JP3897131B2 - 半導体装置及びその製造方法 - Google Patents

半導体装置及びその製造方法 Download PDF

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Publication number
JP3897131B2
JP3897131B2 JP21351496A JP21351496A JP3897131B2 JP 3897131 B2 JP3897131 B2 JP 3897131B2 JP 21351496 A JP21351496 A JP 21351496A JP 21351496 A JP21351496 A JP 21351496A JP 3897131 B2 JP3897131 B2 JP 3897131B2
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JP
Japan
Prior art keywords
electrode
forming
impurity region
semiconductor substrate
dielectric film
Prior art date
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Expired - Fee Related
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JP21351496A
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English (en)
Japanese (ja)
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JPH09116027A5 (enExample
JPH09116027A (ja
Inventor
金成奉
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Samsung Electronics Co Ltd
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Samsung Electronics Co Ltd
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Filing date
Publication date
Application filed by Samsung Electronics Co Ltd filed Critical Samsung Electronics Co Ltd
Publication of JPH09116027A publication Critical patent/JPH09116027A/ja
Publication of JPH09116027A5 publication Critical patent/JPH09116027A5/ja
Application granted granted Critical
Publication of JP3897131B2 publication Critical patent/JP3897131B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10B—ELECTRONIC MEMORY DEVICES
    • H10B12/00—Dynamic random access memory [DRAM] devices
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/80—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs
    • H10D84/811—Combinations of field-effect devices and one or more diodes, capacitors or resistors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/58—Structural electrical arrangements for semiconductor devices not otherwise provided for, e.g. in combination with batteries
    • H01L23/64—Impedance arrangements
    • H01L23/642—Capacitive arrangements
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10B—ELECTRONIC MEMORY DEVICES
    • H10B10/00—Static random access memory [SRAM] devices
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10B—ELECTRONIC MEMORY DEVICES
    • H10B10/00—Static random access memory [SRAM] devices
    • H10B10/12—Static random access memory [SRAM] devices comprising a MOSFET load element
    • H10B10/125—Static random access memory [SRAM] devices comprising a MOSFET load element the MOSFET being a thin film transistor [TFT]
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D1/00—Resistors, capacitors or inductors
    • H10D1/60—Capacitors
    • H10D1/68—Capacitors having no potential barriers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D88/00—Three-dimensional [3D] integrated devices

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  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Semiconductor Memories (AREA)
JP21351496A 1995-09-19 1996-08-13 半導体装置及びその製造方法 Expired - Fee Related JP3897131B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR1019950030681A KR0183739B1 (ko) 1995-09-19 1995-09-19 감결합 커패시터를 포함하는 반도체 장치 및 그 제조방법
KR95-30681 1995-09-19

Publications (3)

Publication Number Publication Date
JPH09116027A JPH09116027A (ja) 1997-05-02
JPH09116027A5 JPH09116027A5 (enExample) 2004-07-15
JP3897131B2 true JP3897131B2 (ja) 2007-03-22

Family

ID=19427199

Family Applications (1)

Application Number Title Priority Date Filing Date
JP21351496A Expired - Fee Related JP3897131B2 (ja) 1995-09-19 1996-08-13 半導体装置及びその製造方法

Country Status (3)

Country Link
US (1) US5851868A (enExample)
JP (1) JP3897131B2 (enExample)
KR (1) KR0183739B1 (enExample)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5739576A (en) * 1995-10-06 1998-04-14 Micron Technology, Inc. Integrated chip multilayer decoupling capacitors
US20010013660A1 (en) * 1999-01-04 2001-08-16 Peter Richard Duncombe Beol decoupling capacitor
JP2001125943A (ja) * 1999-10-28 2001-05-11 Nec Corp 電源デカップリング回路の設計方法および設計支援システム
US6232154B1 (en) * 1999-11-18 2001-05-15 Infineon Technologies North America Corp. Optimized decoupling capacitor using lithographic dummy filler
DE10035584A1 (de) * 2000-07-21 2002-01-31 Philips Corp Intellectual Pty Mobilfunkgerät
KR100442144B1 (ko) * 2001-12-20 2004-07-27 동부전자 주식회사 반도체 장치의 다층 커패시터 제조 방법
KR100437617B1 (ko) * 2002-05-03 2004-06-30 주식회사 하이닉스반도체 반도체 소자의 디커플링 캐피시터 형성방법
KR100479823B1 (ko) * 2002-07-19 2005-03-30 주식회사 하이닉스반도체 반도체소자의 디커플링 캐패시터 및 그 형성방법
KR100480603B1 (ko) * 2002-07-19 2005-04-06 삼성전자주식회사 일정한 커패시턴스를 갖는 금속-절연체-금속 커패시터를 포함하는 반도체 소자
KR100505658B1 (ko) * 2002-12-11 2005-08-03 삼성전자주식회사 ＭＩＭ(Ｍｅｔａｌ-Ｉｎｓｕｌａｔｏｒ-Ｍｅｔａｌ)커패시터를 갖는 반도체 소자
JP2005057254A (ja) * 2003-07-18 2005-03-03 Yamaha Corp 半導体装置
US7177135B2 (en) * 2003-09-23 2007-02-13 Samsung Electronics Co., Ltd. On-chip bypass capacitor and method of manufacturing the same
US6969880B2 (en) * 2003-09-24 2005-11-29 Texas Instruments Incorporated High capacitive density stacked decoupling capacitor structure
KR100665848B1 (ko) * 2005-03-21 2007-01-09 삼성전자주식회사 적층 타입 디커플링 커패시터를 갖는 반도체 장치
JP4908006B2 (ja) * 2006-02-03 2012-04-04 株式会社東芝 半導体装置
KR100764741B1 (ko) * 2006-06-08 2007-10-08 삼성전자주식회사 반도체 장치 및 그 형성 방법
US8497564B2 (en) * 2009-08-13 2013-07-30 Broadcom Corporation Method for fabricating a decoupling composite capacitor in a wafer and related structure
JP6445374B2 (ja) * 2015-04-01 2018-12-26 ローム株式会社 コンデンサ構造
US10468478B2 (en) 2017-10-26 2019-11-05 Taiwan Semiconductor Manufacturing Co., Ltd. Metal-insulator-metal (MIM) capacitor structure and method for forming the same
FR3080948B1 (fr) 2018-05-02 2025-01-17 St Microelectronics Rousset Circuit integre comprenant un element capacitif, et procede de fabrication

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0682783B2 (ja) * 1985-03-29 1994-10-19 三菱電機株式会社 容量およびその製造方法
US5472900A (en) * 1991-12-31 1995-12-05 Intel Corporation Capacitor fabricated on a substrate containing electronic circuitry
SE470415B (sv) * 1992-07-06 1994-02-14 Ericsson Telefon Ab L M Kondensator med hög kapacitans i ett integrerat funktionsblock eller en integrerad krets, förfarande för framställning av kondensatorn och användning av kondensatorn som en integrerad avkopplingskondensator
US5350705A (en) * 1992-08-25 1994-09-27 National Semiconductor Corporation Ferroelectric memory cell arrangement having a split capacitor plate structure
US5439840A (en) * 1993-08-02 1995-08-08 Motorola, Inc. Method of forming a nonvolatile random access memory capacitor cell having a metal-oxide dielectric

Also Published As

Publication number Publication date
KR0183739B1 (ko) 1999-03-20
US5851868A (en) 1998-12-22
KR970018562A (ko) 1997-04-30
JPH09116027A (ja) 1997-05-02

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