JP3974532B2 - ミクロトーム - Google Patents

ミクロトーム Download PDF

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Publication number
JP3974532B2
JP3974532B2 JP2002564564A JP2002564564A JP3974532B2 JP 3974532 B2 JP3974532 B2 JP 3974532B2 JP 2002564564 A JP2002564564 A JP 2002564564A JP 2002564564 A JP2002564564 A JP 2002564564A JP 3974532 B2 JP3974532 B2 JP 3974532B2
Authority
JP
Japan
Prior art keywords
holding device
microtome
sample holding
operating element
cutting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP2002564564A
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English (en)
Japanese (ja)
Other versions
JP2004522154A (ja
JP2004522154A5 (enExample
Inventor
ヘス，ハンス−ユルゲン
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hess Consult GmbH
Original Assignee
Hess Consult GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hess Consult GmbH filed Critical Hess Consult GmbH
Publication of JP2004522154A publication Critical patent/JP2004522154A/ja
Publication of JP2004522154A5 publication Critical patent/JP2004522154A5/ja
Application granted granted Critical
Publication of JP3974532B2 publication Critical patent/JP3974532B2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/02—Devices for withdrawing samples
    • G01N1/04—Devices for withdrawing samples in the solid state, e.g. by cutting
    • G01N1/06—Devices for withdrawing samples in the solid state, e.g. by cutting providing a thin slice, e.g. microtome
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/02—Devices for withdrawing samples
    • G01N1/04—Devices for withdrawing samples in the solid state, e.g. by cutting
    • G01N1/06—Devices for withdrawing samples in the solid state, e.g. by cutting providing a thin slice, e.g. microtome
    • G01N2001/065—Drive details
    • G01N2001/066—Drive details electric
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
    • G01N1/286—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q involving mechanical work, e.g. chopping, disintegrating, compacting, homogenising
    • G01N2001/2873—Cutting or cleaving
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T83/00—Cutting
    • Y10T83/061—With manually actuated means to disturb cyclic operation
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T83/00—Cutting
    • Y10T83/081—With randomly actuated stopping means
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T83/00—Cutting
    • Y10T83/141—With means to monitor and control operation [e.g., self-regulating means]
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T83/00—Cutting
    • Y10T83/647—With means to convey work relative to tool station
    • Y10T83/6492—Plural passes of diminishing work piece through tool station
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T83/00—Cutting
    • Y10T83/647—With means to convey work relative to tool station
    • Y10T83/6492—Plural passes of diminishing work piece through tool station
    • Y10T83/6499—Work rectilinearly reciprocated through tool station
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T83/00—Cutting
    • Y10T83/869—Means to drive or to guide tool
    • Y10T83/8765—Magnet- or solenoid-actuated tool

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Sampling And Sample Adjustment (AREA)
JP2002564564A 2001-02-09 2002-02-07 ミクロトーム Expired - Lifetime JP3974532B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE10106033A DE10106033A1 (de) 2001-02-09 2001-02-09 Mikrotom
PCT/DE2002/000438 WO2002065095A2 (de) 2001-02-09 2002-02-07 In zwei steuerungmodi betriebenes mikrotom

Publications (3)

Publication Number Publication Date
JP2004522154A JP2004522154A (ja) 2004-07-22
JP2004522154A5 JP2004522154A5 (enExample) 2005-12-22
JP3974532B2 true JP3974532B2 (ja) 2007-09-12

Family

ID=7673479

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2002564564A Expired - Lifetime JP3974532B2 (ja) 2001-02-09 2002-02-07 ミクロトーム

Country Status (8)

Country Link
US (2) US7111535B2 (enExample)
EP (1) EP1358462B1 (enExample)
JP (1) JP3974532B2 (enExample)
CN (1) CN1303412C (enExample)
AU (1) AU2002242625A1 (enExample)
DE (2) DE10106033A1 (enExample)
RU (1) RU2300092C2 (enExample)
WO (1) WO2002065095A2 (enExample)

Families Citing this family (28)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4953366B2 (ja) * 2006-02-13 2012-06-13 セイコーインスツル株式会社 薄切片作製装置、及び薄切片の作製方法
DE102006031136B3 (de) * 2006-07-03 2007-07-26 Leica Microsystems Nussloch Gmbh Kurbelantrieb einer Welle eines Mikrotoms
DE102006034879B3 (de) * 2006-07-25 2007-07-12 Leica Microsystems Nussloch Gmbh Mikrotom mit einer Hebelanordnung
DE102007023457B4 (de) * 2007-05-19 2009-05-20 Leica Biosystems Nussloch Gmbh Verfahren zur automatischen Annäherung eines dünn zu schneidenden Präparates an das Messer eines Mikrotoms
DE102007026844B4 (de) * 2007-06-06 2011-02-17 Leica Biosystems Nussloch Gmbh Vorrichtung zum Bremsen der Welle eines Mikrotoms
DE202007018047U1 (de) * 2007-12-27 2008-03-27 Leica Biosystems Nussloch Gmbh Mikrotom mit konzentrischen Bedienelementen zum Steuern einer Motoreinheit
CN101480801B (zh) * 2008-01-07 2010-08-25 致伸科技股份有限公司 具有自动模式及手动模式的裁纸装置
AT506233B1 (de) * 2008-01-18 2009-07-15 Leica Mikrosysteme Gmbh Mikromanipulator für ein kryomikrotom
DE102009006386B4 (de) * 2009-01-16 2011-04-14 HLT Handel, Logistik und Technologie GmbH Miktrotom
AT507572B1 (de) * 2009-07-31 2010-06-15 Leica Mikrosysteme Gmbh Verfahren zur segmentansteuerung einer messerschneide
CN201493868U (zh) * 2009-09-08 2010-06-02 南京德朔实业有限公司 电动剪刀
CN102672743A (zh) * 2011-03-11 2012-09-19 湖北孝感阔海医疗科技有限公司 高精度切片机自动进样机构
US8869666B2 (en) 2011-03-24 2014-10-28 Sakura Finetek U.S.A., Inc. Microtome with surface orientation sensor to sense orientation of surface of sample
US9032854B2 (en) 2011-12-21 2015-05-19 Sakura Finetek U.S.A., Inc. Reciprocating microtome drive system
CN104010860A (zh) 2011-12-22 2014-08-27 斯堪尼亚商用车有限公司 与确定参考值时的模式选择相关的模块和方法
BR112014012321A2 (pt) 2011-12-22 2017-05-30 Scania Cv Ab módulo e método pertencentes a escolha de modo quando determinando valores de referência
SE536271C2 (sv) 2011-12-22 2013-07-23 Scania Cv Ab Metod och modul för att styra ett fordons hastighet genom simulering
EP2794327A4 (en) 2011-12-22 2016-07-13 Scania Cv Ab Method and module for determining at least one reference value for a vehicle control system
US9193264B2 (en) * 2011-12-22 2015-11-24 Scania Cv Ab Method and module for determining of at least one reference value for a vehicle control system
RU2598494C2 (ru) 2011-12-22 2016-09-27 Сканиа Св Аб Способ и модуль для определения, по меньшей мере, одного опорного значения
ITVR20130005A1 (it) * 2013-01-11 2014-07-12 Diapath S P A Sistema di regolazione della velocita' di taglio di un microtomo automatico
CN104079221A (zh) * 2013-03-26 2014-10-01 北京全景多媒体信息系统公司 用于互动展品的无限制操作与线性伺服方法
DE102013110776B4 (de) * 2013-09-30 2015-05-13 Leica Biosystems Nussloch Gmbh Verfahren und Mikrotom zum Herstellen von Dünnschnitten mit einem Schnittprofilaufzeichnungsmodus
CN107374679A (zh) * 2017-08-16 2017-11-24 丁伟山 肠胃炎内窥镜活检检查装置
CN111417847A (zh) * 2017-11-30 2020-07-14 徕卡显微系统(上海)有限公司 控制机动切片机
CN109406194B (zh) * 2017-12-15 2024-08-09 北京市人工影响天气办公室 冰雹切片机
CN110328712B (zh) * 2019-06-28 2020-06-16 中国科学院自动化研究所 刀刃位置切换方法、装置及包括该装置的超薄切片机
CN111413342B (zh) * 2020-04-20 2021-03-26 华中科技大学 一种冰冻切片显微成像系统

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3496819A (en) * 1967-10-26 1970-02-24 Sorvall Inc Ivan Tissue sectioner
DE8100644U1 (de) 1981-01-14 1981-05-14 Ernst Leitz Wetzlar Gmbh, 6330 Wetzlar Mikrotomantrieb
DE3127266C2 (de) * 1981-07-10 1984-05-30 Bernhard Dr. 7801 Buchenbach Wolf Mikrotom
DE8129032U1 (de) 1981-10-03 1982-04-29 Dr. Johannes Heidenhain Gmbh, 8225 Traunreut Hand-Vorschubvorrichtung elektrischer Art
US4691151A (en) * 1985-01-30 1987-09-01 Cambridge Instruments Gmbh Microtome feed-motor control
DE8910071U1 (de) * 1989-08-23 1989-10-19 Microm Laborgeräte GmbH, 6902 Sandhausen Schlitten-Mikrotom
AT399226B (de) * 1990-04-11 1995-04-25 Sitte Hellmuth Automatische anschneidevorrichtung für mikrotome, insbesondere ultramikrotome
AT399227B (de) * 1990-04-11 1995-04-25 Sitte Hellmuth Vorrichtung zur steuerung des antriebes sowie des vorschubes eines mikrotoms, insbesondere ultramikrotoms
JPH05256745A (ja) * 1992-03-16 1993-10-05 Feather Safety Razor Co Ltd ミクロトーム
RU2141797C1 (ru) * 1998-08-03 1999-11-27 Дроздов Константин Александрович Медицинское устройство для обработки тканей (варианты)
DE19911005A1 (de) * 1999-03-12 2000-09-28 Leica Microsystems Verfahren zur Steuerung eines Scheibenmikrotoms
DE19911173C2 (de) * 1999-03-12 2002-01-31 Leica Microsystems Mikrotom mit einem motorischen Zustellantrieb
DE19911163C1 (de) * 1999-03-12 2000-07-20 Leica Microsystems Mikrotom

Also Published As

Publication number Publication date
JP2004522154A (ja) 2004-07-22
RU2003126577A (ru) 2005-01-27
EP1358462A2 (de) 2003-11-05
AU2002242625A1 (en) 2002-08-28
US7111535B2 (en) 2006-09-26
US20060037454A1 (en) 2006-02-23
DE10106033A1 (de) 2002-08-29
US20040149106A1 (en) 2004-08-05
US7044038B2 (en) 2006-05-16
RU2300092C2 (ru) 2007-05-27
WO2002065095A3 (de) 2003-01-23
DE50204020D1 (de) 2005-09-29
CN1630813A (zh) 2005-06-22
CN1303412C (zh) 2007-03-07
WO2002065095A2 (de) 2002-08-22
EP1358462B1 (de) 2005-08-24

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