JP3899319B2 - 液処理装置及び液処理方法 - Google Patents
液処理装置及び液処理方法 Download PDFInfo
- Publication number
- JP3899319B2 JP3899319B2 JP2003005839A JP2003005839A JP3899319B2 JP 3899319 B2 JP3899319 B2 JP 3899319B2 JP 2003005839 A JP2003005839 A JP 2003005839A JP 2003005839 A JP2003005839 A JP 2003005839A JP 3899319 B2 JP3899319 B2 JP 3899319B2
- Authority
- JP
- Japan
- Prior art keywords
- cleaning liquid
- substrate
- discharge port
- liquid
- cleaning
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 239000007788 liquid Substances 0.000 title claims description 207
- 238000012545 processing Methods 0.000 title claims description 41
- 238000003672 processing method Methods 0.000 title claims description 8
- 238000004140 cleaning Methods 0.000 claims description 186
- 239000000758 substrate Substances 0.000 claims description 69
- 239000000126 substance Substances 0.000 claims description 40
- 238000000034 method Methods 0.000 claims description 25
- 238000007664 blowing Methods 0.000 claims description 5
- 239000004065 semiconductor Substances 0.000 claims description 5
- 238000007599 discharging Methods 0.000 claims description 4
- 238000000926 separation method Methods 0.000 claims 1
- 235000012431 wafers Nutrition 0.000 description 88
- 239000007789 gas Substances 0.000 description 64
- 238000012546 transfer Methods 0.000 description 15
- 239000010408 film Substances 0.000 description 12
- 239000003595 mist Substances 0.000 description 7
- 238000000576 coating method Methods 0.000 description 6
- 238000011161 development Methods 0.000 description 6
- 238000001035 drying Methods 0.000 description 6
- 230000002093 peripheral effect Effects 0.000 description 6
- 239000011248 coating agent Substances 0.000 description 5
- 230000001965 increasing effect Effects 0.000 description 4
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 230000003028 elevating effect Effects 0.000 description 3
- 238000010438 heat treatment Methods 0.000 description 3
- 239000010409 thin film Substances 0.000 description 3
- 230000015572 biosynthetic process Effects 0.000 description 2
- 238000001816 cooling Methods 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 229910001873 dinitrogen Inorganic materials 0.000 description 2
- 239000002245 particle Substances 0.000 description 2
- 239000011148 porous material Substances 0.000 description 2
- 238000005406 washing Methods 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- 238000013459 approach Methods 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 101150038956 cup-4 gene Proteins 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 238000011086 high cleaning Methods 0.000 description 1
- 239000011261 inert gas Substances 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 239000012528 membrane Substances 0.000 description 1
- 238000005192 partition Methods 0.000 description 1
- 229920002120 photoresistant polymer Polymers 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 238000010129 solution processing Methods 0.000 description 1
- 238000003756 stirring Methods 0.000 description 1
- 239000002344 surface layer Substances 0.000 description 1
- 238000011144 upstream manufacturing Methods 0.000 description 1
Images
Landscapes
- Coating Apparatus (AREA)
- Cleaning By Liquid Or Steam (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Cleaning In General (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2003005839A JP3899319B2 (ja) | 2003-01-14 | 2003-01-14 | 液処理装置及び液処理方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2003005839A JP3899319B2 (ja) | 2003-01-14 | 2003-01-14 | 液処理装置及び液処理方法 |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2004221244A JP2004221244A (ja) | 2004-08-05 |
JP2004221244A5 JP2004221244A5 (enrdf_load_stackoverflow) | 2005-07-28 |
JP3899319B2 true JP3899319B2 (ja) | 2007-03-28 |
Family
ID=32896397
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2003005839A Expired - Fee Related JP3899319B2 (ja) | 2003-01-14 | 2003-01-14 | 液処理装置及び液処理方法 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP3899319B2 (enrdf_load_stackoverflow) |
Families Citing this family (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20090081810A1 (en) * | 2004-10-06 | 2009-03-26 | Ebara Corporation | Substrate processing apparatus and substrate processing method |
JP4684858B2 (ja) * | 2005-11-10 | 2011-05-18 | 東京エレクトロン株式会社 | リンス処理方法、現像処理方法、現像処理装置、制御プログラムおよびコンピュータ読取可能な記憶媒体 |
JP2007220956A (ja) * | 2006-02-17 | 2007-08-30 | Toshiba Corp | 基板処理方法及び基板処理装置 |
JP4755573B2 (ja) | 2006-11-30 | 2011-08-24 | 東京応化工業株式会社 | 処理装置および処理方法、ならびに表面処理治具 |
KR101253499B1 (ko) | 2006-12-26 | 2013-04-11 | 주식회사 케이씨텍 | 약액 도포모듈 및 이를 이용한 약액 도포장치 |
JP5286857B2 (ja) * | 2008-03-18 | 2013-09-11 | トヨタ自動車株式会社 | 塗工ヘッド、塗工装置、およびメタルセパレータ基板の製造方法 |
US7849554B2 (en) | 2009-04-28 | 2010-12-14 | Lam Research Corporation | Apparatus and system for cleaning substrate |
JP5451662B2 (ja) * | 2011-02-15 | 2014-03-26 | 東京エレクトロン株式会社 | 液処理装置及び液処理方法 |
JP5227441B2 (ja) * | 2011-04-18 | 2013-07-03 | 東京応化工業株式会社 | 処理装置 |
JP5838067B2 (ja) | 2011-10-05 | 2015-12-24 | 株式会社Screenセミコンダクターソリューションズ | 塗布方法および塗布装置 |
DE102013003688A1 (de) * | 2012-10-26 | 2014-04-30 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Kombinationsdüse sowie Vorrichtung für den Auftrag eines viskosen Materials auf eine Bauteilkante |
JP6275984B2 (ja) * | 2013-09-27 | 2018-02-07 | 株式会社Screenホールディングス | 基板処理装置および基板処理方法 |
TWI569349B (zh) | 2013-09-27 | 2017-02-01 | 斯克林集團公司 | 基板處理裝置及基板處理方法 |
JP6443243B2 (ja) * | 2015-06-30 | 2018-12-26 | 東京エレクトロン株式会社 | 基板処理方法 |
JP6443242B2 (ja) * | 2015-06-30 | 2018-12-26 | 東京エレクトロン株式会社 | ノズル、処理液供給装置、液処理装置、及び処理液供給方法 |
KR101842125B1 (ko) * | 2015-12-28 | 2018-05-14 | 세메스 주식회사 | 기판 처리 장치 및 방법 |
JP7236318B2 (ja) * | 2019-04-26 | 2023-03-09 | 東京エレクトロン株式会社 | 液処理装置、及び液処理方法 |
-
2003
- 2003-01-14 JP JP2003005839A patent/JP3899319B2/ja not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
JP2004221244A (ja) | 2004-08-05 |
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