JP3482070B2 - 赤外線ガス分析計 - Google Patents

赤外線ガス分析計

Info

Publication number
JP3482070B2
JP3482070B2 JP11009896A JP11009896A JP3482070B2 JP 3482070 B2 JP3482070 B2 JP 3482070B2 JP 11009896 A JP11009896 A JP 11009896A JP 11009896 A JP11009896 A JP 11009896A JP 3482070 B2 JP3482070 B2 JP 3482070B2
Authority
JP
Japan
Prior art keywords
gas
line
analyzer
infrared
sample
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP11009896A
Other languages
English (en)
Japanese (ja)
Other versions
JPH09273991A (ja
Inventor
二郎 坂井
博二 上坂
重之 秋山
敏和 大西
純治 加藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Horiba Ltd
Original Assignee
Horiba Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Horiba Ltd filed Critical Horiba Ltd
Priority to JP11009896A priority Critical patent/JP3482070B2/ja
Priority to DE1997112823 priority patent/DE19712823C2/de
Publication of JPH09273991A publication Critical patent/JPH09273991A/ja
Application granted granted Critical
Publication of JP3482070B2 publication Critical patent/JP3482070B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3504Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/0004Gaseous mixtures, e.g. polluted air
    • G01N33/0006Calibrating gas analysers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/0004Gaseous mixtures, e.g. polluted air
    • G01N33/0009General constructional details of gas analysers, e.g. portable test equipment
    • G01N33/0011Sample conditioning
    • G01N33/0014Sample conditioning by eliminating a gas
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3504Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
    • G01N2021/3545Disposition for compensating effect of interfering gases
JP11009896A 1996-04-06 1996-04-06 赤外線ガス分析計 Expired - Fee Related JP3482070B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP11009896A JP3482070B2 (ja) 1996-04-06 1996-04-06 赤外線ガス分析計
DE1997112823 DE19712823C2 (de) 1996-04-06 1997-03-26 Infrarot-Gasanalysator

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11009896A JP3482070B2 (ja) 1996-04-06 1996-04-06 赤外線ガス分析計

Publications (2)

Publication Number Publication Date
JPH09273991A JPH09273991A (ja) 1997-10-21
JP3482070B2 true JP3482070B2 (ja) 2003-12-22

Family

ID=14526990

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11009896A Expired - Fee Related JP3482070B2 (ja) 1996-04-06 1996-04-06 赤外線ガス分析計

Country Status (2)

Country Link
JP (1) JP3482070B2 (de)
DE (1) DE19712823C2 (de)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3336256B2 (ja) * 1998-07-02 2002-10-21 日本酸素株式会社 レーザ光によるガスの分光分析方法
DE19835335C1 (de) 1998-08-05 1999-11-25 Draeger Sicherheitstech Gmbh Infrarotoptischer Gassensor
DE19859211C2 (de) * 1998-12-21 2001-04-26 Grimm Aerosol Technik Gmbh & C Einrichtung und Verfahren zum Bestimmen der Korngrößenverteilung und der Gesamtkonzentration von Partikeln in einem Probengasstrom
DE10030134B4 (de) * 2000-06-20 2004-01-08 Grimm Aerosol Technik Gmbh & Co. Kg Vorrichtung und Verfahren zur Bestimmung einer Konzentration von Mikroorganismen in einem Gas
DE102009004278A1 (de) 2009-01-05 2010-07-15 Synthesechemie Dr. Penth Gmbh Messgerät für geringe Kohlenwasserstoffkonzentrationen
DE102010020110A1 (de) 2010-05-10 2012-11-22 Synthesechemie Gmbh Gerät zum Erfassen und Verdünnen für geringe Kohlenwasserstoffkonzentrationen in Druckluft
JP2017219499A (ja) * 2016-06-10 2017-12-14 富士電機株式会社 赤外線ガス分析装置
WO2018105169A1 (ja) * 2016-12-08 2018-06-14 株式会社堀場製作所 ガス分析装置及びガス分析方法
JP7200519B2 (ja) * 2018-07-06 2023-01-10 富士電機株式会社 赤外線ガス分析計
NL2022204B1 (nl) * 2018-12-13 2020-07-03 Green Vision Holding Bv Werkwijze en inrichting voor het bepalen van de concentratie van een gasvormige verontreiniging in een productgas van zeer hoge zuiverheid
WO2020237513A1 (zh) * 2019-05-29 2020-12-03 深圳智人环保科技有限公司 一种消除环境温湿度变化影响的气体检测系统及其方法
WO2023218983A1 (ja) * 2022-05-09 2023-11-16 株式会社堀場製作所 赤外線ガス分析計及び赤外線ガス分析方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2049673A5 (de) * 1969-06-17 1971-03-26 Schlumberger Cie N
JPS5648822A (en) * 1979-09-28 1981-05-02 Iseki Agricult Mach Dust discharging device of thresher
DE4432940C2 (de) * 1993-09-24 1997-10-02 Fuji Electric Co Ltd Infrarot-Gasanalysator

Also Published As

Publication number Publication date
DE19712823C2 (de) 1999-05-20
DE19712823A1 (de) 1997-10-30
JPH09273991A (ja) 1997-10-21

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