CN101057402A - 取样电路与测试装置 - Google Patents
取样电路与测试装置 Download PDFInfo
- Publication number
- CN101057402A CN101057402A CNA2005800382518A CN200580038251A CN101057402A CN 101057402 A CN101057402 A CN 101057402A CN A2005800382518 A CNA2005800382518 A CN A2005800382518A CN 200580038251 A CN200580038251 A CN 200580038251A CN 101057402 A CN101057402 A CN 101057402A
- Authority
- CN
- China
- Prior art keywords
- sampling
- temperature
- pulse
- diode
- pulse wave
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/124—Sampling or signal conditioning arrangements specially adapted for A/D converters
- H03M1/1245—Details of sampling arrangements or methods
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Manipulation Of Pulses (AREA)
- Electronic Switches (AREA)
- Analogue/Digital Conversion (AREA)
- Tests Of Electronic Circuits (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2004328262A JP4445836B2 (ja) | 2004-11-11 | 2004-11-11 | サンプリング回路及び試験装置 |
| JP328262/2004 | 2004-11-11 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN101057402A true CN101057402A (zh) | 2007-10-17 |
Family
ID=36315786
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNA2005800382518A Pending CN101057402A (zh) | 2004-11-11 | 2005-10-27 | 取样电路与测试装置 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US7208982B2 (https=) |
| EP (1) | EP1816745A1 (https=) |
| JP (1) | JP4445836B2 (https=) |
| KR (1) | KR101174935B1 (https=) |
| CN (1) | CN101057402A (https=) |
| TW (1) | TWI369076B (https=) |
| WO (1) | WO2006051694A1 (https=) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| LT7117B (lt) | 2023-06-01 | 2025-01-27 | Valstybinis mokslinių tyrimų institutas Fizinių ir technologijos mokslų centras | Selektyvus metalo padengimo ant gaminio, pagaminto iš neorganinio dielektriko arba puslaidininkinės medžiagos, paviršiaus būdas |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5179565A (en) * | 1990-06-07 | 1993-01-12 | Hamamatsu Photonics, K.K. | Low noise pulsed light source utilizing laser diode and voltage detector device utilizing same low noise pulsed light source |
| JPH0563447A (ja) * | 1991-09-03 | 1993-03-12 | Nec Corp | 周波数逓倍回路 |
| JPH10112636A (ja) * | 1996-10-04 | 1998-04-28 | Yokogawa Electric Corp | 高速サンプリング回路 |
| JP4159862B2 (ja) * | 2002-11-26 | 2008-10-01 | 株式会社アドバンテスト | パルス発生回路、及びサンプリング回路 |
| US20050194960A1 (en) * | 2004-03-04 | 2005-09-08 | Reza Tayrani | Broadband subharmonic sampling phase detector |
-
2004
- 2004-11-11 JP JP2004328262A patent/JP4445836B2/ja not_active Expired - Fee Related
-
2005
- 2005-10-27 WO PCT/JP2005/019806 patent/WO2006051694A1/ja not_active Ceased
- 2005-10-27 KR KR1020077011546A patent/KR101174935B1/ko not_active Expired - Lifetime
- 2005-10-27 CN CNA2005800382518A patent/CN101057402A/zh active Pending
- 2005-10-27 EP EP05805332A patent/EP1816745A1/en not_active Withdrawn
- 2005-11-09 TW TW094139224A patent/TWI369076B/zh active
- 2005-11-10 US US11/271,132 patent/US7208982B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| WO2006051694A1 (ja) | 2006-05-18 |
| TWI369076B (en) | 2012-07-21 |
| US20060097898A1 (en) | 2006-05-11 |
| JP4445836B2 (ja) | 2010-04-07 |
| TW200629739A (en) | 2006-08-16 |
| US7208982B2 (en) | 2007-04-24 |
| JP2006140742A (ja) | 2006-06-01 |
| KR101174935B1 (ko) | 2012-08-17 |
| KR20070084439A (ko) | 2007-08-24 |
| EP1816745A1 (en) | 2007-08-08 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN1234015C (zh) | 用于半导体测试系统的电源电流测量单元 | |
| US6269317B1 (en) | Self-calibration of an oscilloscope using a square-wave test signal | |
| CN101889212A (zh) | 测试装置及校准方法 | |
| CN1618027A (zh) | 具有时间戳系统的紧凑的自动测试设备 | |
| CN114325419A (zh) | Dc信号测量和电池形成/测试 | |
| US20060267637A1 (en) | Calibration comparator circuit | |
| CN1671053A (zh) | 校正数字模拟转换器的直流偏移的方法与相关装置 | |
| CN1627087A (zh) | 用于计量电功率的计量仪 | |
| JP2005315729A (ja) | 直流試験装置 | |
| CN101057402A (zh) | 取样电路与测试装置 | |
| CN112731989B (zh) | 用于激光装置的控制装置、方法以及激光测量装置 | |
| JP2009509174A (ja) | デジタル信号のタイミングを試験するためのストローブ技法 | |
| CN108414001B (zh) | 非均匀采样正弦波形失真度的确定方法 | |
| CN1155082A (zh) | 用于印刷电路板的无源元件测试电路 | |
| CN114389444B (zh) | 一种桥臂故障自适应检测保护方法 | |
| CN1955703A (zh) | 通过平移转换参考电平以进行校正的温度测量电路 | |
| US7957924B2 (en) | System and method for distortion analysis | |
| US7526701B2 (en) | Method and apparatus for measuring group delay of a device under test | |
| JP2005516224A (ja) | Dsp支援によるピーク取り込み回路および方法 | |
| Yarema et al. | A high speed, wide dynamic range digitizer circuit for photomultiplier tubes | |
| US7032150B2 (en) | Method and apparatus for measuring group delay of a device under test | |
| JP2735076B2 (ja) | アナログ/ディジタル変換器の試験方法 | |
| CN101206236A (zh) | 相位差检测装置及其相位检测方法 | |
| TW202024649A (zh) | 信號週期測量電路與方法 | |
| JP2000124805A (ja) | D/aコンバータの検査回路 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C02 | Deemed withdrawal of patent application after publication (patent law 2001) | ||
| WD01 | Invention patent application deemed withdrawn after publication |
Open date: 20071017 |