JP2023543732A - 表面修飾されたシリカ粒子およびかかる粒子を含む組成物 - Google Patents

表面修飾されたシリカ粒子およびかかる粒子を含む組成物 Download PDF

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Publication number
JP2023543732A
JP2023543732A JP2023518346A JP2023518346A JP2023543732A JP 2023543732 A JP2023543732 A JP 2023543732A JP 2023518346 A JP2023518346 A JP 2023518346A JP 2023518346 A JP2023518346 A JP 2023518346A JP 2023543732 A JP2023543732 A JP 2023543732A
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Japan
Prior art keywords
silica particles
modified silica
alkoxyorganosilane
composition
substrate
Prior art date
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Pending
Application number
JP2023518346A
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English (en)
Japanese (ja)
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JP2023543732A5 (https=
Inventor
ジャキノート,エリック
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Merck Patent GmbH
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Merck Patent GmbH
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Publication date
Application filed by Merck Patent GmbH filed Critical Merck Patent GmbH
Publication of JP2023543732A publication Critical patent/JP2023543732A/ja
Publication of JP2023543732A5 publication Critical patent/JP2023543732A5/ja
Pending legal-status Critical Current

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    • CCHEMISTRY; METALLURGY
    • C01INORGANIC CHEMISTRY
    • C01BNON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
    • C01B33/00Silicon; Compounds thereof
    • C01B33/113Silicon oxides; Hydrates thereof
    • C01B33/12Silica; Hydrates thereof, e.g. lepidoic silicic acid
    • C01B33/14Colloidal silica, e.g. dispersions, gels, sols
    • C01B33/146After-treatment of sols
    • CCHEMISTRY; METALLURGY
    • C01INORGANIC CHEMISTRY
    • C01BNON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
    • C01B33/00Silicon; Compounds thereof
    • C01B33/113Silicon oxides; Hydrates thereof
    • C01B33/12Silica; Hydrates thereof, e.g. lepidoic silicic acid
    • C01B33/14Colloidal silica, e.g. dispersions, gels, sols
    • C01B33/146After-treatment of sols
    • C01B33/149Coating
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09GPOLISHING COMPOSITIONS; SKI WAXES
    • C09G1/00Polishing compositions
    • C09G1/02Polishing compositions containing abrasives or grinding agents
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P52/00Grinding, lapping or polishing of wafers, substrates or parts of devices
    • H10P52/40Chemomechanical polishing [CMP]
    • H10P52/403Chemomechanical polishing [CMP] of conductive or resistive materials

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  • Chemical & Material Sciences (AREA)
  • Organic Chemistry (AREA)
  • Dispersion Chemistry (AREA)
  • Inorganic Chemistry (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Silicon Compounds (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
JP2023518346A 2020-09-23 2021-09-21 表面修飾されたシリカ粒子およびかかる粒子を含む組成物 Pending JP2023543732A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP20306085.0 2020-09-23
EP20306085 2020-09-23
PCT/EP2021/075868 WO2022063742A1 (en) 2020-09-23 2021-09-21 Surface-modified silica particles and compositions comprising such particles

Publications (2)

Publication Number Publication Date
JP2023543732A true JP2023543732A (ja) 2023-10-18
JP2023543732A5 JP2023543732A5 (https=) 2025-12-11

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
JP2023518346A Pending JP2023543732A (ja) 2020-09-23 2021-09-21 表面修飾されたシリカ粒子およびかかる粒子を含む組成物

Country Status (7)

Country Link
US (1) US20230374346A1 (https=)
EP (1) EP4217312A1 (https=)
JP (1) JP2023543732A (https=)
KR (1) KR20230070232A (https=)
CN (1) CN116323485A (https=)
TW (1) TWI902906B (https=)
WO (1) WO2022063742A1 (https=)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2025210929A1 (ja) * 2024-04-05 2025-10-09 株式会社アドマテックス 球状複合酸化物粒子材料及びその製造方法、スラリー組成物並びに透明樹脂組成物

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008512871A (ja) * 2004-09-08 2008-04-24 プラックセアー エス.ティ.テクノロジー、 インコーポレイテッド メタレート変性シリカ粒子を含有する水性スラリー
JP2011020208A (ja) * 2009-07-15 2011-02-03 Hitachi Chem Co Ltd Cmp研磨液及びこのcmp研磨液を用いた研磨方法
JP2017122134A (ja) * 2014-05-22 2017-07-13 日立化成株式会社 金属膜用研磨液及びそれを用いた研磨方法
JP2017128504A (ja) * 2011-03-14 2017-07-27 アクゾ ノーベル ケミカルズ インターナショナル ベスローテン フエンノートシャップAkzo Nobel Chemicals International B.V. 改質シリカ粒子
US20190211228A1 (en) * 2018-01-09 2019-07-11 Cabot Microelectronics Corporation Tungsten bulk polishing method with improved topography
JP2019135297A (ja) * 2013-05-15 2019-08-15 ビーエーエスエフ ソシエタス・ヨーロピアBasf Se N−ビニル−ホモポリマーおよびn−ビニルコポリマーからなる群から選択される1種または複数のポリマーを含む化学機械研磨組成物
US20190375643A1 (en) * 2018-06-12 2019-12-12 Evonik Degussa Gmbh Increased particle loading by surface modification with polyethersilane

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
PL3319906T3 (pl) * 2015-07-10 2022-01-31 Evonik Operations Gmbh Zawierająca SiO2 dyspersja o wysokiej stabilności soli
EP3368633B1 (en) * 2015-10-26 2020-05-27 Evonik Operations GmbH Method of obtaining mineral oil using a silica fluid
US9783702B1 (en) * 2016-10-19 2017-10-10 Rohm And Haas Electronic Materials Cmp Holdings Inc. Aqueous compositions of low abrasive silica particles
US10647887B2 (en) * 2018-01-08 2020-05-12 Cabot Microelectronics Corporation Tungsten buff polishing compositions with improved topography
US20200102475A1 (en) * 2018-09-28 2020-04-02 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Chemical mecahnical polishing composition and method of polishing silcon dioxide over silicon nitiride
US10759970B2 (en) * 2018-12-19 2020-09-01 Fujifilm Electronic Materials U.S.A., Inc. Polishing compositions and methods of using same
US11198797B2 (en) 2019-01-24 2021-12-14 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Chemical mechanical polishing compositions having stabilized abrasive particles for polishing dielectric substrates

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008512871A (ja) * 2004-09-08 2008-04-24 プラックセアー エス.ティ.テクノロジー、 インコーポレイテッド メタレート変性シリカ粒子を含有する水性スラリー
JP2011020208A (ja) * 2009-07-15 2011-02-03 Hitachi Chem Co Ltd Cmp研磨液及びこのcmp研磨液を用いた研磨方法
JP2017128504A (ja) * 2011-03-14 2017-07-27 アクゾ ノーベル ケミカルズ インターナショナル ベスローテン フエンノートシャップAkzo Nobel Chemicals International B.V. 改質シリカ粒子
JP2019135297A (ja) * 2013-05-15 2019-08-15 ビーエーエスエフ ソシエタス・ヨーロピアBasf Se N−ビニル−ホモポリマーおよびn−ビニルコポリマーからなる群から選択される1種または複数のポリマーを含む化学機械研磨組成物
JP2017122134A (ja) * 2014-05-22 2017-07-13 日立化成株式会社 金属膜用研磨液及びそれを用いた研磨方法
US20190211228A1 (en) * 2018-01-09 2019-07-11 Cabot Microelectronics Corporation Tungsten bulk polishing method with improved topography
US20190375643A1 (en) * 2018-06-12 2019-12-12 Evonik Degussa Gmbh Increased particle loading by surface modification with polyethersilane

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2025210929A1 (ja) * 2024-04-05 2025-10-09 株式会社アドマテックス 球状複合酸化物粒子材料及びその製造方法、スラリー組成物並びに透明樹脂組成物

Also Published As

Publication number Publication date
EP4217312A1 (en) 2023-08-02
TWI902906B (zh) 2025-11-01
CN116323485A (zh) 2023-06-23
TW202219208A (zh) 2022-05-16
KR20230070232A (ko) 2023-05-22
WO2022063742A1 (en) 2022-03-31
US20230374346A1 (en) 2023-11-23

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