KR101174935B1 - 샘플링 회로 및 시험 장치 - Google Patents

샘플링 회로 및 시험 장치 Download PDF

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Publication number
KR101174935B1
KR101174935B1 KR1020077011546A KR20077011546A KR101174935B1 KR 101174935 B1 KR101174935 B1 KR 101174935B1 KR 1020077011546 A KR1020077011546 A KR 1020077011546A KR 20077011546 A KR20077011546 A KR 20077011546A KR 101174935 B1 KR101174935 B1 KR 101174935B1
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KR
South Korea
Prior art keywords
temperature
sampling
recovery diode
step recovery
pulse
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Expired - Lifetime
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KR1020077011546A
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English (en)
Korean (ko)
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KR20070084439A (ko
Inventor
마사히로 야마카와
요시하루 우메무라
토시아키 아와지
사토시 시와
Original Assignee
주식회사 아도반테스토
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Publication of KR101174935B1 publication Critical patent/KR101174935B1/ko
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Expired - Lifetime legal-status Critical Current

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    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03MCODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12Analogue/digital converters
    • H03M1/124Sampling or signal conditioning arrangements specially adapted for A/D converters
    • H03M1/1245Details of sampling arrangements or methods
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K17/00Electronic switching or gating, i.e. not by contact-making and –breaking

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  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Manipulation Of Pulses (AREA)
  • Electronic Switches (AREA)
  • Analogue/Digital Conversion (AREA)
  • Tests Of Electronic Circuits (AREA)
KR1020077011546A 2004-11-11 2005-10-27 샘플링 회로 및 시험 장치 Expired - Lifetime KR101174935B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2004328262A JP4445836B2 (ja) 2004-11-11 2004-11-11 サンプリング回路及び試験装置
JPJP-P-2004-00328262 2004-11-11

Publications (2)

Publication Number Publication Date
KR20070084439A KR20070084439A (ko) 2007-08-24
KR101174935B1 true KR101174935B1 (ko) 2012-08-17

Family

ID=36315786

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020077011546A Expired - Lifetime KR101174935B1 (ko) 2004-11-11 2005-10-27 샘플링 회로 및 시험 장치

Country Status (7)

Country Link
US (1) US7208982B2 (https=)
EP (1) EP1816745A1 (https=)
JP (1) JP4445836B2 (https=)
KR (1) KR101174935B1 (https=)
CN (1) CN101057402A (https=)
TW (1) TWI369076B (https=)
WO (1) WO2006051694A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
LT7117B (lt) 2023-06-01 2025-01-27 Valstybinis mokslinių tyrimų institutas Fizinių ir technologijos mokslų centras Selektyvus metalo padengimo ant gaminio, pagaminto iš neorganinio dielektriko arba puslaidininkinės medžiagos, paviršiaus būdas

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004179912A (ja) * 2002-11-26 2004-06-24 Advantest Corp パルス発生回路、及びサンプリング回路

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5179565A (en) * 1990-06-07 1993-01-12 Hamamatsu Photonics, K.K. Low noise pulsed light source utilizing laser diode and voltage detector device utilizing same low noise pulsed light source
JPH0563447A (ja) * 1991-09-03 1993-03-12 Nec Corp 周波数逓倍回路
JPH10112636A (ja) * 1996-10-04 1998-04-28 Yokogawa Electric Corp 高速サンプリング回路
US20050194960A1 (en) * 2004-03-04 2005-09-08 Reza Tayrani Broadband subharmonic sampling phase detector

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004179912A (ja) * 2002-11-26 2004-06-24 Advantest Corp パルス発生回路、及びサンプリング回路

Also Published As

Publication number Publication date
WO2006051694A1 (ja) 2006-05-18
TWI369076B (en) 2012-07-21
US20060097898A1 (en) 2006-05-11
JP4445836B2 (ja) 2010-04-07
TW200629739A (en) 2006-08-16
US7208982B2 (en) 2007-04-24
JP2006140742A (ja) 2006-06-01
KR20070084439A (ko) 2007-08-24
CN101057402A (zh) 2007-10-17
EP1816745A1 (en) 2007-08-08

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