JP4239343B2 - 酸化物の結晶成長方法、電界効果トランジスタの製造方法および強誘電体不揮発性メモリの製造方法 - Google Patents
酸化物の結晶成長方法、電界効果トランジスタの製造方法および強誘電体不揮発性メモリの製造方法 Download PDFInfo
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- JP4239343B2 JP4239343B2 JP2000027362A JP2000027362A JP4239343B2 JP 4239343 B2 JP4239343 B2 JP 4239343B2 JP 2000027362 A JP2000027362 A JP 2000027362A JP 2000027362 A JP2000027362 A JP 2000027362A JP 4239343 B2 JP4239343 B2 JP 4239343B2
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- cerium oxide
- silicon substrate
- oxide
- cerium
- film
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- Crystals, And After-Treatments Of Crystals (AREA)
- Semiconductor Memories (AREA)
- Non-Volatile Memory (AREA)
- Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)
- Insulated Gate Type Field-Effect Transistor (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2000027362A JP4239343B2 (ja) | 1999-03-26 | 2000-01-31 | 酸化物の結晶成長方法、電界効果トランジスタの製造方法および強誘電体不揮発性メモリの製造方法 |
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8491999 | 1999-03-26 | ||
| JP11-84919 | 1999-03-26 | ||
| JP2000027362A JP4239343B2 (ja) | 1999-03-26 | 2000-01-31 | 酸化物の結晶成長方法、電界効果トランジスタの製造方法および強誘電体不揮発性メモリの製造方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2000344599A JP2000344599A (ja) | 2000-12-12 |
| JP2000344599A5 JP2000344599A5 (enExample) | 2006-02-16 |
| JP4239343B2 true JP4239343B2 (ja) | 2009-03-18 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2000027362A Expired - Fee Related JP4239343B2 (ja) | 1999-03-26 | 2000-01-31 | 酸化物の結晶成長方法、電界効果トランジスタの製造方法および強誘電体不揮発性メモリの製造方法 |
Country Status (1)
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|---|---|
| JP (1) | JP4239343B2 (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8099635B2 (en) | 2007-03-21 | 2012-01-17 | Arm Limited | Techniques for generating a trace stream for a data processing apparatus |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3470068B2 (ja) | 1999-09-01 | 2003-11-25 | 松下電器産業株式会社 | 誘電体膜の形成方法 |
| US6569240B1 (en) | 1999-03-17 | 2003-05-27 | Matsushita Electric Industrial Co., Ltd. | Dielectric film and method for forming the same |
| JP5029539B2 (ja) * | 2007-09-04 | 2012-09-19 | 三菱マテリアル株式会社 | 多結晶シリコンの洗浄方法及び多結晶シリコンの製造方法 |
| JP5262068B2 (ja) * | 2007-11-01 | 2013-08-14 | 富士ゼロックス株式会社 | 画像形成装置 |
| JP2009224403A (ja) * | 2008-03-13 | 2009-10-01 | Toshiba Corp | 情報記録素子及びそれを備えた情報記録再生装置 |
| JP2010212391A (ja) * | 2009-03-10 | 2010-09-24 | Hitachi Kokusai Electric Inc | 半導体装置の製造方法及び基板処理装置 |
| AU2019459231A1 (en) * | 2019-07-29 | 2022-01-06 | Microsoft Technology Licensing Llc | Fabrication method for semiconductor nanowires coupled to a superconductor |
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2000
- 2000-01-31 JP JP2000027362A patent/JP4239343B2/ja not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8099635B2 (en) | 2007-03-21 | 2012-01-17 | Arm Limited | Techniques for generating a trace stream for a data processing apparatus |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2000344599A (ja) | 2000-12-12 |
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