JP4035016B2 - 表面プラズモン共鳴センサチップ、並びにそれを用いた試料の分析方法及び分析装置 - Google Patents

表面プラズモン共鳴センサチップ、並びにそれを用いた試料の分析方法及び分析装置 Download PDF

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Publication number
JP4035016B2
JP4035016B2 JP2002226494A JP2002226494A JP4035016B2 JP 4035016 B2 JP4035016 B2 JP 4035016B2 JP 2002226494 A JP2002226494 A JP 2002226494A JP 2002226494 A JP2002226494 A JP 2002226494A JP 4035016 B2 JP4035016 B2 JP 4035016B2
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Prior art keywords
diffraction grating
sensor chip
sample
light
reflected light
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Japanese (ja)
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JP2003121349A (ja
JP2003121349A5 (enExample
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孝明 宗林
英士 高山
一博 長池
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Mitsubishi Chemical Corp
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Mitsubishi Chemical Corp
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Publication of JP2003121349A5 publication Critical patent/JP2003121349A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/552—Attenuated total reflection
    • G01N21/553—Attenuated total reflection and using surface plasmons

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Optical Measuring Cells (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP2002226494A 2001-08-07 2002-08-02 表面プラズモン共鳴センサチップ、並びにそれを用いた試料の分析方法及び分析装置 Expired - Fee Related JP4035016B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2002226494A JP4035016B2 (ja) 2001-08-07 2002-08-02 表面プラズモン共鳴センサチップ、並びにそれを用いた試料の分析方法及び分析装置

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2001238884 2001-08-07
JP2001-238884 2001-08-07
JP2002226494A JP4035016B2 (ja) 2001-08-07 2002-08-02 表面プラズモン共鳴センサチップ、並びにそれを用いた試料の分析方法及び分析装置

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JP2003121349A JP2003121349A (ja) 2003-04-23
JP2003121349A5 JP2003121349A5 (enExample) 2005-10-27
JP4035016B2 true JP4035016B2 (ja) 2008-01-16

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10431505B2 (en) 2016-06-07 2019-10-01 Samsung Electronics Co., Ltd. Method of inspecting surface having a minute pattern based on detecting light reflected from metal layer on the surface

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPWO2005078415A1 (ja) * 2004-02-13 2007-10-18 オムロン株式会社 表面プラズモン共鳴センサー
JP4548416B2 (ja) * 2004-03-31 2010-09-22 オムロン株式会社 局在プラズモン共鳴センサ及び検査装置
JP2007010578A (ja) * 2005-07-01 2007-01-18 Sony Corp 表面プラズモン共鳴素子および表面プラズモン共鳴測定装置
JP5178049B2 (ja) * 2006-05-12 2013-04-10 キヤノン株式会社 標的物質検出素子、標的物質検出装置、及び標的物質検出方法
JP4891841B2 (ja) 2007-06-08 2012-03-07 浜松ホトニクス株式会社 分光モジュール
KR101491889B1 (ko) 2007-06-08 2015-02-11 하마마츠 포토닉스 가부시키가이샤 분광기
JP2009168469A (ja) * 2008-01-10 2009-07-30 Univ Of Tokyo Ｓｐｒセンサチップ及びこれを用いたｓｐｒセンサ
WO2010073605A1 (ja) * 2008-12-24 2010-07-01 株式会社日立ハイテクノロジーズ 蛍光検出装置
JP5621394B2 (ja) * 2009-11-19 2014-11-12 セイコーエプソン株式会社 センサーチップ、センサーカートリッジ及び分析装置
JP5589656B2 (ja) * 2009-12-11 2014-09-17 セイコーエプソン株式会社 センサーチップ、センサーカートリッジ及び分析装置
JP5669312B2 (ja) * 2011-03-31 2015-02-12 富士フイルム株式会社 検出方法および検出装置
FR2982027B1 (fr) * 2011-10-26 2014-01-03 Thibaut Mercey Puce microstructuree pour analyse par resonance des plasmons de surface, dispositif d'analyse comprenant ladite puce microstructuree et utilisation dudit dispositif
FR2982028B1 (fr) * 2011-10-26 2020-02-21 Aryballe Technologies Puce microstructuree comprenant des surfaces convexes pour analyse par resonance des plasmons de surface, dispositif d'analyse contenant ladite puce microstructuree et utilisation dudit dispositif
JP4990420B1 (ja) * 2012-04-04 2012-08-01 浜松ホトニクス株式会社 分光モジュールの製造方法
JP6183095B2 (ja) * 2013-09-20 2017-08-23 コニカミノルタ株式会社 イムノアッセイ分析方法およびイムノアッセイ分析装置
JP6076934B2 (ja) * 2014-03-26 2017-02-08 富士フイルム株式会社 光沢度測定方法及び装置
EP3232182A4 (en) * 2014-12-09 2018-03-21 Konica Minolta, Inc. Detection chip and detection method
JP6607635B2 (ja) * 2015-09-09 2019-11-20 学校法人 東洋大学 測定用器具
JP6704920B2 (ja) * 2015-10-14 2020-06-03 アルプスアルパイン株式会社 流路構造体および測定対象液体の測定装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10431505B2 (en) 2016-06-07 2019-10-01 Samsung Electronics Co., Ltd. Method of inspecting surface having a minute pattern based on detecting light reflected from metal layer on the surface

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