JP2023543732A - 表面修飾されたシリカ粒子およびかかる粒子を含む組成物 - Google Patents
表面修飾されたシリカ粒子およびかかる粒子を含む組成物 Download PDFInfo
- Publication number
- JP2023543732A JP2023543732A JP2023518346A JP2023518346A JP2023543732A JP 2023543732 A JP2023543732 A JP 2023543732A JP 2023518346 A JP2023518346 A JP 2023518346A JP 2023518346 A JP2023518346 A JP 2023518346A JP 2023543732 A JP2023543732 A JP 2023543732A
- Authority
- JP
- Japan
- Prior art keywords
- silica particles
- modified silica
- alkoxyorganosilane
- composition
- substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01B—NON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
- C01B33/00—Silicon; Compounds thereof
- C01B33/113—Silicon oxides; Hydrates thereof
- C01B33/12—Silica; Hydrates thereof, e.g. lepidoic silicic acid
- C01B33/14—Colloidal silica, e.g. dispersions, gels, sols
- C01B33/146—After-treatment of sols
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01B—NON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
- C01B33/00—Silicon; Compounds thereof
- C01B33/113—Silicon oxides; Hydrates thereof
- C01B33/12—Silica; Hydrates thereof, e.g. lepidoic silicic acid
- C01B33/14—Colloidal silica, e.g. dispersions, gels, sols
- C01B33/146—After-treatment of sols
- C01B33/149—Coating
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09G—POLISHING COMPOSITIONS; SKI WAXES
- C09G1/00—Polishing compositions
- C09G1/02—Polishing compositions containing abrasives or grinding agents
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P52/00—Grinding, lapping or polishing of wafers, substrates or parts of devices
- H10P52/40—Chemomechanical polishing [CMP]
- H10P52/403—Chemomechanical polishing [CMP] of conductive or resistive materials
Landscapes
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Dispersion Chemistry (AREA)
- Inorganic Chemistry (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Silicon Compounds (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP20306085.0 | 2020-09-23 | ||
| EP20306085 | 2020-09-23 | ||
| PCT/EP2021/075868 WO2022063742A1 (en) | 2020-09-23 | 2021-09-21 | Surface-modified silica particles and compositions comprising such particles |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2023543732A true JP2023543732A (ja) | 2023-10-18 |
| JP2023543732A5 JP2023543732A5 (https=) | 2025-12-11 |
Family
ID=72840437
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2023518346A Pending JP2023543732A (ja) | 2020-09-23 | 2021-09-21 | 表面修飾されたシリカ粒子およびかかる粒子を含む組成物 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US20230374346A1 (https=) |
| EP (1) | EP4217312A1 (https=) |
| JP (1) | JP2023543732A (https=) |
| KR (1) | KR20230070232A (https=) |
| CN (1) | CN116323485A (https=) |
| TW (1) | TWI902906B (https=) |
| WO (1) | WO2022063742A1 (https=) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2025210929A1 (ja) * | 2024-04-05 | 2025-10-09 | 株式会社アドマテックス | 球状複合酸化物粒子材料及びその製造方法、スラリー組成物並びに透明樹脂組成物 |
Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008512871A (ja) * | 2004-09-08 | 2008-04-24 | プラックセアー エス.ティ.テクノロジー、 インコーポレイテッド | メタレート変性シリカ粒子を含有する水性スラリー |
| JP2011020208A (ja) * | 2009-07-15 | 2011-02-03 | Hitachi Chem Co Ltd | Cmp研磨液及びこのcmp研磨液を用いた研磨方法 |
| JP2017122134A (ja) * | 2014-05-22 | 2017-07-13 | 日立化成株式会社 | 金属膜用研磨液及びそれを用いた研磨方法 |
| JP2017128504A (ja) * | 2011-03-14 | 2017-07-27 | アクゾ ノーベル ケミカルズ インターナショナル ベスローテン フエンノートシャップAkzo Nobel Chemicals International B.V. | 改質シリカ粒子 |
| US20190211228A1 (en) * | 2018-01-09 | 2019-07-11 | Cabot Microelectronics Corporation | Tungsten bulk polishing method with improved topography |
| JP2019135297A (ja) * | 2013-05-15 | 2019-08-15 | ビーエーエスエフ ソシエタス・ヨーロピアBasf Se | N−ビニル−ホモポリマーおよびn−ビニルコポリマーからなる群から選択される1種または複数のポリマーを含む化学機械研磨組成物 |
| US20190375643A1 (en) * | 2018-06-12 | 2019-12-12 | Evonik Degussa Gmbh | Increased particle loading by surface modification with polyethersilane |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| PL3319906T3 (pl) * | 2015-07-10 | 2022-01-31 | Evonik Operations Gmbh | Zawierająca SiO2 dyspersja o wysokiej stabilności soli |
| EP3368633B1 (en) * | 2015-10-26 | 2020-05-27 | Evonik Operations GmbH | Method of obtaining mineral oil using a silica fluid |
| US9783702B1 (en) * | 2016-10-19 | 2017-10-10 | Rohm And Haas Electronic Materials Cmp Holdings Inc. | Aqueous compositions of low abrasive silica particles |
| US10647887B2 (en) * | 2018-01-08 | 2020-05-12 | Cabot Microelectronics Corporation | Tungsten buff polishing compositions with improved topography |
| US20200102475A1 (en) * | 2018-09-28 | 2020-04-02 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Chemical mecahnical polishing composition and method of polishing silcon dioxide over silicon nitiride |
| US10759970B2 (en) * | 2018-12-19 | 2020-09-01 | Fujifilm Electronic Materials U.S.A., Inc. | Polishing compositions and methods of using same |
| US11198797B2 (en) | 2019-01-24 | 2021-12-14 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Chemical mechanical polishing compositions having stabilized abrasive particles for polishing dielectric substrates |
-
2021
- 2021-09-21 WO PCT/EP2021/075868 patent/WO2022063742A1/en not_active Ceased
- 2021-09-21 CN CN202180064555.0A patent/CN116323485A/zh active Pending
- 2021-09-21 KR KR1020237011384A patent/KR20230070232A/ko active Pending
- 2021-09-21 JP JP2023518346A patent/JP2023543732A/ja active Pending
- 2021-09-21 US US18/027,720 patent/US20230374346A1/en active Pending
- 2021-09-21 EP EP21777548.5A patent/EP4217312A1/en active Pending
- 2021-09-22 TW TW110135028A patent/TWI902906B/zh active
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008512871A (ja) * | 2004-09-08 | 2008-04-24 | プラックセアー エス.ティ.テクノロジー、 インコーポレイテッド | メタレート変性シリカ粒子を含有する水性スラリー |
| JP2011020208A (ja) * | 2009-07-15 | 2011-02-03 | Hitachi Chem Co Ltd | Cmp研磨液及びこのcmp研磨液を用いた研磨方法 |
| JP2017128504A (ja) * | 2011-03-14 | 2017-07-27 | アクゾ ノーベル ケミカルズ インターナショナル ベスローテン フエンノートシャップAkzo Nobel Chemicals International B.V. | 改質シリカ粒子 |
| JP2019135297A (ja) * | 2013-05-15 | 2019-08-15 | ビーエーエスエフ ソシエタス・ヨーロピアBasf Se | N−ビニル−ホモポリマーおよびn−ビニルコポリマーからなる群から選択される1種または複数のポリマーを含む化学機械研磨組成物 |
| JP2017122134A (ja) * | 2014-05-22 | 2017-07-13 | 日立化成株式会社 | 金属膜用研磨液及びそれを用いた研磨方法 |
| US20190211228A1 (en) * | 2018-01-09 | 2019-07-11 | Cabot Microelectronics Corporation | Tungsten bulk polishing method with improved topography |
| US20190375643A1 (en) * | 2018-06-12 | 2019-12-12 | Evonik Degussa Gmbh | Increased particle loading by surface modification with polyethersilane |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2025210929A1 (ja) * | 2024-04-05 | 2025-10-09 | 株式会社アドマテックス | 球状複合酸化物粒子材料及びその製造方法、スラリー組成物並びに透明樹脂組成物 |
Also Published As
| Publication number | Publication date |
|---|---|
| EP4217312A1 (en) | 2023-08-02 |
| TWI902906B (zh) | 2025-11-01 |
| CN116323485A (zh) | 2023-06-23 |
| TW202219208A (zh) | 2022-05-16 |
| KR20230070232A (ko) | 2023-05-22 |
| WO2022063742A1 (en) | 2022-03-31 |
| US20230374346A1 (en) | 2023-11-23 |
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