JP4738134B2 - 分析装置 - Google Patents
分析装置 Download PDFInfo
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- JP4738134B2 JP4738134B2 JP2005311436A JP2005311436A JP4738134B2 JP 4738134 B2 JP4738134 B2 JP 4738134B2 JP 2005311436 A JP2005311436 A JP 2005311436A JP 2005311436 A JP2005311436 A JP 2005311436A JP 4738134 B2 JP4738134 B2 JP 4738134B2
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- 238000004458 analytical method Methods 0.000 title claims description 74
- 239000013307 optical fiber Substances 0.000 claims description 103
- 230000005540 biological transmission Effects 0.000 claims description 84
- 230000003287 optical effect Effects 0.000 claims description 60
- 239000012491 analyte Substances 0.000 claims description 19
- 238000007493 shaping process Methods 0.000 claims description 11
- 230000001678 irradiating effect Effects 0.000 claims description 10
- 229910052744 lithium Inorganic materials 0.000 description 15
- WHXSMMKQMYFTQS-UHFFFAOYSA-N Lithium Chemical compound [Li] WHXSMMKQMYFTQS-UHFFFAOYSA-N 0.000 description 14
- 230000035945 sensitivity Effects 0.000 description 9
- 230000005281 excited state Effects 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
- 239000003792 electrolyte Substances 0.000 description 2
- 238000007689 inspection Methods 0.000 description 2
- 230000007704 transition Effects 0.000 description 2
- 238000002834 transmittance Methods 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 239000008151 electrolyte solution Substances 0.000 description 1
- 238000000921 elemental analysis Methods 0.000 description 1
- 239000002223 garnet Substances 0.000 description 1
- 150000002641 lithium Chemical class 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 230000035699 permeability Effects 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 229910052727 yttrium Inorganic materials 0.000 description 1
- VWQVUPCCIRVNHF-UHFFFAOYSA-N yttrium atom Chemical compound [Y] VWQVUPCCIRVNHF-UHFFFAOYSA-N 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
- G01N21/718—Laser microanalysis, i.e. with formation of sample plasma
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
- G01J3/0208—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using focussing or collimating elements, e.g. lenses or mirrors; performing aberration correction
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
- G01J3/0218—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using optical fibers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
- G01J3/024—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using means for illuminating a slit efficiently (e.g. entrance slit of a spectrometer or entrance face of fiber)
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/44—Raman spectrometry; Scattering spectrometry ; Fluorescence spectrometry
- G01J3/4406—Fluorescence spectrometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/645—Specially adapted constructive features of fluorimeters
- G01N21/6456—Spatial resolved fluorescence measurements; Imaging
- G01N21/6458—Fluorescence microscopy
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- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Engineering & Computer Science (AREA)
- Optics & Photonics (AREA)
- Plasma & Fusion (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Description
12 分析対象物
13 光学系ユニット
16 レーザ光伝送用光ファイバ
17 蛍光伝送用光ファイバ
18 分析手段
26 蛍光導光筒部
27 分波手段としての分波反射ミラー
29 集光照射手段
30 集光手段としての集光レンズ群
35 蛍光集光レンズ
41 整形手段
42 円錐レンズ
46,47 トロイダルレンズ
51〜54 レンズ
57 反射手段としての反射ミラー
F 蛍光
L レーザ光としてのパルスレーザ光
Claims (7)
- レーザ光を伝送するレーザ光伝送用光ファイバと、
蛍光を伝送する蛍光伝送用光ファイバと、
前記レーザ光伝送用光ファイバで伝送するレーザ光を透過するとともにこのレーザ光の分析対象物への照射にて放出される蛍光を反射する分波手段、この分波手段を透過したレーザ光を集光して前記分析対象物に照射させるとともにこの分析対象物からの前記蛍光を集光して前記分波手段に導光させる集光照射手段、前記分波手段で反射した蛍光を先端へ向けて導光するとともに先端には前記蛍光伝送用光ファイバが接続されている蛍光導光筒部、およびこの蛍光導光筒部へと導光された蛍光を集光して前記蛍光伝送用光ファイバに入射させる凹レンズである蛍光集光レンズを有する光学系ユニットと、
前記蛍光伝送用光ファイバで伝送する蛍光に基づいて前記分析対象物に含まれている元素を定量する分析手段と
を具備していることを特徴とする分析装置。 - レーザ光を伝送するレーザ光伝送用光ファイバと、
蛍光を伝送する蛍光伝送用光ファイバと、
前記レーザ光伝送用光ファイバで伝送するレーザ光を透過するとともにこのレーザ光の分析対象物への照射にて放出される蛍光を反射する分波手段、この分波手段を透過したレーザ光を集光して前記分析対象物に照射させるとともに前記分析対象物からの前記蛍光を集光して前記分波手段に導光させる集光照射手段、前記分波手段で反射した蛍光をその反射方向に対して異なる方向に向けて反射させる反射手段、この反射手段で反射した蛍光を先端へ向けて導光するとともに先端には前記蛍光伝送用光ファイバが接続されている蛍光導光筒部、およびこの蛍光導光筒部へと導光された蛍光を集光して前記蛍光伝送用光ファイバに入射させる凹レンズである蛍光集光レンズを有する光学系ユニットと、
前記蛍光伝送用光ファイバで伝送する蛍光に基づいて前記分析対象物に含まれている元素を定量する分析手段と
を具備していることを特徴とする分析装置。 - 集光照射手段は、レーザ光伝送用光ファイバで伝送されたレーザ光を円環状に整形する円錐レンズを有し、円環状に整形したレーザ光を分析対象物に照射させる
ことを特徴とする請求項1または2記載の分析装置。 - 集光照射手段は、レーザ光伝送用光ファイバで伝送されたレーザ光を長手方向の長さが1mm以上5mm以下の線状に整形する2つのトロイダルレンズを有し、線状に整形したレーザ光を分析対象物に照射させる
ことを特徴とする請求項1または2記載の分析装置。 - 集光照射手段は、レーザ光伝送用光ファイバで伝送されたレーザ光を直径が1mm以上2.5mm以下の円形状に整形するレンズを有し、円形状に整形したレーザ光を分析対象物に照射させる
ことを特徴とする請求項1または2記載の分析装置。 - 集光照射手段は、複数の集光レンズを備え、これら複数の集光レンズの少なくとも一部に蛍光を透過させて分波手段に導光する
ことを特徴とした請求項1または2記載の分析装置。 - 集光照射手段は、レーザ光を円環状に整形する整形手段と、この整形手段にて円環状に整形されたレーザ光を集光させる集光手段とを備え、
分波手段は、前記整形手段と前記集光手段との間に設けられている
ことを特徴とする請求項1または2記載の分析装置。
Priority Applications (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005311436A JP4738134B2 (ja) | 2005-10-26 | 2005-10-26 | 分析装置 |
KR1020097014859A KR100933101B1 (ko) | 2005-10-26 | 2006-10-25 | 분석 장치 |
EP06822738A EP1963827A4 (en) | 2005-10-26 | 2006-10-25 | ANALYSIS DEVICE |
PCT/JP2006/321809 WO2007049795A1 (en) | 2005-10-26 | 2006-10-25 | Analysis apparatus |
KR1020077011696A KR100928109B1 (ko) | 2005-10-26 | 2006-10-25 | 분석 장치 |
US11/819,254 US7477379B2 (en) | 2005-10-26 | 2007-06-26 | Analysis apparatus |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005311436A JP4738134B2 (ja) | 2005-10-26 | 2005-10-26 | 分析装置 |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2007121025A JP2007121025A (ja) | 2007-05-17 |
JP2007121025A5 JP2007121025A5 (ja) | 2008-03-13 |
JP4738134B2 true JP4738134B2 (ja) | 2011-08-03 |
Family
ID=37967900
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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JP2005311436A Expired - Fee Related JP4738134B2 (ja) | 2005-10-26 | 2005-10-26 | 分析装置 |
Country Status (5)
Country | Link |
---|---|
US (1) | US7477379B2 (ja) |
EP (1) | EP1963827A4 (ja) |
JP (1) | JP4738134B2 (ja) |
KR (2) | KR100933101B1 (ja) |
WO (1) | WO2007049795A1 (ja) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5391734B2 (ja) * | 2009-02-27 | 2014-01-15 | 一般財団法人雑賀技術研究所 | 品質測定装置 |
KR20160008673A (ko) | 2014-07-14 | 2016-01-25 | 서강대학교산학협력단 | 광섬유 전달 링크를 이용한 집광 장치 |
CN106066323A (zh) * | 2016-06-06 | 2016-11-02 | 中国科学技术大学 | 一种无色差浸入式熔融金属成分检测系统 |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58219437A (ja) * | 1982-06-15 | 1983-12-20 | Kawasaki Steel Corp | レ−ザ発光分光分析装置 |
JP2000028519A (ja) * | 1998-07-07 | 2000-01-28 | Olympus Optical Co Ltd | 照明光学系 |
JP2000310596A (ja) * | 1999-04-27 | 2000-11-07 | Toshiba Corp | 元素分析装置 |
JP2002529713A (ja) * | 1998-11-05 | 2002-09-10 | サイトメトリクス インコーポレイテッド | 高コントラストイメージングを提供するための方法および装置 |
JP2005140529A (ja) * | 2003-11-04 | 2005-06-02 | Toshiba Corp | 元素分析装置および元素分析方法 |
JP2005201762A (ja) * | 2004-01-15 | 2005-07-28 | Toshiba Corp | リチウム漏洩検出装置およびリチウム漏洩検出方法 |
JP2006275794A (ja) * | 2005-03-29 | 2006-10-12 | Toshiba Corp | 分析装置 |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0435803Y2 (ja) * | 1985-09-11 | 1992-08-25 | ||
US5112127A (en) * | 1989-11-28 | 1992-05-12 | Eic Laboratories, Inc. | Apparatus for measuring Raman spectra over optical fibers |
CA2373537A1 (en) * | 1999-05-12 | 2000-11-16 | Aclara Biosciences, Inc. | Multiplexed fluorescent detection in microfluidic devices |
JP3184969B2 (ja) * | 1999-05-25 | 2001-07-09 | 住友重機械工業株式会社 | レーザ溶接の溶接状態検出装置 |
RU2182328C2 (ru) * | 2000-02-17 | 2002-05-10 | Институт молекулярной биологии им. В.А. Энгельгардта РАН | Флуоресцентный микроскоп |
US6407395B1 (en) * | 2000-02-29 | 2002-06-18 | The University Of Chicago | Portable biochip scanner device |
JP2002357550A (ja) * | 2001-05-31 | 2002-12-13 | Jasco Corp | プローブ及びそれを用いたラマン分光装置 |
US6762835B2 (en) * | 2002-03-18 | 2004-07-13 | Mississippi State University | Fiber optic laser-induced breakdown spectroscopy sensor for molten material analysis |
JP4642401B2 (ja) * | 2004-07-26 | 2011-03-02 | オリンパス株式会社 | レーザ走査型観察装置 |
-
2005
- 2005-10-26 JP JP2005311436A patent/JP4738134B2/ja not_active Expired - Fee Related
-
2006
- 2006-10-25 EP EP06822738A patent/EP1963827A4/en not_active Withdrawn
- 2006-10-25 WO PCT/JP2006/321809 patent/WO2007049795A1/en active Application Filing
- 2006-10-25 KR KR1020097014859A patent/KR100933101B1/ko not_active IP Right Cessation
- 2006-10-25 KR KR1020077011696A patent/KR100928109B1/ko not_active IP Right Cessation
-
2007
- 2007-06-26 US US11/819,254 patent/US7477379B2/en not_active Expired - Fee Related
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58219437A (ja) * | 1982-06-15 | 1983-12-20 | Kawasaki Steel Corp | レ−ザ発光分光分析装置 |
JP2000028519A (ja) * | 1998-07-07 | 2000-01-28 | Olympus Optical Co Ltd | 照明光学系 |
JP2002529713A (ja) * | 1998-11-05 | 2002-09-10 | サイトメトリクス インコーポレイテッド | 高コントラストイメージングを提供するための方法および装置 |
JP2000310596A (ja) * | 1999-04-27 | 2000-11-07 | Toshiba Corp | 元素分析装置 |
JP2005140529A (ja) * | 2003-11-04 | 2005-06-02 | Toshiba Corp | 元素分析装置および元素分析方法 |
JP2005201762A (ja) * | 2004-01-15 | 2005-07-28 | Toshiba Corp | リチウム漏洩検出装置およびリチウム漏洩検出方法 |
JP2006275794A (ja) * | 2005-03-29 | 2006-10-12 | Toshiba Corp | 分析装置 |
Also Published As
Publication number | Publication date |
---|---|
WO2007049795A1 (en) | 2007-05-03 |
EP1963827A4 (en) | 2013-01-23 |
KR100928109B1 (ko) | 2009-11-24 |
KR20090083960A (ko) | 2009-08-04 |
EP1963827A1 (en) | 2008-09-03 |
KR20070084504A (ko) | 2007-08-24 |
JP2007121025A (ja) | 2007-05-17 |
US20070252985A1 (en) | 2007-11-01 |
US7477379B2 (en) | 2009-01-13 |
KR100933101B1 (ko) | 2009-12-21 |
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