JP4615312B2 - 複合材料、その製造方法およびそれを用いた部材 - Google Patents
複合材料、その製造方法およびそれを用いた部材 Download PDFInfo
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- JP4615312B2 JP4615312B2 JP2004546491A JP2004546491A JP4615312B2 JP 4615312 B2 JP4615312 B2 JP 4615312B2 JP 2004546491 A JP2004546491 A JP 2004546491A JP 2004546491 A JP2004546491 A JP 2004546491A JP 4615312 B2 JP4615312 B2 JP 4615312B2
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- 239000002131 composite material Substances 0.000 title claims description 105
- 238000004519 manufacturing process Methods 0.000 title claims description 10
- 239000010949 copper Substances 0.000 claims description 206
- 229910052802 copper Inorganic materials 0.000 claims description 190
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 167
- 239000000463 material Substances 0.000 claims description 100
- 229910017315 Mo—Cu Inorganic materials 0.000 claims description 35
- 239000000843 powder Substances 0.000 claims description 35
- 239000004065 semiconductor Substances 0.000 claims description 21
- 238000000034 method Methods 0.000 claims description 20
- 239000011159 matrix material Substances 0.000 claims description 15
- 238000000465 moulding Methods 0.000 claims description 14
- 229910000881 Cu alloy Inorganic materials 0.000 claims description 13
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- 229910052750 molybdenum Inorganic materials 0.000 description 19
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- 239000000758 substrate Substances 0.000 description 14
- 238000013461 design Methods 0.000 description 10
- 230000008595 infiltration Effects 0.000 description 9
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- 230000017525 heat dissipation Effects 0.000 description 8
- 229910052751 metal Inorganic materials 0.000 description 8
- 239000002184 metal Substances 0.000 description 8
- 238000009826 distribution Methods 0.000 description 7
- 238000003466 welding Methods 0.000 description 7
- 239000000919 ceramic Substances 0.000 description 6
- 230000000694 effects Effects 0.000 description 6
- 239000007789 gas Substances 0.000 description 6
- 239000001257 hydrogen Substances 0.000 description 6
- 229910052739 hydrogen Inorganic materials 0.000 description 6
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 5
- 230000007423 decrease Effects 0.000 description 5
- 238000010304 firing Methods 0.000 description 5
- 238000003754 machining Methods 0.000 description 5
- PXHVJJICTQNCMI-UHFFFAOYSA-N nickel Substances [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 5
- 238000005096 rolling process Methods 0.000 description 5
- 238000012360 testing method Methods 0.000 description 5
- 239000011800 void material Substances 0.000 description 5
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 4
- 239000011230 binding agent Substances 0.000 description 4
- 239000010410 layer Substances 0.000 description 4
- 230000005855 radiation Effects 0.000 description 4
- 239000002994 raw material Substances 0.000 description 4
- 229910052709 silver Inorganic materials 0.000 description 4
- 239000004332 silver Substances 0.000 description 4
- 238000005245 sintering Methods 0.000 description 4
- 239000000126 substance Substances 0.000 description 4
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 3
- 239000000956 alloy Substances 0.000 description 3
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 3
- 238000001125 extrusion Methods 0.000 description 3
- 238000005098 hot rolling Methods 0.000 description 3
- 230000007246 mechanism Effects 0.000 description 3
- 239000004014 plasticizer Substances 0.000 description 3
- DSSYKIVIOFKYAU-XCBNKYQSSA-N (R)-camphor Chemical compound C1C[C@@]2(C)C(=O)C[C@@H]1C2(C)C DSSYKIVIOFKYAU-XCBNKYQSSA-N 0.000 description 2
- 241000723346 Cinnamomum camphora Species 0.000 description 2
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 2
- 229910045601 alloy Inorganic materials 0.000 description 2
- 239000007864 aqueous solution Substances 0.000 description 2
- 229960000846 camphor Drugs 0.000 description 2
- 229930008380 camphor Natural products 0.000 description 2
- ZTXONRUJVYXVTJ-UHFFFAOYSA-N chromium copper Chemical compound [Cr][Cu][Cr] ZTXONRUJVYXVTJ-UHFFFAOYSA-N 0.000 description 2
- 230000000295 complement effect Effects 0.000 description 2
- 238000012790 confirmation Methods 0.000 description 2
- 238000001816 cooling Methods 0.000 description 2
- PMHQVHHXPFUNSP-UHFFFAOYSA-M copper(1+);methylsulfanylmethane;bromide Chemical compound Br[Cu].CSC PMHQVHHXPFUNSP-UHFFFAOYSA-M 0.000 description 2
- 238000004049 embossing Methods 0.000 description 2
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- 229910052759 nickel Inorganic materials 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
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- 230000000704 physical effect Effects 0.000 description 2
- 229920002689 polyvinyl acetate Polymers 0.000 description 2
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- 239000007858 starting material Substances 0.000 description 2
- PIGFYZPCRLYGLF-UHFFFAOYSA-N Aluminum nitride Chemical compound [Al]#N PIGFYZPCRLYGLF-UHFFFAOYSA-N 0.000 description 1
- 238000007088 Archimedes method Methods 0.000 description 1
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 1
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 description 1
- 239000004698 Polyethylene Substances 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- QCEUXSAXTBNJGO-UHFFFAOYSA-N [Ag].[Sn] Chemical compound [Ag].[Sn] QCEUXSAXTBNJGO-UHFFFAOYSA-N 0.000 description 1
- 229910000905 alloy phase Inorganic materials 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 239000010953 base metal Substances 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
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- 239000011651 chromium Substances 0.000 description 1
- 238000010273 cold forging Methods 0.000 description 1
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- C—CHEMISTRY; METALLURGY
- C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
- C22C—ALLOYS
- C22C9/00—Alloys based on copper
-
- C—CHEMISTRY; METALLURGY
- C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
- C22C—ALLOYS
- C22C1/00—Making non-ferrous alloys
- C22C1/04—Making non-ferrous alloys by powder metallurgy
- C22C1/0425—Copper-based alloys
-
- C—CHEMISTRY; METALLURGY
- C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
- C22C—ALLOYS
- C22C1/00—Making non-ferrous alloys
- C22C1/04—Making non-ferrous alloys by powder metallurgy
- C22C1/045—Alloys based on refractory metals
-
- C—CHEMISTRY; METALLURGY
- C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
- C22C—ALLOYS
- C22C27/00—Alloys based on rhenium or a refractory metal not mentioned in groups C22C14/00 or C22C16/00
- C22C27/04—Alloys based on tungsten or molybdenum
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/36—Selection of materials, or shaping, to facilitate cooling or heating, e.g. heatsinks
- H01L23/373—Cooling facilitated by selection of materials for the device or materials for thermal expansion adaptation, e.g. carbon
- H01L23/3736—Metallic materials
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L2224/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
- H01L2224/321—Disposition
- H01L2224/32151—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/32221—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/32225—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48225—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
- H01L2224/48227—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation connecting the wire to a bond pad of the item
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/12—All metal or with adjacent metals
- Y10T428/12014—All metal or with adjacent metals having metal particles
- Y10T428/12028—Composite; i.e., plural, adjacent, spatially distinct metal components [e.g., layers, etc.]
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/12—All metal or with adjacent metals
- Y10T428/12493—Composite; i.e., plural, adjacent, spatially distinct metal components [e.g., layers, joint, etc.]
- Y10T428/12528—Semiconductor component
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- Engineering & Computer Science (AREA)
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- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Powder Metallurgy (AREA)
- Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)
Description
いずれも純度が99%以上の表1に記載された銅または銅合金の素材および表2に記載されたMoの粉末を用意した。
上記表3乃至表5の試料番号2、5、10、14、17、18、22、24、25、29、32、33、38ないし40と同じ材料構成で150mm角で厚み5mmの板状の素材を用意した。いずれの場合も同じサイズにて溶浸体とそれを加工率90%で塑性加工したものとを準備した。
試料番号2と10の溶浸直後の素材から直径5mm、厚み5mmのスポット溶接用の一対の電極を切り出した。この電極を使って直径5mm、厚み1mmの電気接点を銅の合金にスポット溶接した。溶接機の通電部に対向させて、準備して電極対を固定した。電気接点のアッセンブリは、台金上に銀蝋薄片を置き、その上に主成分が銀の電気接点を載せたものである。このアッセンブリを下部の固定電極上に置き、上部可動電極を下降させてアッセンブリに荷重500gを負荷すると同時に、3秒間通電して銀蝋を溶融させ、その後放冷するようにした。このようにしてスポット溶接を繰り返し、溶接数1000個を越えたところでの電極の消耗量を比較したところ、試料番号10の銅プール相を形成したものは、試料番号2の銅プール相の形成されていないもののほぼ60%であった。
試料番号2と10の素材から直径、厚みとも10mmの放電加工用電極を切出した。この電極を使い、直径20mmの棒状TiC−Co系サーメント部品の一方の面に、直径約10mmm、深さ3mmの底付き穴を放電加工によって形成した。ワークを変えてこのステップを繰り返したところ、加工数1000個を越えたところでの電極の消純量を比較したところ、試料番号10の銅プール相を形成したものは、試料番号2の銅プール相の形成されていないもののほぼ70%であった。
Claims (7)
- Cu含有量30〜70重量%のMo−Cu系複合材料であり、材料中に銅プール相とMo−Cu系複合相とを含み、銅プール相を10〜50重量%含み、前記銅プール相の平均短径が、50〜200μmであることを特徴とする複合材料。
- 請求項1に記載の複合材料において、塑性加工を施したものであることを特徴とする複合材料。
- 請求項1又は2に記載の複合材料を用いたことを特徴とする部材。
- 請求項1又は2に記載の複合材料を用いたことを特徴とする放熱部材。
- Mo粉末マトリックスに、平均短径が50μm以上の銅系素材を配置した状態で成形一体化して成形体とするか、またはさらにこの成形体を焼成して中間焼結体とする工程、この成形体または中間焼結体に銅または銅合金を溶浸させCu含有量が30〜70重量%であり銅プール相を10〜50重量%含むとともに前記銅プール相の平均短径が、50〜200μmである複合材料とする工程を含むことを特徴とする複合材料の製造方法。
- 請求項5に記載の複合材料の製造方法において、前記銅系素材が、平均短径50−200μmの粉末であり、前記成形一体化前にこれとMo粉末とを混合することを特徴とする複合材料の製造方法。
- 請求項4に記載の放熱部材を用いたことを特徴とする半導体装置。
Applications Claiming Priority (3)
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JP2002312130 | 2002-10-28 | ||
JP2002312130 | 2002-10-28 | ||
PCT/JP2003/013779 WO2004038049A1 (ja) | 2002-10-28 | 2003-10-28 | 複合材料、その製造方法およびそれを用いた部材 |
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JPWO2004038049A1 JPWO2004038049A1 (ja) | 2006-02-23 |
JP4615312B2 true JP4615312B2 (ja) | 2011-01-19 |
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US (1) | US7547412B2 (ja) |
EP (1) | EP1566456B1 (ja) |
JP (1) | JP4615312B2 (ja) |
CN (1) | CN100475991C (ja) |
WO (1) | WO2004038049A1 (ja) |
Families Citing this family (9)
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JP2007142126A (ja) * | 2005-11-18 | 2007-06-07 | Allied Material Corp | 複合材料及び半導体搭載用放熱基板、及びそれを用いたセラミックパッケージ |
EP2439295B1 (en) * | 2006-02-15 | 2016-08-24 | Jfe Precision Corporation | Method for producing a Cr-Cu-alloy |
DE102007059443A1 (de) * | 2007-12-10 | 2009-06-18 | Li-Tec Vermögensverwaltungs GmbH | Elektrode für einen Energiespeicher |
KR101679104B1 (ko) | 2009-10-01 | 2016-11-23 | 제이에프이 세이미츠 가부시키가이샤 | 전자 기기용 히트 싱크 및 그의 제조 프로세스 |
CN103170616B (zh) * | 2011-12-21 | 2015-07-22 | 北京有色金属研究总院 | 一种钼铜合金箔片及其制备方法 |
CN103187544B (zh) | 2011-12-28 | 2015-07-22 | 比亚迪股份有限公司 | 一种电池的负极密封组件及其制作方法、以及一种锂离子电池 |
CN102560214B (zh) * | 2012-02-09 | 2013-04-10 | 北京航空航天大学 | 一种面对等离子体材料中抗起泡的梯度多孔结构 |
JP5818045B1 (ja) * | 2014-12-05 | 2015-11-18 | 株式会社半導体熱研究所 | 放熱基板と、それを使用した半導体パッケージと半導体モジュール |
AT15574U3 (de) * | 2017-05-11 | 2018-05-15 | Plansee Se | Flexibles Bauteil mit Schichtaufbau mit metallischer Lage |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
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JPH0449642A (ja) * | 1990-06-18 | 1992-02-19 | Nippon Tungsten Co Ltd | 半導体装置用基板材料及びその製造方法 |
JPH05171222A (ja) * | 1991-12-26 | 1993-07-09 | Nippon Tungsten Co Ltd | 重量可変部材の製造法 |
JPH11307701A (ja) * | 1997-08-22 | 1999-11-05 | Tokyo Tungsten Co Ltd | 放熱基板及びその製造方法 |
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CH519775A (de) | 1970-03-26 | 1972-02-29 | Siemens Ag | Verfahren zum Herstellen eines heterogenen Durchdringungs-Verbundmetalls als Kontaktwerkstoff für Vakuumschalter |
DE3378439D1 (en) * | 1982-08-09 | 1988-12-15 | Meidensha Electric Mfg Co Ltd | Contact material of vacuum interrupter and manufacturing process therefor |
US4661666A (en) * | 1985-05-28 | 1987-04-28 | Kabushiki Kaisha Meidensha | Vacuum interrupter |
JPH06310620A (ja) | 1993-04-27 | 1994-11-04 | Sumitomo Electric Ind Ltd | 半導体装置用放熱基板及びその製造方法 |
JP2746078B2 (ja) | 1993-09-30 | 1998-04-28 | 松下電工株式会社 | 光電式煙感知器 |
JPH1012767A (ja) | 1996-06-19 | 1998-01-16 | Tokyo Tungsten Co Ltd | 積層構造放熱基板及びその製造方法 |
US6271585B1 (en) * | 1997-07-08 | 2001-08-07 | Tokyo Tungsten Co., Ltd. | Heat sink substrate consisting essentially of copper and molybdenum and method of manufacturing the same |
SE9704685L (sv) * | 1997-12-15 | 1999-06-16 | Asea Brown Boveri | Kopplingsanordning och -förfarande |
JP3505704B2 (ja) | 1999-05-10 | 2004-03-15 | 株式会社アライドマテリアル | 放熱基板およびその製造方法 |
JP3856640B2 (ja) | 2000-01-26 | 2006-12-13 | 株式会社アライドマテリアル | 半導体搭載用放熱基板材料、その製造方法、及びそれを用いたセラミックパッケージ |
-
2003
- 2003-10-28 CN CN200380102302.XA patent/CN100475991C/zh not_active Expired - Fee Related
- 2003-10-28 WO PCT/JP2003/013779 patent/WO2004038049A1/ja active Application Filing
- 2003-10-28 US US10/533,087 patent/US7547412B2/en active Active
- 2003-10-28 EP EP03758996.7A patent/EP1566456B1/en not_active Expired - Lifetime
- 2003-10-28 JP JP2004546491A patent/JP4615312B2/ja not_active Expired - Fee Related
Patent Citations (3)
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JPH0449642A (ja) * | 1990-06-18 | 1992-02-19 | Nippon Tungsten Co Ltd | 半導体装置用基板材料及びその製造方法 |
JPH05171222A (ja) * | 1991-12-26 | 1993-07-09 | Nippon Tungsten Co Ltd | 重量可変部材の製造法 |
JPH11307701A (ja) * | 1997-08-22 | 1999-11-05 | Tokyo Tungsten Co Ltd | 放熱基板及びその製造方法 |
Also Published As
Publication number | Publication date |
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CN1708596A (zh) | 2005-12-14 |
CN100475991C (zh) | 2009-04-08 |
JPWO2004038049A1 (ja) | 2006-02-23 |
EP1566456A4 (en) | 2010-01-20 |
EP1566456B1 (en) | 2013-10-02 |
EP1566456A1 (en) | 2005-08-24 |
US20050287387A1 (en) | 2005-12-29 |
WO2004038049A1 (ja) | 2004-05-06 |
US7547412B2 (en) | 2009-06-16 |
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