JP4609757B2 - 成膜装置における基板装着方法 - Google Patents
成膜装置における基板装着方法 Download PDFInfo
- Publication number
- JP4609757B2 JP4609757B2 JP2005047815A JP2005047815A JP4609757B2 JP 4609757 B2 JP4609757 B2 JP 4609757B2 JP 2005047815 A JP2005047815 A JP 2005047815A JP 2005047815 A JP2005047815 A JP 2005047815A JP 4609757 B2 JP4609757 B2 JP 4609757B2
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- mask
- chuck
- glass substrate
- forming apparatus
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 239000000758 substrate Substances 0.000 title claims description 195
- 238000000034 method Methods 0.000 title claims description 22
- 239000011521 glass Substances 0.000 claims description 96
- 238000001704 evaporation Methods 0.000 claims description 25
- 230000008020 evaporation Effects 0.000 claims description 24
- 238000001771 vacuum deposition Methods 0.000 description 11
- 238000007740 vapor deposition Methods 0.000 description 11
- 239000011368 organic material Substances 0.000 description 8
- 238000000151 deposition Methods 0.000 description 7
- 230000008021 deposition Effects 0.000 description 5
- 230000007246 mechanism Effects 0.000 description 5
- 238000007738 vacuum evaporation Methods 0.000 description 5
- 238000010586 diagram Methods 0.000 description 4
- 238000005452 bending Methods 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 230000007723 transport mechanism Effects 0.000 description 3
- 230000015572 biosynthetic process Effects 0.000 description 2
- 230000003028 elevating effect Effects 0.000 description 2
- 230000005484 gravity Effects 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 230000008022 sublimation Effects 0.000 description 1
- 238000000859 sublimation Methods 0.000 description 1
Images
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/04—Coating on selected surface areas, e.g. using masks
- C23C14/042—Coating on selected surface areas, e.g. using masks using masks
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/458—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
- H10K71/10—Deposition of organic active material
- H10K71/16—Deposition of organic active material using physical vapour deposition [PVD], e.g. vacuum deposition or sputtering
- H10K71/166—Deposition of organic active material using physical vapour deposition [PVD], e.g. vacuum deposition or sputtering using selective deposition, e.g. using a mask
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- General Chemical & Material Sciences (AREA)
- Manufacturing & Machinery (AREA)
- Electroluminescent Light Sources (AREA)
- Physical Vapour Deposition (AREA)
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005047815A JP4609757B2 (ja) | 2005-02-23 | 2005-02-23 | 成膜装置における基板装着方法 |
KR1020077016151A KR100932140B1 (ko) | 2005-02-23 | 2006-02-22 | 성막 장치에서의 기판 장착 방법 및 성막 방법 |
CN2006800015532A CN101090996B (zh) | 2005-02-23 | 2006-02-22 | 成膜装置的基板安装方法以及成膜方法 |
TW095105918A TW200632117A (en) | 2005-02-23 | 2006-02-22 | Method of mounting substrate in film deposition apparatus and method of depositing film |
PCT/JP2006/303191 WO2006090749A1 (fr) | 2005-02-23 | 2006-02-22 | Procédé de montage de substrat et procédé de formation de film pour appareil de formation de film |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005047815A JP4609757B2 (ja) | 2005-02-23 | 2005-02-23 | 成膜装置における基板装着方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2006233259A JP2006233259A (ja) | 2006-09-07 |
JP4609757B2 true JP4609757B2 (ja) | 2011-01-12 |
Family
ID=36927387
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2005047815A Expired - Fee Related JP4609757B2 (ja) | 2005-02-23 | 2005-02-23 | 成膜装置における基板装着方法 |
Country Status (5)
Country | Link |
---|---|
JP (1) | JP4609757B2 (fr) |
KR (1) | KR100932140B1 (fr) |
CN (1) | CN101090996B (fr) |
TW (1) | TW200632117A (fr) |
WO (1) | WO2006090749A1 (fr) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2009125802A1 (fr) * | 2008-04-09 | 2009-10-15 | 株式会社 アルバック | Source d'évaporation et dispositif de formation de film |
WO2010106958A1 (fr) * | 2009-03-18 | 2010-09-23 | 株式会社アルバック | Procédé de positionnement et procédé de dépôt de vapeur |
DE102009034532A1 (de) | 2009-07-23 | 2011-02-03 | Msg Lithoglas Ag | Verfahren zum Herstellen einer strukturierten Beschichtung auf einem Substrat, beschichtetes Substrat sowie Halbzeug mit einem beschichteten Substrat |
TWI598377B (zh) | 2015-08-20 | 2017-09-11 | 大連化學工業股份有限公司 | 聚碳酸酯二醇及使用該聚碳酸酯二醇製得之熱塑性聚氨酯 |
CN105762278B (zh) * | 2016-03-04 | 2018-05-01 | 苏州大学 | 一种真空蒸镀装置及利用其制备有机电致发光器件的方法 |
JP6876520B2 (ja) * | 2016-06-24 | 2021-05-26 | キヤノントッキ株式会社 | 基板の挟持方法、基板の挟持装置、成膜方法、成膜装置、及び電子デバイスの製造方法、基板載置方法、アライメント方法、基板載置装置 |
WO2018211703A1 (fr) * | 2017-05-19 | 2018-11-22 | シャープ株式会社 | Procédé de dépôt en phase vapeur, appareil de dépôt en phase vapeur, appareil de production de dispositif électroluminescent et procédé de production de dispositif électroluminescent |
JP6468540B2 (ja) * | 2017-05-22 | 2019-02-13 | キヤノントッキ株式会社 | 基板搬送機構、基板載置機構、成膜装置及びそれらの方法 |
JP2024037209A (ja) * | 2022-09-07 | 2024-03-19 | キヤノントッキ株式会社 | 成膜装置、成膜装置の駆動方法及び成膜方法 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH051375A (ja) * | 1991-06-25 | 1993-01-08 | Canon Inc | 真空処理装置 |
JPH0688206A (ja) * | 1992-09-08 | 1994-03-29 | Dainippon Printing Co Ltd | スパッタ用治具 |
JP2004183044A (ja) * | 2002-12-03 | 2004-07-02 | Seiko Epson Corp | マスク蒸着方法及び装置、マスク及びマスクの製造方法、表示パネル製造装置、表示パネル並びに電子機器 |
JP2004303559A (ja) * | 2003-03-31 | 2004-10-28 | Tohoku Pioneer Corp | アライメント装置及び方法、並びにこれを用いて製造される有機el素子 |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH1046339A (ja) * | 1996-07-29 | 1998-02-17 | Matsushita Electric Ind Co Ltd | 基板ハンドリング方法 |
-
2005
- 2005-02-23 JP JP2005047815A patent/JP4609757B2/ja not_active Expired - Fee Related
-
2006
- 2006-02-22 WO PCT/JP2006/303191 patent/WO2006090749A1/fr active Application Filing
- 2006-02-22 KR KR1020077016151A patent/KR100932140B1/ko not_active IP Right Cessation
- 2006-02-22 TW TW095105918A patent/TW200632117A/zh unknown
- 2006-02-22 CN CN2006800015532A patent/CN101090996B/zh not_active Expired - Fee Related
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH051375A (ja) * | 1991-06-25 | 1993-01-08 | Canon Inc | 真空処理装置 |
JPH0688206A (ja) * | 1992-09-08 | 1994-03-29 | Dainippon Printing Co Ltd | スパッタ用治具 |
JP2004183044A (ja) * | 2002-12-03 | 2004-07-02 | Seiko Epson Corp | マスク蒸着方法及び装置、マスク及びマスクの製造方法、表示パネル製造装置、表示パネル並びに電子機器 |
JP2004303559A (ja) * | 2003-03-31 | 2004-10-28 | Tohoku Pioneer Corp | アライメント装置及び方法、並びにこれを用いて製造される有機el素子 |
Also Published As
Publication number | Publication date |
---|---|
JP2006233259A (ja) | 2006-09-07 |
WO2006090749A1 (fr) | 2006-08-31 |
CN101090996A (zh) | 2007-12-19 |
TWI316968B (fr) | 2009-11-11 |
CN101090996B (zh) | 2010-05-26 |
TW200632117A (en) | 2006-09-16 |
KR100932140B1 (ko) | 2009-12-16 |
KR20070087080A (ko) | 2007-08-27 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP4609756B2 (ja) | 成膜装置のマスク位置合わせ機構および成膜装置 | |
JP4609757B2 (ja) | 成膜装置における基板装着方法 | |
JP4609755B2 (ja) | マスク保持機構および成膜装置 | |
JP4609759B2 (ja) | 成膜装置 | |
JP4609754B2 (ja) | マスククランプの移動機構および成膜装置 | |
JP4553124B2 (ja) | 真空蒸着方法及びelディスプレイ用パネル | |
CN108517505B (zh) | 基板载置装置、成膜装置、基板载置方法、成膜方法和电子器件的制造方法 | |
JP4773834B2 (ja) | マスク成膜方法およびマスク成膜装置 | |
JP2019031720A (ja) | マスク製造装置及びマスク製造方法 | |
WO2010106958A1 (fr) | Procédé de positionnement et procédé de dépôt de vapeur | |
CN107002219A (zh) | 用于在处理腔室中掩蔽基板的掩模布置 | |
CN110777327B (zh) | 掩模装置的制造装置 | |
CN103205670B (zh) | 用于掩模组件间接对位的系统 | |
JP4478472B2 (ja) | 有機薄膜蒸着方法 | |
JP5084112B2 (ja) | 蒸着膜の形成方法 | |
CN103205682B (zh) | 掩模组件间接对位的方法 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20070319 |
|
A711 | Notification of change in applicant |
Free format text: JAPANESE INTERMEDIATE CODE: A711 Effective date: 20070918 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20100527 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20100720 |
|
TRDD | Decision of grant or rejection written | ||
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20100917 |
|
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20100930 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20131022 Year of fee payment: 3 |
|
R150 | Certificate of patent or registration of utility model |
Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20131022 Year of fee payment: 3 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20141022 Year of fee payment: 4 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
LAPS | Cancellation because of no payment of annual fees |