JP4216387B2 - Ｘ線検出器 - Google Patents

Ｘ線検出器 Download PDF

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Publication number
JP4216387B2
JP4216387B2 JP190599A JP190599A JP4216387B2 JP 4216387 B2 JP4216387 B2 JP 4216387B2 JP 190599 A JP190599 A JP 190599A JP 190599 A JP190599 A JP 190599A JP 4216387 B2 JP4216387 B2 JP 4216387B2
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JP
Japan
Prior art keywords
charge
ray detector
circuit
cycle
voltage
Prior art date
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Expired - Fee Related
Application number
JP190599A
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English (en)
Japanese (ja)
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JP2000206255A (ja
JP2000206255A5 (enExample
Inventor
道隆 本田
清一郎 永井
隆之 富崎
徹 小野寺
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Canon Medical Systems Corp
Original Assignee
Toshiba Corp
Toshiba Medical Systems Engineering Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Application filed by Toshiba Corp, Toshiba Medical Systems Engineering Co Ltd filed Critical Toshiba Corp
Priority to JP190599A priority Critical patent/JP4216387B2/ja
Publication of JP2000206255A publication Critical patent/JP2000206255A/ja
Publication of JP2000206255A5 publication Critical patent/JP2000206255A5/ja
Application granted granted Critical
Publication of JP4216387B2 publication Critical patent/JP4216387B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP190599A 1999-01-07 1999-01-07 Ｘ線検出器 Expired - Fee Related JP4216387B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP190599A JP4216387B2 (ja) 1999-01-07 1999-01-07 Ｘ線検出器

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP190599A JP4216387B2 (ja) 1999-01-07 1999-01-07 Ｘ線検出器

Publications (3)

Publication Number Publication Date
JP2000206255A JP2000206255A (ja) 2000-07-28
JP2000206255A5 JP2000206255A5 (enExample) 2006-02-23
JP4216387B2 true JP4216387B2 (ja) 2009-01-28

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JP190599A Expired - Fee Related JP4216387B2 (ja) 1999-01-07 1999-01-07 Ｘ線検出器

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JP (1) JP4216387B2 (enExample)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100428795B1 (ko) * 2000-11-24 2004-04-28 삼성전자주식회사 빠른 초기화를 수행하는 엑스선 검출기
JP2004037382A (ja) * 2002-07-05 2004-02-05 Toshiba Corp 放射線検出器及び放射線診断装置
JP4540301B2 (ja) * 2003-05-20 2010-09-08 三菱電機株式会社 放射線モニタ
US7091491B2 (en) * 2004-05-14 2006-08-15 General Electric Company Method and means for reducing electromagnetic noise induced in X-ray detectors
JP2009186268A (ja) * 2008-02-05 2009-08-20 Fujifilm Corp 画像検出装置
KR100969707B1 (ko) 2008-06-17 2010-07-14 주식회사바텍 Ｘ선 이미지센서의 옵셋 레벨 안정화방법
JP2011214886A (ja) * 2010-03-31 2011-10-27 Fujifilm Corp 放射線画像処理装置
KR101809542B1 (ko) 2011-12-26 2017-12-18 삼성전자주식회사 스위칭 회로, 이를 포함하는 전하량 검출 증폭기 및 광자 계수 검출 장치

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JP2000206255A (ja) 2000-07-28

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