loaded, unloaded and moved to the tiling location at high speed. The fine movement stage 43 is basically a stage capable of fine movement over a short distance (for example, about several μm to several hundred μm) in the x, y, z, and θ directions, for example. This achieves high resolution and high stop position accuracy during alignment. Further, a part of the operation of the coarse movement stage 42 can be combined with the operation of the fine movement stage 43. For example, the movement of the coarse movement stage 42 in the θ direction can be combined with the movement of the fine movement stage 43 in the θ direction. Further, the operation of the fine movement stage 43 in the z direction can be combined with the operation of the tilt portion 21 described later in detail in the Z direction. In this specification, the x direction, the y direction, and the z direction are axes in a three-dimensional orthogonal coordinate system, and the θ direction is a rotation direction around the z axis in the xy plane.

  The substrate transport unit 41 has an operation of separating the first substrate 51 from the element 55 in a state where the element 55 is adhered to the adhesive layer 54 formed on the second substrate 52. Also good. This operation may be performed by a descent operation in the z-axis operation of the substrate transport unit 41.

  The substrate transport unit 41 can move the first substrate 51 to a predetermined position directly below the second substrate 52 via the first substrate support unit 11. Therefore, the first substrate 51 can be moved to a desired position with respect to the second substrate 52 by the substrate transport unit 41.

  A sensor unit 15 is provided between the substrate transport unit 41 and the first substrate support unit 11 to detect a state in which the element 55 bonded to the first substrate 51 is in contact with the second substrate 52 side. Yes. As the sensor unit 15, for example, a load sensor that can measure a load applied when the element 55 bonded to the first substrate 51 is pressed against the second substrate 52 side can be used.

  The substrate support method of the first substrate support unit 11 may be mechanical support, support by vacuum suction, or other support means. In short, what is necessary is that the first substrate 51 is supported and fixed to the first substrate support portion 11 until the first substrate 51 is levitated. Further, the substrate support method of the second substrate support unit 12 may be mechanical support, support by vacuum suction, or other support means. In short, the second substrate support unit 12 may be any member as long as the second substrate 52 is supported and fixed.

  The element transfer apparatus 1 includes an alignment unit 65 for positioning the first substrate 51 at a predetermined position with respect to the second substrate 52 supported by the second substrate support unit 12 by the first substrate support unit 11. For example, it is installed on the first substrate support part 11 side. For example, the alignment unit 65 operates the substrate transport unit 41 to align the alignment mark formed on the first substrate 51 side with the alignment mark formed on the second substrate 52 side. In contrast, the first substrate 51 is aligned.

  Next, the operation of the element transfer apparatus 1 will be described with reference to FIG.

  The first substrate 51 is placed at a predetermined position on the first substrate support unit 11, and the second substrate 52 is supported at a predetermined position on the second substrate support unit 12.

  Then, the first substrate 51 is moved by the coarse movement stage 42 and the fine movement stage 43 of the substrate transport unit 41 so that the first substrate 51 is located immediately below a predetermined region of the second substrate 52. Then, the element 55 on the first substrate 51 is brought close to the distance of about 100 μm from the back surface of the second substrate 52 to perform precise alignment. In this precise alignment, for example, the fine movement stage 43 performs alignment in the x direction, the y direction, and the θ direction, and guides the element 55 directly below the embedded position of the adhesive layer 54 of the second substrate 52.

  Further, the fine movement stage 43 is driven in the z-axis direction to close the interval between the first substrate 51 and the second substrate 52. And if the element 55 on the 1st board | substrate 51 contacts the 2nd board | substrate 52 side, the sensor part 15 will sense the contact pressure. At this time, driving of fine movement stage 43 in the z-axis direction is stopped.

Next, the vacuum suction of the first substrate 51 is released, air is supplied to supply a fluid (for example, gas) to the hole 14, the fluid is blown out from the substrate mounting surface of the first substrate support portion 11, and the first The first substrate 51 is levitated from the substrate support 11. As the fluid at this time, air or a rare gas such as nitrogen (N ₂ ) or argon (Ar) is used.

  The element 55 on the first substrate 51 that has been levitated by the blowing of gas is pressed so as to follow the surface shape of the second substrate 52 with the point that has previously contacted the second substrate 52 as a fulcrum. As a result, all the elements 55 on the first substrate 51 are transferred to the adhesive layer 54 formed on the second substrate 52.

After the bonding of the element 55 to the second substrate 52 side is completed, the supply of the fluid to the hole 14 is stopped, and this time, by vacuuming, the first substrate 51 is again vacuum-adsorbed by the first substrate support 11. Then, the first substrate 51 is pulled away from the element 55 adhered to the adhesive layer 54 of the second substrate 52, and the first substrate support portion 11 is further lowered to complete the embedded transfer.

  In the element transfer apparatus 1, the first substrate support unit 11 presses the back surface side of the first substrate 51 placed thereon with a fluid pressure, so that the first substrate 51 from the first substrate support unit 11. Is floated and pressed to the second substrate 52 side. As a result, the first substrate 51 is evenly pressed by the pressure of the fluid. Therefore, when the element 55 on the first substrate 51 comes into contact with the second substrate 52 side, the element 55 becomes the surface of the first substrate 51. Even if a plurality of elements 55 are distributed, the respective elements 55 are pressed against and adhered to the adhesive layer 54 of the second substrate 52 with equal pressure.

  When the substrate transport unit 41 moves the first substrate 51 in a state parallel to the second substrate 52 to a position immediately below the second substrate 52, as shown in FIG. The vacuum suction of the first substrate support 11 to the first substrate 51 is released, and the gas is blown out from the holes 14 to press the back side of the first substrate 51 by the pressure of the blown fluid. As a result, the first substrate 51 is levitated from the first substrate support portion 11 and the elements 55 on the first substrate 51 are pressed against the second substrate 52 side. Thus, since the first substrate 51 is uniformly pressed by the pressure of the fluid (gas), when the element 55 on the first substrate 51 contacts the second substrate 52 side (adhesive layer 54), Even if a plurality of elements 55 are distributed in the plane of the first substrate 51, each element 55 is pressed against and adhered to the adhesive layer 54 of the second substrate 52 with equal pressure. 2 and 3, the hole 14 formed in the first substrate support portion 11 is shown only in one place, but it is shown in a simplified manner in the drawings, and in fact, as described above. In addition, it is formed at a plurality of locations.

  In addition, as shown in FIG. 2B, even when the first substrate support portion 11 and the second substrate support portion 12 are not sufficiently parallel, the vacuum of the first substrate support portion 11 with respect to the first substrate 51 is obtained. Since the first substrate 51 is levitated by fluid pressure (gas pressure) by releasing the suction and blowing the gas from the hole 14, the element 55 on the first substrate 51 is moved to the second substrate 52 side (adhesion layer). 54), the first substrate 51 presses the adhesive layer 54 of the second substrate 52 with a uniform force through the element 55. Therefore, even if a plurality of elements 55 are distributed in the plane of the first substrate 51, each element 55 is pressed against and adhered to the adhesive layer 54 of the second substrate 52 with equal pressure.

  Further, as shown in FIG. 2 (3), even when the height of the element 55 is low, the vacuum suction of the first substrate support 11 to the first substrate 51 is released, and the gas is blown out from the hole 14. Thus, since the first substrate 51 is levitated by the fluid pressure (gas pressure), when a part of the element 55 on the first substrate 51 comes into contact with the second substrate 52 side, the point is used as a fulcrum. One substrate 51 is levitated and the remaining elements 55 are brought into contact with the adhesive layer 54. For this reason, the first substrate 51 presses the adhesive layer 54 of the second substrate 52 through the element 55 with a uniform force. Therefore, even if a plurality of elements 55 are distributed in the plane of the first substrate 51, each element 55 is pressed against and adhered to the adhesive layer 54 of the second substrate 52 with equal pressure.

  Further, as shown in FIG. 3 (4), even when the area of the first substrate 51 is as large as the second substrate 52 and the element 55 is present over a wide area of the first substrate 51, the first substrate support Since the first substrate 51 is levitated by the fluid pressure (gas pressure) by releasing the vacuum suction of the part 11 to the first substrate 51 and blowing out the gas from the hole 14, the element 55 on the first substrate 51. When a part of the first substrate 51 comes into contact with the second substrate 52 side, the first substrate 51 is levitated using the point as a fulcrum, and the remaining elements 55 are in contact with the adhesive layer 54. For this reason, the first substrate 51 presses the adhesive layer 54 of the second substrate 52 through the element 55 with a uniform force. Therefore, even if a plurality of elements 55 are distributed in the plane of the first substrate 51, each element 55 is pressed against and adhered to the adhesive layer 54 of the second substrate 52 with equal pressure.

  Further, as shown in FIG. 3 (5), even when the second substrate 52 is warped or wavy, for example, the vacuum suction of the first substrate support portion 11 to the first substrate 51 is released, and the holes By blowing gas from 14, the back surface of the first substrate 51 is uniformly pressed by the pressure of the fluid (gas pressure), so that part of the element 55 on the first substrate 51 contacts the second substrate 52 side. Then, with this point as a fulcrum, the first substrate 51 tilts in a state following the surface shape of the second substrate 52, and the element 55 on the first substrate 51 is pressed against the second substrate 52 side. For this reason, the first substrate 51 presses the adhesive layer 54 of the second substrate 52 through the element 55 with a uniform force. Therefore, even if a plurality of elements 55 are distributed in the plane of the first substrate 51, each element 55 is pressed against and adhered to the adhesive layer 54 of the second substrate 52 with equal pressure.

  As shown in FIG. 3 (6), in the element transfer method of the present invention, a part of the element 55 on the first substrate 51 is in contact with the adhesive layer 54 of the second substrate 52, and in this state, Since the substrate is floated by the fluid pressure, the first substrate 51 rotates around the point where the element 55 contacts the adhesive layer 54 as the rotation center O, and the first substrate 51 is parallel to the second substrate 52. . Now, the inclination of the first substrate 51 with respect to the second substrate 52 when the element 55 contacts the adhesive layer 54 is θ, and the distance from the rotation center O to the element is r. Further, the bonding position (transfer position) of the element 55 when the first substrate 51 is levitated in a state where the first substrate 51 is parallel to the second substrate 52, and the first substrate 51 with respect to the second substrate 52. If the difference from the adhesion position (transfer position) when the first substrate 51 is levitated in a state where is inclined by θ is d, then d = r (1−cos θ), so θ is about 1 degree, for example. If d = 0.0001r, d = 0.001r even if θ is 3 degrees, for example, it can be considered that d≈0. Therefore, it can be said that the transfer of the element 55 from the first substrate 51 to the second substrate 52 by the element transfer apparatus 1 can be performed at an accurate position.

  Next, a modified example of the shape of the first substrate 51 will be described with reference to the schematic configuration diagram of FIG.

As shown in FIG. 4A, the basic shape of the first substrate 51 is a flat plate. As a modification thereof, as shown in FIG. 4B, there is a convex substrate in which the peripheral portion of the substrate is lower than the central portion of the substrate. The side surface of the convex portion of the convex substrate is preferably an inclined surface as shown. By using the inclined surface, the adhesive layer 54 can be easily formed. This is particularly effective when the adhesive layer 53 is formed by being attached to the first substrate 51. When the convex substrate is used, when the element 55 on the first substrate contacts the adhesive layer 54 of the second substrate 52 with the first substrate 51 tilted with respect to the second substrate 52, There is an advantage that the edge portion of the first substrate 51 is less likely to contact the second substrate 54 side. This is particularly effective when the height of the element 55 is low.

  Next, a modified example of the support relationship between the first substrate 51 and the first substrate support portion 11 will be described with reference to the schematic configuration diagram of FIG.

  As shown in FIG. 5A, a guide ring 57 is provided around the first substrate 51, the surface of which is located at a position lower than the surface of the first substrate 51 and fixed to the first substrate support portion 11. May be. In addition, the adhesive layer 53 formed on the first substrate 51 is attached to the surface of the guide ring 57 and is bonded to the element 55. Further, the guide ring 57 can be fixed to the first substrate support 11 by, for example, vacuum suction using the suction holes 16 provided in the first substrate support 11.

  The first substrate support portion 11 having the above configuration is formed on the first substrate support portion 11 by providing the guide ring 57 and attaching the adhesive layer 53 formed on the first substrate 51 to the surface of the guide ring 57. When the gas is blown from the hole 14 toward the first substrate 51, the adhesive layer 53 between the first substrate 51 and the guide ring 57 is stretched. In other words, the adhesive layer 53 can prevent the first substrate 51 from rising rapidly. This is because, as described above, the adhesive layer 53 is formed of a resin coating film, a resin film or the like, and thus has elasticity. In this way, it is possible to avoid the first substrate 51 from colliding with a second substrate (not shown) disposed above the first substrate 51. Further, since the surface of the guide ring 57 is formed at a position lower than the surface of the first substrate 51, the guide ring 57 is moved to the second substrate when the first substrate support portion 11 is raised to the second substrate side. Contact with the side can be prevented. By these, damage on the second substrate side can be prevented and the yield can be improved.

  As shown in FIG. 5 (2), the surface is positioned around the first substrate 51 at a position lower than the surface of the first substrate 51, and is fixed to the first substrate support portion 11 via the adhesive layer 58. A guide ring 57 may be provided. The adhesive layer 58 adheres the back surface side of the first substrate 51 and the back surface of the guide ring 57 (surface on the first substrate support part 11 side), and is formed of, for example, a single adhesive layer. As for this adhesion layer 58, the back surface (surface on the opposite side to the 1st board | substrate 51) does not have adhesiveness. Further, an adhesive layer 53 for adhering an element (not shown) is formed on the first substrate 51. Further, the guide ring 57 is fixed to the first substrate support 11 by, for example, vacuum-adsorbing the adhesive layer 58 adhered to the back side of the guide ring 57 through the suction holes 16 provided in the first substrate support 11. Can be made.

  The first substrate support portion 11 having the above configuration is provided with the guide ring 57, and the adhesive layer 58 formed on the back surface of the first substrate 51 (the surface on the first substrate support portion 11 side) is attached to the back surface of the guide ring 57. As a result, when the gas is blown to the first substrate 51 side from the hole 14 formed in the first substrate support portion 11, it is possible to prevent the first substrate 51 from rapidly rising by the adhesive layer 58. This is because the adhesive layer 58 between the part adhered to the first substrate 51 and the part adhered to the guide ring 57 is stretched. Thereby, it can avoid that the 1st board | substrate 51 collides with the 2nd board | substrate (not shown) arrange | positioned above the 1st board | substrate 51. FIG. Further, since the surface of the guide ring 57 is formed at a position lower than the surface of the first substrate 51, even when the first substrate support portion 11 is raised to the second substrate side, Even if the first substrate support portion 11 is inclined, the guide ring 57 can be prevented from coming into contact with the second substrate side. By these, damage on the second substrate side can be prevented and the yield can be improved.

  As shown in FIG. 5 (3), the surface is positioned around the first substrate 51 at a position lower than the surface of the first substrate 51, and is fixed to the first substrate support portion 11 via the adhesive layer 53. A guide ring 57 may be provided. The adhesive layer 53 formed on the first substrate 51 is attached to the back surface of the guide ring 57 and bonded to the element 55. Therefore, the adhesive layer 53 is formed as a single layer from the surface of the first substrate 51 to the back surface of the guide ring 57. Further, the guide ring 57 can be fixed to the first substrate support portion 11 by, for example, vacuum-adsorbing the adhesive layer 53 side through the suction holes 16 provided in the first substrate support portion 11.

  The first substrate support portion 11 having the above configuration is formed on the first substrate support portion 11 by providing the guide ring 57 and attaching the adhesive layer 53 formed on the first substrate 51 to the back surface of the guide ring 57. When the gas is blown from the hole 14 toward the first substrate 51, the adhesive layer 53 between the first substrate 51 and the guide ring 57 is stretched. The adhesive layer 53 can prevent the first substrate 51 from rising rapidly. This is because, as described above, the adhesive layer 53 is formed of a resin coating film, a resin film or the like, and thus has elasticity. In this way, it is possible to avoid the first substrate 51 from colliding with a second substrate (not shown) disposed above the first substrate 51. Further, since the surface of the guide ring 57 is formed at a position lower than the surface of the first substrate 51, the guide ring 57 is moved to the second substrate when the first substrate support portion 11 is raised to the second substrate side. Contact with the side can be prevented. By these, damage on the second substrate side can be prevented and the yield can be improved.

  Next, in the element transfer apparatus 1, an example of an element transfer apparatus in which a tilt portion that mechanically improves the parallel alignment accuracy of the first substrate 51 and the second substrate 52 is schematically shown in FIG. This will be described with reference to FIG.

  As shown in FIGS. 6 and 7, in the element transfer apparatus 1 described with reference to FIG. 1, the ridge portion 21, the sensor support portion 13, and the sensor portion 15 are provided between the substrate transport portion 41 and the first substrate support portion 11. It is provided.

  The tilt portion 21 is supported by the fine movement stage 43 described with reference to FIG. 1, for example, and is moved to a predetermined position directly below the second substrate 52 by the coarse movement stage 42 and the fine movement stage 43. The first substrate 51 and the second substrate 52 supported by the second substrate support part 12 are adjusted so as to be substantially parallel. Details of the mechanism will be described below.

  The tilt portion 21 is for positioning the first substrate 51 in parallel with the second substrate 52 and includes three uniaxial directions (for example, the z-axis direction) provided on the fine movement stage 43. The actuator 22 can be moved up and down. Each of the actuators 22 is disposed at a position that is a vertex of the triangle. Usually, in order to support the substrate and adjust the inclination, the substrate can be supported at three points. Therefore, also in this embodiment, the first substrate support portion 11 is supported at three points by the three actuators 22. As shown in FIG. 7, the support point is preferably located at the apex of an equilateral triangle whose center coincides with the center of the first substrate support portion 11. In addition, although it can also support at four or more points, since three points may contact the 1st board | substrate support part 11 and the remaining one point may not contact, three support points are enough. In addition, by positioning the support point at the apex of an equilateral triangle whose center coincides with the center of the first substrate support portion 11, it becomes easy to adjust the inclination of the first substrate 51 via the first substrate support portion 11. Further, in order to increase the precision of fine adjustment, as shown in the drawing, the lower surface side of the first substrate support portion 11 (the side opposite to the side where the first substrate 51 is supported) is larger than the first substrate support portion 11. A sensor support portion 13 is provided. In this case, the spherical bearing 30 described below is provided on the back surface side of the sensor support portion 13 (the side opposite to the side on which the first substrate support portion 11 is fixed).

  The movable tip portion of each actuator 22 has the following configuration. In other words, a rotary bearing 24 is provided at the tip of the drive shaft 23 of the actuator 22, and the rotary bearing 24 is supported by a linear motion shaft 25 fixed on the substrate transport portion 41 so as to be movable up and down. It has. A rotating shaft 27 is rotatably supported on the rotating bearing 24, and a swing shaft 28 orthogonal to the rotating shaft 27 is formed at the center of the rotating shaft 26. Therefore, the rotation shaft 27 and the swing shaft 28 are formed in a T shape. The tip of the swing shaft 28 is formed in a spherical shape, and the spherical bearing 30 that receives the spherical portion 29 is on the back surface of the first substrate support portion 11 (the surface opposite to the surface that supports the first substrate 51). Is provided. Since the sensor support portion 13 is provided in the drawing as described above, the spherical bearing 30 is installed on the sensor support portion 13.

  In addition, an elastic portion 31 is provided around the swing shaft 28 that is a drive shaft of each actuator 22 and between the rotary bearing 24 and the spherical bearing 30. The elastic portion 31 further presses the first substrate 51 against the second substrate 52 side after the element 55 bonded to the first substrate 51 contacts the second substrate 53 side by the operation of the actuator 22. The operation amount of the actuator 22 with respect to the first substrate 51 when the actuator 22 is operated in the direction is absorbed. The elastic portion 31 is formed by a coil spring, for example.

  Accordingly, the tilt portion 21 operates as follows. As the actuator 22 moves upward, the rotary bearing 24 is slidably supported by the linear motion bearing 26 and moves up. At this time, the rotating shaft 24 and the swing shaft 28 are also raised simultaneously. Then, the spherical bearing 30 pushed up by the spherical portion 29 provided on the swing shaft 28 is layered, and the sensor support portion 13 on which the spherical bearing 30 is installed is also pushed up at the portion where the actuator 22 operates. Each actuator 22 is adjusted to move upward so that the first substrate 51 placed on the sensor support portion 13 via the sensor portion 15 and the first substrate support portion 11 is parallel to the second substrate 52. Is done. For this reason, a difference may occur in the operation amount of each actuator 22.

  For example, when the operation amount of the first actuator 22 (22a) and the operation amount of the second actuator 22 (22b) are the same and longer than the actuator 22 (22c), the spherical bearing 30 connected to the actuator 22c is used. The sensor support part 13 inclines as a rotation fulcrum. Therefore, the spherical bearing 30 connected to the first actuator 22 (22a) and the spherical bearing 30 connected to the second actuator 22 (22b) are simply compared with the case where the operation amount of each actuator 22 is the same. It does not rise directly above, but rises in an oblique direction according to the inclination of the sensor support portion 13. This oblique rise is followed by the rotational motion of the spherical portion 29 serving as the operating end of the actuator 22 with respect to the spherical bearing 30 and the rotational motion of the rotational shaft 27 that supports the swing shaft 28 relative to the rotational bearing 24. It is like that.

  A first substrate support unit 11 that supports the first substrate 51 to which the element 55 to be transferred to the second substrate 51 side is attached and floats the first substrate 51 by fluid pressure is provided in the tilt portion 21. It is installed.

  Since the tilt portion 21 can be moved up and down in the z-axis direction by the actuator 22, the operation of the substrate transport portion 41 in the z-axis direction can also be used. In this case, the operation mechanism in the z-axis direction can be omitted in the substrate transport unit 41.

  The sensor unit 15 senses a state in which the element 55 bonded to the first substrate 51 is in contact with the second substrate 52 side. The sensor unit 15 is configured to detect the first substrate support unit 11 and the first tilt unit 21. It is provided between the sensor support part 13 formed on the substrate support part 12 side. As the sensor unit 15, for example, a load sensor that measures a load applied when the element 55 bonded to the first substrate 51 is pressed against the second substrate 52 can be used.

  In addition, the measurement unit 61 determines a position where the operation of the first substrate 51 is stopped when the first substrate 51 comes into contact with the second substrate 52 when the first substrate 51 is brought close to the second substrate 52. In addition to the measurement, the movement amount of the tilt portion 21 after the first substrate 51 is stopped is measured, and is provided for each actuator 22. The measurement unit 61 can use, for example, a linear scale that can read the amount of displacement. Furthermore, an alignment unit 65 for aligning the first substrate 51 with respect to the second substrate 52 is provided in the first substrate support unit 11, for example.

  In the element transfer apparatus 1, in order to smoothly move the first substrate 51 to a predetermined position directly below the second substrate 52 by the substrate transport unit 41, each of the first substrates 51 with respect to the second substrate 52 is previously stored. It is preferable that the movement position of the substrate transport unit 41 is set in advance by performing a pre-leveling operation using the first master substrate and the second master substrate at the movement position. By performing such a pre-leveling operation, the alignment operation of the first substrate 51 with respect to the second substrate 52 can be performed quickly.

  The pre-leveling operation is performed as follows. First, a first master substrate (not shown) and a second master substrate (not shown) are prepared. Both substrates use substrates with high dimensional accuracy (especially dimensional accuracy of thickness and flatness). Then, the first master substrate is placed on the first substrate support portion 11. Further, the second master substrate is placed on the second substrate support portion 12.

  Next, the substrate transport unit 41 is driven to move the first master substrate below a predetermined position where the first master substrate is brought into contact with the second master substrate. The alignment in the x, y, z, and θ directions at this time can also be performed by the alignment unit.

  The operation of raising the actuator 22 of the tilt portion 21 is performed to bring the first master substrate closer to the second master substrate. At this time, the operation amount of each actuator 22, the measurement value of the measurement unit 61 made of a linear scale attached to each axis, and the measurement value of the sensor unit 15 made of a load sensor are always monitored.

  Eventually, at least a part of the first master substrate comes into contact with the second master substrate. For example, if the first master substrate contacts the second master substrate at the position of the first master substrate corresponding to one of the actuators 22a (hereinafter referred to as the first actuator), the first master substrate becomes the second master substrate. The sensor unit 15 that senses the touched state reacts. That is, it is detected that the load applied to the first master substrate has increased.

  At that time, the elastic portion 31 provided between the first actuator 22a and the sensor support portion 13 contracts, and even if the first actuator 22a is lifted, the portion of the first master substrate supported by the first actuator 22a No longer fluctuates. When the master substrates are in contact with each other in this way, even if the first actuator 22a is continuously operated, only the elastic portion 31 contracts, the first master substrate does not rise, and the value of the measurement unit 61 does not change. A difference between the operation amount of the actuator 22a and the measurement value of the measurement unit 61 begins to be made. Further, the value of the sensor unit 15 starts to increase.

  Eventually, all of the actuators 22 are in the above state. At this time, it is determined that the entire surfaces of the first master substrate and the second master substrate are in contact with each other, and the measurement values of the measurement unit 61 at that time are individually stored.

  Next, the first master substrate is lowered and moved to the next embedding position, and the above series of operations is repeated again. This is performed at all embedding positions, and pre-leveling is completed. This pre-leveling is performed mechanically, electrically, or softly with respect to the element transfer device 1 such as when the element transfer device 1 is completed, when the element transfer device 1 is installed, or when the element transfer device 1 is adjusted. It is preferable to carry out when changed to.

  Next, the operation of the element transfer apparatus 1 equipped with the tilt portion 21 will be described with reference to FIGS.

  The first substrate 51 is placed at a predetermined position on the first substrate support unit 11, and the second substrate 52 is supported at a predetermined position on the second substrate support unit 12.

  Then, the first substrate 51 is moved by the coarse movement stage 42 and the fine movement stage 43 of the substrate transport unit 41 so that the first substrate 51 is located immediately below a predetermined region of the second substrate 52. At this time, based on the measurement position previously obtained by the pre-leveling operation, the first substrate 51 is moved within a range of 100 μm to 300 μm immediately below the first substrate 51.

  Next, each actuator 22 is moved upward to bring the first substrate 51 closer to the second substrate 52 side.

  At this time, among the actuators 22, for example, the first actuator 22 corresponding to one actuator 22 (now referred to as the first actuator 22 a) of the actuators 22 that brings the first substrate 51 closer to the second substrate 52 side. Assuming that a part of the element 55 bonded to the first substrate 51 is in contact with the contact layer 54 on the second substrate 52 side at the position of the substrate 51, the state where the element 55 is in contact with the second substrate 52 side is as follows. The sensor unit 15 to detect reacts. That is, it is detected that the load applied to the first substrate 51 has increased. The position of the first actuator 22a at this time is measured by the measuring unit 61.

  At that time, the elastic portion 31 provided between the first actuator 22a and the sensor support portion 13 contracts, and even if the first actuator 22a is lifted, the portion of the first substrate 51 supported by the first actuator 22a. No longer fluctuates. When the first actuator 22a is moving upward, the measurement unit 61 previously measures the position of the first actuator 22a at the contact position between the first substrate 51 and the second substrate 52; The current position of the first actuator 22a is compared, and if it is within a predetermined range, the raising operation of the first actuator 22a is stopped.

  On the other hand, the second actuator 22 (22b) and the third actuator 22 (22c) other than the first actuator 22a continue the operation of bringing the first substrate 51 closer to the second substrate 52 side. Then, for example, of the remaining two actuators 22b and 22c, the contact with the contact layer 54 on the second substrate 52 side at the position of the first substrate 51 corresponding to, for example, one actuator (hereinafter referred to as the second actuator 22b). If so, the sensor unit 15 that senses the state in which the element 55 is in contact with the second substrate 52 side reacts. That is, it is detected that the load applied to the first substrate is increasing. The position of the second actuator 22b at this time is measured by the measurement unit 61.

  At that time, the elastic portion 31 provided between the second actuator 22b and the sensor support portion 13 contracts, and the portion of the first substrate 51 that the second actuator 22b supports even when the second actuator 22b is raised. No longer fluctuates. Then, when the second actuator 22b is moving upward, the measurement unit 61 previously measures the position of the second actuator 22b at the contact position between the first substrate 51 and the second substrate 52, The current position of the second actuator 22b is compared, and if it is within a predetermined range, the raising operation of the second actuator 22b is stopped.

  Finally, the operation of causing the first substrate 51 of the remaining third actuator 22c to approach the second substrate 52 side is continued. If the second substrate 52 is contacted at the position of the first substrate 51 corresponding to the third actuator 22c, the sensor unit 15 that senses the state in which the element 55 is in contact with the second substrate 52 side reacts. That is, it is detected that the load applied to the first substrate 51 has increased. The position of the third actuator 22c at this time is measured by the measurement unit 61.

  At that time, the elastic portion 31 provided between the third actuator 22c and the sensor support portion 13 contracts, and the portion of the first substrate 51 that the third actuator 22c supports even when the third actuator 22c is moved up. No longer fluctuates. When the third actuator 22c is moving upward, the measurement unit 61 previously measures the position of the third actuator 22c at the contact position between the first substrate 51 and the second substrate 52; The current position of the third actuator 22c is compared, and if it is within a predetermined range, the ascending operation of the third actuator 22c is stopped.

  In this way, in all the three-axis actuators 22, the entire area of the element 55 bonded to the first substrate 51 is in contact with the second substrate 52 side, and the elastic portion 31 is deformed even if each actuator 22 is moved upward. Only by (shrinking), the position of the first substrate 51 does not change. The load measured by the sensor unit 15 at this time is preferably a uniform value, but may be within a predetermined range. In addition, if the value of the measurement unit 61 is within a predetermined range from the contact position between the first substrate 51 and the second substrate 52 obtained by measurement in advance, the first substrate 51 and the second substrate 52 Can be regarded as being parallel to each other, and it is determined that the element 55 can be bonded to the second substrate 52 side. Further, the operation amount of the actuator 22 is substantially the operation amount of the tilt portion 21.

  In the element transfer apparatus 1, by providing the tilt portion 21, the first substrate 51 can be arranged in parallel to the second substrate 52 by finely adjusting the inclination of the first substrate 51. In addition, by providing the substrate transport unit 41 that moves the tilt unit 21, the first substrate 51 supported on the substrate transport unit 41 via the tilt unit 21 and the first substrate support unit 11 is directly below the second substrate 52. It can be moved to a desired position. Further, since the measurement unit 61 that measures the distance between the first substrate 51 and the second substrate 52 without contact with the first substrate 51 and the second substrate 52 is provided, the first substrate 51 and the second substrate 52 are Even if an adhesive layer (first adhesive layer 53, second adhesive layer 54) is formed on the opposing surfaces, the measurement unit 61 does not contact the first adhesive layer 53 and the second adhesive layer 54. In the element transfer apparatus 1 having such a feature, the element 55 attached to the first substrate 51 can be pressed in parallel to the second substrate 52 side. At this time, since the first substrate 51 and the second substrate 52 are parallel to each other, the substrates do not contact each other. Therefore, there is an advantage that the element 55 on the first substrate 51 side can be pressed against the second substrate 52 side without damaging the second substrate 52. Therefore, the yield in the transfer technique of the element 55 can be improved.

Furthermore, in the element transfer apparatus 1 of the present invention, both the first substrate 51 and the second substrate 52 may be opaque substrates, and the first substrate 51 and the second substrate 52 are paralleled. Therefore, the first and second substrates have a high degree of freedom in selecting the substrate material. Further, there is a feature that the first substrate 51 and the second substrate 52 can be paralleled without any problem even if elements, wirings, and the like are formed on the substrate. Therefore, the degree of freedom in designing the devices formed on each substrate by parallel substrate placement is not affected.

  Also, the first and second substrate support portions 11 and 12 that support each substrate may be opaque substrates, as described above, and the degree of freedom in selecting the material of the first and second substrate support portions 11 and 12 is acceptable. Has high characteristics. Further, since it can be formed by a single substrate, the flatness of each substrate support surface of the first and second substrate support portions 11 and 12 can be processed with high accuracy, and parallel when the substrate is supported. The dispensing accuracy can be increased.

  Next, an example of an embodiment according to the element transfer method of the present invention will be described with reference to the manufacturing process diagram of FIG. The element transfer method of the present invention is a method that is performed using the element transfer apparatus 1 of the present invention. Therefore, please also refer to FIG. In addition, the reference numerals of the constituent parts shown in the explanation of the element transfer device are given to the constituent parts in the following explanation.

  In the element transfer method of the present invention, the element 55 on the first substrate 51 is adhered to the adhesive layer 54 formed on the second substrate 55, and the first substrate 51 is removed from the element 55 adhered to the second substrate 52 side. In the element transfer method for separating, the element transfer apparatus 1 described with reference to FIGS. 1, 4 to 7, etc. is used, and the element 55 on the first substrate 51 is moved closer to the second substrate 52 or the adhesive layer. An element approaching / contacting process for bringing the element into contact with a part of the element 54; an element adhering process for pressing the first substrate 51 toward the second substrate 52 with a fluid pressure and adhering the element 55 to the adhesive layer 54; A substrate separating step of separating the first substrate 51 from the element 55 in a state where the element 55 is adhered to the adhesive layer 54. This will be specifically described below.

  As shown in FIG. 8A, the “element approach / contact process” S1 is performed. In this step, the first substrate 51 is supported by the first substrate support portion 11. For example, the support method is such that the front surface (first adhesive layer 53 side) of the first substrate 51 faces up and the back surface of the first substrate 51 faces the first substrate support portion 11 side, for example, vacuuming from the hole 14. Is supported by vacuum suction. For the first substrate 51, for example, a substrate having a diameter of Φ = 40 mm to Φ200 mm (8 inches) is used. The element 55 bonded to the first adhesive layer 53 formed on the surface of the first substrate 51 has a size of about 5 μm to 100 μm, for example, and a height of about 5 μm to 100 μm. The number of the first substrate 51 bonded is about 10 to 1 million.

  Next, the second substrate 52 is supported by the second substrate support unit 12. This support method is supported by vacuum suction, for example, with the front surface (second adhesive layer 54 side) of the second substrate 52 facing down and the back surface of the second substrate 52 facing the second substrate support portion 12 side. The support of the first substrate 51 with respect to the first substrate support portion 11 may be mechanically fixed so as to be detachable. Further, as the second substrate 52, for example, a substrate having a diameter of Φ = 75 mm (3 inches) to about 2 m square is used. The second substrate 52 can be a substrate larger than the 2 m silicon method. A second adhesive layer 54 is formed on the surface of the second substrate 52. The second adhesive layer 54 has a greater adhesive force with respect to the element 55 than the adhesive force of the first adhesive layer 53 to which the element 55 is bonded. The second adhesive layer 54 formed on the second substrate 52 is made of, for example, an uncured resin layer. The uncured resin layer is made of, for example, a so-called tack-resistant resist film by spin coating, printing, It is formed by a film forming method such as a laminating method. Note that either the first substrate support step or the second substrate support step may be performed first.

  Next, the first substrate 51 and the second substrate 52 are opposed to each other while maintaining a predetermined distance. Specifically, the first substrate 51 is moved by moving the substrate transport unit 41 (see FIG. 1) in, for example, the xy direction and the θ direction based on the measurement of the alignment unit 65 (see FIG. 1). And move to a predetermined position directly below the second substrate 52. At this time, the distance between the surface of the element 55 on the first substrate 51 and the surface of the adhesive layer 54 of the second substrate 52 is, for example, about 30 μm to 100 μm.

  When the first substrate 51 is inclined with respect to the second substrate 52 and approaches the second substrate 52 side, the first substrate support unit 11 is gradually moved further in the z direction by the substrate transport unit 41. A part of the element 55 on the first substrate 51 comes into contact with the second substrate 52 side, that is, the adhesive layer 54. At this time, since an increase in pressure is detected by the sensor unit 15, it is detected that at least a part of the element 55 has contacted the adhesive layer 54.

  Next, as shown in FIG. 8B, the “element bonding step” S2 is performed. In this step, gas is blown to the first substrate 51 side from the hole 14 of the first substrate support portion 11 to float the first substrate 51 by the pressure of the gas, and the first substrate 51 is pressed to the second substrate 52 side. The upper element 55 is adhered to the adhesive layer 54. In the drawing, for simplicity, only one hole 14 is depicted, but a large number of holes 14 are provided. Therefore, gas is blown over the entire back surface side of the first substrate 51 with an equal pressure. Therefore, the element 55 pressed against the adhesive layer 54 is pressed against the adhesive layer 54 with a uniform pressure over the entire area of each element 55. The pressing force of the first substrate 51 is adjusted by adjusting the pressure (flow rate) of the gas. As a result, the element 55 of the first substrate 51 can be pressed with an appropriate pressure toward the second substrate 52, so that the element 55 is embedded in the adhesive layer 54 formed on the second substrate 52 with an appropriate depth. be able to. Therefore, the element 55 can be reliably adhered to the adhesive layer 54.

  The state in which the first substrate 51 is pressed with gas is maintained until the adhesive layer 54 is cured and the element 55 is sufficiently adhered to the adhesive layer 54.

  Next, as shown in FIG. 8C, the “substrate separation step” S3 is performed. In this step, the first substrate 51 is separated from the element 55 in a state where the element 55 is bonded to the adhesive layer 54. In this separation operation, for example, by stopping the blowing of gas from the hole 14 and evacuating the hole 14, the first substrate 51 is vacuum-adsorbed to the first substrate support 11 by evacuation from the hole 14 again. To do. Further, the first substrate support unit 11 is lowered along the z-axis direction by the substrate transfer unit 41 (see FIG. 1).

  In the element transfer method, the element 55 on the first substrate 51 is brought close to the second substrate 52 or brought into contact with a part of the adhesive layer 54 by the “element approach / contact process” S1, and then “element adhesion” is performed. In step S2, the first substrate 51 is pushed up to the second substrate 52 side by the pressure of the fluid. When there are a plurality of elements 55 on the first substrate 51, each element 55 receives an equal force and receives an adhesive layer. Adhere to 54. That is, the elements of the first substrate 51 can be bonded to the second substrate 52 side with the first substrate 51 parallel to the second substrate 52. In addition, in the “element approach / contact step” S1, the element 55 on the first substrate 51 is brought close to the second substrate 52 or brought into contact with a part of the adhesive layer 54 on the second substrate 52 side. The element 55 is accurately guided to the bonding position on the second substrate 52 side.

  In the element transfer method, the first substrate 51 is levitated by the pressure of the fluid and pressed to the second substrate 52 side. Therefore, when the first substrate 51 is brought close to the second substrate 52, various methods are performed. Depending on the factors, it is possible to cope with the case where the first substrate 51 is inclined and approaches the second substrate 52. The details will be described with reference to FIGS.

  As shown in FIG. 2 (2), when the parallel alignment between the first substrate support portion 11 and the second substrate support portion 12 is insufficient, the element transfer method of the present invention uses the first substrate support portion 11 on the first substrate 51. A part of the element 55 comes into contact with the adhesive layer 54 of the second substrate 52 first. The determination as to whether or not the element 55 is in contact can be made by, for example, detecting a pressure increase when the sensor unit 15 detects the pressure applied to the first substrate 51. Thereafter, gas is blown from the hole 14 of the first substrate support portion 11 toward the first substrate 51, and the first substrate 51 is floated with the contact point of the element 55 that has contacted the adhesive layer 54 as a fulcrum. Then, the first substrate 51 is pressed toward the second substrate 52 by the gas pressure, and the element 55 on the first substrate 51 is adhered to the adhesive layer 54. Since the first substrate 51 moves in a direction that is levitated by the pressure of the gas, when the element 55 on the first substrate 51 comes into contact with the second substrate 52 side, the first substrate 51 is connected to the second substrate via the element 55. The adhesive layer 54 of 52 is pressed with a uniform force. Therefore, even if a plurality of elements 55 are distributed in the plane of the first substrate 51, each element 55 is pressed against and adhered to the adhesive layer 54 of the second substrate 52 with equal pressure.

  As shown in FIG. 2C, when the height of the element 55 is low, a part of the element 55 does not come into contact with the adhesive layer 54 in the conventional transfer technique. In the element transfer method, since the first substrate 51 is levitated by fluid pressure (gas pressure), when a part of the element 55 on the first substrate 51 comes into contact with the second substrate 52 side, that point is used as a fulcrum. The first substrate 51 is levitated and the remaining elements 55 are brought into contact with the adhesive layer 54. For this reason, the first substrate 51 presses the adhesive layer 54 of the second substrate 52 through the element 55 with a uniform force. Therefore, even if a plurality of elements 55 are distributed in the plane of the first substrate 51, each element 55 is pressed against and adhered to the adhesive layer 54 of the second substrate 52 with equal pressure.

  Further, as shown in FIG. 3 (4), when the area of the first substrate 51 is as large as the second substrate 52 and the element 55 is present over a wide area of the first substrate 51, the conventional transfer technique is used. Some of the elements 55 do not come into contact with the adhesive layer 54. However, in the element transfer method of the present invention, the first substrate 51 is levitated by the fluid pressure (gas pressure). When a part of the element 55 comes into contact with the second substrate 52 side, the first substrate 51 is levitated using the point as a fulcrum, and the remaining element 55 is brought into contact with the adhesive layer 54. For this reason, the first substrate 51 presses the adhesive layer 54 of the second substrate 52 through the element 55 with a uniform force. Therefore, even if a plurality of elements 55 are distributed in the plane of the first substrate 51, each element 55 is pressed against and adhered to the adhesive layer 54 of the second substrate 52 with equal pressure.

  In addition, as shown in FIG. 3 (5), when the second substrate 52 is warped or wavy, for example, in the conventional transfer technique, a part of the element 55 does not contact the adhesive layer 54. However, in the element transfer method of the present invention, the back surface of the first substrate 51 is uniformly pressed by the gas pressure, so that when a part of the element 55 on the first substrate 51 comes into contact with the second substrate 52 side, Using the point as a fulcrum, the first substrate 51 tilts in a state following the surface shape of the second substrate 52, and the element 55 on the first substrate 51 is pressed against the second substrate 52 side. For this reason, the first substrate 51 presses the adhesive layer 54 of the second substrate 52 through the element 55 with a uniform force. Therefore, even if a plurality of elements 55 are distributed in the plane of the first substrate 51, each element 55 is pressed against and adhered to the adhesive layer 54 of the second substrate 52 with equal pressure.

  Further, as shown in FIG. 3 (6), in the element transfer method of the present invention, a part of the element 55 on the first substrate 51 contacts the adhesive layer 54 of the second substrate 52, and in this state, In the case where one substrate is floated by fluid pressure, the first substrate 51 rotates around the point where the element 55 contacts the adhesive layer 54 as a fulcrum O, and the first substrate 51 is parallel to the second substrate 52. Become. Now, the inclination of the first substrate 51 with respect to the second substrate 52 when the element 55 contacts the adhesive layer 54 is θ, and the distance from the fulcrum O to the element 55 is r. Further, the bonding position (transfer position) of the element 55 when the first substrate 51 is levitated in a state where the first substrate 51 is parallel to the second substrate 52, and the first substrate 51 with respect to the second substrate 52. If the difference from the adhesion position (transfer position) when the first substrate 51 is levitated in a state where is inclined by θ is d, then d = r (1−cos θ), so θ is about 1 degree, for example. If d = 0.0001r, d = 0.001r even if θ is 3 degrees, for example, it can be considered that d≈0. Therefore, the transfer of the element 55 from the first substrate 51 to the second substrate 52 by the element transfer apparatus 1 can be performed at an accurate position.

  In the element transfer method of the present invention, the substrate described with reference to the schematic configuration diagram of FIG. 4 can be used as the first substrate 51.

  As shown in FIG. 4A, the first substrate 51 is a flat plate having excellent flatness on both surfaces and excellent parallelism on both surfaces. Further, as shown in FIG. 4B, a convex substrate in which the peripheral portion of the substrate is lower than the central portion of the substrate can be used. Details are as described above.

  Next, a modified example related to the method for supporting the first substrate 51 in the element transfer method of the present invention will be described with reference to the schematic configuration diagram of FIG.

  As shown in FIG. 5 (1), the guide ring 57 fixed to the first substrate support portion 11 has a surface around the first substrate 51 at a position lower than the surface of the first substrate 51. In addition, the adhesive layer 53 formed on the first substrate 51 may be configured to extend and adhere to the surface of the guide ring 57. Further, the guide ring 57 is fixed to the first substrate support 11 by, for example, vacuum suction using the suction holes 16 provided in the first substrate support 11.

  By using the guide ring 57 and the adhesive layer 53 configured as described above, when the gas is blown to the first substrate 51 side from the hole 14 formed in the first substrate support portion 11, the guide ring 57 and the guide ring 57 are formed. The adhesive layer 53 between the top is stretched. In other words, the adhesive layer 53 can prevent the first substrate 51 from rising rapidly. This is because, as described above, the adhesive layer 53 is formed of a resin coating film, a resin film or the like, and thus has elasticity. In this way, it is possible to avoid the first substrate 51 from colliding with a second substrate (not shown) disposed above the first substrate 51. Further, since the surface of the guide ring 57 is formed at a position lower than the surface of the first substrate 51, the guide ring 57 is moved to the second substrate when the first substrate support portion 11 is raised to the second substrate side. Contact with the side can be prevented. By these, damage on the second substrate side can be prevented and the yield can be improved.

  As shown in FIG. 5 (2), the surface is located around the first substrate 51 at a position lower than the surface of the first substrate 51, and is fixed to the first substrate support portion 11 through the adhesive layer 58. The adhesive layer 58 adheres to the back surface side of the first substrate 51 and the back surface of the guide ring 57 (surface on the first substrate support part 11 side). For example, one adhesive layer The structure formed by can be used. Note that the back surface of the adhesive layer 58 (the surface opposite to the first substrate 51) does not have adhesiveness. Further, an adhesive layer 53 for adhering an element (not shown) is formed on the first substrate 51. Further, the guide ring 57 is fixed to the first substrate support 11 by, for example, vacuum-adsorbing the adhesive layer 58 adhered to the back side of the guide ring 57 through the suction holes 16 provided in the first substrate support 11. Let

  By using the guide ring 57 and the adhesive layer 58 configured as described above, when the gas is blown to the first substrate 51 side from the hole 14 formed in the first substrate support portion 11, the first substrate 51 is caused to adhere to the adhesive layer 58. A sudden rise can be prevented. This is because the adhesive layer 58 between the part adhered to the first substrate 51 and the part adhered to the guide ring 57 is stretched. Thereby, it is possible to avoid the first substrate 51 from colliding with the second substrate 52. Further, since the surface of the guide ring 57 is formed at a position lower than the surface of the first substrate 51, even when the first substrate support portion 11 is raised to the second substrate 52 side, even if the second substrate 52 is moved. In contrast, even if the first substrate support portion 11 is inclined, the guide ring 57 can be prevented from coming into contact with the second substrate 52 side. By these, damage on the second substrate 52 side can be prevented and the yield can be improved.

  As shown in FIG. 5 (3), the surface is positioned around the first substrate 51 at a position lower than the surface of the first substrate 51, and is fixed to the first substrate support portion 11 via the adhesive layer 53. It is possible to use a guide ring 57 that is provided with the element 55 to be bonded and the adhesive layer 53 formed on the first substrate 51 is extended and bonded to the back surface of the guide ring 57. The adhesive layer 53 is formed, for example, as a single layer from the surface of the first substrate 51 to the back surface of the guide ring 57. Further, the guide ring 57 is fixed to the first substrate support portion 11 by, for example, vacuum adsorbing the adhesive layer 53 side through the suction holes 16 provided in the first substrate support portion 11.

  By using the guide ring 57 and the adhesive layer 53 configured as described above, when the gas is blown to the first substrate 51 side from the hole 14 formed in the first substrate support portion 11, the guide ring 57 and the guide ring 57 are formed. The adhesive layer 53 between the bottom is stretched. The adhesive layer 53 can prevent the first substrate 51 from rising rapidly. This is because, as described above, the adhesive layer 53 is formed of a resin coating film, a resin film or the like, and thus has elasticity. In this way, it is possible to avoid the first substrate 51 from colliding with the second substrate 52. Further, since the surface of the guide ring 57 is formed at a position lower than the surface of the first substrate 51, the guide ring 57 is second when the first substrate support portion 11 is raised to the second substrate 52 side. Contact with the substrate 52 side can be prevented. By these, damage on the second substrate 52 side can be prevented and the yield can be improved.

  The element transfer method can be repeated. Next, a method of repeatedly performing the element transfer method will be described with reference to the flowcharts of FIGS.

  As shown in FIG. 9, after performing the “element approach / contact process” S1, the “element bonding process step” S2, and the “substrate separation process” S3 in order, the “first substrate replacement process” S4 (S41). )I do. In this step, the first substrate 51 used for element transfer is replaced with a first substrate 51 to which a new element 55 is bonded, and the “element approach / contact process” S1, the “element bonding process” S2, and the “ The substrate separation step “S3” is performed in order, and a new element 55 (552) is bonded to a region different from the bonding region of the element 55 (551) previously bonded to the second adhesive layer 54 of the second substrate 52.

  Further, by repeatedly performing the “first substrate replacement step” S4 (S41) and the “element approach / contact step” S1, the “element bonding step” S2, and the “substrate separation step” S3, the second substrate 52 is obtained. The element 55 can be transferred over a wide range.

  Further, as shown in FIG. 10, after performing the “element approach / contact process” S1, the “element bonding process” S2, and the “substrate separation process” S3 in this order, the “first substrate replacement process” S4 ( S402) is performed. In this step, the first substrate 51 is replaced with a new element 55 (552) bonded to a position different from the position of the element bonded to the first substrate 51 previously used for element transfer. Then, using the new first substrate 51, the “element approach / contact process” S1, the “element bonding process” S2, and the “substrate separation process” S3 are performed in order. As a result, in the adhesion region of the element 55 (551) that has been first adhered to the second adhesive layer 54 of the second substrate 52, a new element 55 (in a position different from the adhesion position of the element 55 (551) that has been adhered first). 552) can be glued. That is, different types of elements can be transferred to a predetermined area.

  Further, by repeatedly performing the “first substrate replacement step” S4 (S42) and the “element approach / contact step” S1, the “element bonding step” S2, and the “substrate separation step” S3, the second substrate 52 is obtained. A plurality of types of elements can be transferred to the predetermined region.

  Next, the manufacturing method of the display device of the present invention will be described with reference to the manufacturing process diagrams of FIGS. 11 and 12, a method for manufacturing a display device in which a plurality of light emitting elements are arranged and mounted by bonding a light emitting element bonded to a first substrate to an adhesive layer formed on a second substrate will be described. Specifically, a method for manufacturing a display device on which the red light emitting element 55R, the green light emitting element 55G, and the blue light emitting element 55B are mounted will be described. For example, as such a display device, for example, a large number (for example, 10 to several hundreds) of minute LEDs (Light Emitting Diodes) having a diameter or a rectangular side length of about 5 μm to 100 μm and a height of about 5 μm to 100 μm. There are LED display devices that are arranged.

  As shown in FIG. 11A, the first substrate 51 in which the red light emitting element 55R is bonded to a predetermined position of the first adhesive layer 53 is used as the first substrate 51. Next, as shown in FIG. 11B, the second adhesive layer in which the red light emitting element 55R bonded to the first substrate 51 side is formed on the second substrate 52 by the element transfer method of the present invention described above. Adhesive transfer to 54. Then, as shown in FIG. 11 (3), as described with reference to FIG. 9, the red light emitting element 55R is bonded and transferred to the entire predetermined region of the second substrate 52.

  Next, as shown in FIG. 11 (4), the first substrate 51 in which the green light emitting element 55 </ b> G is bonded to a predetermined position of the first adhesive layer 53 is used as the first substrate 51. Next, as shown in FIG. 11 (5), the second adhesive layer in which the green light emitting element 55G bonded to the first substrate 51 side is formed on the second substrate 52 by the element transfer method of the present invention described above. Adhesive transfer to 54. At that time, as shown in FIG. 11 (5), a new green light emitting element 55G is bonded to a predetermined position different from the bonding position of the previously bonded red light emitting element 55R by the method described with reference to FIG. Then, as shown in FIG. 11 (6), the green light emitting element 55G is bonded and transferred to the entire predetermined region of the second substrate 52 by the method described with reference to FIG.

  Next, as shown in FIG. 12A, the first substrate 51 in which the blue light emitting element 55 </ b> B is bonded to a predetermined position of the first adhesive layer 53 is used as the first substrate 51. Next, as shown in FIG. 12B, the second adhesive layer in which the blue light emitting element 55B bonded to the first substrate 51 side is formed on the second substrate 52 by the element transfer method of the present invention described above. Adhesive transfer to 54. At that time, as shown in FIG. 12 (2), a new blue light emitting element is formed at a predetermined position different from the bonding position of the red light emitting element 55R and the green light emitting element 55G previously bonded by the method described with reference to FIG. Adhere 55B. Then, as shown in FIG. 12 (3), the blue light emitting element 55B is bonded and transferred to the entire predetermined region of the second substrate 52 by the method described with reference to FIG.

  In this manner, each color light emitting element (red light emitting element 55R, green light emitting element 55G, and blue light emitting element 55B) used in the display device could be transferred from the first substrate 51 to the second substrate 52.

  In the manufacturing method of the display device of the present invention, the first substrate 51 and the second substrate 52 are held in parallel when the element 55 on the first substrate 51 side is transferred to the second substrate 52 side. There is no contact between them. Therefore, there is an advantage that the element 55 on the first substrate 51 side can be pressed against the second substrate 52 side without damaging the second substrate 52. Therefore, it is possible to improve the yield when manufacturing the display device using the transfer technology of the element 55.

  In the above description, an example of a method for manufacturing a display device using light emitting elements of three primary colors of red, green, and blue has been described. However, light emitting elements of other colors can be used, and four colors can be used. The present invention can also be applied to a method for manufacturing a display device using the above light emitting element.

  In the manufacturing method of the display device, it becomes easy to embed a fine LED into a panel. Further, as described with reference to FIGS. 11 and 12 above, light emitting elements (for example, LEDs) of the respective colors are selectively transferred onto the first substrates 51, and are multicolored (for example, three colors) and have a large screen. Tiling can be performed in this step.

It is the schematic block diagram and the principal part expanded sectional view which showed an example of one Embodiment which concerns on the element transfer apparatus of this invention. It is a schematic structure sectional view showing an example of embedding nature of an element in various states of a substrate. It is a schematic structure sectional view showing an example of embedding nature of an element in various states of a substrate. It is the schematic block diagram which showed the modification of the shape of a 1st board | substrate. It is the schematic block diagram which showed an example of the modification of the support relationship of a 1st board | substrate and a 1st board | substrate support part. It is the schematic block diagram which showed an example of the element transfer apparatus carrying the tilt part which carries out the parallel alignment of the 1st board | substrate and the 2nd board | substrate mechanically. FIG. 5 is a plan layout diagram showing an example of an element transfer device on which a tilt portion that mechanically aligns a first substrate and a second substrate is mounted. It is manufacturing process sectional drawing which showed an example of embodiment which concerns on the element transfer method of this invention. It is the flowchart and schematic structure sectional drawing which showed an example of Embodiment which concerns on the element transfer method of this invention. It is the flowchart figure and schematic structure sectional drawing which showed an example of one Embodiment which concerns on the element transfer method of this invention. It is the manufacturing process figure which showed an example of embodiment which concerns on the manufacturing method of the display apparatus of this invention. It is the manufacturing process figure which showed an example of embodiment which concerns on the manufacturing method of the display apparatus of this invention. FIG. 6 is a schematic cross-sectional view showing a problem of element embedding according to a conventional element transfer method. FIG. 6 is a schematic cross-sectional view showing a problem of element embedding according to a conventional element transfer method.

Explanation of symbols

  DESCRIPTION OF SYMBOLS 1 ... Element transfer apparatus, 11 ... 1st board | substrate support part, 12 ... 2nd board | substrate support part, 41 ... Board | substrate conveyance part, 51 ... 1st board | substrate, 52 ... 2nd board | substrate

Claims (12)

A plurality of elements which are bonded to the first substrate is attached to a second substrate, a plurality of elements which are bonded to the second substrate side an element transferring device for separating the first substrate,
A first substrate support section that places the first substrate and presses the back surface side of the first substrate with fluid pressure to float the first substrate and press it against the second substrate side;
A second substrate supporting section for supporting the second substrate disposed so as to face the first substrate,
And a substrate transfer unit for transferring the first substrate placed on the first substrate supporting portion at a predetermined position immediately below the second substrate supported by the second substrate supporting unit, the element transfer apparatus. Senses that a plurality of elements bonded to the first substrate are in contact with the second substrate side, and includes a sensor unit provided between the first substrate support unit and the substrate transport unit. , element transfer apparatus according to claim 1. The element transfer apparatus according to claim 1 , wherein the first substrate is a flat plate. The element transfer apparatus according to claim 1 , wherein the first substrate is a convex substrate having a substrate peripheral portion lower than a substrate central portion. The surface is located at a position lower than the surface of the first substrate around the first substrate, and has a guide ring fixed to the first substrate support part,
An adhesive layer for bonding a plurality of elements formed on the first substrate is extended and bonded to the surface of the guide ring.
Element transfer device 請 Motomeko 1 wherein. The surface is located at a position lower than the surface of the first substrate around the first substrate, and has a guide ring fixed to the first substrate support part,
The guide ring and the first substrate support portion are fixed to each other by an adhesive layer attached to the first substrate support portion side of the first substrate.
Element transfer device 請 Motomeko 1 wherein. The surface is located at a position lower than the surface of the first substrate around the first substrate, and has a guide ring fixed to the first substrate support part,
An adhesive layer for bonding a plurality of elements formed on the first substrate is extended to the back surface of the guide ring to bond the guide ring and the first substrate support part.
Element transfer device 請 Motomeko 1 wherein. An element transfer method in which a plurality of elements on a first substrate are bonded to an adhesive layer formed on a second substrate, and the first substrate is separated from the plurality of elements bonded to the second substrate side,
An element approach / contact step for bringing a plurality of elements on the first substrate placed on the first substrate support portion into a state of approaching the second substrate or contacting a part of the adhesive layer;
An element bonding step by floating the first substrate by applying pressing the second substrate side, thereby bonding the plurality of elements in the adhesive layer by pressure pressing in the first substrate rear surface side flow body pressure,
It said plurality of said first substrate in a state adhered to the adhesive layer element comprising a substrate spaced steps away from the plurality of elements, the element transfer method. Around the first substrate, a guide ring whose surface is located at a position lower than the surface of the first substrate is fixed to the first substrate support part,
An adhesive layer for bonding a plurality of elements formed on the first substrate is extended to the guide ring surface to bond the adhesive layer to the guide ring surface.
The element transfer method according to claim 8. A guide ring having a surface positioned at a position lower than the surface of the first substrate is provided around the first substrate,
The guide ring is fixed to the first substrate support portion by an adhesive layer attached to the first substrate support portion side of the first substrate.
The element transfer method according to claim 8. A guide ring having a surface positioned at a position lower than the surface of the first substrate is provided around the first substrate,
An adhesive layer for bonding a plurality of elements formed on the first substrate is extended to the back surface of the guide ring, and the guide ring and the first substrate support portion are fixed by the adhesive layer.
The element transfer method according to claim 8. Using an element transfer method in which a plurality of light emitting elements on a first substrate are bonded to an adhesive layer formed on a second substrate, and the first substrate is separated from the plurality of light emitting elements bonded to the second substrate side. , A method for manufacturing a display device in which a plurality of light emitting elements are arranged and mounted,
The element transfer method includes:
An element approaching / contacting step for bringing the plurality of light emitting elements on the first substrate into contact with the second substrate or in contact with a part of the adhesive layer;
An element bonding step by floating the first substrate by applying pressing the second substrate side, thereby adhering the plurality of light emitting elements in the adhesive layer by pressure pressing in the first substrate rear surface side flow body pressure,
It said plurality of said first substrate in a state adhered to the adhesive layer emitting element and a substrate spaced steps away from the plurality of light emitting elements, a method of manufacturing a display device.

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