JP3013903B2 - Defect detection device for sheet glass - Google Patents

Defect detection device for sheet glass

Info

Publication number
JP3013903B2
JP3013903B2 JP3011169A JP1116991A JP3013903B2 JP 3013903 B2 JP3013903 B2 JP 3013903B2 JP 3011169 A JP3011169 A JP 3011169A JP 1116991 A JP1116991 A JP 1116991A JP 3013903 B2 JP3013903 B2 JP 3013903B2
Authority
JP
Japan
Prior art keywords
defect
glass
edge portion
camera
light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP3011169A
Other languages
Japanese (ja)
Other versions
JPH06258231A (en
Inventor
福江正亮
朗 松本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Central Glass Co Ltd
Original Assignee
Central Glass Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Central Glass Co Ltd filed Critical Central Glass Co Ltd
Priority to JP3011169A priority Critical patent/JP3013903B2/en
Publication of JPH06258231A publication Critical patent/JPH06258231A/en
Application granted granted Critical
Publication of JP3013903B2 publication Critical patent/JP3013903B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958Inspecting transparent materials or objects, e.g. windscreens
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
    • G01N2021/8967Discriminating defects on opposite sides or at different depths of sheet or rod

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【産業上の利用分野】本発明は、エッジ部分が面取りさ
れた板ガラスエッジの欠点、特にやけと呼ばれる欠点の
検出装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an apparatus for detecting a defect of a sheet glass edge whose edge portion is chamfered, particularly a defect called "burn".

【0002】[0002]

【従来技術とその問題点】リボン状ガラスは走行中に切
り筋を入れられ、折り割り装置によって切断される際に
傷が多数発生し、このままでは、加工時あるいは取りつ
け作業時等における安全性に問題があり、さらに強度低
下、商品価値低下をも招来するので、角部を断面V形状
のダイヤモンドホィールなどで面取り加工(シーミン
グ)される。
2. Description of the Related Art Ribbon-shaped glass is cut in the course of running and many scratches occur when it is cut by a folding device. There is a problem, and the strength and the commercial value are also reduced. Therefore, the corners are chamfered (seamed) with a diamond wheel having a V-shaped cross section.

【0003】このような加工を行っても、板ガラスのエ
ッジ部分に後述する図2におけるガラスの表面S1、S2
シーミング面M1、M2のコーナー部分A1、A2にははまか
け、びりはまと呼ばれる、引き剥がされた欠点が、シー
ミング面M1、M2と端面部分Tのコーナー部分B1、B2ある
いはシーミング面M1、M2には面取り時の研削具とガラス
の摩擦熱によってガラスが溶融して白っぽく見える筋状
などの傷が連続したやけと呼ばれる欠点が残ることがあ
った。
[0003] be carried out such processing, Hama the corner portion A 1, A 2 of the surface S 1 of the glass in FIG. 2, S 2 and seaming surface M 1, M 2, which will be described later to the edge portion of the glass sheet The disadvantages of peeling, called hangs and vibrations, are that the seaming surfaces M 1 , M 2 and the corners B 1 , B 2 of the end face portion T or the seaming surfaces M 1 , M 2 have grinding tools for chamfering. In some cases, a flaw called a continuous burn, in which streaks such as streaks appearing whitish when the glass is melted by frictional heat of the glass, remains.

【0004】このような欠点を検出する方法として、特
開平1-169343号、特開平1-189549号が提案されている。
しかしながら、いずれも面取りをされたエッジ部分の欠
点を検出するものではなく、仮に同装置で検出したとし
ても、ガラスエッジの垂直線上に光源とカメラを対向し
て配設し、透過光の暗信号により検出するものであり、
シーミング面M1、M2から端面部分T は磨りガラスとなっ
ており、不透明であるので、光源からの光は散乱され、
これらの欠点を検出するのは極めて困難であり、まして
やけの検出は不可能であった。
As methods for detecting such a defect, Japanese Patent Application Laid-Open Nos. 1-169343 and 1-189549 have been proposed.
However, none of these methods detect the defects at the chamfered edges, and even if they are detected by the same device, the light source and the camera are arranged facing each other on the vertical line of the glass edge, and the dark signal of the transmitted light is detected. Is to be detected by
Since the end surface portion T from the seaming surfaces M 1 and M 2 is frosted glass and opaque, light from the light source is scattered,
It was extremely difficult to detect these drawbacks, much less the detection of burns.

【0005】本発明はこのような点に鑑みてなされたも
のであり、やけの検出を正確に識別できる板ガラスエッ
ジ部分の欠点検出装置を提供することを目的とする。
[0005] The present invention has been made in view of such a point, and it is an object of the present invention to provide a defect detecting device for a sheet glass edge portion capable of accurately detecting burn detection.

【0006】[0006]

【問題点を解決するための手段】本発明はエッジ部分が
面取りされシーミング面を有するガラスを水平に裁置し
た状態で該エッジ部分の欠点を検出する装置において、
透過散乱光として検出する場合には、該エッジ部分に板
ガラスとは反対側の上下斜め方向の2方向から光を照射
する光源と、ガラスエッジに照射される光路の延長領域
の範囲外であって、板ガラス面とシーミング面の光源側
のコーナー部分を光の照射方向とは反対側から板ガラス
透明部分を介してエッジ部分を撮像する少なくとも2台
のカメラとを設け、該カメラが撮像した画像信号の明信
号の大きさによりやけ欠点を識別するようにしたことを
特徴とし、反射散乱光として検出する場合には、エッジ
部分における垂直面より板ガラスの反対側領域の上下2
方向から光を照射する光源と、該2方向から光が照射さ
れたエッジ部を直接撮像するカメラとを設け、該カメラ
が撮像した画像信号の明信号の大きさによりやけ欠点
識別するようにしたことを特徴とする。
SUMMARY OF THE INVENTION The present invention relates to an apparatus for detecting a defect of an edge portion of a glass having an edge portion chamfered and having a seaming surface horizontally placed.
When detecting as transmitted scattered light, a light source that irradiates the edge portion with light from two directions, that is, a vertical diagonal direction opposite to the sheet glass, and a light source that irradiates the glass edge are out of an extended range of an optical path. And at least two cameras for imaging the edge portion of the sheet glass surface and the corner portion on the light source side of the seaming surface from the side opposite to the light irradiation direction via the transparent portion of the sheet glass, and providing an image signal of the image captured by the camera. The method is characterized in that a burnt defect is identified based on the magnitude of a bright signal.
A light source that irradiates light from two directions, and a camera that directly captures an edge portion irradiated with light from the two directions, such that the defect is identified by the magnitude of a bright signal of an image signal captured by the camera. It is characterized by having done.

【0007】[0007]

【作用】やけと呼ばれる欠点はシーミング面M1、M2と端
面部分Tのコーナー部分B1、B2あるいはシーミング面
M1、M2の不透明部分に、面取り時の研削具とガラスの摩
擦熱によってガラスが溶融して生ずるもので白っぽく見
える筋状などの傷が連続した欠点であるが、光源とカメ
ラを板ガラスのエッジに向けて対向させて光源、板ガラ
スのエッジ部、カメラを一直線上に配設した従来の検出
装置で検出しても、この欠点が不透明部分に生じたもの
であるから、検出することができないものである。
[Action] The disadvantage called burnt is that the seaming surfaces M 1 and M 2 and the corner portions B 1 and B 2 of the end face portion T or the seaming surface.
Opaque portion of the M 1, M 2, a glass by frictional heat of grinding tool and the glass during the chamfering are drawbacks scratches are continuous, such as whitish streaks those caused by melting, the light source and camera of the glass sheet Even if the light source, the edge of the glass sheet, and the camera are arranged in a straight line so as to face the edge and are detected by a conventional detection device, the defect cannot be detected because the defect occurs in the opaque portion. Things.

【0008】本発明の検出装置は、光源とカメラを板ガ
ラスのエッジに向けて対向させて設けるものであるが、
ガラス、板ガラスのエッジ部、カメラを一直線上になら
ないように配設することにより、欠点部分における散乱
光を明信号をとして捉えるもので、図2に示すようにカ
メラを、板ガラス面とシーミング面の光源側のコーナー
部分に前記2方向からの光が照射される光路の延長領域
より板ガラス側に設けることにより、欠点がなければ、
不透明部分で散乱されカメラに入射する光量が低下し、
暗となるが、欠点があるとレンズ効果を示し明るく光る
ので明信号として捉えることができ、検出することがで
きるものである。
In the detection apparatus of the present invention, a light source and a camera are provided so as to face each other toward the edge of the glass sheet.
By arranging the glass, the edge of the sheet glass, and the camera so as not to be on a straight line, the scattered light at the defective portion is captured as a bright signal, and as shown in FIG. 2, the camera is moved between the sheet glass surface and the seaming surface. By providing the corner portion on the light source side on the plate glass side from the extended area of the optical path where light from the two directions is irradiated, if there is no defect,
The amount of light that is scattered by opaque parts and enters the camera decreases,
Although it becomes dark, if there is a defect, it shows a lens effect and shines brightly, so that it can be detected as a bright signal and can be detected.

【0009】また、エッジ部分における垂直面より反板
ガラス側の領域の上下2方向から光を照射する光源と、
該2方向から照射されたエッジ部を直接撮像するカメラ
と設け、該カメラが撮像した画像信号の明信号によって
も、すなわち反射散乱光を捉えることによっても、検出
することができる。
A light source for irradiating light from two directions, upper and lower, in a region on the side opposite to the sheet glass from the vertical plane at the edge portion;
A camera is provided that directly captures an edge portion irradiated from the two directions, and the detection can be performed by a bright signal of an image signal captured by the camera, that is, by capturing reflected scattered light.

【0010】[0010]

【実施例】以下、図面を参照しながら、本発明を詳細に
説明する。図1、図3はそれぞれ本発明の実施例1、実
施例2における欠点検出装置を示す要部概略図、図2は
実施例1の1部を詳細に示す要部概略図、図4は板ガラ
スエッジとカメラの走査線の関係を示す摸式図と得られ
た信号を処理する過程の信号波形を示すチャート図であ
る。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, the present invention will be described in detail with reference to the drawings. FIGS. 1 and 3 are schematic diagrams of a main part showing a defect detection apparatus according to the first and second embodiments of the present invention, FIG. 2 is a schematic diagram of a main part showing a part of the first embodiment in detail, and FIG. FIG. 2 is a schematic diagram showing a relationship between an edge and a scanning line of a camera, and a chart showing a signal waveform in a process of processing an obtained signal.

【0011】自動車用窓ガラスとして使用される台形の
板ガラスの検出装置について説明する。切断後面取りさ
れた直後の板ガラス1が図示しないコンベア上を搬送さ
れ、欠点検出装置の位置までくると光電管あるいはリ
ミットスイッチ等の作動により停止させ、この状態で欠
点検出を行う。
An apparatus for detecting a trapezoidal sheet glass used as an automobile window glass will be described. When the sheet glass 1 immediately after being cut and chamfered is conveyed on a conveyor (not shown) and reaches the position of the defect detection device 2 , it is stopped by the operation of a photoelectric tube or a limit switch, and defect detection is performed in this state.

【0012】実施例1 図1、図2、図4に示すように、散乱透過光により検出
する欠点検出装置について例示する。
Embodiment 1 As shown in FIGS. 1, 2 and 4, an example of a defect detecting device 2 for detecting by scattered transmitted light will be described.

【0013】欠点検出装置2は板ガラスとは反対側の上
下斜め方向の2方向からエッジ部分に照射する例えば半
導体レーザーなどの光源31、32、反射鏡4、板ガラスエ
ッジ部分を撮像する2台のカメラ51、52、例えば CCDエ
リアカメラで撮像されたビデオ信号に基づいて、明信号
を処理する微分回路、2値化回路、判定回路などを具備
するコントローラー61、62、パーソナルコンピューター
などの演算識別装置7から構成される。
The defect detecting device 2 includes two light sources 3 1 and 3 2 , such as semiconductor lasers, which irradiate an edge portion from two directions, that is, an obliquely upper and lower direction opposite to the plate glass, a reflecting mirror 4, and a plate glass edge portion. the camera 5 1, 5 2, for example, based on the captured video signal by the CCD area camera, a differentiating circuit for processing the light signal, binarizing circuit, the controller 61 having a like determination circuit, 6 2, a personal computer And the like.

【0014】光源31、32および反射鏡4は、光源からの
照射角度は水平面Hとの角度φ1 、φ2 で表すと、シー
ミング面は水平面Hに対してほぼ135 °に面取りされて
いるので、このシーミング面に対する垂直面V1 とする
とV1 ±20°の範囲、すなわちφ1 、φ2 が (45±20)
°の範囲、例えば55°の角度で入射するように配設す
る。
When the irradiation angles of the light sources 3 1 , 3 2 and the reflecting mirror 4 are represented by angles φ 1 and φ 2 with respect to the horizontal plane H, the seaming plane is chamfered to approximately 135 ° with respect to the horizontal plane H. because there, a vertical plane V 1 to the V 1 ± 20 ° range for the seaming surface, i.e. phi 1, phi 2 is (45 ± 20)
It is arranged so as to be incident at an angle of, for example, 55 °.

【0015】2台のカメラ51、52はガラスエッジに照射
される光路の延長線に対してエッジ部分からの角度が少
なくとも3°の領域(斜線部分)を外した範囲であっ
て、板ガラス面とシーミング面のコーナー部分を光の照
射方向とは反対側から板ガラス透明部分を介してエッジ
部分を撮像できる位置、すなわち、図2に示すように、
下側のやけを検出する場合には、板ガラス表面S1とシー
ミング面M1のコーナー部分A1と、シーミング面M2と端面
Tのコーナー部分B2とを結んだ直線面Lより板ガラス側
の範囲θ内に、例えば、水平面Hとの角度θ1 、θ2
約45°になるように配設する。
The two cameras 5 1 and 5 2 are provided in a range where an angle from the edge portion to the extension of the optical path irradiated to the glass edge is at least 3 ° (hatched portion) is excluded, and A position where the edge portion of the surface and the corner portion of the seaming surface can be imaged from the side opposite to the light irradiation direction via the transparent portion of the plate glass, that is, as shown in FIG.
When detecting the lower burn includes a corner portion A 1 of the glass sheet surface S 1 and the seaming surface M 1, the seaming surface M 2 and the corner portion B 2 and the connecting straight line surface L than the glass sheet side of the end surface T In the range θ, for example, the angles θ 1 and θ 2 with respect to the horizontal plane H are arranged to be about 45 °.

【0016】また、光源31、32、反射鏡4、カメラ51
52 は図1 に示す位置関係を保って板ガラス4辺のエッ
ジに沿って移動する駆動台(図示省略)に一体に設置す
る。以下、やけ欠点検出の手順について述べる。
Further, the light source 3 1, 3 2, reflector 4, the camera 5 1,
5 2 is placed integrally with the driving board (not shown) that keeps the positional relationship shown in FIG. 1 moves along the edges of the glass sheet 4 sides. Hereinafter, a procedure for detecting a burnt defect will be described.

【0017】カメラ51、52はエリアカメラであって、図
4(a) に示すように、走査線方向は板ガラスエッジとほ
ぼ平行に設定され、該カメラによって撮像されたビデオ
信号は、走査線sn について示すと図4(b)のようにな
る。
The camera 5 1, 5 2 is an area camera, as shown in FIG. 4 (a), the scanning line direction is set substantially parallel to the plate glass edge, video signals captured by the camera, scanning When shown on the line s n is as FIG. 4 (b).

【0018】ここでK1、K2はコーナー部分B2に生じた比
較的小さな欠点と比較的大きな欠点であり、図4(b)から
明らかなように欠点の幅に応じた明信号が得られる。各
走査線毎にこのようなビデオ信号が得られ、コントロー
ラー61、62に出力される。
Here, K 1 and K 2 are a relatively small defect and a relatively large defect generated in the corner portion B 2 , and a bright signal corresponding to the width of the defect is obtained as is apparent from FIG. Can be Such video signals for each scan line is obtained and output to the controller 6 and 62.

【0019】コントローラー61、62では、微分回路で各
走査線毎のビデオ信号が微分され、設定レベルSLを上回
ったか否かの2値化が2値化回路で行われる。走査線s
n については、微分信号と二値化信号はそれぞれ図4
(c) 、(d) のようになる。その後、コントローラー61
62の判定回路では、全走査線について二値化信号に基づ
いて走査線に沿った欠点幅xと走査線に垂直な欠点幅y
( 走査線sn については、走査線に沿った欠点幅x1
2 が図4(d) に示す) の最大値xmax とy max が演算
され、xmax が設定値、例えば2mm 以下かymax が設定
値、例えば1mm 以下のときには良品として、xmax が例
えば2mm を越え、しかもymax が例えば1mm 以下のとき
には欠点として演算識別装置7に出力される。この処理
はエッジの長さに換算して、例えば5〜10mmを1 ブロッ
クとしてブロック毎に行い、エッジ全周の欠点検出を行
う。
Controller 61, 6TwoIn the differentiation circuit,
The video signal for each scanning line is differentiated and exceeds the set level SL
Binarization is performed by a binarization circuit. Scan line s
n, The differential signal and the binarized signal are respectively shown in FIG.
(c) and (d). After that, controller 61,
6TwoIn the determination circuit of all the scanning lines, based on the binarized signal,
And the defect width x along the scanning line and the defect width y perpendicular to the scanning line
(Scan line snFor defect width x along the scan line1,
xTwoIs shown in Fig. 4 (d)).maxAnd y maxIs calculated
And xmaxIs a set value, for example,maxIs set
Value, for example, 1 mm or less, xmaxIs an example
For example, over 2mm and ymaxIs, for example, 1 mm or less
Is output to the operation identification device 7 as a defect. This process
Is the edge length, for example, 5-10 mm
Is performed for each block, and defects are detected around the entire edge.
U.

【0020】演算識別装置7では欠点として信号が入力
された場合に、この欠点信号が連続して入力されたかど
うかによって、やけかそれ以外の欠点かを識別するもの
である。例えば、欠点信号として入力された信号が連続
的に3回以上であればやけ欠点とし、2回以下であれ
ば、その他の欠点か良品と識別する。すなわち、やけ
は所定間隔、例えば10mmごとにxmax が例えば2mm を
越え、しかもymax が例えば1mm を越える欠点信号が少
なくとも1個以上存在する状態が3ブロック連続したと
きにやけ欠点と判定する。また、欠点信号として入力さ
れた信号が連続的に2回以下のときには、ガラス表面と
シーミング面のコーナー部分からシーミング面にかけて
かなり大きく欠けているはま欠点である場合か、良品の
範囲の欠点である。
When a signal is input as a defect, the operation identification device 7 identifies whether the defect is a burn or any other defect depending on whether or not the defect signal is continuously input. For example, if the signal input as the defect signal is continuous
If the number is three or more times , it is determined to be a burnt defect, and if the number is two or less, it is identified as another defect or a good product. In other words, burning missing
Point a predetermined interval, exceed x max, for example, 2mm for example, every 10 mm, moreover determines that burnt disadvantage when defect signal exceeding a y max, for example, 1mm is the possibility that there is at least one or more consecutive three blocks. Also input as a defect signal
When the number of the received signals is two or less consecutively, it is either a defect that is considerably large from the corner portion of the glass surface and the seaming surface to the seaming surface, or a defect in the range of good products.

【0021】実施例2 図3に示すように、反射散乱光により検出する欠点検出
装置について例示する。
Embodiment 2 As shown in FIG. 3, an example of a defect detection apparatus 2 for detecting by reflected scattered light will be described.

【0022】カメラの配置を変えて、エッジ上側のやけ
を下側のカメラ51で、エッジ下側のやけを上側のカメラ
52で撮像するようにした以外は実施例1と同じ構成にし
たものであり、同様の処理によりやけ欠点を他の欠点と
混同することなく、検出することができる。
[0022] changing the arrangement of the camera, the burning of the edge upper below the camera 5 1, the upper camera burning edge lower
5 2 except that as imaged with is obtained by the same configuration as in Example 1, without confusing the burning disadvantages and other disadvantages by the same process can be detected.

【0023】以上、好適な実施例により説明したが、本
発明はこれらに限定されるものではなく、種々の応用が
可能である。シーミング面について、実施例の約45°に
面取りしたもの以外にも、その他の角度で面取りしたも
の、あるいは円弧状の面取りしたものなどであってもよ
い。
Although the preferred embodiments have been described above, the present invention is not limited to these embodiments, and various applications are possible. As for the seaming surface, in addition to the chamfering at about 45 ° in the embodiment, a chamfering at another angle or an arc-shaped chamfering may be used.

【0024】実施例1のように透過散乱光で検出する
か、実施例2のように反射散乱光で検出するかについ
て、板ガラスに光が照射されたときに、その角度にもよ
るが、通常は反射する量より透過する量のほうがはるか
に大きいので、実施例1のように透過散乱光で検出する
方が好ましい。ただ、反射散乱光による検出も勿論可能
であり、この場合にガラスエッジの垂直面V2 より板ガ
ラスとは反対側の広い範囲に配置することができる。例
えば2つの光源を垂直面V2 上かやや反板ガラス側(実
施例2の光源31と反射鏡4の位置近傍)に配置して、水
平面H上に配設した1台のカメラで上下のエッジを検出
することも可能である。
Whether the detection is made by the transmitted scattered light as in the first embodiment or by the reflected scattered light as in the second embodiment depends on the angle when the sheet glass is irradiated with light. Since the amount of transmitted light is much larger than the amount of reflected light, it is preferable to detect the transmitted scattered light as in the first embodiment. However, a detected course possible due to the reflected scattered light, it can be arranged in a wide range of the side opposite to the glass sheet from the vertical plane V 2 of the glass edge in this case. For example, arranged in the two light sources vertical plane V 2 on or slightly counter-plate glass side (position near the light source 3 1 and the reflector 4 in Example 2), the upper and lower a single camera which is arranged on a horizontal plane H It is also possible to detect edges.

【0025】光源については半導体レーザー以外にも高
周波蛍光灯など各種の光源を使用することができる。光
が発散する光源を用いる場合には、各実施例の光源の位
置に1個の光源を設ければよい。2個の光源を用いる場
合には各実施例のように反射鏡を介して照射すると光強
度が低下するので、スペースがあれば一方の光源32は反
射鏡4の位置に設けた方がよい。
As the light source, various light sources such as a high-frequency fluorescent lamp can be used other than the semiconductor laser. When a light source that emits light is used, one light source may be provided at the position of the light source in each embodiment. Because light intensity decreases when the irradiation through the reflecting mirror as in the embodiment in case of using two light sources, one light source 3 2 If there is space is better provided at the position of the reflecting mirror 4 .

【0026】カメラについては、透過散乱光で検出する
場合には、最低2台、反射散乱光で検出する場合には最
低1台必要であるが、これ以上のカメラを設けて検出し
てもよいことは勿論である。
At least two cameras are required for detection by transmitted scattered light, and at least one camera is required for detection by reflected scattered light. However, more cameras may be provided. Of course.

【0027】カメラが撮像したビデオ信号に基づく処理
について、微分回路は必ずしもなくてもよいが、明暗の
傾向を拡大してS/N 比を高める点で設けた方が好まし
い。ただ、欠点幅を小さくするのは避けられないので、
その点を考慮して使う必要がある。また、設定レベルSL
や各種の設定値はどの程度のやけを検出するかによって
任意に設定すればよい。さらに増幅回路やエッジ不透明
部分の表面凹凸によるノイズを逓減させる積分回路など
を付加することができる。
The processing based on the video signal picked up by the camera does not necessarily require a differentiating circuit, but is preferably provided in that the tendency of light and darkness is enlarged to increase the S / N ratio. However, since it is inevitable to reduce the width of the defect,
It is necessary to use in consideration of that point. In addition, setting level SL
And various setting values may be arbitrarily set depending on how much burn is detected. Further, an amplifier circuit and an integration circuit for gradually reducing noise due to surface irregularities in the opaque edge portion can be added.

【0028】[0028]

【発明の効果】本発明の欠点検出装置は光源とカメラを
特異な位置に設けることにより、従来困難であったやけ
欠点の検出を他の欠点と混同することなく、正確に行う
ことができるものである。
According to the defect detecting apparatus of the present invention, by providing a light source and a camera at specific positions, it is possible to accurately detect a burnt defect, which was difficult in the past, without confusing it with other defects. It is.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の実施例1における欠点検出装置を示す
要部概略図である。
FIG. 1 is a schematic diagram illustrating a main part of a defect detection device according to a first embodiment of the present invention.

【図2】実施例1の1部を詳細に示す要部概略図であ
る。
FIG. 2 is a main part schematic diagram showing a part of Example 1 in detail.

【図3】実施例2における欠点検出装置を示す要部概略
図である。
FIG. 3 is a schematic diagram illustrating a main part of a defect detection device according to a second embodiment.

【図4】板ガラスエッジとカメラの走査線の関係を示す
摸式図と得られた信号を処理する過程の信号波形を示す
チャート図であり、(a) は摸式図(b) 、(c) 、(d) はそ
れぞれビデオ信号、微分信号、二値化信号を表す。
FIG. 4 is a schematic diagram showing the relationship between the edge of the glass plate and the scanning line of the camera, and a chart diagram showing signal waveforms in the process of processing the obtained signals, wherein (a) is a schematic diagram (b), (c) ) And (d) represent a video signal, a differential signal, and a binarized signal, respectively.

【符号の説明】[Explanation of symbols]

1 板ガラス 欠点検出装置 31、32 光源 51、52 カメラ 61、62 コントローラー 7 演算識別装置1 Flat glass 2 Defect detection device 3 1 , 3 2 Light source 5 1 , 5 2 Camera 6 1 , 6 2 Controller 7 Operation identification device

フロントページの続き (56)参考文献 特開 平1−189549(JP,A) 特開 平1−169343(JP,A) (58)調査した分野(Int.Cl.7,DB名) G01N 21/84 - 21/958 Continuation of the front page (56) References JP-A-1-189549 (JP, A) JP-A-1-169343 (JP, A) (58) Fields investigated (Int. Cl. 7 , DB name) G01N 21 / 84-21/958

Claims (2)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】エッジ部分が面取りされシーミング面を有
するガラスを水平に裁置した状態で該エッジ部分の欠点
を検出する装置において、該エッジ部分に板ガラスとは
反対側の上下斜め方向の2方向から光を照射する光源
と、ガラスエッジに照射される光路の延長領域の範囲外
であって、板ガラス面とシーミング面の光源側のコーナ
ー部分を光の照射方向とは反対側から板ガラス透明部分
を介してエッジ部分を撮像する少なくとも2台のカメラ
とを設け、該カメラが撮像した画像信号の明信号の大き
さによりやけ欠点を識別するようにしたことを特徴とす
る板ガラスの欠点検出装置。
An apparatus for detecting a defect of an edge portion in a state where glass having a seaming surface and having a chamfered edge portion is horizontally disposed, wherein the edge portion has two sides in a vertical and oblique direction opposite to a sheet glass. The light source that irradiates light from the outside and the light source side corners of the sheet glass surface and the seaming surface that are outside the range of the extended area of the optical path irradiated to the glass edge A defect detecting apparatus for a glass sheet, comprising: at least two cameras for capturing an image of an edge portion via a camera; and identifying a burnt defect based on a magnitude of a bright signal of an image signal captured by the camera.
【請求項2】エッジ部分が面取りされシーミング面を有
するガラスを水平に裁置した状態で該エッジ部分の欠点
を検出する装置において、エッジ部分における垂直面よ
り板ガラスの反対側領域の上下2方向から光を照射する
光源と、該2方向から光が照射されたエッジ部を直接撮
像するカメラとを設け、該カメラが撮像した画像信号の
明信号の大きさによりやけ欠点を識別するようにしたこ
とを特徴とする板ガラスの欠点検出装置。
2. An apparatus for detecting a defect of an edge portion in a state where glass having an edge portion is chamfered and having a seaming surface is horizontally placed, wherein the glass portion is located in a direction opposite to a vertical surface of the edge portion in a region opposite to the sheet glass from above and below. A light source for irradiating light; and a camera for directly imaging an edge portion irradiated with light from the two directions, and a burn defect is identified based on a magnitude of a bright signal of an image signal captured by the camera. A sheet glass defect detecting apparatus characterized by the above-mentioned.
JP3011169A 1991-01-31 1991-01-31 Defect detection device for sheet glass Expired - Fee Related JP3013903B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3011169A JP3013903B2 (en) 1991-01-31 1991-01-31 Defect detection device for sheet glass

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3011169A JP3013903B2 (en) 1991-01-31 1991-01-31 Defect detection device for sheet glass

Publications (2)

Publication Number Publication Date
JPH06258231A JPH06258231A (en) 1994-09-16
JP3013903B2 true JP3013903B2 (en) 2000-02-28

Family

ID=11770552

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3011169A Expired - Fee Related JP3013903B2 (en) 1991-01-31 1991-01-31 Defect detection device for sheet glass

Country Status (1)

Country Link
JP (1) JP3013903B2 (en)

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