JP2021125680A5 - - Google Patents

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Publication number
JP2021125680A5
JP2021125680A5 JP2021001035A JP2021001035A JP2021125680A5 JP 2021125680 A5 JP2021125680 A5 JP 2021125680A5 JP 2021001035 A JP2021001035 A JP 2021001035A JP 2021001035 A JP2021001035 A JP 2021001035A JP 2021125680 A5 JP2021125680 A5 JP 2021125680A5
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JP
Japan
Prior art keywords
superstrate
chuck
substrate
edge
recessed region
Prior art date
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Application number
JP2021001035A
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English (en)
Japanese (ja)
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JP2021125680A (ja
JP7555829B2 (ja
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Priority claimed from US16/779,205 external-priority patent/US11562924B2/en
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Publication of JP2021125680A5 publication Critical patent/JP2021125680A5/ja
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Publication of JP7555829B2 publication Critical patent/JP7555829B2/ja
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JP2021001035A 2020-01-31 2021-01-06 平坦化装置、平坦化方法及び物品の製造方法 Active JP7555829B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US16/779,205 US11562924B2 (en) 2020-01-31 2020-01-31 Planarization apparatus, planarization process, and method of manufacturing an article
US16/779,205 2020-01-31

Publications (3)

Publication Number Publication Date
JP2021125680A JP2021125680A (ja) 2021-08-30
JP2021125680A5 true JP2021125680A5 (enExample) 2023-09-25
JP7555829B2 JP7555829B2 (ja) 2024-09-25

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ID=77062134

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JP2021001035A Active JP7555829B2 (ja) 2020-01-31 2021-01-06 平坦化装置、平坦化方法及び物品の製造方法

Country Status (4)

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US (2) US11562924B2 (enExample)
JP (1) JP7555829B2 (enExample)
KR (1) KR102831923B1 (enExample)
TW (1) TWI817064B (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US12065573B2 (en) * 2020-07-31 2024-08-20 Canon Kabushiki Kaisha Photocurable composition
US11908711B2 (en) * 2020-09-30 2024-02-20 Canon Kabushiki Kaisha Planarization process, planarization system and method of manufacturing an article
US12282251B2 (en) 2021-09-24 2025-04-22 Canon Kabushiki Kaisha Method of shaping a surface, shaping system, and method of manufacturing an article
US12195382B2 (en) * 2021-12-01 2025-01-14 Canon Kabushiki Kaisha Superstrate and a method of using the same
US20250269438A1 (en) * 2024-02-27 2025-08-28 Canon Kabushiki Kaisha Chuck assembly, planarization process, apparatus and method of manufacturing an article

Family Cites Families (52)

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US6964793B2 (en) * 2002-05-16 2005-11-15 Board Of Regents, The University Of Texas System Method for fabricating nanoscale patterns in light curable compositions using an electric field
US20040206621A1 (en) * 2002-06-11 2004-10-21 Hongwen Li Integrated equipment set for forming a low K dielectric interconnect on a substrate
US7019819B2 (en) * 2002-11-13 2006-03-28 Molecular Imprints, Inc. Chucking system for modulating shapes of substrates
US7077992B2 (en) * 2002-07-11 2006-07-18 Molecular Imprints, Inc. Step and repeat imprint lithography processes
US6908861B2 (en) * 2002-07-11 2005-06-21 Molecular Imprints, Inc. Method for imprint lithography using an electric field
US6900881B2 (en) * 2002-07-11 2005-05-31 Molecular Imprints, Inc. Step and repeat imprint lithography systems
US20050098534A1 (en) * 2003-11-12 2005-05-12 Molecular Imprints, Inc. Formation of conductive templates employing indium tin oxide
EP1768846B1 (en) * 2004-06-03 2010-08-11 Molecular Imprints, Inc. Fluid dispensing and drop-on-demand dispensing for nano-scale manufacturing
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US10606171B2 (en) * 2018-02-14 2020-03-31 Canon Kabushiki Kaisha Superstrate and a method of using the same
JP7218114B2 (ja) 2018-07-12 2023-02-06 キヤノン株式会社 平坦化装置、平坦化方法及び物品の製造方法
US11198235B2 (en) * 2018-08-09 2021-12-14 Canon Kabushiki Kaisha Flexible mask modulation for controlling atmosphere between mask and substrate and methods of using the same
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US11018018B2 (en) * 2018-12-05 2021-05-25 Canon Kabushiki Kaisha Superstrate and methods of using the same
US10754078B2 (en) * 2018-12-20 2020-08-25 Canon Kabushiki Kaisha Light source, a shaping system using the light source and an article manufacturing method
US10892167B2 (en) * 2019-03-05 2021-01-12 Canon Kabushiki Kaisha Gas permeable superstrate and methods of using the same
US11664220B2 (en) * 2019-10-08 2023-05-30 Canon Kabushiki Kaisha Edge exclusion apparatus and methods of using the same
US11776840B2 (en) * 2019-10-29 2023-10-03 Canon Kabushiki Kaisha Superstrate chuck, method of use, and method of manufacturing an article
US11215921B2 (en) * 2019-10-31 2022-01-04 Canon Kabushiki Kaisha Residual layer thickness compensation in nano-fabrication by modified drop pattern
US11550216B2 (en) * 2019-11-25 2023-01-10 Canon Kabushiki Kaisha Systems and methods for curing a shaped film
US11107678B2 (en) * 2019-11-26 2021-08-31 Canon Kabushiki Kaisha Wafer process, apparatus and method of manufacturing an article
JP7346268B2 (ja) * 2019-12-05 2023-09-19 キヤノン株式会社 インプリント用のテンプレート、テンプレートを用いたインプリント方法
US11567401B2 (en) * 2019-12-20 2023-01-31 Canon Kabushiki Kaisha Nanofabrication method with correction of distortion within an imprint system
US11656546B2 (en) * 2020-02-27 2023-05-23 Canon Kabushiki Kaisha Exposure apparatus for uniform light intensity and methods of using the same
JP2021144985A (ja) * 2020-03-10 2021-09-24 キオクシア株式会社 テンプレート、テンプレートの製造方法および半導体装置の製造方法
US12136564B2 (en) * 2020-03-30 2024-11-05 Canon Kabushiki Kaisha Superstrate and method of making it
US11443940B2 (en) * 2020-06-24 2022-09-13 Canon Kabushiki Kaisha Apparatus for uniform light intensity and methods of using the same

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