JP2523740Y2 - IC board inspection position determination device - Google Patents

Description

DETAILED DESCRIPTION OF THE INVENTION [Industrial Application Field] The present invention relates to an apparatus for determining an inspection position of an IC substrate.

[Conventional technology]

During the manufacturing process of the IC substrate, the soldering state and the like are inspected. Normally, an IC substrate is set on an XY table, is imaged by an image processing camera or the like while determining an inspection position, and is inspected in the field of image processing.

In a conventional inspection device, an IC board to be inspected is placed on a table that can be indexed in the XY direction, images are taken from above by a fixed camera, and the XY table is moved in a predetermined direction for each inspection position. ing.

[Problems of the prior art]

If the size of the IC board is, for example, about 500 × 500 [mm], the dimension required for indexing and moving the table is twice that size.
It becomes 1000 × 1000 [mm] or more. For this reason, the indexing device becomes large.

On the other hand, in order to speed up the inspection work, it is required to fix the IC substrate and to shorten the indexing work time. Since there is a limit to the moving speed at the time of indexing, when the size of the table is increased, the indexing time is lengthened, and the demand for shortening the moving time cannot be met.

[Purpose of the invention]

Therefore, an object of the present invention is to reduce the indexing time of the table and reduce the indexing mechanism.

[Solution of the invention]

In view of this, the present invention provides a table for mounting an IC substrate on a base so as to be movable in the XY direction, and a camera for image processing above the table is also movable in the XY direction. Can be simultaneously driven by the index driving means and the rotation controller.

[Action of the invention]

The inspection position is set in advance depending on the type of the IC substrate. The rotation controller simultaneously drives the table index driving unit and the camera index driving unit according to an index program suitable for the inspection position. Therefore, in the process of indexing from the current inspection position to the next inspection position, the rotation controller drives the indexing drive means of the table to move the next inspection point on the IC board in the direction of the camera, and The camera is moved to the next inspection point by driving the indexing driving means. As a result, the table and the camera relatively simultaneously move in the direction approaching the inspection point.
Therefore, the time required for the indexing movement can be shortened, and the indexing drive portion of the table in the XY direction can be reduced in size.

〔Example〕

FIG. 1 is an apparatus 1 for determining an inspection position of an IC substrate according to the present invention.
2 shows a mechanical configuration of the first embodiment.

The inspection position indexing device 1 includes a table 3 on a base 2.
And an image processing camera 4 above the table 3. The table 3 is mounted on the upper surface of the base 2 by the index driving means 5 so as to be movable in the X and Y directions. Also, the camera 4
Above the table 3, the support 6 is attached downward so as to be movable in the X and Y directions by a support 6 attached to the side surface of the base 2 and an index driving means 7 incorporated in the horizontal portion of the support 6.

Next, FIG. 2 shows the connection relationship between the indexing drive means 5, 7 and the rotation controller 12.

The indexing driving means 5 and 7 are assembled by feed screw units and feed belt units in the X and Y directions, and are driven by motors 8, 9, 10, and 11 for each direction. And the rotation controller
12 is connected to respective motors 8, 9, 10, 11 via drivers 13, 14, 15, 16;

At the time of inspection, the IC substrate 17 to be inspected is placed on the table 3 and is fixed in a positioning state by an appropriate clamp means. Thereafter, the rotation controller 12 controls the drivers 13, 14 in order to sequentially place one or more inspection points preset according to the type of the IC board 17 in the field of view of the camera 4.
, The motors 8 and 9 are driven to control the amount of rotation, and the table 3 is moved via the index driving means 5,
The inspection point as the next indexing point of the IC board 17 is moved in the direction of the optical axis of the camera 4, and at the same time, the rotation amounts of the motors 10 and 11 are controlled, and the optical axis of the camera 4 is In the direction of the inspection point. As a result, the table 3 moves the next inspection point on the IC board 17 in the direction of the camera 4, and at the same time, the camera 4 also moves in a direction relatively approaching in that direction. Accordingly, the moving amount required for each of the table 3 and the camera 4 may be about half of the case where only one of them is moved. Therefore, the moving amount necessary for the indexing driving means 5 and 7 is also small, and the configuration can be downsized. . Further, since the moving amount required for each of the indexing driving means 5 and 7 is small, the time required for the indexing movement can be shortened. However, the amount of movement of the table 3 and the amount of movement of the camera 4 are not necessarily equal to each other, and may be distributed so that the table 3 is moved more on the side where the moving load is smaller. Such movement distribution, acceleration, maximum speed, and the like are set in advance by the rotation controller 12.

In addition, in the indexing state, the point to be inspected only needs to be within the field of view of the camera 4, so that even if the relative positioning accuracy between the table 3 and the camera 4 is low, there is no substantial problem in the inspection work.

[Effect of the invention]

In the present invention, when determining the inspection position of the IC board, the table is moved to move the IC board in the direction of the field of view of the camera, and at the same time, the camera itself is relatively moved toward the direction of the inspection point. The required time can be shortened, the size of the table required for indexing can be reduced over the entire area of the IC substrate, and the moving amount required for indexing is small on each indexing drive side, so the drive mechanism can be downsized accordingly .

[Brief description of the drawings]

FIG. 1 is a perspective view of the IC board inspection apparatus of the present invention, and FIG. 2 is a block diagram of a connection portion between a rotation controller and a motor. 1 ... IC board inspection position indexing device
3 ... table, 4 ... camera, 5 ... index driving means, 6 ... support, 7 ... index driving means, 8,
9, 10, 11 ... motor, 12 ... rotation controller, 13, 14, 1
5, 16: Driver, 17: IC board.

Claims (1)

(57) [Scope of request for utility model registration] 1. A base (2) and an IC substrate mounting table (3) movable on the upper surface of the base (2) in the XY direction.
Index driving means (5) for moving the table (3) in the XY direction by motors (8, 9) for each direction;
An image processing camera (4) movable in the X and Y directions above the table (3), and indexing driving means (10 and 11) for moving the camera (4) in the X and Y directions for each direction ( 7) When the inspection point of the IC board (17) on the table (3) is coincident with the optical axis of the camera (4), the inspection point of the IC board (17) on the table (3) and the camera are determined. Index drive for moving the motor (8, 9) of the index drive means (5) for moving the table (3) for mounting the IC substrate and the camera (4) so that the optical axis of (4) is close to each other. A rotation controller (12) for simultaneously driving the motors (10, 11) of the means (7); and a position indexing device (1) for IC substrate inspection.