JP2020510864A5 - - Google Patents
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- Publication number
- JP2020510864A5 JP2020510864A5 JP2019545264A JP2019545264A JP2020510864A5 JP 2020510864 A5 JP2020510864 A5 JP 2020510864A5 JP 2019545264 A JP2019545264 A JP 2019545264A JP 2019545264 A JP2019545264 A JP 2019545264A JP 2020510864 A5 JP2020510864 A5 JP 2020510864A5
- Authority
- JP
- Japan
- Prior art keywords
- reticle
- inspection
- images
- image
- reticles
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000007689 inspection Methods 0.000 claims 49
- 238000000034 method Methods 0.000 claims 22
- 230000007547 defect Effects 0.000 claims 11
- 238000000206 photolithography Methods 0.000 claims 10
- 230000003287 optical effect Effects 0.000 claims 2
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US15/438,588 | 2017-02-21 | ||
| US15/438,588 US10451563B2 (en) | 2017-02-21 | 2017-02-21 | Inspection of photomasks by comparing two photomasks |
| PCT/US2018/018578 WO2018156442A1 (en) | 2017-02-21 | 2018-02-19 | Inspection of photomasks by comparing two photomasks |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2020510864A JP2020510864A (ja) | 2020-04-09 |
| JP2020510864A5 true JP2020510864A5 (enExample) | 2021-04-01 |
| JP7035069B2 JP7035069B2 (ja) | 2022-03-14 |
Family
ID=63167640
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2019545264A Active JP7035069B2 (ja) | 2017-02-21 | 2018-02-19 | 2つのフォトマスクを比較することによるフォトマスクの検査 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US10451563B2 (enExample) |
| JP (1) | JP7035069B2 (enExample) |
| KR (1) | KR102329153B1 (enExample) |
| IL (1) | IL268480B (enExample) |
| TW (1) | TWI760437B (enExample) |
| WO (1) | WO2018156442A1 (enExample) |
Families Citing this family (23)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2018180578A (ja) * | 2017-04-03 | 2018-11-15 | 富士通株式会社 | 設計支援プログラム、情報処理装置、および設計支援方法 |
| JP2018180875A (ja) * | 2017-04-12 | 2018-11-15 | 富士通株式会社 | 判定装置、判定方法および判定プログラム |
| US10755405B2 (en) * | 2017-11-24 | 2020-08-25 | Taiwan Semiconductor Manufacturing Co., Ltd. | Method and system for diagnosing a semiconductor wafer |
| US11055464B2 (en) * | 2018-08-14 | 2021-07-06 | Taiwan Semiconductor Manufacturing Co., Ltd. | Critical dimension uniformity |
| US10866197B2 (en) * | 2018-09-20 | 2020-12-15 | KLA Corp. | Dispositioning defects detected on extreme ultraviolet photomasks |
| KR20210073561A (ko) * | 2018-10-15 | 2021-06-18 | 쓰리엠 이노베이티브 프로퍼티즈 컴파니 | 제조 필름으로부터의 임의 형상의 시트 파트들에 대한 자동화된 검사 |
| CN112955926B (zh) * | 2018-10-23 | 2025-07-01 | Asml荷兰有限公司 | 用于自适应对准的方法和装置 |
| US11079672B2 (en) * | 2018-10-31 | 2021-08-03 | Taiwan Semiconductor Manufacturing Company Ltd. | Method and system for layout enhancement based on inter-cell correlation |
| US10545099B1 (en) * | 2018-11-07 | 2020-01-28 | Kla-Tencor Corporation | Ultra-high sensitivity hybrid inspection with full wafer coverage capability |
| JP2020148615A (ja) * | 2019-03-13 | 2020-09-17 | 株式会社ニューフレアテクノロジー | 参照画像生成方法およびパターン検査方法 |
| US11442021B2 (en) * | 2019-10-11 | 2022-09-13 | Kla Corporation | Broadband light interferometry for focal-map generation in photomask inspection |
| EP4042373A4 (en) * | 2019-10-11 | 2023-11-29 | Applied Materials, Inc. | MATRIX SYSTEM AND METHOD FOR COMPARING ALIGNMENT VECTORS |
| CN110992322A (zh) * | 2019-11-25 | 2020-04-10 | 创新奇智(青岛)科技有限公司 | 基于卷积神经网络的贴片掩膜检测系统及检测方法 |
| US11293970B2 (en) * | 2020-01-12 | 2022-04-05 | Kla Corporation | Advanced in-line part average testing |
| WO2021210505A1 (ja) * | 2020-04-17 | 2021-10-21 | Tasmit株式会社 | パターンマッチング方法 |
| US11379972B2 (en) * | 2020-06-03 | 2022-07-05 | Applied Materials Israel Ltd. | Detecting defects in semiconductor specimens using weak labeling |
| KR102425392B1 (ko) * | 2020-06-17 | 2022-07-28 | 주식회사 앤에이치씨 | 블랭크 마스크의 재활용 가능 여부를 판단하기 위한 블랭크 마스크 장치 및 방법 |
| US11636587B2 (en) * | 2020-12-30 | 2023-04-25 | Applied Materials Israel Ltd. | Inspection of a semiconductor specimen |
| US12481213B2 (en) | 2021-09-02 | 2025-11-25 | Synopsys, Inc. | Mask corner rounding effects in three-dimensional mask simulations using feature images |
| US12474634B2 (en) | 2021-11-18 | 2025-11-18 | Synopsys, Inc. | Mask synthesis integrating mask fabrication effects and wafer lithography effects |
| US20250044710A1 (en) * | 2021-12-17 | 2025-02-06 | Asml Netherlands B.V. | Overlay metrology based on template matching with adaptive weighting |
| CN115965574B (zh) * | 2022-08-31 | 2025-03-14 | 东方晶源微电子科技(北京)股份有限公司 | 基于设计版图的扫描电子显微镜图像缺陷检测方法、装置 |
| KR20250119539A (ko) * | 2022-12-08 | 2025-08-07 | 레이아 인코포레이티드 | 대형 포맷 임프린트 리소그래피 방법 및 임프린트 리소그래피 몰드 |
Family Cites Families (29)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5419664A (en) | 1977-07-15 | 1979-02-14 | Nippon Jidoseigyo Ltd | Device for inspecting fault of pattern |
| DE69208413T2 (de) * | 1991-08-22 | 1996-11-14 | Kla Instr Corp | Gerät zur automatischen Prüfung von Photomaske |
| US6064484A (en) | 1996-03-13 | 2000-05-16 | Fujitsu Limited | Pattern inspection method and system |
| JP3639079B2 (ja) * | 1996-03-13 | 2005-04-13 | 富士通株式会社 | パターン検査方法と検査装置 |
| JP3865156B2 (ja) * | 1997-04-24 | 2007-01-10 | 株式会社ニコン | 画像比較装置およびこれを用いたウエハ検査装置とウエハ検査システム |
| US6516085B1 (en) | 1999-05-03 | 2003-02-04 | Kla-Tencor | Apparatus and methods for collecting global data during a reticle inspection |
| AU2002245560A1 (en) | 2001-03-20 | 2002-10-03 | Numerial Technologies, Inc. | System and method of providing mask defect printability analysis |
| JP2004317975A (ja) * | 2003-04-18 | 2004-11-11 | Toshiba Corp | フォトマスク及びこのフォトマスクを用いた半導体装置の製造方法 |
| US7251033B1 (en) | 2004-06-02 | 2007-07-31 | Advanced Micro Devices, Inc. | In-situ reticle contamination detection system at exposure wavelength |
| JP4928862B2 (ja) * | 2006-08-04 | 2012-05-09 | 株式会社日立ハイテクノロジーズ | 欠陥検査方法及びその装置 |
| US7873204B2 (en) | 2007-01-11 | 2011-01-18 | Kla-Tencor Corporation | Method for detecting lithographically significant defects on reticles |
| US8038897B2 (en) * | 2007-02-06 | 2011-10-18 | Taiwan Semiconductor Manufacturing Company, Ltd. | Method and system for wafer inspection |
| US7738093B2 (en) | 2007-05-07 | 2010-06-15 | Kla-Tencor Corp. | Methods for detecting and classifying defects on a reticle |
| KR20090074554A (ko) * | 2008-01-02 | 2009-07-07 | 주식회사 하이닉스반도체 | 포토마스크의 결함 수정 방법 |
| JP5229575B2 (ja) | 2009-05-08 | 2013-07-03 | ソニー株式会社 | 画像処理装置および方法、並びにプログラム |
| CN102792297A (zh) | 2010-03-01 | 2012-11-21 | 日本电气株式会社 | 模式匹配装置、模式匹配方法和模式匹配系统 |
| JP4988000B2 (ja) * | 2010-03-17 | 2012-08-01 | 株式会社東芝 | パターン検査装置及びパターン検査方法 |
| JP2011247957A (ja) | 2010-05-24 | 2011-12-08 | Toshiba Corp | パターン検査方法および半導体装置の製造方法 |
| US8818072B2 (en) * | 2010-08-25 | 2014-08-26 | Taiwan Semiconductor Manufacturing Company, Ltd. | Rendered database image-to-inspection image optimization for inspection |
| KR101834601B1 (ko) * | 2011-04-26 | 2018-03-05 | 케이엘에이-텐코 코포레이션 | 하이브리드 레티클 검사 방법 및 시스템 |
| US8914754B2 (en) | 2011-04-26 | 2014-12-16 | Kla-Tencor Corporation | Database-driven cell-to-cell reticle inspection |
| US10401305B2 (en) * | 2012-02-15 | 2019-09-03 | Kla-Tencor Corporation | Time-varying intensity map generation for reticles |
| JP6236216B2 (ja) * | 2013-04-16 | 2017-11-22 | 株式会社ニューフレアテクノロジー | 検査装置および検査方法 |
| US9518935B2 (en) | 2013-07-29 | 2016-12-13 | Kla-Tencor Corporation | Monitoring changes in photomask defectivity |
| JP6364193B2 (ja) * | 2014-01-23 | 2018-07-25 | 株式会社ニューフレアテクノロジー | 焦点位置調整方法および検査方法 |
| JP2015145922A (ja) * | 2014-01-31 | 2015-08-13 | 株式会社ニューフレアテクノロジー | マスク検査装置及びマスク検査方法 |
| JP6307367B2 (ja) * | 2014-06-26 | 2018-04-04 | 株式会社ニューフレアテクノロジー | マスク検査装置、マスク評価方法及びマスク評価システム |
| JP6251647B2 (ja) * | 2014-07-15 | 2017-12-20 | 株式会社ニューフレアテクノロジー | マスク検査装置及びマスク検査方法 |
| JP6373119B2 (ja) * | 2014-08-08 | 2018-08-15 | 株式会社ニューフレアテクノロジー | マスク検査装置及びマスク検査方法 |
-
2017
- 2017-02-21 US US15/438,588 patent/US10451563B2/en active Active
-
2018
- 2018-02-14 TW TW107105510A patent/TWI760437B/zh active
- 2018-02-19 WO PCT/US2018/018578 patent/WO2018156442A1/en not_active Ceased
- 2018-02-19 KR KR1020197027641A patent/KR102329153B1/ko active Active
- 2018-02-19 JP JP2019545264A patent/JP7035069B2/ja active Active
-
2019
- 2019-08-04 IL IL268480A patent/IL268480B/en unknown
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