JP3482070B2 - 赤外線ガス分析計 - Google Patents
赤外線ガス分析計Info
- Publication number
- JP3482070B2 JP3482070B2 JP11009896A JP11009896A JP3482070B2 JP 3482070 B2 JP3482070 B2 JP 3482070B2 JP 11009896 A JP11009896 A JP 11009896A JP 11009896 A JP11009896 A JP 11009896A JP 3482070 B2 JP3482070 B2 JP 3482070B2
- Authority
- JP
- Japan
- Prior art keywords
- gas
- line
- analyzer
- infrared
- sample
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 20
- 238000001035 drying Methods 0.000 claims description 19
- 238000005259 measurement Methods 0.000 claims description 14
- 239000012530 fluid Substances 0.000 claims description 6
- 230000000694 effects Effects 0.000 claims description 5
- 239000007789 gas Substances 0.000 description 186
- 230000000052 comparative effect Effects 0.000 description 29
- 239000003054 catalyst Substances 0.000 description 12
- 230000003647 oxidation Effects 0.000 description 12
- 238000007254 oxidation reaction Methods 0.000 description 12
- 238000010521 absorption reaction Methods 0.000 description 4
- 238000011144 upstream manufacturing Methods 0.000 description 3
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- CURLTUGMZLYLDI-UHFFFAOYSA-N Carbon dioxide Chemical compound O=C=O CURLTUGMZLYLDI-UHFFFAOYSA-N 0.000 description 2
- UGFAIRIUMAVXCW-UHFFFAOYSA-N Carbon monoxide Chemical compound [O+]#[C-] UGFAIRIUMAVXCW-UHFFFAOYSA-N 0.000 description 2
- 229910002091 carbon monoxide Inorganic materials 0.000 description 2
- 239000002274 desiccant Substances 0.000 description 2
- 238000001514 detection method Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 229910001873 dinitrogen Inorganic materials 0.000 description 2
- 238000009434 installation Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- MYMOFIZGZYHOMD-UHFFFAOYSA-N Dioxygen Chemical compound O=O MYMOFIZGZYHOMD-UHFFFAOYSA-N 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 229910002092 carbon dioxide Inorganic materials 0.000 description 1
- 239000001569 carbon dioxide Substances 0.000 description 1
- 238000012937 correction Methods 0.000 description 1
- 229910001882 dioxygen Inorganic materials 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 230000001590 oxidative effect Effects 0.000 description 1
- 239000000741 silica gel Substances 0.000 description 1
- 229910002027 silica gel Inorganic materials 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3504—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
- G01N33/0004—Gaseous mixtures, e.g. polluted air
- G01N33/0006—Calibrating gas analysers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
- G01N33/0004—Gaseous mixtures, e.g. polluted air
- G01N33/0009—General constructional details of gas analysers, e.g. portable test equipment
- G01N33/0011—Sample conditioning
- G01N33/0014—Sample conditioning by eliminating a gas
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3504—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
- G01N2021/3545—Disposition for compensating effect of interfering gases
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11009896A JP3482070B2 (ja) | 1996-04-06 | 1996-04-06 | 赤外線ガス分析計 |
DE1997112823 DE19712823C2 (de) | 1996-04-06 | 1997-03-26 | Infrarot-Gasanalysator |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11009896A JP3482070B2 (ja) | 1996-04-06 | 1996-04-06 | 赤外線ガス分析計 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH09273991A JPH09273991A (ja) | 1997-10-21 |
JP3482070B2 true JP3482070B2 (ja) | 2003-12-22 |
Family
ID=14526990
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP11009896A Expired - Fee Related JP3482070B2 (ja) | 1996-04-06 | 1996-04-06 | 赤外線ガス分析計 |
Country Status (2)
Country | Link |
---|---|
JP (1) | JP3482070B2 (de) |
DE (1) | DE19712823C2 (de) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3336256B2 (ja) * | 1998-07-02 | 2002-10-21 | 日本酸素株式会社 | レーザ光によるガスの分光分析方法 |
DE19835335C1 (de) | 1998-08-05 | 1999-11-25 | Draeger Sicherheitstech Gmbh | Infrarotoptischer Gassensor |
DE19859211C2 (de) * | 1998-12-21 | 2001-04-26 | Grimm Aerosol Technik Gmbh & C | Einrichtung und Verfahren zum Bestimmen der Korngrößenverteilung und der Gesamtkonzentration von Partikeln in einem Probengasstrom |
DE10030134B4 (de) * | 2000-06-20 | 2004-01-08 | Grimm Aerosol Technik Gmbh & Co. Kg | Vorrichtung und Verfahren zur Bestimmung einer Konzentration von Mikroorganismen in einem Gas |
DE102009004278A1 (de) | 2009-01-05 | 2010-07-15 | Synthesechemie Dr. Penth Gmbh | Messgerät für geringe Kohlenwasserstoffkonzentrationen |
DE102010020110A1 (de) | 2010-05-10 | 2012-11-22 | Synthesechemie Gmbh | Gerät zum Erfassen und Verdünnen für geringe Kohlenwasserstoffkonzentrationen in Druckluft |
JP2017219499A (ja) * | 2016-06-10 | 2017-12-14 | 富士電機株式会社 | 赤外線ガス分析装置 |
WO2018105169A1 (ja) * | 2016-12-08 | 2018-06-14 | 株式会社堀場製作所 | ガス分析装置及びガス分析方法 |
JP7200519B2 (ja) * | 2018-07-06 | 2023-01-10 | 富士電機株式会社 | 赤外線ガス分析計 |
NL2022204B1 (nl) * | 2018-12-13 | 2020-07-03 | Green Vision Holding Bv | Werkwijze en inrichting voor het bepalen van de concentratie van een gasvormige verontreiniging in een productgas van zeer hoge zuiverheid |
WO2020237513A1 (zh) * | 2019-05-29 | 2020-12-03 | 深圳智人环保科技有限公司 | 一种消除环境温湿度变化影响的气体检测系统及其方法 |
WO2023218983A1 (ja) * | 2022-05-09 | 2023-11-16 | 株式会社堀場製作所 | 赤外線ガス分析計及び赤外線ガス分析方法 |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2049673A5 (de) * | 1969-06-17 | 1971-03-26 | Schlumberger Cie N | |
JPS5648822A (en) * | 1979-09-28 | 1981-05-02 | Iseki Agricult Mach | Dust discharging device of thresher |
DE4432940C2 (de) * | 1993-09-24 | 1997-10-02 | Fuji Electric Co Ltd | Infrarot-Gasanalysator |
-
1996
- 1996-04-06 JP JP11009896A patent/JP3482070B2/ja not_active Expired - Fee Related
-
1997
- 1997-03-26 DE DE1997112823 patent/DE19712823C2/de not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
DE19712823C2 (de) | 1999-05-20 |
DE19712823A1 (de) | 1997-10-30 |
JPH09273991A (ja) | 1997-10-21 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
LAPS | Cancellation because of no payment of annual fees |