JP4748978B2 - 圧電/電歪素子及びその製造方法 - Google Patents
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- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 description 1
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- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 1
- 229910052581 Si3N4 Inorganic materials 0.000 description 1
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 1
- 229910002367 SrTiO Inorganic materials 0.000 description 1
- 229910010413 TiO 2 Inorganic materials 0.000 description 1
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 description 1
- KWVFUTDPKIKVQW-UHFFFAOYSA-N [Sr].[Na] Chemical compound [Sr].[Na] KWVFUTDPKIKVQW-UHFFFAOYSA-N 0.000 description 1
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- DSAJWYNOEDNPEQ-UHFFFAOYSA-N barium atom Chemical compound [Ba] DSAJWYNOEDNPEQ-UHFFFAOYSA-N 0.000 description 1
- 229910002113 barium titanate Inorganic materials 0.000 description 1
- JRPBQTZRNDNNOP-UHFFFAOYSA-N barium titanate Chemical compound [Ba+2].[Ba+2].[O-][Ti]([O-])([O-])[O-] JRPBQTZRNDNNOP-UHFFFAOYSA-N 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
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- 229910052797 bismuth Inorganic materials 0.000 description 1
- JCXGWMGPZLAOME-UHFFFAOYSA-N bismuth atom Chemical compound [Bi] JCXGWMGPZLAOME-UHFFFAOYSA-N 0.000 description 1
- LGRDPUAPARTXMG-UHFFFAOYSA-N bismuth nickel Chemical compound [Ni].[Bi] LGRDPUAPARTXMG-UHFFFAOYSA-N 0.000 description 1
- 229910002115 bismuth titanate Inorganic materials 0.000 description 1
- 239000010974 bronze Substances 0.000 description 1
- 229910052793 cadmium Inorganic materials 0.000 description 1
- BDOSMKKIYDKNTQ-UHFFFAOYSA-N cadmium atom Chemical compound [Cd] BDOSMKKIYDKNTQ-UHFFFAOYSA-N 0.000 description 1
- 150000004649 carbonic acid derivatives Chemical class 0.000 description 1
- 229910010293 ceramic material Inorganic materials 0.000 description 1
- ZMIGMASIKSOYAM-UHFFFAOYSA-N cerium Chemical compound [Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce] ZMIGMASIKSOYAM-UHFFFAOYSA-N 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
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- 229910017052 cobalt Inorganic materials 0.000 description 1
- 239000010941 cobalt Substances 0.000 description 1
- GUTLYIVDDKVIGB-UHFFFAOYSA-N cobalt atom Chemical compound [Co] GUTLYIVDDKVIGB-UHFFFAOYSA-N 0.000 description 1
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- 238000007796 conventional method Methods 0.000 description 1
- KUNSUQLRTQLHQQ-UHFFFAOYSA-N copper tin Chemical compound [Cu].[Sn] KUNSUQLRTQLHQQ-UHFFFAOYSA-N 0.000 description 1
- PMHQVHHXPFUNSP-UHFFFAOYSA-M copper(1+);methylsulfanylmethane;bromide Chemical compound Br[Cu].CSC PMHQVHHXPFUNSP-UHFFFAOYSA-M 0.000 description 1
- 238000005336 cracking Methods 0.000 description 1
- 238000000280 densification Methods 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- NKZSPGSOXYXWQA-UHFFFAOYSA-N dioxido(oxo)titanium;lead(2+) Chemical compound [Pb+2].[O-][Ti]([O-])=O NKZSPGSOXYXWQA-UHFFFAOYSA-N 0.000 description 1
- 238000001035 drying Methods 0.000 description 1
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- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 150000004679 hydroxides Chemical class 0.000 description 1
- 229910052741 iridium Inorganic materials 0.000 description 1
- GKOZUEZYRPOHIO-UHFFFAOYSA-N iridium atom Chemical compound [Ir] GKOZUEZYRPOHIO-UHFFFAOYSA-N 0.000 description 1
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- 238000005304 joining Methods 0.000 description 1
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- 229910052746 lanthanum Inorganic materials 0.000 description 1
- FZLIPJUXYLNCLC-UHFFFAOYSA-N lanthanum atom Chemical compound [La] FZLIPJUXYLNCLC-UHFFFAOYSA-N 0.000 description 1
- HEPLMSKRHVKCAQ-UHFFFAOYSA-N lead nickel Chemical compound [Ni].[Pb] HEPLMSKRHVKCAQ-UHFFFAOYSA-N 0.000 description 1
- JQJCSZOEVBFDKO-UHFFFAOYSA-N lead zinc Chemical compound [Zn].[Pb] JQJCSZOEVBFDKO-UHFFFAOYSA-N 0.000 description 1
- HFGPZNIAWCZYJU-UHFFFAOYSA-N lead zirconate titanate Chemical compound [O-2].[O-2].[O-2].[O-2].[O-2].[Ti+4].[Zr+4].[Pb+2] HFGPZNIAWCZYJU-UHFFFAOYSA-N 0.000 description 1
- CPLXHLVBOLITMK-UHFFFAOYSA-N magnesium oxide Inorganic materials [Mg]=O CPLXHLVBOLITMK-UHFFFAOYSA-N 0.000 description 1
- 239000000395 magnesium oxide Substances 0.000 description 1
- AXZKOIWUVFPNLO-UHFFFAOYSA-N magnesium;oxygen(2-) Chemical compound [O-2].[Mg+2] AXZKOIWUVFPNLO-UHFFFAOYSA-N 0.000 description 1
- 229910052748 manganese Inorganic materials 0.000 description 1
- 239000011572 manganese Substances 0.000 description 1
- WPBNNNQJVZRUHP-UHFFFAOYSA-L manganese(2+);methyl n-[[2-(methoxycarbonylcarbamothioylamino)phenyl]carbamothioyl]carbamate;n-[2-(sulfidocarbothioylamino)ethyl]carbamodithioate Chemical compound [Mn+2].[S-]C(=S)NCCNC([S-])=S.COC(=O)NC(=S)NC1=CC=CC=C1NC(=S)NC(=O)OC WPBNNNQJVZRUHP-UHFFFAOYSA-L 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 229910052750 molybdenum Inorganic materials 0.000 description 1
- 239000011733 molybdenum Substances 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- GUCVJGMIXFAOAE-UHFFFAOYSA-N niobium atom Chemical compound [Nb] GUCVJGMIXFAOAE-UHFFFAOYSA-N 0.000 description 1
- 150000002823 nitrates Chemical class 0.000 description 1
- 150000003891 oxalate salts Chemical class 0.000 description 1
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 1
- ZBSCCQXBYNSKPV-UHFFFAOYSA-N oxolead;oxomagnesium;2,4,5-trioxa-1$l^{5},3$l^{5}-diniobabicyclo[1.1.1]pentane 1,3-dioxide Chemical compound [Mg]=O.[Pb]=O.[Pb]=O.[Pb]=O.O1[Nb]2(=O)O[Nb]1(=O)O2 ZBSCCQXBYNSKPV-UHFFFAOYSA-N 0.000 description 1
- 229910052763 palladium Inorganic materials 0.000 description 1
- 238000005240 physical vapour deposition Methods 0.000 description 1
- 229910052700 potassium Inorganic materials 0.000 description 1
- 239000000843 powder Substances 0.000 description 1
- 230000009257 reactivity Effects 0.000 description 1
- 229910052703 rhodium Inorganic materials 0.000 description 1
- 239000010948 rhodium Substances 0.000 description 1
- MHOVAHRLVXNVSD-UHFFFAOYSA-N rhodium atom Chemical compound [Rh] MHOVAHRLVXNVSD-UHFFFAOYSA-N 0.000 description 1
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 1
- 239000004332 silver Substances 0.000 description 1
- 239000002356 single layer Substances 0.000 description 1
- 239000002002 slurry Substances 0.000 description 1
- 229910052708 sodium Inorganic materials 0.000 description 1
- UYLYBEXRJGPQSH-UHFFFAOYSA-N sodium;oxido(dioxo)niobium Chemical compound [Na+].[O-][Nb](=O)=O UYLYBEXRJGPQSH-UHFFFAOYSA-N 0.000 description 1
- 238000005507 spraying Methods 0.000 description 1
- 229940071182 stannate Drugs 0.000 description 1
- 229910052712 strontium Inorganic materials 0.000 description 1
- CIOAGBVUUVVLOB-UHFFFAOYSA-N strontium atom Chemical compound [Sr] CIOAGBVUUVVLOB-UHFFFAOYSA-N 0.000 description 1
- 229910052715 tantalum Inorganic materials 0.000 description 1
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
- 239000011800 void material Substances 0.000 description 1
- 229910052727 yttrium Inorganic materials 0.000 description 1
- VWQVUPCCIRVNHF-UHFFFAOYSA-N yttrium atom Chemical compound [Y] VWQVUPCCIRVNHF-UHFFFAOYSA-N 0.000 description 1
- 229910052725 zinc Inorganic materials 0.000 description 1
- 239000011701 zinc Substances 0.000 description 1
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N30/00—Piezoelectric or electrostrictive devices
- H10N30/01—Manufacture or treatment
- H10N30/07—Forming of piezoelectric or electrostrictive parts or bodies on an electrical element or another base
- H10N30/074—Forming of piezoelectric or electrostrictive parts or bodies on an electrical element or another base by depositing piezoelectric or electrostrictive layers, e.g. aerosol or screen printing
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N30/00—Piezoelectric or electrostrictive devices
- H10N30/01—Manufacture or treatment
- H10N30/09—Forming piezoelectric or electrostrictive materials
- H10N30/093—Forming inorganic materials
- H10N30/097—Forming inorganic materials by sintering
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N30/00—Piezoelectric or electrostrictive devices
- H10N30/20—Piezoelectric or electrostrictive devices with electrical input and mechanical output, e.g. functioning as actuators or vibrators
- H10N30/204—Piezoelectric or electrostrictive devices with electrical input and mechanical output, e.g. functioning as actuators or vibrators using bending displacement, e.g. unimorph, bimorph or multimorph cantilever or membrane benders
- H10N30/2047—Membrane type
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/42—Piezoelectric device making
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- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Chemical & Material Sciences (AREA)
- Inorganic Chemistry (AREA)
- General Electrical Machinery Utilizing Piezoelectricity, Electrostriction Or Magnetostriction (AREA)
Description
図1は、本実施形態に係る圧電/電歪素子10の概略構成を示す側断面図である。
続いて、上述のような構成の圧電/電歪素子10の製造方法について、図2及び図3を用いて説明する。
s=(Tb−0.3Tm)/DT
の値を計算する。
DT≒kσ/{E(αp−αb)}+β
[k、βは定数、σは圧電/電歪材料の引張強度、Eは圧電/電歪材料のヤング率、αpは圧電/電歪材料の線膨張係数、αbは基板11を構成する材料の線膨張係数。なお、βはkσ/{E(αp−αb)}よりも十分に小さい。]
続いて、上述のような構成の圧電/電歪素子10の製造方法の典型的な1つの具体例について説明する。本具体例においては、基板11として、Y2O3で安定化されたZrO2(線膨張係数:10〜11×10-6/K)が用いられ、中間電極層12として、白金電極(白金の融点Tm(Pt)=2042K(1769℃))が用いられ、圧電/電歪層13として、チタン酸ビスマスナトリウムとニオブ酸カリウムの固溶体(以下「BNT−KN」と称する。線膨張係数:13×10-6/K)が用いられているものとする。
以下、上述の実施形態の効果を確認するための実施例について説明する。この実施例は、図4に示されている圧電/電歪素子10”を用いて、上述の冷却工程の条件、及び圧電/電歪層13の分極処理における印加電圧(以下、「分極電圧」と称する。)を変えた場合の、当該圧電/電歪素子10”の圧電/電歪特性を評価したものである。
なお、本発明は、上述した実施形態や実施例に限定されるものではなく、本発明の本質的部分を変更しない範囲内において適宜変形することが可能である。以下に変形例を例示するが、この変形例とて下記のものに限定されるものではない。
Claims (5)
- 基板上に固着して形成された電極層と、その電極層上に固着して形成された圧電/電歪層と、からなる圧電/電歪素子の製造方法において、
前記基板上に前記電極層を形成するために、当該基板上に金属を含む第1の層を形成する第1層形成工程と、
前記第1層形成工程により形成された前記第1の層の上に圧電/電歪材料を含む第2の層を形成する第2層形成工程と、
前記第1及び第2の層が形成された前記基板を焼成温度に加熱して、少なくとも前記第2層形成工程により形成された前記第2の層を焼成することで、前記基板よりも熱膨張率が大きな前記圧電/電歪素子を形成する焼成工程と、
前記焼成工程の後に前記圧電/電歪素子を冷却する冷却工程と、
を含み、
前記冷却工程の途中に、温度を前記焼成温度よりも低い一定温度に保持する温度保持工程を含む、
圧電/電歪素子の製造方法。 - 請求項1に記載の圧電/電歪素子の製造方法であって、
前記冷却工程は、前記焼成工程を経た前記圧電/電歪素子を自然冷却以上の降温速度で冷却する、
圧電/電歪素子の製造方法。 - 請求項1又は2に記載の圧電/電歪素子の製造方法であって、
前記一定温度は、前記電極層を構成する前記金属が高温クリープする温度域内の温度である、
圧電/電歪素子の製造方法。 - 請求項3に記載の圧電/電歪素子の製造方法であって、
前記一定温度は、前記電極層を構成する前記金属の融点Tm(K)の0.3倍以上の温度である、
圧電/電歪素子の製造方法。 - 基板と、その基板上に固着して形成された電極層と、その電極層上に固着して形成された圧電/電歪層と、からなる圧電/電歪素子において、
前記電極層は、高温クリープにより変形されている、
圧電/電歪素子。
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JP2004349378A JP4748978B2 (ja) | 2004-12-02 | 2004-12-02 | 圧電/電歪素子及びその製造方法 |
US11/273,828 US7441317B2 (en) | 2004-12-02 | 2005-11-15 | Piezoelectric/electrostrictive device and method for manufacturing the same |
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JP2006165007A JP2006165007A (ja) | 2006-06-22 |
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JP4748978B2 true JP4748978B2 (ja) | 2011-08-17 |
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Publication number | Priority date | Publication date | Assignee | Title |
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US7888842B2 (en) * | 2004-02-13 | 2011-02-15 | University Of Maine System Board Of Trustees | Ultra-thin film electrodes and protective layer for high temperature device applications |
DE602007013843D1 (de) * | 2006-08-14 | 2011-05-26 | Ngk Insulators Ltd | Verfahren zur Herstellung eines piezoelektrischen/elektrostriktiven Elements |
JP4800989B2 (ja) * | 2006-11-15 | 2011-10-26 | 日本碍子株式会社 | 圧電/電歪材料、圧電/電歪体、及び圧電/電歪素子 |
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WO2012026107A1 (ja) | 2010-08-27 | 2012-03-01 | パナソニック株式会社 | インクジェットヘッド、インクジェットヘッドを用いて画像を形成する方法、角速度センサ、角速度センサを用いて角速度を測定する方法、圧電発電素子ならびに圧電発電素子を用いた発電方法 |
JP5816185B2 (ja) * | 2011-03-25 | 2015-11-18 | 日本碍子株式会社 | 積層体並びにそれらの製造方法 |
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DE102014211465A1 (de) * | 2013-08-07 | 2015-02-12 | Pi Ceramic Gmbh Keramische Technologien Und Bauelemente | Bleifreier piezokeramischer Werkstoff auf Bismut-Natrium-Titanat (BNT)-Basis |
US10056539B2 (en) | 2014-04-30 | 2018-08-21 | Oregon State University | Electrocaloric device |
CN105036736B (zh) * | 2015-08-19 | 2017-03-08 | 湖北大学 | 一种钛酸铋钠基无铅电致伸缩陶瓷材料及其制备方法 |
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FR2557598B1 (fr) * | 1983-12-29 | 1986-11-28 | Armines | Alliage monocristallin a matrice a base de nickel |
JPH07108102B2 (ja) * | 1990-05-01 | 1995-11-15 | 日本碍子株式会社 | 圧電/電歪膜型アクチュエータの製造方法 |
JP3307400B2 (ja) * | 1996-09-12 | 2002-07-24 | シチズン時計株式会社 | 強誘電体素子及びその製法ならびにインクジェットヘッド |
US6337805B1 (en) * | 1999-08-30 | 2002-01-08 | Micron Technology, Inc. | Discrete devices including EAPROM transistor and NVRAM memory cell with edge defined ferroelectric capacitance, methods for operating same, and apparatuses including same |
JP3921918B2 (ja) | 2000-03-31 | 2007-05-30 | 日本碍子株式会社 | 圧電/電歪素子の製造方法 |
JP2001298135A (ja) * | 2000-04-14 | 2001-10-26 | Matsushita Electric Ind Co Ltd | 半導体装置およびその製造方法 |
JP2001354497A (ja) * | 2000-06-07 | 2001-12-25 | Matsushita Electric Ind Co Ltd | 強誘電体膜の製造方法 |
US6793843B2 (en) * | 2000-11-21 | 2004-09-21 | Tdk Corporation | Piezoelectric ceramic |
DE60129533T2 (de) * | 2000-12-25 | 2007-11-22 | Tdk Corp. | Dielektrische porzellan zusammensetzung und elektronische teile |
US7019438B2 (en) * | 2002-06-21 | 2006-03-28 | Ngk Insulators, Ltd. | Piezoelectric/electrostrictive film device |
JP2004291584A (ja) * | 2003-03-28 | 2004-10-21 | Sharp Corp | インクジェットヘッド |
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