JP2023067828A5 - - Google Patents

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Publication number
JP2023067828A5
JP2023067828A5 JP2022172369A JP2022172369A JP2023067828A5 JP 2023067828 A5 JP2023067828 A5 JP 2023067828A5 JP 2022172369 A JP2022172369 A JP 2022172369A JP 2022172369 A JP2022172369 A JP 2022172369A JP 2023067828 A5 JP2023067828 A5 JP 2023067828A5
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JP
Japan
Prior art keywords
logic
path
input
logic path
input multiplexer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2022172369A
Other languages
English (en)
Japanese (ja)
Other versions
JP2023067828A (ja
Filing date
Publication date
Priority claimed from DE102021128331.0A external-priority patent/DE102021128331B3/de
Application filed filed Critical
Publication of JP2023067828A publication Critical patent/JP2023067828A/ja
Publication of JP2023067828A5 publication Critical patent/JP2023067828A5/ja
Pending legal-status Critical Current

Links

JP2022172369A 2021-10-29 2022-10-27 集積回路、集積回路をテストするテスト装置および方法 Pending JP2023067828A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102021128331.0A DE102021128331B3 (de) 2021-10-29 2021-10-29 Integrierte schaltung, testanordnung und verfahren zum testen einer integrierten schaltung
DE102021128331.0 2021-10-29

Publications (2)

Publication Number Publication Date
JP2023067828A JP2023067828A (ja) 2023-05-16
JP2023067828A5 true JP2023067828A5 (https=) 2025-07-17

Family

ID=85383805

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022172369A Pending JP2023067828A (ja) 2021-10-29 2022-10-27 集積回路、集積回路をテストするテスト装置および方法

Country Status (3)

Country Link
US (1) US12055587B2 (https=)
JP (1) JP2023067828A (https=)
DE (1) DE102021128331B3 (https=)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102021123889B3 (de) * 2021-09-15 2023-02-16 Infineon Technologies Ag Integrierte schaltung, testanordnung und verfahren zum testen einer integrierten schaltung
DE102021128331B3 (de) * 2021-10-29 2023-03-23 Infineon Technologies Ag Integrierte schaltung, testanordnung und verfahren zum testen einer integrierten schaltung
US11879942B1 (en) * 2022-08-31 2024-01-23 Micron Technology, Inc. Core and interface scan testing architecture and methodology
CN119270040A (zh) * 2023-06-30 2025-01-07 深圳市中兴微电子技术有限公司 芯片及电子设备

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0989980A (ja) 1995-09-28 1997-04-04 Nec Corp 半導体集積回路およびその評価方法
JP2001074813A (ja) * 1999-09-06 2001-03-23 Toshiba Corp 機能ブロック及び機能ブロックの周波数測定回路
JP2002181901A (ja) * 2000-12-15 2002-06-26 Nec Eng Ltd 半導体集積回路
KR100505664B1 (ko) * 2003-01-07 2005-08-04 삼성전자주식회사 공정 중의 칩 상의 변화를 용이하게 모니터링할 수 있는스피드 비닝 테스트 회로를 구비한 반도체 장치, 및 그테스트 방법
ITMI20040918A1 (it) * 2004-05-06 2004-08-06 St Microelectronics Srl Circuito oscillatore ad anello
FR2912842B1 (fr) * 2007-02-19 2009-05-08 St Microelectronics Sa Circuit integre comprenant un mode de test de performance
EP1967860A1 (en) * 2007-03-08 2008-09-10 Matsushita Electric Industrial Co., Ltd. Ring oscillator
US8560980B2 (en) 2010-11-16 2013-10-15 International Business Machines Corporation Optimal chip acceptance criterion and its applications
US9081991B2 (en) 2011-03-23 2015-07-14 Polytechnic Institute Of New York University Ring oscillator based design-for-trust
FR2996005A1 (fr) * 2012-09-21 2014-03-28 Stmicroeletronics Sa Procede de conception d'un circuit electronique
US9188643B2 (en) 2012-11-13 2015-11-17 Globalfoundries Inc. Flexible performance screen ring oscillator within a scan chain
US9097765B1 (en) 2014-05-08 2015-08-04 International Business Machines Corporation Performance screen ring oscillator formed from multi-dimensional pairings of scan chains
US9501604B1 (en) 2014-09-23 2016-11-22 Xilinx, Inc. Testing critical paths of a circuit design
US9891276B2 (en) 2015-07-28 2018-02-13 International Business Machines Corporation Performance-screen ring oscillator (PSRO) using an integrated circuit test signal distribution network
US9897653B2 (en) * 2016-03-16 2018-02-20 Stmicroelectronics (Grenoble 2) Sas Scan chain circuit supporting logic self test pattern injection during run time
DE102021123889B3 (de) * 2021-09-15 2023-02-16 Infineon Technologies Ag Integrierte schaltung, testanordnung und verfahren zum testen einer integrierten schaltung
DE102021128331B3 (de) * 2021-10-29 2023-03-23 Infineon Technologies Ag Integrierte schaltung, testanordnung und verfahren zum testen einer integrierten schaltung

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