JP4323903B2 - 照明光学系及びそれを用いた露光装置 - Google Patents

照明光学系及びそれを用いた露光装置 Download PDF

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Publication number
JP4323903B2
JP4323903B2 JP2003321419A JP2003321419A JP4323903B2 JP 4323903 B2 JP4323903 B2 JP 4323903B2 JP 2003321419 A JP2003321419 A JP 2003321419A JP 2003321419 A JP2003321419 A JP 2003321419A JP 4323903 B2 JP4323903 B2 JP 4323903B2
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JP
Japan
Prior art keywords
optical system
light
polarization
light source
illumination
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2003321419A
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English (en)
Japanese (ja)
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JP2005093522A5 (enExample
JP2005093522A (ja
Inventor
章義 鈴木
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to JP2003321419A priority Critical patent/JP4323903B2/ja
Application filed by Canon Inc filed Critical Canon Inc
Priority to US10/538,230 priority patent/US7196773B2/en
Priority to EP04773236A priority patent/EP1668679A4/en
Priority to TW093127499A priority patent/TWI274375B/zh
Priority to KR1020067004912A priority patent/KR100731255B1/ko
Priority to PCT/JP2004/013592 priority patent/WO2005027207A1/en
Publication of JP2005093522A publication Critical patent/JP2005093522A/ja
Publication of JP2005093522A5 publication Critical patent/JP2005093522A5/ja
Priority to US11/676,891 priority patent/US20070146677A1/en
Application granted granted Critical
Publication of JP4323903B2 publication Critical patent/JP4323903B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/09Beam shaping, e.g. changing the cross-sectional area, not otherwise provided for
    • G02B27/0938Using specific optical elements
    • G02B27/095Refractive optical elements
    • G02B27/0955Lenses
    • G02B27/0961Lens arrays
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/09Beam shaping, e.g. changing the cross-sectional area, not otherwise provided for
    • G02B27/0905Dividing and/or superposing multiple light beams
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/09Beam shaping, e.g. changing the cross-sectional area, not otherwise provided for
    • G02B27/0927Systems for changing the beam intensity distribution, e.g. Gaussian to top-hat
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00Optical elements other than lenses
    • G02B5/32Holograms used as optical elements
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70058Mask illumination systems
    • G03F7/70091Illumination settings, i.e. intensity distribution in the pupil plane or angular distribution in the field plane; On-axis or off-axis settings, e.g. annular, dipole or quadrupole settings; Partial coherence control, i.e. sigma or numerical aperture [NA]
    • G03F7/70108Off-axis setting using a light-guiding element, e.g. diffractive optical elements [DOEs] or light guides
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70058Mask illumination systems
    • G03F7/7015Details of optical elements
    • G03F7/70158Diffractive optical elements
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70058Mask illumination systems
    • G03F7/70191Optical correction elements, filters or phase plates for controlling intensity, wavelength, polarisation, phase or the like
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70483Information management; Active and passive control; Testing; Wafer monitoring, e.g. pattern monitoring
    • G03F7/7055Exposure light control in all parts of the microlithographic apparatus, e.g. pulse length control or light interruption
    • G03F7/70566Polarisation control

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
JP2003321419A 2003-09-12 2003-09-12 照明光学系及びそれを用いた露光装置 Expired - Fee Related JP4323903B2 (ja)

Priority Applications (7)

Application Number Priority Date Filing Date Title
JP2003321419A JP4323903B2 (ja) 2003-09-12 2003-09-12 照明光学系及びそれを用いた露光装置
EP04773236A EP1668679A4 (en) 2003-09-12 2004-09-10 OPTICAL LIGHTING SYSTEM AND EXPOSURE DEVICE THEREFOR
TW093127499A TWI274375B (en) 2003-09-12 2004-09-10 Illumination optical system and exposure apparatus using the same
KR1020067004912A KR100731255B1 (ko) 2003-09-12 2004-09-10 조명광학계 및 그것을 사용한 노광장치
US10/538,230 US7196773B2 (en) 2003-09-12 2004-09-10 Illumination optical system and exposure apparatus using the same
PCT/JP2004/013592 WO2005027207A1 (en) 2003-09-12 2004-09-10 Illumination optical system and exposure apparatus using the same
US11/676,891 US20070146677A1 (en) 2003-09-12 2007-02-20 Illumination optical system and exposure apparatus using the same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2003321419A JP4323903B2 (ja) 2003-09-12 2003-09-12 照明光学系及びそれを用いた露光装置

Publications (3)

Publication Number Publication Date
JP2005093522A JP2005093522A (ja) 2005-04-07
JP2005093522A5 JP2005093522A5 (enExample) 2006-10-19
JP4323903B2 true JP4323903B2 (ja) 2009-09-02

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JP2003321419A Expired - Fee Related JP4323903B2 (ja) 2003-09-12 2003-09-12 照明光学系及びそれを用いた露光装置

Country Status (6)

Country Link
US (2) US7196773B2 (enExample)
EP (1) EP1668679A4 (enExample)
JP (1) JP4323903B2 (enExample)
KR (1) KR100731255B1 (enExample)
TW (1) TWI274375B (enExample)
WO (1) WO2005027207A1 (enExample)

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TWI512335B (zh) * 2003-11-20 2015-12-11 尼康股份有限公司 光束變換元件、光學照明裝置、曝光裝置、以及曝光方法
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TWI395068B (zh) 2004-01-27 2013-05-01 尼康股份有限公司 光學系統、曝光裝置以及曝光方法
TWI511182B (zh) 2004-02-06 2015-12-01 尼康股份有限公司 光學照明裝置、曝光裝置、曝光方法以及元件製造方法
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JP5308638B2 (ja) * 2006-07-14 2013-10-09 カール・ツァイス・エスエムティー・ゲーエムベーハー マイクロリソグラフィ投影露光装置用の照明光学系
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Also Published As

Publication number Publication date
TWI274375B (en) 2007-02-21
KR100731255B1 (ko) 2007-06-25
US7196773B2 (en) 2007-03-27
EP1668679A1 (en) 2006-06-14
US20070146677A1 (en) 2007-06-28
KR20060087551A (ko) 2006-08-02
TW200511392A (en) 2005-03-16
WO2005027207A1 (en) 2005-03-24
US20060012769A1 (en) 2006-01-19
EP1668679A4 (en) 2008-04-30
JP2005093522A (ja) 2005-04-07

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