KR101174935B1 - 샘플링 회로 및 시험 장치 - Google Patents
샘플링 회로 및 시험 장치 Download PDFInfo
- Publication number
- KR101174935B1 KR101174935B1 KR1020077011546A KR20077011546A KR101174935B1 KR 101174935 B1 KR101174935 B1 KR 101174935B1 KR 1020077011546 A KR1020077011546 A KR 1020077011546A KR 20077011546 A KR20077011546 A KR 20077011546A KR 101174935 B1 KR101174935 B1 KR 101174935B1
- Authority
- KR
- South Korea
- Prior art keywords
- temperature
- sampling
- recovery diode
- step recovery
- pulse
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Images
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/124—Sampling or signal conditioning arrangements specially adapted for A/D converters
- H03M1/1245—Details of sampling arrangements or methods
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Manipulation Of Pulses (AREA)
- Electronic Switches (AREA)
- Analogue/Digital Conversion (AREA)
- Tests Of Electronic Circuits (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2004328262A JP4445836B2 (ja) | 2004-11-11 | 2004-11-11 | サンプリング回路及び試験装置 |
| JPJP-P-2004-00328262 | 2004-11-11 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20070084439A KR20070084439A (ko) | 2007-08-24 |
| KR101174935B1 true KR101174935B1 (ko) | 2012-08-17 |
Family
ID=36315786
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020077011546A Expired - Lifetime KR101174935B1 (ko) | 2004-11-11 | 2005-10-27 | 샘플링 회로 및 시험 장치 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US7208982B2 (https=) |
| EP (1) | EP1816745A1 (https=) |
| JP (1) | JP4445836B2 (https=) |
| KR (1) | KR101174935B1 (https=) |
| CN (1) | CN101057402A (https=) |
| TW (1) | TWI369076B (https=) |
| WO (1) | WO2006051694A1 (https=) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| LT7117B (lt) | 2023-06-01 | 2025-01-27 | Valstybinis mokslinių tyrimų institutas Fizinių ir technologijos mokslų centras | Selektyvus metalo padengimo ant gaminio, pagaminto iš neorganinio dielektriko arba puslaidininkinės medžiagos, paviršiaus būdas |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2004179912A (ja) * | 2002-11-26 | 2004-06-24 | Advantest Corp | パルス発生回路、及びサンプリング回路 |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5179565A (en) * | 1990-06-07 | 1993-01-12 | Hamamatsu Photonics, K.K. | Low noise pulsed light source utilizing laser diode and voltage detector device utilizing same low noise pulsed light source |
| JPH0563447A (ja) * | 1991-09-03 | 1993-03-12 | Nec Corp | 周波数逓倍回路 |
| JPH10112636A (ja) * | 1996-10-04 | 1998-04-28 | Yokogawa Electric Corp | 高速サンプリング回路 |
| US20050194960A1 (en) * | 2004-03-04 | 2005-09-08 | Reza Tayrani | Broadband subharmonic sampling phase detector |
-
2004
- 2004-11-11 JP JP2004328262A patent/JP4445836B2/ja not_active Expired - Fee Related
-
2005
- 2005-10-27 WO PCT/JP2005/019806 patent/WO2006051694A1/ja not_active Ceased
- 2005-10-27 KR KR1020077011546A patent/KR101174935B1/ko not_active Expired - Lifetime
- 2005-10-27 CN CNA2005800382518A patent/CN101057402A/zh active Pending
- 2005-10-27 EP EP05805332A patent/EP1816745A1/en not_active Withdrawn
- 2005-11-09 TW TW094139224A patent/TWI369076B/zh active
- 2005-11-10 US US11/271,132 patent/US7208982B2/en not_active Expired - Lifetime
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2004179912A (ja) * | 2002-11-26 | 2004-06-24 | Advantest Corp | パルス発生回路、及びサンプリング回路 |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2006051694A1 (ja) | 2006-05-18 |
| TWI369076B (en) | 2012-07-21 |
| US20060097898A1 (en) | 2006-05-11 |
| JP4445836B2 (ja) | 2010-04-07 |
| TW200629739A (en) | 2006-08-16 |
| US7208982B2 (en) | 2007-04-24 |
| JP2006140742A (ja) | 2006-06-01 |
| KR20070084439A (ko) | 2007-08-24 |
| CN101057402A (zh) | 2007-10-17 |
| EP1816745A1 (en) | 2007-08-08 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PA0105 | International application |
Patent event date: 20070521 Patent event code: PA01051R01D Comment text: International Patent Application |
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| PG1501 | Laying open of application | ||
| A201 | Request for examination | ||
| PA0201 | Request for examination |
Patent event code: PA02012R01D Patent event date: 20101022 Comment text: Request for Examination of Application |
|
| E902 | Notification of reason for refusal | ||
| PE0902 | Notice of grounds for rejection |
Comment text: Notification of reason for refusal Patent event date: 20111026 Patent event code: PE09021S01D |
|
| E701 | Decision to grant or registration of patent right | ||
| PE0701 | Decision of registration |
Patent event code: PE07011S01D Comment text: Decision to Grant Registration Patent event date: 20120510 |
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| GRNT | Written decision to grant | ||
| PR0701 | Registration of establishment |
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