JP3929285B2 - 基板検査装置 - Google Patents

基板検査装置 Download PDF

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Publication number
JP3929285B2
JP3929285B2 JP2001339938A JP2001339938A JP3929285B2 JP 3929285 B2 JP3929285 B2 JP 3929285B2 JP 2001339938 A JP2001339938 A JP 2001339938A JP 2001339938 A JP2001339938 A JP 2001339938A JP 3929285 B2 JP3929285 B2 JP 3929285B2
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Japan
Prior art keywords
inspection
heads
stage
head
glass substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP2001339938A
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English (en)
Japanese (ja)
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JP2003139721A (ja
JP2003139721A5 (enrdf_load_stackoverflow
Inventor
暢夫 藤崎
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Olympus Corp
Original Assignee
Olympus Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Olympus Corp filed Critical Olympus Corp
Priority to JP2001339938A priority Critical patent/JP3929285B2/ja
Priority to TW091132539A priority patent/TWI264532B/zh
Priority to PCT/JP2002/011507 priority patent/WO2003040711A1/ja
Priority to CNB028219295A priority patent/CN100368794C/zh
Priority to KR1020047006299A priority patent/KR100634652B1/ko
Publication of JP2003139721A publication Critical patent/JP2003139721A/ja
Publication of JP2003139721A5 publication Critical patent/JP2003139721A5/ja
Application granted granted Critical
Publication of JP3929285B2 publication Critical patent/JP3929285B2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Liquid Crystal (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP2001339938A 2001-11-05 2001-11-05 基板検査装置 Expired - Lifetime JP3929285B2 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2001339938A JP3929285B2 (ja) 2001-11-05 2001-11-05 基板検査装置
TW091132539A TWI264532B (en) 2001-11-05 2002-11-04 Substrate inspection device
PCT/JP2002/011507 WO2003040711A1 (fr) 2001-11-05 2002-11-05 Dispositif de controle de substrat
CNB028219295A CN100368794C (zh) 2001-11-05 2002-11-05 基板检查装置
KR1020047006299A KR100634652B1 (ko) 2001-11-05 2002-11-05 기판 검사 장치

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2001339938A JP3929285B2 (ja) 2001-11-05 2001-11-05 基板検査装置

Publications (3)

Publication Number Publication Date
JP2003139721A JP2003139721A (ja) 2003-05-14
JP2003139721A5 JP2003139721A5 (enrdf_load_stackoverflow) 2005-07-07
JP3929285B2 true JP3929285B2 (ja) 2007-06-13

Family

ID=19154212

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001339938A Expired - Lifetime JP3929285B2 (ja) 2001-11-05 2001-11-05 基板検査装置

Country Status (1)

Country Link
JP (1) JP3929285B2 (enrdf_load_stackoverflow)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006266722A (ja) * 2005-03-22 2006-10-05 Olympus Corp 基板検査システム及び基板検査方法
JP4704793B2 (ja) * 2005-04-06 2011-06-22 オリンパス株式会社 外観検査装置
JP4519705B2 (ja) * 2005-04-26 2010-08-04 株式会社堀場製作所 パネル部材検査装置及びそれに適用される位置情報補正プログラム
JP4578383B2 (ja) * 2005-10-25 2010-11-10 株式会社堀場製作所 パネル部材検査装置及びそれに適用されるパネル部材検査用プログラム
JP2007248714A (ja) * 2006-03-15 2007-09-27 Olympus Corp 複数ヘッド顕微鏡装置
JP2008014767A (ja) * 2006-07-05 2008-01-24 Olympus Corp 基板検査装置
JP2011099875A (ja) * 2011-02-18 2011-05-19 Olympus Corp 外観検査装置

Also Published As

Publication number Publication date
JP2003139721A (ja) 2003-05-14

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