JP2019505092A5 - - Google Patents

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Publication number
JP2019505092A5
JP2019505092A5 JP2018536478A JP2018536478A JP2019505092A5 JP 2019505092 A5 JP2019505092 A5 JP 2019505092A5 JP 2018536478 A JP2018536478 A JP 2018536478A JP 2018536478 A JP2018536478 A JP 2018536478A JP 2019505092 A5 JP2019505092 A5 JP 2019505092A5
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Prior art keywords
heater
spatially adjustable
temperature
controller
heating elements
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JP2018536478A
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English (en)
Japanese (ja)
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JP2019505092A (ja
JP7253922B2 (ja
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Priority claimed from US15/409,362 external-priority patent/US10582570B2/en
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Priority to JP2023010117A priority Critical patent/JP7780852B2/ja
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Publication of JP7253922B2 publication Critical patent/JP7253922B2/ja
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JP2018536478A 2016-01-22 2017-01-20 マルチゾーン静電チャックのためのセンサシステム Active JP7253922B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2023010117A JP7780852B2 (ja) 2016-01-22 2023-01-26 マルチゾーン静電チャックのためのセンサシステム

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US201662286064P 2016-01-22 2016-01-22
US62/286,064 2016-01-22
US15/409,362 2017-01-18
US15/409,362 US10582570B2 (en) 2016-01-22 2017-01-18 Sensor system for multi-zone electrostatic chuck
PCT/US2017/014233 WO2017127611A1 (en) 2016-01-22 2017-01-20 Sensor system for multi-zone electrostatic chuck

Related Child Applications (1)

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JP2023010117A Division JP7780852B2 (ja) 2016-01-22 2023-01-26 マルチゾーン静電チャックのためのセンサシステム

Publications (3)

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JP2019505092A JP2019505092A (ja) 2019-02-21
JP2019505092A5 true JP2019505092A5 (enExample) 2021-10-14
JP7253922B2 JP7253922B2 (ja) 2023-04-07

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JP2018536478A Active JP7253922B2 (ja) 2016-01-22 2017-01-20 マルチゾーン静電チャックのためのセンサシステム
JP2023010117A Active JP7780852B2 (ja) 2016-01-22 2023-01-26 マルチゾーン静電チャックのためのセンサシステム

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US (2) US10582570B2 (enExample)
JP (2) JP7253922B2 (enExample)
KR (2) KR20250079252A (enExample)
CN (2) CN117198968A (enExample)
TW (2) TWI771859B (enExample)
WO (1) WO2017127611A1 (enExample)

Families Citing this family (60)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6335341B2 (ja) * 2014-07-23 2018-05-30 アプライド マテリアルズ インコーポレイテッドApplied Materials,Incorporated 可変型温度制御式基板支持アセンブリ
US10763142B2 (en) 2015-06-22 2020-09-01 Lam Research Corporation System and method for determining field non-uniformities of a wafer processing chamber using a wafer processing parameter
US10386821B2 (en) 2015-06-22 2019-08-20 Lam Research Corporation Systems and methods for calibrating scalar field contribution values for a limited number of sensors including a temperature value of an electrostatic chuck and estimating temperature distribution profiles based on calibrated values
US9779974B2 (en) * 2015-06-22 2017-10-03 Lam Research Corporation System and method for reducing temperature transition in an electrostatic chuck
US10381248B2 (en) 2015-06-22 2019-08-13 Lam Research Corporation Auto-correction of electrostatic chuck temperature non-uniformity
JP6775997B2 (ja) * 2016-05-13 2020-10-28 株式会社エンプラス 電気部品用ソケット
US10908195B2 (en) * 2016-06-15 2021-02-02 Watlow Electric Manufacturing Company System and method for controlling power to a heater
US11621180B2 (en) * 2016-10-31 2023-04-04 Nissin Ion Equipment Co., Ltd. Heating device
US10535538B2 (en) * 2017-01-26 2020-01-14 Gary Hillman System and method for heat treatment of substrates
US11508600B2 (en) * 2017-04-10 2022-11-22 Ngk Spark Plug Co., Ltd. Holding device
KR102467605B1 (ko) * 2017-06-28 2022-11-16 도쿄엘렉트론가부시키가이샤 열처리 장치, 열처리 장치의 관리 방법 및 기억 매체
TWI639225B (zh) 2017-10-27 2018-10-21 國立中山大學 彎曲平板波感測器及其製作方法
US11236422B2 (en) 2017-11-17 2022-02-01 Lam Research Corporation Multi zone substrate support for ALD film property correction and tunability
CN108346554A (zh) * 2018-04-24 2018-07-31 西南林业大学 一种等离子体刻蚀与沉积设备及方法
US10633742B2 (en) 2018-05-07 2020-04-28 Lam Research Foundation Use of voltage and current measurements to control dual zone ceramic pedestals
US12488967B2 (en) * 2018-05-31 2025-12-02 Applied Materials, Inc. Extreme uniformity heated substrate support assembly
JP7094804B2 (ja) * 2018-07-03 2022-07-04 東京エレクトロン株式会社 基板処理装置および基板処理方法
KR102788956B1 (ko) 2018-07-05 2025-03-28 램 리써치 코포레이션 기판 프로세싱 시스템에서 기판 지지부의 동적 온도 제어
US11183400B2 (en) 2018-08-08 2021-11-23 Lam Research Corporation Progressive heating of components of substrate processing systems using TCR element-based heaters
US10872747B2 (en) 2018-08-08 2020-12-22 Lam Research Corporation Controlling showerhead heating via resistive thermal measurements
JP7571017B2 (ja) * 2018-11-20 2024-10-22 ラム リサーチ コーポレーション 半導体製造における二相冷却
CN111326388B (zh) * 2018-12-17 2023-02-28 中微半导体设备(上海)股份有限公司 一种用于基片支撑的加热装置以及等离子体处理器
KR102944324B1 (ko) 2019-02-15 2026-03-25 램 리써치 코포레이션 멀티-패터닝 프로세스들을 위한 멀티-존 가열된 기판 지지부를 사용한 트리밍 및 증착 프로파일 제어
US11367645B2 (en) * 2019-03-13 2022-06-21 Applied Materials, Inc. Temperature tunable multi-zone electrostatic chuck
US12354892B2 (en) * 2019-05-21 2025-07-08 Tocalo Co., Ltd. Temperature control unit
KR102280033B1 (ko) * 2019-05-29 2021-07-21 세메스 주식회사 기판 처리 장치 및 기판 처리 방법
TWI886128B (zh) * 2019-05-30 2025-06-11 美商蘭姆研究公司 用於監測基板處理系統之靜電卡盤之溫度的不受射頻影響之感測器探針
JP7292115B2 (ja) * 2019-06-07 2023-06-16 東京エレクトロン株式会社 温度調整装置及び温度制御方法。
KR102850304B1 (ko) * 2019-06-10 2025-08-25 램 리써치 코포레이션 광섬유를 통한 플라즈마 챔버들의 기판 지지부로 전력 및 데이터 송신
US12209312B2 (en) 2019-06-24 2025-01-28 Lam Research Corporation Temperature control of a multi-zone pedestal
US11533783B2 (en) 2019-07-18 2022-12-20 Applied Materials, Inc. Multi-zone heater model-based control in semiconductor manufacturing
US11610792B2 (en) * 2019-08-16 2023-03-21 Applied Materials, Inc. Heated substrate support with thermal baffles
WO2021108176A1 (en) * 2019-11-26 2021-06-03 Tokyo Electron Limited THERMAL TREATMENTS USING A PLURALITY OF EMBEDDED RESISTANCE TEMPERATURE DETECTORS (RTDs)
JP7411431B2 (ja) * 2020-01-31 2024-01-11 新光電気工業株式会社 静電チャック、基板固定装置
US20210249284A1 (en) * 2020-02-12 2021-08-12 Applied Materials, Inc. Fast response dual-zone pedestal assembly for selective preclean
JP7539236B2 (ja) * 2020-02-21 2024-08-23 東京エレクトロン株式会社 基板処理装置
JP7561867B2 (ja) * 2020-03-31 2024-10-04 アプライド マテリアルズ インコーポレイテッド 高温マイクロゾーン静電チャック
JP7413128B2 (ja) * 2020-04-01 2024-01-15 東京エレクトロン株式会社 基板支持台
KR102776505B1 (ko) * 2020-07-09 2025-03-07 삼성전자주식회사 플라즈마 처리 장치 및 이를 이용한 반도체 소자 제조방법
US11688615B2 (en) * 2020-08-19 2023-06-27 Taiwan Semiconductor Manufacturing Co., Ltd. System and method for heating semiconductor wafers
US11862499B2 (en) * 2020-08-19 2024-01-02 Applied Materials, Inc. Multiplexing control of multiple positional sensors in device manufacturing machines
JP2023548296A (ja) 2020-11-11 2023-11-16 アクセリス テクノロジーズ, インコーポレイテッド ワークピースの温度均一性を改善するためのハイブリッド高温静電クランプ
KR102554876B1 (ko) * 2021-04-13 2023-07-12 현대자동차주식회사 에너지 효율이 향상된 자동차용 시트히터
US12331984B2 (en) * 2021-05-10 2025-06-17 Applied Materials, Inc. Cryogenic micro-zone electrostatic chuck connector assembly
US12062565B2 (en) 2021-06-29 2024-08-13 Asm Ip Holding B.V. Electrostatic chuck, assembly including the electrostatic chuck, and method of controlling temperature of the electrostatic chuck
US12094748B2 (en) * 2021-08-18 2024-09-17 Applied Materials, Inc. Bipolar esc with balanced RF impedance
US12562353B2 (en) 2021-09-02 2026-02-24 Applied Materials, Inc. Replaceable electrostatic chuck outer ring for edge arcing mitigation
CN115775762B (zh) * 2021-09-07 2026-05-05 维人股份有限公司 多个加热区域结构的静电卡盘
KR102704120B1 (ko) * 2021-11-17 2024-09-06 (주)샘씨엔에스 공간 변환기 및 이를 포함하는 프로브 카드
CN114121731A (zh) * 2021-11-25 2022-03-01 北京北方华创微电子装备有限公司 半导体工艺设备中的加热装置及半导体工艺设备
US12293933B2 (en) * 2021-12-15 2025-05-06 Vm Inc. Electrostatic chuck with multiple heater zones
JP7634493B2 (ja) * 2022-03-03 2025-02-21 日本碍子株式会社 給電部材及びウエハ載置台
CN117063617A (zh) * 2022-03-14 2023-11-14 株式会社日立高新技术 等离子处理装置
US12601621B2 (en) 2022-03-30 2026-04-14 Applied Materials, Inc. Methods of manufacturing plasma generating cells for a plasma source
TW202412165A (zh) * 2022-05-26 2024-03-16 日商東京威力科創股份有限公司 基板處理裝置
JP7471566B2 (ja) * 2022-09-28 2024-04-22 Toto株式会社 静電チャック
KR102872815B1 (ko) * 2023-08-02 2025-10-21 주식회사 쎄믹스 웨이퍼 척의 온도 제어 장치 및 제어 방법
CN117107223B (zh) * 2023-08-28 2025-07-15 无锡先为科技有限公司 半导体处理装置及温度调整方法
US20250319637A1 (en) * 2024-04-16 2025-10-16 Canon Kabushiki Kaisha System including an array including a heat source and an actinic radiation source
US20250379077A1 (en) * 2024-06-07 2025-12-11 Applied Materials, Inc. Substrate supports including measurement assemblies, and related apparatus, methods, and processing chambers

Family Cites Families (31)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000012195A (ja) * 1998-06-29 2000-01-14 Ibiden Co Ltd セラミックヒータ
US6094334A (en) * 1999-03-02 2000-07-25 Applied Materials, Inc. Polymer chuck with heater and method of manufacture
JP2001244320A (ja) * 2000-02-25 2001-09-07 Ibiden Co Ltd セラミック基板およびその製造方法
WO2001084888A1 (fr) * 2000-04-29 2001-11-08 Ibiden Co., Ltd. Element chauffant en ceramique
US6847014B1 (en) 2001-04-30 2005-01-25 Lam Research Corporation Method and apparatus for controlling the spatial temperature distribution across the surface of a workpiece support
JP4549022B2 (ja) * 2001-04-30 2010-09-22 ラム リサーチ コーポレイション ワーク支持体の表面を横切る空間温度分布を制御する方法および装置
US7161121B1 (en) * 2001-04-30 2007-01-09 Lam Research Corporation Electrostatic chuck having radial temperature control capability
CN1473452A (zh) * 2001-07-09 2004-02-04 IBIDEN�ɷ����޹�˾ 陶瓷加热器与陶瓷接合体
US6921724B2 (en) 2002-04-02 2005-07-26 Lam Research Corporation Variable temperature processes for tunable electrostatic chuck
JP4371847B2 (ja) 2004-02-25 2009-11-25 本田技研工業株式会社 軽車両のカバー支持構造
JP5069452B2 (ja) * 2006-04-27 2012-11-07 アプライド マテリアルズ インコーポレイテッド 二重温度帯を有する静電チャックをもつ基板支持体
US8226769B2 (en) 2006-04-27 2012-07-24 Applied Materials, Inc. Substrate support with electrostatic chuck having dual temperature zones
US9275887B2 (en) 2006-07-20 2016-03-01 Applied Materials, Inc. Substrate processing with rapid temperature gradient control
KR20090071060A (ko) 2007-12-27 2009-07-01 주성엔지니어링(주) 정전척 및 그를 포함하는 기판처리장치
US20090274590A1 (en) 2008-05-05 2009-11-05 Applied Materials, Inc. Plasma reactor electrostatic chuck having a coaxial rf feed and multizone ac heater power transmission through the coaxial feed
US20100206869A1 (en) * 2009-02-13 2010-08-19 General Electric Company Heat pump water heater control
US8637794B2 (en) * 2009-10-21 2014-01-28 Lam Research Corporation Heating plate with planar heating zones for semiconductor processing
US8274017B2 (en) 2009-12-18 2012-09-25 Applied Materials, Inc. Multifunctional heater/chiller pedestal for wide range wafer temperature control
KR101813635B1 (ko) * 2011-08-30 2017-12-29 와틀로 일렉트릭 매뉴팩츄어링 컴파니 열 어레이 제어 시스템 및 방법
JP5973731B2 (ja) * 2012-01-13 2016-08-23 東京エレクトロン株式会社 プラズマ処理装置及びヒータの温度制御方法
US9324589B2 (en) 2012-02-28 2016-04-26 Lam Research Corporation Multiplexed heater array using AC drive for semiconductor processing
US9706605B2 (en) * 2012-03-30 2017-07-11 Applied Materials, Inc. Substrate support with feedthrough structure
JP5823915B2 (ja) * 2012-05-29 2015-11-25 新光電気工業株式会社 静電チャックの製造方法
US10049948B2 (en) 2012-11-30 2018-08-14 Lam Research Corporation Power switching system for ESC with array of thermal control elements
WO2014158370A2 (en) 2013-03-14 2014-10-02 Applied Materials, Inc. Temperature measurement in multi-zone heater
KR101510008B1 (ko) 2013-12-13 2015-04-07 현대자동차주식회사 연료필터의 히팅 제어방법 및 장치
JP6313983B2 (ja) 2014-01-29 2018-04-18 株式会社日立ハイテクノロジーズ プラズマ処理装置およびプラズマ処理方法
US11158526B2 (en) * 2014-02-07 2021-10-26 Applied Materials, Inc. Temperature controlled substrate support assembly
JP6240532B2 (ja) * 2014-02-27 2017-11-29 東京エレクトロン株式会社 静電チャックの温度制御方法
KR102233925B1 (ko) 2014-11-20 2021-03-30 스미토모 오사카 세멘토 가부시키가이샤 정전 척 장치
US9826574B2 (en) * 2015-10-28 2017-11-21 Watlow Electric Manufacturing Company Integrated heater and sensor system

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