JP2023085418A5 - - Google Patents

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Publication number
JP2023085418A5
JP2023085418A5 JP2023059695A JP2023059695A JP2023085418A5 JP 2023085418 A5 JP2023085418 A5 JP 2023085418A5 JP 2023059695 A JP2023059695 A JP 2023059695A JP 2023059695 A JP2023059695 A JP 2023059695A JP 2023085418 A5 JP2023085418 A5 JP 2023085418A5
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JP
Japan
Prior art keywords
contact
probe card
flexible membrane
group
tips
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2023059695A
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English (en)
Japanese (ja)
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JP2023085418A (ja
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Publication date
Priority claimed from IT102017000017037A external-priority patent/IT201700017037A1/it
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Publication of JP2023085418A publication Critical patent/JP2023085418A/ja
Publication of JP2023085418A5 publication Critical patent/JP2023085418A5/ja
Pending legal-status Critical Current

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JP2023059695A 2017-02-15 2023-04-03 高周波用途用のプローブカード Pending JP2023085418A (ja)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
IT102017000017037 2017-02-15
IT102017000017037A IT201700017037A1 (it) 2017-02-15 2017-02-15 Scheda di misura per applicazioni ad alta frequenza
PCT/EP2018/053615 WO2018149847A1 (en) 2017-02-15 2018-02-14 Probe card for high-frequency applications
JP2019543287A JP7306993B2 (ja) 2017-02-15 2018-02-14 高周波用途用のプローブカード

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
JP2019543287A Division JP7306993B2 (ja) 2017-02-15 2018-02-14 高周波用途用のプローブカード

Publications (2)

Publication Number Publication Date
JP2023085418A JP2023085418A (ja) 2023-06-20
JP2023085418A5 true JP2023085418A5 (cg-RX-API-DMAC7.html) 2023-08-15

Family

ID=59579801

Family Applications (2)

Application Number Title Priority Date Filing Date
JP2019543287A Active JP7306993B2 (ja) 2017-02-15 2018-02-14 高周波用途用のプローブカード
JP2023059695A Pending JP2023085418A (ja) 2017-02-15 2023-04-03 高周波用途用のプローブカード

Family Applications Before (1)

Application Number Title Priority Date Filing Date
JP2019543287A Active JP7306993B2 (ja) 2017-02-15 2018-02-14 高周波用途用のプローブカード

Country Status (11)

Country Link
US (1) US11112431B2 (cg-RX-API-DMAC7.html)
EP (1) EP3583431A1 (cg-RX-API-DMAC7.html)
JP (2) JP7306993B2 (cg-RX-API-DMAC7.html)
KR (1) KR102522524B1 (cg-RX-API-DMAC7.html)
CN (1) CN110291407B (cg-RX-API-DMAC7.html)
IT (1) IT201700017037A1 (cg-RX-API-DMAC7.html)
MY (1) MY195983A (cg-RX-API-DMAC7.html)
PH (1) PH12019501889A1 (cg-RX-API-DMAC7.html)
SG (1) SG11201907121WA (cg-RX-API-DMAC7.html)
TW (1) TWI703329B (cg-RX-API-DMAC7.html)
WO (1) WO2018149847A1 (cg-RX-API-DMAC7.html)

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IT201700017037A1 (it) * 2017-02-15 2018-08-15 Technoprobe Spa Scheda di misura per applicazioni ad alta frequenza
CN108241078B (zh) * 2017-05-18 2020-06-02 苏州韬盛电子科技有限公司 垂直探针卡
KR102066678B1 (ko) * 2019-10-30 2020-01-15 김재길 범프필름 타입 프로브카드
IT201900024964A1 (it) * 2019-12-20 2021-06-20 Technoprobe Spa Testa di misura per applicazioni a ridotto pitch
CN113433360B (zh) * 2020-03-23 2023-12-01 奥特斯(中国)有限公司 测试适配器、测试设备和测试部件承载件的方法
KR102307942B1 (ko) * 2020-07-13 2021-10-01 양진석 반도체 소자 검사 장치
CN112305395B (zh) * 2020-11-06 2021-05-28 法特迪精密科技（苏州）有限公司 一种探针结构及其安装方法、闭路方法、抗干扰方法
TWI784439B (zh) * 2021-03-12 2022-11-21 冠銓科技實業股份有限公司 應用於高頻量測之測試針座構造
JP7766290B2 (ja) * 2021-03-26 2025-11-10 石福金属興業株式会社 プローブピン用合金材料
US11714105B2 (en) * 2021-03-30 2023-08-01 Enplas Corporation Socket and inspection socket
KR102309675B1 (ko) * 2021-07-30 2021-10-07 김재길 필름 형태의 프로브카드
JP7795316B2 (ja) * 2021-09-27 2026-01-07 株式会社ヨコオ コンタクトユニット及び検査治具
KR102450658B1 (ko) * 2022-09-01 2022-10-06 윌테크놀러지(주) 니들유닛의 팁 길이조절이 용이한 니들블럭
KR102847367B1 (ko) * 2022-10-20 2025-08-18 주식회사 에이엠에스티 프로브 카드 제작 방법
IT202400003139A1 (it) * 2024-02-14 2025-08-14 Technoprobe Spa Scheda di misura per applicazioni ad elevata frequenza
KR102913907B1 (ko) * 2024-06-10 2026-01-19 (주)위드멤스 피검사체의 전기적 특성을 프로빙하는 프로브 카드 어셈블리

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JP6721302B2 (ja) * 2015-08-10 2020-07-15 東京特殊電線株式会社 両面回路基板の検査装置
IT201700017037A1 (it) * 2017-02-15 2018-08-15 Technoprobe Spa Scheda di misura per applicazioni ad alta frequenza
IT201700017061A1 (it) * 2017-02-15 2018-08-15 Technoprobe Spa Scheda di misura perfezionata per applicazioni ad alta frequenza

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