JP2005093522A5 - - Google Patents

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Publication number
JP2005093522A5
JP2005093522A5 JP2003321419A JP2003321419A JP2005093522A5 JP 2005093522 A5 JP2005093522 A5 JP 2005093522A5 JP 2003321419 A JP2003321419 A JP 2003321419A JP 2003321419 A JP2003321419 A JP 2003321419A JP 2005093522 A5 JP2005093522 A5 JP 2005093522A5
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JP
Japan
Prior art keywords
light beam
optical system
light
optical element
diffractive optical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2003321419A
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English (en)
Japanese (ja)
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JP2005093522A (ja
JP4323903B2 (ja
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Publication date
Application filed filed Critical
Priority claimed from JP2003321419A external-priority patent/JP4323903B2/ja
Priority to JP2003321419A priority Critical patent/JP4323903B2/ja
Priority to US10/538,230 priority patent/US7196773B2/en
Priority to PCT/JP2004/013592 priority patent/WO2005027207A1/en
Priority to KR1020067004912A priority patent/KR100731255B1/ko
Priority to TW093127499A priority patent/TWI274375B/zh
Priority to EP04773236A priority patent/EP1668679A4/en
Publication of JP2005093522A publication Critical patent/JP2005093522A/ja
Publication of JP2005093522A5 publication Critical patent/JP2005093522A5/ja
Priority to US11/676,891 priority patent/US20070146677A1/en
Publication of JP4323903B2 publication Critical patent/JP4323903B2/ja
Application granted granted Critical
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP2003321419A 2003-09-12 2003-09-12 照明光学系及びそれを用いた露光装置 Expired - Fee Related JP4323903B2 (ja)

Priority Applications (7)

Application Number Priority Date Filing Date Title
JP2003321419A JP4323903B2 (ja) 2003-09-12 2003-09-12 照明光学系及びそれを用いた露光装置
TW093127499A TWI274375B (en) 2003-09-12 2004-09-10 Illumination optical system and exposure apparatus using the same
PCT/JP2004/013592 WO2005027207A1 (en) 2003-09-12 2004-09-10 Illumination optical system and exposure apparatus using the same
KR1020067004912A KR100731255B1 (ko) 2003-09-12 2004-09-10 조명광학계 및 그것을 사용한 노광장치
US10/538,230 US7196773B2 (en) 2003-09-12 2004-09-10 Illumination optical system and exposure apparatus using the same
EP04773236A EP1668679A4 (en) 2003-09-12 2004-09-10 OPTICAL LIGHTING SYSTEM AND EXPOSURE DEVICE THEREFOR
US11/676,891 US20070146677A1 (en) 2003-09-12 2007-02-20 Illumination optical system and exposure apparatus using the same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2003321419A JP4323903B2 (ja) 2003-09-12 2003-09-12 照明光学系及びそれを用いた露光装置

Publications (3)

Publication Number Publication Date
JP2005093522A JP2005093522A (ja) 2005-04-07
JP2005093522A5 true JP2005093522A5 (enExample) 2006-10-19
JP4323903B2 JP4323903B2 (ja) 2009-09-02

Family

ID=34308635

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2003321419A Expired - Fee Related JP4323903B2 (ja) 2003-09-12 2003-09-12 照明光学系及びそれを用いた露光装置

Country Status (6)

Country Link
US (2) US7196773B2 (enExample)
EP (1) EP1668679A4 (enExample)
JP (1) JP4323903B2 (enExample)
KR (1) KR100731255B1 (enExample)
TW (1) TWI274375B (enExample)
WO (1) WO2005027207A1 (enExample)

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US7924406B2 (en) * 2005-07-13 2011-04-12 Asml Netherlands B.V. Stage apparatus, lithographic apparatus and device manufacturing method having switch device for two illumination channels
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JP2007220767A (ja) * 2006-02-15 2007-08-30 Canon Inc 露光装置及びデバイス製造方法
US7525642B2 (en) * 2006-02-23 2009-04-28 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US7657147B2 (en) * 2006-03-02 2010-02-02 Solar Light Company, Inc. Sunlight simulator apparatus
JP4957058B2 (ja) 2006-04-12 2012-06-20 大日本印刷株式会社 回折光学素子、および該素子を備えた露光装置
JP4784746B2 (ja) * 2006-04-12 2011-10-05 株式会社ニコン 照明光学装置、投影露光装置、投影光学系、及びデバイス製造方法
CN101379593A (zh) * 2006-04-14 2009-03-04 株式会社尼康 曝光装置、元件制造方法以及曝光方法
WO2007119514A1 (ja) * 2006-04-17 2007-10-25 Nikon Corporation 照明光学装置、露光装置、およびデバイス製造方法
JPWO2008007632A1 (ja) * 2006-07-12 2009-12-10 株式会社ニコン 照明光学装置、露光装置、およびデバイス製造方法
DE102006032810A1 (de) 2006-07-14 2008-01-17 Carl Zeiss Smt Ag Beleuchtungsoptik für eine Mikrolithografie-Projektionsbelichtungsanlage, Beleuchtungssystem mit einer derartigen Beleuchtungsoptik, mikrolithografie-Projektionsbelichtungsanlage mit einem derartigen Beleuchtungssystem, mikrolithografisches Herstellungsverfahren für Bauelemente sowie mit diesem Verfahren hergestelltes Bauelement
JP5308638B2 (ja) * 2006-07-14 2013-10-09 カール・ツァイス・エスエムティー・ゲーエムベーハー マイクロリソグラフィ投影露光装置用の照明光学系
JP5023589B2 (ja) 2006-07-21 2012-09-12 大日本印刷株式会社 フォトマスクおよび該フォトマスクの設計方法
JP2008047673A (ja) * 2006-08-14 2008-02-28 Canon Inc 露光装置及びデバイス製造方法
DE102006038643B4 (de) 2006-08-17 2009-06-10 Carl Zeiss Smt Ag Mikrolithographische Projektionsbelichtungsanlage sowie mikrolithographisches Belichtungsverfahren
US7952685B2 (en) * 2007-03-15 2011-05-31 Carl Zeiss Smt Ag Illuminator for a lithographic apparatus and method
US20080285000A1 (en) * 2007-05-17 2008-11-20 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
JP4971932B2 (ja) 2007-10-01 2012-07-11 キヤノン株式会社 照明光学系、露光装置、デバイス製造方法および偏光制御ユニット
JP5459482B2 (ja) * 2007-10-16 2014-04-02 株式会社ニコン 送光光学系、照明光学系、露光装置、およびデバイス製造方法
US20090180088A1 (en) * 2008-01-11 2009-07-16 Uwe Paul Schroeder Illumination Sources for Lithography Systems
DE102008009601A1 (de) * 2008-02-15 2009-08-20 Carl Zeiss Smt Ag Optisches System für eine mikrolithographische Projektionsbelichtungsanlage sowie mikrolithographisches Belichtungsverfahren
WO2009128293A1 (ja) * 2008-04-14 2009-10-22 株式会社ニコン 空間光変調ユニット、照明光学系、露光装置、およびデバイス製造方法
JP5531955B2 (ja) * 2008-06-12 2014-06-25 株式会社ニコン 照明装置、露光装置及びデバイス製造方法
JP5167032B2 (ja) * 2008-08-27 2013-03-21 キヤノン株式会社 計算機ホログラム、露光装置及びデバイスの製造方法
US20110037962A1 (en) * 2009-08-17 2011-02-17 Nikon Corporation Polarization converting unit, illumination optical system, exposure apparatus, and device manufacturing method
US20110205519A1 (en) * 2010-02-25 2011-08-25 Nikon Corporation Polarization converting unit, illumination optical system, exposure apparatus, and device manufacturing method
US9868664B2 (en) * 2012-02-29 2018-01-16 Corning Incorporated Low CTE, ion-exchangeable glass compositions and glass articles comprising the same
KR102091652B1 (ko) * 2013-03-12 2020-03-20 어플라이드 머티어리얼스, 인코포레이티드 레이저 어닐링 시스템들에서의 에지 프로파일의 제어를 위한 맞춤화된 퍼필 스톱 장치
CN103744183B (zh) * 2014-01-24 2016-01-20 哈尔滨工业大学 一种红外宽波段多干扰复合光学系统
US10143340B2 (en) * 2015-06-17 2018-12-04 Essity Hygiene And Health Aktiebolag Dispenser assembly and related methods
JP6567005B2 (ja) * 2017-08-31 2019-08-28 キヤノン株式会社 露光装置、調整方法、および、物品製造方法
TW202303301A (zh) * 2021-05-10 2023-01-16 美商應用材料股份有限公司 用於灰階微影術的方法以及設備
WO2024245977A1 (en) * 2023-05-26 2024-12-05 Powerphotonic Ltd Improvements in or relating to laser beam shapers

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JP2000021748A (ja) * 1998-06-30 2000-01-21 Canon Inc 露光方法および露光装置
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JP3919419B2 (ja) * 2000-03-30 2007-05-23 キヤノン株式会社 照明装置及びそれを有する露光装置
TW567406B (en) * 2001-12-12 2003-12-21 Nikon Corp Diffraction optical device, refraction optical device, illuminating optical device, exposure system and exposure method
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