JP2953737B2 - 複数ビット並列テスト回路を具備する半導体メモリ - Google Patents

複数ビット並列テスト回路を具備する半導体メモリ

Info

Publication number
JP2953737B2
JP2953737B2 JP2084006A JP8400690A JP2953737B2 JP 2953737 B2 JP2953737 B2 JP 2953737B2 JP 2084006 A JP2084006 A JP 2084006A JP 8400690 A JP8400690 A JP 8400690A JP 2953737 B2 JP2953737 B2 JP 2953737B2
Authority
JP
Japan
Prior art keywords
output
data
bit
match
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2084006A
Other languages
English (en)
Japanese (ja)
Other versions
JPH03283199A (ja
Inventor
和宏 中田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Electric Co Ltd filed Critical Nippon Electric Co Ltd
Priority to JP2084006A priority Critical patent/JP2953737B2/ja
Priority to DE69123875T priority patent/DE69123875T2/de
Priority to EP91104684A priority patent/EP0455977B1/en
Priority to US07/677,197 priority patent/US5079747A/en
Publication of JPH03283199A publication Critical patent/JPH03283199A/ja
Application granted granted Critical
Publication of JP2953737B2 publication Critical patent/JP2953737B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
    • G11C29/30—Accessing single arrays
    • G11C29/34—Accessing multiple bits simultaneously

Landscapes

  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Dram (AREA)
JP2084006A 1990-03-30 1990-03-30 複数ビット並列テスト回路を具備する半導体メモリ Expired - Fee Related JP2953737B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2084006A JP2953737B2 (ja) 1990-03-30 1990-03-30 複数ビット並列テスト回路を具備する半導体メモリ
DE69123875T DE69123875T2 (de) 1990-03-30 1991-03-25 Halbleiter-Speichereinrichtung mit auf parallelen Daten-Bits anwendbarer diagnostischer Einheit
EP91104684A EP0455977B1 (en) 1990-03-30 1991-03-25 Semiconductor memory device having diagnostic unit operable on parallel data bits
US07/677,197 US5079747A (en) 1990-03-30 1991-03-29 Semiconductor memory device having diagnostic unit operable on parallel data bits

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2084006A JP2953737B2 (ja) 1990-03-30 1990-03-30 複数ビット並列テスト回路を具備する半導体メモリ

Publications (2)

Publication Number Publication Date
JPH03283199A JPH03283199A (ja) 1991-12-13
JP2953737B2 true JP2953737B2 (ja) 1999-09-27

Family

ID=13818522

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2084006A Expired - Fee Related JP2953737B2 (ja) 1990-03-30 1990-03-30 複数ビット並列テスト回路を具備する半導体メモリ

Country Status (4)

Country Link
US (1) US5079747A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
EP (1) EP0455977B1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
JP (1) JP2953737B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
DE (1) DE69123875T2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001357700A (ja) * 2000-06-14 2001-12-26 Mitsubishi Electric Corp 半導体記憶装置
JP2006114192A (ja) * 2004-10-15 2006-04-27 Hynix Semiconductor Inc バンク内のセルをテストするためのデータ出力コンプレス回路及びその方法

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2549209B2 (ja) * 1991-01-23 1996-10-30 株式会社東芝 半導体記憶装置
KR950001293B1 (ko) * 1992-04-22 1995-02-15 삼성전자주식회사 반도체 메모리칩의 병렬테스트 회로
US5377144A (en) * 1993-07-27 1994-12-27 Texas Instruments Inc. Memory array reconfiguration for testing
KR0168896B1 (ko) * 1993-09-20 1999-02-01 세키자와 다다시 패리티에 의해 에러를 수정할 수 있는 반도체 메모리장치
US5655113A (en) * 1994-07-05 1997-08-05 Monolithic System Technology, Inc. Resynchronization circuit for a memory system and method of operating same
JPH08203278A (ja) * 1995-01-25 1996-08-09 Sony Corp 半導体メモリ
JP2746222B2 (ja) * 1995-08-31 1998-05-06 日本電気株式会社 半導体記憶装置
JP2004234770A (ja) * 2003-01-31 2004-08-19 Renesas Technology Corp 半導体記憶装置とテスト方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4287577A (en) * 1979-09-27 1981-09-01 Communications Satellite Corporation Interleaved TDMA terrestrial interface buffer
JP2523586B2 (ja) * 1987-02-27 1996-08-14 株式会社日立製作所 半導体記憶装置
US4967394A (en) * 1987-09-09 1990-10-30 Kabushiki Kaisha Toshiba Semiconductor memory device having a test cell array
JPH02226589A (ja) * 1989-02-27 1990-09-10 Nec Corp 半導体記憶装置
JPH0359899A (ja) * 1989-07-27 1991-03-14 Nec Corp 半導体メモリ

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001357700A (ja) * 2000-06-14 2001-12-26 Mitsubishi Electric Corp 半導体記憶装置
JP2006114192A (ja) * 2004-10-15 2006-04-27 Hynix Semiconductor Inc バンク内のセルをテストするためのデータ出力コンプレス回路及びその方法

Also Published As

Publication number Publication date
EP0455977A3 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1995-02-08
DE69123875D1 (de) 1997-02-13
EP0455977A2 (en) 1991-11-13
DE69123875T2 (de) 1997-06-26
JPH03283199A (ja) 1991-12-13
US5079747A (en) 1992-01-07
EP0455977B1 (en) 1997-01-02

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