JP2024083377A5 - - Google Patents

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Publication number
JP2024083377A5
JP2024083377A5 JP2024050247A JP2024050247A JP2024083377A5 JP 2024083377 A5 JP2024083377 A5 JP 2024083377A5 JP 2024050247 A JP2024050247 A JP 2024050247A JP 2024050247 A JP2024050247 A JP 2024050247A JP 2024083377 A5 JP2024083377 A5 JP 2024083377A5
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JP
Japan
Prior art keywords
transistor
wiring
memory cell
drain
source
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP2024050247A
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English (en)
Japanese (ja)
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JP2024083377A (ja
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Publication date
Priority claimed from PCT/IB2019/059906 external-priority patent/WO2020152522A1/ja
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Publication of JP2024083377A publication Critical patent/JP2024083377A/ja
Publication of JP2024083377A5 publication Critical patent/JP2024083377A5/ja
Withdrawn legal-status Critical Current

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JP2024050247A 2019-01-25 2024-03-26 半導体装置 Withdrawn JP2024083377A (ja)

Applications Claiming Priority (12)

Application Number Priority Date Filing Date Title
JP2019011690 2019-01-25
JP2019011688 2019-01-25
JP2019011691 2019-01-25
JP2019011692 2019-01-25
JP2019011691 2019-01-25
JP2019011688 2019-01-25
JP2019011690 2019-01-25
JP2019011692 2019-01-25
JP2019013505 2019-01-29
JP2019013505 2019-01-29
PCT/IB2019/059906 WO2020152522A1 (ja) 2019-01-25 2019-11-19 半導体装置および当該半導体装置を有する電気機器
JP2020567657A JP7462575B2 (ja) 2019-01-25 2019-11-19 半導体装置

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
JP2020567657A Division JP7462575B2 (ja) 2019-01-25 2019-11-19 半導体装置

Publications (2)

Publication Number Publication Date
JP2024083377A JP2024083377A (ja) 2024-06-21
JP2024083377A5 true JP2024083377A5 (enExample) 2024-07-30

Family

ID=71736829

Family Applications (2)

Application Number Title Priority Date Filing Date
JP2020567657A Active JP7462575B2 (ja) 2019-01-25 2019-11-19 半導体装置
JP2024050247A Withdrawn JP2024083377A (ja) 2019-01-25 2024-03-26 半導体装置

Family Applications Before (1)

Application Number Title Priority Date Filing Date
JP2020567657A Active JP7462575B2 (ja) 2019-01-25 2019-11-19 半導体装置

Country Status (6)

Country Link
US (1) US12426378B2 (enExample)
JP (2) JP7462575B2 (enExample)
KR (1) KR20210120003A (enExample)
CN (1) CN113330552A (enExample)
TW (2) TW202537448A (enExample)
WO (1) WO2020152522A1 (enExample)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7330986B2 (ja) * 2018-08-31 2023-08-22 株式会社半導体エネルギー研究所 半導体装置及び半導体装置の動作方法
US12225705B2 (en) 2019-02-22 2025-02-11 Semiconductor Energy Laboratory Co., Ltd. Memory device having error detection function, semiconductor device, and electronic device
KR20220050134A (ko) 2019-08-22 2022-04-22 가부시키가이샤 한도오따이 에네루기 켄큐쇼 메모리 셀 및 기억 장치
CN115274664B (zh) * 2021-04-30 2025-09-16 华为技术有限公司 一种三维存储器、芯片封装结构及电子设备
TWI807494B (zh) * 2021-11-19 2023-07-01 鯨鏈科技股份有限公司 晶圓對晶圓技術之輸入及輸出電路與使用其晶片裝置
US12014796B2 (en) * 2022-02-11 2024-06-18 Taiwan Semiconductor Manufacturing Company, Ltd. Memory device and method of operating the same
WO2023242665A1 (ja) 2022-06-16 2023-12-21 株式会社半導体エネルギー研究所 半導体装置
CN115103510A (zh) * 2022-06-20 2022-09-23 山东大学 对称内植压电智能层的复合材料智能结构及其制备方法
CN117352489A (zh) 2022-06-21 2024-01-05 长鑫存储技术有限公司 半导体结构及其制造方法、存储芯片、电子设备
US20240032281A1 (en) * 2022-07-20 2024-01-25 Invention And Collaboration Laboratory Pte. Ltd. Memory cell structure
TW202431604A (zh) * 2022-09-09 2024-08-01 日商半導體能源研究所股份有限公司 半導體裝置
WO2024079575A1 (ja) 2022-10-13 2024-04-18 株式会社半導体エネルギー研究所 半導体装置
WO2024089570A1 (ja) * 2022-10-28 2024-05-02 株式会社半導体エネルギー研究所 半導体装置
CN116863974B (zh) * 2023-09-05 2023-11-21 北京超弦存储器研究院 半导体器件及电子设备
WO2025219839A1 (ja) * 2024-04-19 2025-10-23 株式会社半導体エネルギー研究所 半導体装置及びその駆動方法
CN118314936B (zh) * 2024-06-06 2024-09-06 北京超弦存储器研究院 存储器及访问方法、电子设备

Family Cites Families (22)

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Publication number Priority date Publication date Assignee Title
JP3603229B2 (ja) 1994-02-09 2004-12-22 富士通株式会社 半導体記憶装置
JP2000312005A (ja) 1999-02-26 2000-11-07 Seiko Epson Corp 半導体装置の製造方法及び電気光学装置の製造方法並びに半導体装置及び電気光学装置
JP3399432B2 (ja) 1999-02-26 2003-04-21 セイコーエプソン株式会社 電気光学装置の製造方法及び電気光学装置
US6687147B2 (en) 2002-04-02 2004-02-03 Hewlett-Packard Development Company, L.P. Cubic memory array with diagonal select lines
US6643159B2 (en) 2002-04-02 2003-11-04 Hewlett-Packard Development Company, L.P. Cubic memory array
WO2012029638A1 (en) 2010-09-03 2012-03-08 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
JP2012256821A (ja) 2010-09-13 2012-12-27 Semiconductor Energy Lab Co Ltd 記憶装置
TWI539453B (zh) 2010-09-14 2016-06-21 半導體能源研究所股份有限公司 記憶體裝置和半導體裝置
TWI574259B (zh) 2010-09-29 2017-03-11 半導體能源研究所股份有限公司 半導體記憶體裝置和其驅動方法
TWI541981B (zh) 2010-11-12 2016-07-11 半導體能源研究所股份有限公司 半導體裝置
US8513773B2 (en) 2011-02-02 2013-08-20 Semiconductor Energy Laboratory Co., Ltd. Capacitor and semiconductor device including dielectric and N-type semiconductor
JP2013065638A (ja) * 2011-09-15 2013-04-11 Elpida Memory Inc 半導体装置
KR102107591B1 (ko) 2012-07-18 2020-05-07 가부시키가이샤 한도오따이 에네루기 켄큐쇼 기억 소자 및 프로그래머블 로직 디바이스
JP6347704B2 (ja) 2013-09-18 2018-06-27 株式会社半導体エネルギー研究所 半導体装置
US9653611B2 (en) 2014-03-07 2017-05-16 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
JP6560508B2 (ja) 2014-03-13 2019-08-14 株式会社半導体エネルギー研究所 半導体装置
TWI767772B (zh) 2014-04-10 2022-06-11 日商半導體能源研究所股份有限公司 記憶體裝置及半導體裝置
WO2015170220A1 (en) 2014-05-09 2015-11-12 Semiconductor Energy Laboratory Co., Ltd. Memory device and electronic device
US9583177B2 (en) 2014-12-10 2017-02-28 Semiconductor Energy Laboratory Co., Ltd. Memory device and semiconductor device including memory device
US9589611B2 (en) 2015-04-01 2017-03-07 Semiconductor Energy Laboratory Co., Ltd. Memory device, semiconductor device, and electronic device
US9728243B2 (en) * 2015-05-11 2017-08-08 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device or electronic component including the same
US9627034B2 (en) 2015-05-15 2017-04-18 Semiconductor Energy Laboratory Co., Ltd. Electronic device

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