TWI369076B - Sampling circuit and test ing device - Google Patents
Sampling circuit and test ing deviceInfo
- Publication number
- TWI369076B TWI369076B TW094139224A TW94139224A TWI369076B TW I369076 B TWI369076 B TW I369076B TW 094139224 A TW094139224 A TW 094139224A TW 94139224 A TW94139224 A TW 94139224A TW I369076 B TWI369076 B TW I369076B
- Authority
- TW
- Taiwan
- Prior art keywords
- sampling circuit
- ing device
- test ing
- test
- sampling
- Prior art date
Links
- 238000005070 sampling Methods 0.000 title 1
- 238000012360 testing method Methods 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/124—Sampling or signal conditioning arrangements specially adapted for A/D converters
- H03M1/1245—Details of sampling arrangements or methods
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Manipulation Of Pulses (AREA)
- Electronic Switches (AREA)
- Analogue/Digital Conversion (AREA)
- Tests Of Electronic Circuits (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2004328262A JP4445836B2 (ja) | 2004-11-11 | 2004-11-11 | サンプリング回路及び試験装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW200629739A TW200629739A (en) | 2006-08-16 |
| TWI369076B true TWI369076B (en) | 2012-07-21 |
Family
ID=36315786
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW094139224A TWI369076B (en) | 2004-11-11 | 2005-11-09 | Sampling circuit and test ing device |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US7208982B2 (https=) |
| EP (1) | EP1816745A1 (https=) |
| JP (1) | JP4445836B2 (https=) |
| KR (1) | KR101174935B1 (https=) |
| CN (1) | CN101057402A (https=) |
| TW (1) | TWI369076B (https=) |
| WO (1) | WO2006051694A1 (https=) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| LT7117B (lt) | 2023-06-01 | 2025-01-27 | Valstybinis mokslinių tyrimų institutas Fizinių ir technologijos mokslų centras | Selektyvus metalo padengimo ant gaminio, pagaminto iš neorganinio dielektriko arba puslaidininkinės medžiagos, paviršiaus būdas |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5179565A (en) * | 1990-06-07 | 1993-01-12 | Hamamatsu Photonics, K.K. | Low noise pulsed light source utilizing laser diode and voltage detector device utilizing same low noise pulsed light source |
| JPH0563447A (ja) * | 1991-09-03 | 1993-03-12 | Nec Corp | 周波数逓倍回路 |
| JPH10112636A (ja) * | 1996-10-04 | 1998-04-28 | Yokogawa Electric Corp | 高速サンプリング回路 |
| JP4159862B2 (ja) * | 2002-11-26 | 2008-10-01 | 株式会社アドバンテスト | パルス発生回路、及びサンプリング回路 |
| US20050194960A1 (en) * | 2004-03-04 | 2005-09-08 | Reza Tayrani | Broadband subharmonic sampling phase detector |
-
2004
- 2004-11-11 JP JP2004328262A patent/JP4445836B2/ja not_active Expired - Fee Related
-
2005
- 2005-10-27 WO PCT/JP2005/019806 patent/WO2006051694A1/ja not_active Ceased
- 2005-10-27 KR KR1020077011546A patent/KR101174935B1/ko not_active Expired - Lifetime
- 2005-10-27 CN CNA2005800382518A patent/CN101057402A/zh active Pending
- 2005-10-27 EP EP05805332A patent/EP1816745A1/en not_active Withdrawn
- 2005-11-09 TW TW094139224A patent/TWI369076B/zh active
- 2005-11-10 US US11/271,132 patent/US7208982B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| WO2006051694A1 (ja) | 2006-05-18 |
| US20060097898A1 (en) | 2006-05-11 |
| JP4445836B2 (ja) | 2010-04-07 |
| TW200629739A (en) | 2006-08-16 |
| US7208982B2 (en) | 2007-04-24 |
| JP2006140742A (ja) | 2006-06-01 |
| KR101174935B1 (ko) | 2012-08-17 |
| KR20070084439A (ko) | 2007-08-24 |
| CN101057402A (zh) | 2007-10-17 |
| EP1816745A1 (en) | 2007-08-08 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| GB0513024D0 (en) | Shape-acceleration measurement device and method | |
| GB0306098D0 (en) | Sample testing device | |
| GB0508689D0 (en) | Electrical circuit testing device | |
| GB0401288D0 (en) | Sampling and assay device | |
| GB2418258B (en) | Analyte testing device | |
| TWI318450B (en) | Integrated circuit device and electronic instrument | |
| EP1610135A4 (en) | TESTING DEVICE AND TEST PROCEDURE | |
| TWI319231B (en) | Integrated circuit device and electronic instrument | |
| EP1729648A4 (en) | NON-SEEDING BIOPSY DEVICE AND METHOD | |
| EP1757947A4 (en) | TEST DEVICE AND TEST METHOD | |
| GB0420786D0 (en) | Time measurement device | |
| TWI371594B (en) | Testing device and testing method | |
| GB0422306D0 (en) | Tester device | |
| TWI347443B (en) | Delay circuit and testing device | |
| GB0403369D0 (en) | Devices and methods for testing analytes | |
| TWI372878B (en) | Testing device | |
| EP1653239A4 (en) | TEST EQUIPMENT | |
| GB2416280B (en) | Testing device and method | |
| TWI369076B (en) | Sampling circuit and test ing device | |
| TWI349904B (en) | Amplifier circuit and display device | |
| AU2003291413A8 (en) | Specimen testing device | |
| TWI369527B (en) | Amplifier circuit and display device | |
| GB2430040B (en) | Testing Device And Method | |
| GB0421535D0 (en) | Sample and hold circuits | |
| EP1780739A4 (en) | THIN FILTER AND TEST DEVICE |