JP4445836B2 - サンプリング回路及び試験装置 - Google Patents

サンプリング回路及び試験装置 Download PDF

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Publication number
JP4445836B2
JP4445836B2 JP2004328262A JP2004328262A JP4445836B2 JP 4445836 B2 JP4445836 B2 JP 4445836B2 JP 2004328262 A JP2004328262 A JP 2004328262A JP 2004328262 A JP2004328262 A JP 2004328262A JP 4445836 B2 JP4445836 B2 JP 4445836B2
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JP
Japan
Prior art keywords
sampling
temperature
recovery diode
step recovery
pulse
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2004328262A
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English (en)
Japanese (ja)
Other versions
JP2006140742A (ja
JP2006140742A5 (https=
Inventor
雅裕 山川
芳春 梅村
利明 淡路
誠士 志波
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to JP2004328262A priority Critical patent/JP4445836B2/ja
Application filed by Advantest Corp filed Critical Advantest Corp
Priority to CNA2005800382518A priority patent/CN101057402A/zh
Priority to KR1020077011546A priority patent/KR101174935B1/ko
Priority to EP05805332A priority patent/EP1816745A1/en
Priority to PCT/JP2005/019806 priority patent/WO2006051694A1/ja
Priority to TW094139224A priority patent/TWI369076B/zh
Priority to US11/271,132 priority patent/US7208982B2/en
Publication of JP2006140742A publication Critical patent/JP2006140742A/ja
Publication of JP2006140742A5 publication Critical patent/JP2006140742A5/ja
Application granted granted Critical
Publication of JP4445836B2 publication Critical patent/JP4445836B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/124—Sampling or signal conditioning arrangements specially adapted for A/D converters
    • H03M1/1245—Details of sampling arrangements or methods
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking

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  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Manipulation Of Pulses (AREA)
  • Electronic Switches (AREA)
  • Analogue/Digital Conversion (AREA)
  • Tests Of Electronic Circuits (AREA)
JP2004328262A 2004-11-11 2004-11-11 サンプリング回路及び試験装置 Expired - Fee Related JP4445836B2 (ja)

Priority Applications (7)

Application Number Priority Date Filing Date Title
JP2004328262A JP4445836B2 (ja) 2004-11-11 2004-11-11 サンプリング回路及び試験装置
KR1020077011546A KR101174935B1 (ko) 2004-11-11 2005-10-27 샘플링 회로 및 시험 장치
EP05805332A EP1816745A1 (en) 2004-11-11 2005-10-27 Sampling circuit and tester
PCT/JP2005/019806 WO2006051694A1 (ja) 2004-11-11 2005-10-27 サンプリング回路及び試験装置
CNA2005800382518A CN101057402A (zh) 2004-11-11 2005-10-27 取样电路与测试装置
TW094139224A TWI369076B (en) 2004-11-11 2005-11-09 Sampling circuit and test ing device
US11/271,132 US7208982B2 (en) 2004-11-11 2005-11-10 Sampling circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004328262A JP4445836B2 (ja) 2004-11-11 2004-11-11 サンプリング回路及び試験装置

Publications (3)

Publication Number Publication Date
JP2006140742A JP2006140742A (ja) 2006-06-01
JP2006140742A5 JP2006140742A5 (https=) 2007-09-20
JP4445836B2 true JP4445836B2 (ja) 2010-04-07

Family

ID=36315786

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004328262A Expired - Fee Related JP4445836B2 (ja) 2004-11-11 2004-11-11 サンプリング回路及び試験装置

Country Status (7)

Country Link
US (1) US7208982B2 (https=)
EP (1) EP1816745A1 (https=)
JP (1) JP4445836B2 (https=)
KR (1) KR101174935B1 (https=)
CN (1) CN101057402A (https=)
TW (1) TWI369076B (https=)
WO (1) WO2006051694A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
LT7117B (lt) 2023-06-01 2025-01-27 Valstybinis mokslinių tyrimų institutas Fizinių ir technologijos mokslų centras Selektyvus metalo padengimo ant gaminio, pagaminto iš neorganinio dielektriko arba puslaidininkinės medžiagos, paviršiaus būdas

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5179565A (en) * 1990-06-07 1993-01-12 Hamamatsu Photonics, K.K. Low noise pulsed light source utilizing laser diode and voltage detector device utilizing same low noise pulsed light source
JPH0563447A (ja) * 1991-09-03 1993-03-12 Nec Corp 周波数逓倍回路
JPH10112636A (ja) * 1996-10-04 1998-04-28 Yokogawa Electric Corp 高速サンプリング回路
JP4159862B2 (ja) * 2002-11-26 2008-10-01 株式会社アドバンテスト パルス発生回路、及びサンプリング回路
US20050194960A1 (en) * 2004-03-04 2005-09-08 Reza Tayrani Broadband subharmonic sampling phase detector

Also Published As

Publication number Publication date
WO2006051694A1 (ja) 2006-05-18
TWI369076B (en) 2012-07-21
US20060097898A1 (en) 2006-05-11
TW200629739A (en) 2006-08-16
US7208982B2 (en) 2007-04-24
JP2006140742A (ja) 2006-06-01
KR101174935B1 (ko) 2012-08-17
KR20070084439A (ko) 2007-08-24
CN101057402A (zh) 2007-10-17
EP1816745A1 (en) 2007-08-08

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