JP2020526030A - 発光ダイオード(led)のマストランスファー装置および製造方法 - Google Patents
発光ダイオード(led)のマストランスファー装置および製造方法 Download PDFInfo
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- JP2020526030A JP2020526030A JP2019572152A JP2019572152A JP2020526030A JP 2020526030 A JP2020526030 A JP 2020526030A JP 2019572152 A JP2019572152 A JP 2019572152A JP 2019572152 A JP2019572152 A JP 2019572152A JP 2020526030 A JP2020526030 A JP 2020526030A
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- light emitting
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67288—Monitoring of warpage, curvature, damage, defects or the like
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H29/00—Integrated devices, or assemblies of multiple devices, comprising at least one light-emitting semiconductor element covered by group H10H20/00
- H10H29/10—Integrated devices comprising at least one light-emitting semiconductor component covered by group H10H20/00
- H10H29/14—Integrated devices comprising at least one light-emitting semiconductor component covered by group H10H20/00 comprising multiple light-emitting semiconductor components
- H10H29/142—Two-dimensional arrangements, e.g. asymmetric LED layout
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67132—Apparatus for placing on an insulating substrate, e.g. tape
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67144—Apparatus for mounting on conductive members, e.g. leadframes or conductors on insulating substrates
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67271—Sorting devices
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/77—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
- H01L21/78—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/77—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
- H01L21/78—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
- H01L21/7806—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices involving the separation of the active layers from a substrate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L25/00—Assemblies consisting of a plurality of semiconductor or other solid state devices
- H01L25/03—Assemblies consisting of a plurality of semiconductor or other solid state devices all the devices being of a type provided for in a single subclass of subclasses H10B, H10D, H10F, H10H, H10K or H10N, e.g. assemblies of rectifier diodes
- H01L25/04—Assemblies consisting of a plurality of semiconductor or other solid state devices all the devices being of a type provided for in a single subclass of subclasses H10B, H10D, H10F, H10H, H10K or H10N, e.g. assemblies of rectifier diodes the devices not having separate containers
- H01L25/075—Assemblies consisting of a plurality of semiconductor or other solid state devices all the devices being of a type provided for in a single subclass of subclasses H10B, H10D, H10F, H10H, H10K or H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H10H20/00
- H01L25/0753—Assemblies consisting of a plurality of semiconductor or other solid state devices all the devices being of a type provided for in a single subclass of subclasses H10B, H10D, H10F, H10H, H10K or H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H10H20/00 the devices being arranged next to each other
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L25/00—Assemblies consisting of a plurality of semiconductor or other solid state devices
- H01L25/16—Assemblies consisting of a plurality of semiconductor or other solid state devices the devices being of types provided for in two or more different subclasses of H10B, H10D, H10F, H10H, H10K or H10N, e.g. forming hybrid circuits
- H01L25/167—Assemblies consisting of a plurality of semiconductor or other solid state devices the devices being of types provided for in two or more different subclasses of H10B, H10D, H10F, H10H, H10K or H10N, e.g. forming hybrid circuits comprising optoelectronic devices, e.g. LED, photodiodes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/01—Manufacture or treatment
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/01—Manufacture or treatment
- H10H20/011—Manufacture or treatment of bodies, e.g. forming semiconductor layers
- H10H20/013—Manufacture or treatment of bodies, e.g. forming semiconductor layers having light-emitting regions comprising only Group III-V materials
- H10H20/0137—Manufacture or treatment of bodies, e.g. forming semiconductor layers having light-emitting regions comprising only Group III-V materials the light-emitting regions comprising nitride materials
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/01—Manufacture or treatment
- H10H20/011—Manufacture or treatment of bodies, e.g. forming semiconductor layers
- H10H20/018—Bonding of wafers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/81—Bodies
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/20—Sequence of activities consisting of a plurality of measurements, corrections, marking or sorting steps
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/81—Bodies
- H10H20/811—Bodies having quantum effect structures or superlattices, e.g. tunnel junctions
- H10H20/812—Bodies having quantum effect structures or superlattices, e.g. tunnel junctions within the light-emitting regions, e.g. having quantum confinement structures
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/81—Bodies
- H10H20/822—Materials of the light-emitting regions
- H10H20/824—Materials of the light-emitting regions comprising only Group III-V materials, e.g. GaP
- H10H20/825—Materials of the light-emitting regions comprising only Group III-V materials, e.g. GaP containing nitrogen, e.g. GaN
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Led Device Packages (AREA)
- Led Devices (AREA)
- Wire Bonding (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201762525105P | 2017-06-26 | 2017-06-26 | |
| US62/525,105 | 2017-06-26 | ||
| PCT/US2018/039533 WO2019005818A1 (en) | 2017-06-26 | 2018-06-26 | LIGHT EMITTING DIODE (LED) MASS TRANSFER APPARATUS AND METHOD FOR MANUFACTURING THE SAME |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2020526030A true JP2020526030A (ja) | 2020-08-27 |
| JP2020526030A5 JP2020526030A5 (enExample) | 2021-07-26 |
Family
ID=64693505
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2019572152A Pending JP2020526030A (ja) | 2017-06-26 | 2018-06-26 | 発光ダイオード(led)のマストランスファー装置および製造方法 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US10978429B2 (enExample) |
| EP (1) | EP3646384A4 (enExample) |
| JP (1) | JP2020526030A (enExample) |
| KR (1) | KR20200013068A (enExample) |
| CN (1) | CN111052386A (enExample) |
| TW (1) | TW201917811A (enExample) |
| WO (1) | WO2019005818A1 (enExample) |
Families Citing this family (28)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US10720098B2 (en) * | 2017-11-15 | 2020-07-21 | Facebook Technologies, Llc | Pulse-width-modulation control of micro LED |
| JP6650547B1 (ja) * | 2018-12-28 | 2020-02-19 | 信越エンジニアリング株式会社 | 検査装置及び検査方法 |
| US11430830B2 (en) * | 2019-04-05 | 2022-08-30 | Nanosys, Inc. | White light emitting diode (LED) and method of repairing light emitting device using same |
| US11246251B2 (en) | 2019-05-02 | 2022-02-08 | Seagate Technology Llc | Micro-component transfer systems, methods, and devices |
| US10923378B2 (en) | 2019-05-13 | 2021-02-16 | Seagate Technology Llc | Micro-component batch transfer systems, methods, and devices |
| WO2020248201A1 (zh) * | 2019-06-13 | 2020-12-17 | 京东方科技集团股份有限公司 | 微型发光二极管的巨量转移方法及系统 |
| DE102019118270B4 (de) * | 2019-07-05 | 2021-10-07 | X-Fab Semiconductor Foundries Gmbh | Verfahren zur Herstellung von Halbleiterbauelementen zur Ausbeutesteigerung beim Mikrotransferdruck |
| KR20210019323A (ko) * | 2019-08-12 | 2021-02-22 | 삼성전자주식회사 | 마이크로 엘이디 디스플레이 및 이의 제작 방법 |
| WO2021065918A1 (ja) * | 2019-10-01 | 2021-04-08 | 日亜化学工業株式会社 | 画像表示装置の製造方法および画像表示装置 |
| TWI733226B (zh) * | 2019-10-25 | 2021-07-11 | 台灣愛司帝科技股份有限公司 | 發光二極體晶圓以及發光二極體晶圓檢測裝置與方法 |
| KR102297791B1 (ko) * | 2019-11-13 | 2021-09-03 | 한국광기술원 | 레이저를 이용하여 전사 대상물을 분리하고 전사하는 장치 및 방법 |
| KR102163570B1 (ko) * | 2019-11-21 | 2020-10-12 | 엔엠시스코(주) | u-LED Panel to Panel 전사 방식을 이용한 u-LED 글라스 Panel의 LED 소자 공백 확인 및 이를 보충하기 위한 LED 소자 수리 공정 |
| JP7377092B2 (ja) * | 2019-12-16 | 2023-11-09 | Towa株式会社 | 統計データ生成方法、切断装置及びシステム |
| CN111341766B (zh) * | 2020-02-27 | 2023-12-22 | 惠州中京电子科技有限公司 | 一种mini LED主板制作方法 |
| WO2021183644A1 (en) * | 2020-03-10 | 2021-09-16 | Lumileds Llc | Method of manufacturing an augmented led array assembly |
| JP7463153B2 (ja) * | 2020-03-23 | 2024-04-08 | 東レエンジニアリング株式会社 | 実装方法および実装装置 |
| JP2022115687A (ja) * | 2021-01-28 | 2022-08-09 | 東レエンジニアリング株式会社 | 転写装置 |
| WO2021193135A1 (ja) * | 2020-03-23 | 2021-09-30 | 東レエンジニアリング株式会社 | 実装方法、実装装置、および転写装置 |
| CN112992665B (zh) * | 2020-05-22 | 2022-02-25 | 重庆康佳光电技术研究院有限公司 | 巨量转移装置、系统及其控制方法 |
| TWI752595B (zh) * | 2020-08-18 | 2022-01-11 | 東捷科技股份有限公司 | 自發光畫素裝置 |
| CN112768572B (zh) * | 2021-01-07 | 2022-10-11 | 武汉理工大学 | 基于高速扫描激光转印的微型led巨量转移方法及装置 |
| CN116190257A (zh) * | 2021-11-26 | 2023-05-30 | 群创光电股份有限公司 | 电子装置的制造方法 |
| TWI807544B (zh) * | 2021-12-17 | 2023-07-01 | 友達光電股份有限公司 | 顯示面板及其製造方法 |
| WO2023182625A1 (ko) * | 2022-03-22 | 2023-09-28 | 엘지전자 주식회사 | 불량 검사용 기판, 반도체 발광 소자 및 디스플레이 장치 |
| DE102022204077A1 (de) * | 2022-04-27 | 2023-11-02 | Robert Bosch Gesellschaft mit beschränkter Haftung | Verfahren zum Ermitteln einer Abpickreihenfolge für eine Halbleiter-Bestückungseinrichtung |
| DE102022114646A1 (de) * | 2022-06-10 | 2023-12-21 | Trumpf Laser Gmbh | Verfahren und Vorrichtung zum Verarbeiten mindestens eines Teilbereichs eines Schichtsystems |
| EP4507477A4 (en) * | 2022-12-15 | 2025-09-03 | Boe Technology Group Co Ltd | BILLBOARD AND DISPLAY APPARATUS |
| CN118841358B (zh) * | 2024-06-28 | 2025-11-21 | 天马新型显示技术研究院(厦门)有限公司 | 发光元件转移板,修补方法和显示面板 |
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| JP2002314053A (ja) * | 2001-04-19 | 2002-10-25 | Sony Corp | チップ部品の転写方法及びこれを用いた素子の配列方法、画像表示装置の製造方法 |
| WO2003010825A1 (fr) * | 2001-07-24 | 2003-02-06 | Seiko Epson Corporation | Procede de transfert, procede de fabrication d'un element en couche mince, procede de fabrication d'un circuit integre, substrat de circuit et son procede de fabrication, dispositif electro-optique et son procede de fabrication et carte a circuit integre et materiel electronique |
| JP2006041500A (ja) * | 2004-06-23 | 2006-02-09 | Sony Corp | 素子の転写方法、素子の間引き方法及び素子の転写装置 |
| JP2010050344A (ja) * | 2008-08-22 | 2010-03-04 | Fujinon Corp | リワーク装置 |
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-
2018
- 2018-06-25 TW TW107121749A patent/TW201917811A/zh unknown
- 2018-06-26 KR KR1020207002145A patent/KR20200013068A/ko not_active Ceased
- 2018-06-26 US US16/019,012 patent/US10978429B2/en active Active
- 2018-06-26 EP EP18825387.6A patent/EP3646384A4/en not_active Withdrawn
- 2018-06-26 JP JP2019572152A patent/JP2020526030A/ja active Pending
- 2018-06-26 CN CN201880055587.2A patent/CN111052386A/zh active Pending
- 2018-06-26 WO PCT/US2018/039533 patent/WO2019005818A1/en not_active Ceased
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Also Published As
| Publication number | Publication date |
|---|---|
| EP3646384A1 (en) | 2020-05-06 |
| US10978429B2 (en) | 2021-04-13 |
| CN111052386A (zh) | 2020-04-21 |
| KR20200013068A (ko) | 2020-02-05 |
| US20180374829A1 (en) | 2018-12-27 |
| EP3646384A4 (en) | 2021-03-24 |
| TW201917811A (zh) | 2019-05-01 |
| WO2019005818A1 (en) | 2019-01-03 |
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