JP2523740Y2 - Ｉｃ基板の検査位置割り出し装置 - Google Patents

Ｉｃ基板の検査位置割り出し装置

Info

Publication number
JP2523740Y2
JP2523740Y2 JP14851789U JP14851789U JP2523740Y2 JP 2523740 Y2 JP2523740 Y2 JP 2523740Y2 JP 14851789 U JP14851789 U JP 14851789U JP 14851789 U JP14851789 U JP 14851789U JP 2523740 Y2 JP2523740 Y2 JP 2523740Y2
Authority
JP
Japan
Prior art keywords
camera
indexing
inspection
moving
board
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP14851789U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0388339U (en, 2012
Inventor
隆弘 山本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Lossev Technology Corp
Original Assignee
Lossev Technology Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Lossev Technology Corp filed Critical Lossev Technology Corp
Priority to JP14851789U priority Critical patent/JP2523740Y2/ja
Publication of JPH0388339U publication Critical patent/JPH0388339U/ja
Application granted granted Critical
Publication of JP2523740Y2 publication Critical patent/JP2523740Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices By Optical Means (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP14851789U 1989-12-22 1989-12-22 Ｉｃ基板の検査位置割り出し装置 Expired - Lifetime JP2523740Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14851789U JP2523740Y2 (ja) 1989-12-22 1989-12-22 Ｉｃ基板の検査位置割り出し装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14851789U JP2523740Y2 (ja) 1989-12-22 1989-12-22 Ｉｃ基板の検査位置割り出し装置

Publications (2)

Publication Number Publication Date
JPH0388339U JPH0388339U (en, 2012) 1991-09-10
JP2523740Y2 true JP2523740Y2 (ja) 1997-01-29

Family

ID=31694962

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14851789U Expired - Lifetime JP2523740Y2 (ja) 1989-12-22 1989-12-22 Ｉｃ基板の検査位置割り出し装置

Country Status (1)

Country Link
JP (1) JP2523740Y2 (en, 2012)

Also Published As

Publication number Publication date
JPH0388339U (en, 2012) 1991-09-10

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