JP5920996B2 - 2次元試料配列を検出及び撮像するためのシステム及び方法 - Google Patents
2次元試料配列を検出及び撮像するためのシステム及び方法 Download PDFInfo
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Description
Claims (10)
- 2次元(2D)配列の干渉分光イメージングのための検出システムであって、
広帯域光源と、
試料の2次元配列を収容するように構成された複数の試料フィールドを有する検出面であって、検出面の1以上の部分が金属膜を含んでいて、広帯域光源からの光が、表面プラズモン共鳴(SPR)現象を生じる入射角で検出面に入射するように構成されている検出面と、
複数の試料フィールドの試料フィールドを解像するための位相差発生器であって、対照ビームと得られる試料ビームの間に経路長差を導入することによって対照ビームと得られる試料ビームに位相差を生じさせるように構成された位相差発生器と、
対照ビームと得られる試料ビームとを組み合わせる干渉計と、
組み合わされた対照ビームと得られる試料ビームを受けるように構成されたスペクトル的に分離された2次元検出器を備えるイメージング分光器であって、組み合わされた対照ビームと得られる試料ビームに基づいて試料の2次元配列における2以上の空間的に分離されたポイントを区別するように構成されたイメージング分光器と
を備える検出システム。 - 前記位相差発生器が、得られる試料ビーム又は対照ビームの経路内に配置され、前記位相差発生器が任意には誘電体材料、ガラス板の積層体又は液晶ディスプレイを備える、請求項1記載の検出システム。
- 前記位相差発生器が、厚さの異なる複数の部分を備えているか、或いは互いに屈折率の異なる複数の部分を有する平面構造体を備えている、請求項1又は請求項2記載の検出システム。
- 前記検出面が、基板上に配置された金属膜、基板上に配置されたナノ格子又はガラス基板に配置された金属膜を備える、請求項1乃至請求項3のいずれか1項記載の検出システム。
- 前記広帯域光源からのビームを試料ビームと対照ビームとに分割するように前記広帯域光源と動作可能に結合したビームスプリッタを更に備える、請求項1乃至請求項4のいずれか1項委記載の検出システム。
- 前記試料フィールドの間の前記検出面の少なくとも一部分上に配置された画定要素を更に備える、請求項1乃至請求項5のいずれか1項記載の検出システム。
- 前記検出面の複数の部分から反射された反射光ビームを少なくとも部分的に吸収するフィルタ要素を更に備える、請求項1乃至請求項6のいずれか1項記載の検出システム。
- 前記イメージング分光器が、回折格子と動作可能に結合した2次元検出器を備える、請求項1乃至請求項7のいずれか1項記載の検出システム。
- 2次元(2D)配列の試料を同時に撮像する方法であって、
広帯域光源を用いて試料ビーム及び対照ビームを用意するステップであって、試料ビームを表面プラズモン共鳴(SPR)現象を生じる入射角で用意するステップと、
前記試料ビームで前記2次元配列の試料を照射して、得られる試料ビームを生じさせるステップであって、金属膜を含む検出面上に前記2次元配列の試料が配置されている、ステップと、
前記対照ビーム又は得られる試料ビームの一方に経路長差を導入するステップと、
前記得られる試料ビームを対照ビームと干渉させて、干渉スペクトルを形成するステップと、
前記干渉スペクトルをスペクトル的に別々に取得するステップと、
前記取得した干渉スペクトルのフーリエ変換を用いて2次元配列の画像を再構成するステップと
を含む方法。 - 前記再構成するステップが、
前記干渉スペクトルの逆フーリエ変換を求めるステップと、
前記2次元配列の試料に対応する1以上の曲線を空間的に分離するために、前記干渉スペクトルをフィルタするステップと、
空間的位置に対応する周波数を取り出すために、フーリエ変換を適用するステップと
を含む、請求項9記載の方法。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US12/914,622 | 2010-10-28 | ||
US12/914,622 US8792102B2 (en) | 2010-10-28 | 2010-10-28 | Interferometric spectral imaging of a two-dimensional array of samples using surface plasmon resonance |
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