JP3905475B2 - エンジン軸受の検査システム - Google Patents

エンジン軸受の検査システム Download PDF

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Publication number
JP3905475B2
JP3905475B2 JP2002521850A JP2002521850A JP3905475B2 JP 3905475 B2 JP3905475 B2 JP 3905475B2 JP 2002521850 A JP2002521850 A JP 2002521850A JP 2002521850 A JP2002521850 A JP 2002521850A JP 3905475 B2 JP3905475 B2 JP 3905475B2
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JP
Japan
Prior art keywords
mirror
inspection system
scanning
scanning mirror
fixed
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Expired - Fee Related
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JP2002521850A
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English (en)
Japanese (ja)
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JP2004522936A5 (enExample
JP2004522936A (ja
Inventor
チャン、ツィー−シュー
Original Assignee
オージー・テクノロジーズ・インコーポレイテッド
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Publication of JP2004522936A publication Critical patent/JP2004522936A/ja
Publication of JP2004522936A5 publication Critical patent/JP2004522936A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Mechanical Optical Scanning Systems (AREA)
  • Testing Of Engines (AREA)
  • Manufacture Of Motors, Generators (AREA)
  • Testing Of Balance (AREA)
JP2002521850A 2000-08-24 2001-08-22 エンジン軸受の検査システム Expired - Fee Related JP3905475B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US22753800P 2000-08-24 2000-08-24
US09/934,151 US6661506B2 (en) 2000-08-24 2001-08-21 Engine bearing inspection system
PCT/US2001/026222 WO2002016787A2 (en) 2000-08-24 2001-08-22 Engine bearing inspection system

Publications (3)

Publication Number Publication Date
JP2004522936A JP2004522936A (ja) 2004-07-29
JP2004522936A5 JP2004522936A5 (enExample) 2005-07-21
JP3905475B2 true JP3905475B2 (ja) 2007-04-18

Family

ID=26921527

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2002521850A Expired - Fee Related JP3905475B2 (ja) 2000-08-24 2001-08-22 エンジン軸受の検査システム

Country Status (7)

Country Link
US (1) US6661506B2 (enExample)
EP (1) EP1336302B1 (enExample)
JP (1) JP3905475B2 (enExample)
AT (1) ATE425451T1 (enExample)
AU (1) AU2001286623A1 (enExample)
DE (1) DE60137959D1 (enExample)
WO (1) WO2002016787A2 (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2003007879A2 (en) * 2001-07-16 2003-01-30 Depuy Products, Inc. Cartilage repair and regeneration scaffold and method
WO2011112675A1 (en) * 2010-03-09 2011-09-15 Federal-Mogul Corporation Bore inspection system and method of inspection therewith
CN107436307A (zh) * 2017-07-07 2017-12-05 柳州杰诺瑞汽车电器系统制造有限公司 视觉自动检测系统及其检测方法
SG11202101620UA (en) * 2018-08-21 2021-03-30 Waertsilae Finland Oy Method and apparatus for plain bearing crush height measurement
CN110470472B (zh) * 2019-09-20 2020-11-17 台州浙盛轴承科技有限公司 一种轴承内圈磨损程度检测设备

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IT1130474B (it) 1980-05-28 1986-06-11 Fiat Auto Spa Procedimento e dispositivo per l ispezione ed il controllo della superficie interna di un pezzo cilindrico cavo che ha subito una lavorazione meccanica
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US4527055A (en) * 1982-11-15 1985-07-02 Honeywell Inc. Apparatus for selectively viewing either of two scenes of interest
JPS60229006A (ja) * 1984-04-27 1985-11-14 Nec Corp 回転多面鏡の面倒れ角補正装置
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US4725883A (en) 1986-07-18 1988-02-16 Westinghouse Electric Corp. Optical profilometry system for tubular products
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US5008555A (en) 1988-04-08 1991-04-16 Eaton Leonard Technologies, Inc. Optical probe with overlapping detection fields
FR2631697B1 (fr) 1988-05-17 1991-07-26 Hispano Suiza Sa Appareil pour le controle optique du profil interne d'un tube ou d'un alesage
WO1990002310A1 (en) * 1988-08-26 1990-03-08 Libbey-Owens-Ford Co. Apparatus and method for inspecting glass sheets
JPH0762654B2 (ja) * 1988-10-25 1995-07-05 松下電器産業株式会社 実装基板検査装置
GB8908507D0 (en) 1989-04-14 1989-06-01 Fokker Aircraft Bv Method of and apparatus for non-destructive composite laminatecharacterisation
US5078955A (en) 1989-06-14 1992-01-07 Westinghouse Electric Corp. Control rod guide tube inspection system
JP3048168B2 (ja) 1990-07-19 2000-06-05 キヤノン株式会社 表面状態検査装置及びこれを備える露光装置
US5060063A (en) 1990-07-30 1991-10-22 Mpm Corporation Viewing and illuminating video probe with viewing means for simultaneously viewing object and device images along viewing axis and translating them along optical axis
US5245411A (en) 1991-09-03 1993-09-14 Stark Yttrium Optical instrument and conveyor for automated optical inspection machine and methods of operation
US5416589A (en) 1991-10-04 1995-05-16 Kms Fusion, Inc. Electro-optical system for gauging surface profile deviations
US5289267A (en) 1991-10-04 1994-02-22 Kms Fusion, Inc. Electro-optical system for gauging surface profile deviations
US5465153A (en) 1991-10-04 1995-11-07 Kms Fusion, Inc. Electro-optical system for gauging specular surface profile deviations
US5237444A (en) * 1992-06-26 1993-08-17 General Scanning, Inc. Optical scanning system
US5392113A (en) 1992-09-30 1995-02-21 Vlsi Technology, Inc. Semiconductor wafer defect monitoring
DE4304991C1 (de) * 1993-02-18 1994-10-20 Optel Mestechnik Gmbh Vorrichtung zur Vermessung der Lage und Orientierung von großflächigen Werkstücken
KR0138721B1 (ko) 1993-06-08 1998-05-15 가메다카 소키치 미세관내면 측정방법 및 장치(tube inner surface measuring method and apparatus)
JPH0783841A (ja) * 1993-09-16 1995-03-31 Fujitsu Ltd バイアホールの残渣検出装置および残渣観察装置
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JPH10267624A (ja) * 1997-03-27 1998-10-09 Ono Sokki Co Ltd 三次元形状測定装置
DE19714202A1 (de) * 1997-04-07 1998-10-15 Bosch Gmbh Robert Vorrichtung zum optischen Prüfen von Oberflächen
DE19717488C2 (de) * 1997-04-25 2003-05-15 Baumer Optronic Gmbh Vorrichtung zur Inspektion der Oberfläche von Objekten
US6002495A (en) * 1997-06-04 1999-12-14 Agfa Corporation Imaging system with moveable registration pins
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US6108025A (en) * 1997-09-29 2000-08-22 Eastman Kodak Company Optical scanner system having a laser beam power attentuation mechanism
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Also Published As

Publication number Publication date
AU2001286623A1 (en) 2002-03-04
DE60137959D1 (de) 2009-04-23
ATE425451T1 (de) 2009-03-15
US20020024658A1 (en) 2002-02-28
JP2004522936A (ja) 2004-07-29
WO2002016787A2 (en) 2002-02-28
EP1336302A2 (en) 2003-08-20
WO2002016787A3 (en) 2002-05-10
US6661506B2 (en) 2003-12-09
EP1336302B1 (en) 2009-03-11
EP1336302A4 (en) 2006-01-11

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