JP2019504297A5 - - Google Patents
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- Publication number
- JP2019504297A5 JP2019504297A5 JP2018526916A JP2018526916A JP2019504297A5 JP 2019504297 A5 JP2019504297 A5 JP 2019504297A5 JP 2018526916 A JP2018526916 A JP 2018526916A JP 2018526916 A JP2018526916 A JP 2018526916A JP 2019504297 A5 JP2019504297 A5 JP 2019504297A5
- Authority
- JP
- Japan
- Prior art keywords
- radiation
- dark current
- pixels
- photon counting
- radiation detector
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000005855 radiation Effects 0.000 claims 30
- 238000001514 detection method Methods 0.000 claims 11
- 238000003384 imaging method Methods 0.000 claims 8
- 230000003595 spectral effect Effects 0.000 claims 3
- 239000011248 coating agent Substances 0.000 claims 2
- 238000000576 coating method Methods 0.000 claims 2
- 238000005070 sampling Methods 0.000 claims 2
- MARUHZGHZWCEQU-UHFFFAOYSA-N 5-phenyl-2h-tetrazole Chemical compound C1=CC=CC=C1C1=NNN=N1 MARUHZGHZWCEQU-UHFFFAOYSA-N 0.000 claims 1
- QWUZMTJBRUASOW-UHFFFAOYSA-N cadmium tellanylidenezinc Chemical compound [Zn].[Cd].[Te] QWUZMTJBRUASOW-UHFFFAOYSA-N 0.000 claims 1
- 238000006243 chemical reaction Methods 0.000 claims 1
- 238000002591 computed tomography Methods 0.000 claims 1
- 230000002265 prevention Effects 0.000 claims 1
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP15196524.1 | 2015-11-26 | ||
| EP15196524 | 2015-11-26 | ||
| PCT/EP2016/078481 WO2017089363A1 (en) | 2015-11-26 | 2016-11-23 | Dark current compensation |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2019504297A JP2019504297A (ja) | 2019-02-14 |
| JP2019504297A5 true JP2019504297A5 (enrdf_load_stackoverflow) | 2019-12-05 |
| JP6924755B2 JP6924755B2 (ja) | 2021-08-25 |
Family
ID=54705437
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2018526916A Expired - Fee Related JP6924755B2 (ja) | 2015-11-26 | 2016-11-23 | 光子計数放射線検出器、撮像システム、およびスペクトル放射線検出方法 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US10267928B2 (enrdf_load_stackoverflow) |
| EP (1) | EP3380870A1 (enrdf_load_stackoverflow) |
| JP (1) | JP6924755B2 (enrdf_load_stackoverflow) |
| CN (1) | CN108291973B (enrdf_load_stackoverflow) |
| RU (1) | RU2734452C2 (enrdf_load_stackoverflow) |
| WO (1) | WO2017089363A1 (enrdf_load_stackoverflow) |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2019019038A1 (en) * | 2017-07-26 | 2019-01-31 | Shenzhen Xpectvision Technology Co., Ltd. | X-RAY DETECTOR CAPABLE OF MANAGING LOAD SHARING AT ITS PERIPHERY |
| EP3444826A1 (en) * | 2017-08-14 | 2019-02-20 | Koninklijke Philips N.V. | Low profile anti scatter and anti charge sharing grid for photon counting computed tomography |
| CN111226136B (zh) * | 2017-10-30 | 2023-07-18 | 深圳帧观德芯科技有限公司 | 辐射检测器中的暗噪声补偿 |
| EP3567405A1 (en) | 2018-05-08 | 2019-11-13 | Koninklijke Philips N.V. | Photon counting spectral ct |
| US10813607B2 (en) * | 2018-06-27 | 2020-10-27 | Prismatic Sensors Ab | X-ray sensor, method for constructing an x-ray sensor and an x-ray imaging system comprising such an x-ray sensor |
| US20230367025A1 (en) * | 2020-09-18 | 2023-11-16 | Analog Devices, Inc. | Delta modulated baseline restoration for photon counting computed tomography |
| US11985438B2 (en) * | 2021-03-18 | 2024-05-14 | Taiwan Semiconductor Manufacturing Company, Ltd. | Pixel array including dark pixel sensors |
| JP7439027B2 (ja) | 2021-09-08 | 2024-02-27 | 富士フイルムヘルスケア株式会社 | 放射線撮像装置及び放射線検出器 |
Family Cites Families (26)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4100739B2 (ja) | 1996-10-24 | 2008-06-11 | キヤノン株式会社 | 光電変換装置 |
| DE19734717A1 (de) * | 1997-08-11 | 1999-02-25 | Sirona Dental Systems Gmbh | Verfahren zur Kompensation des Dunkelstroms bei der Erstellung von zahnärztlichen Panorama- und/oder cephalometrischen Schichtaufnahmen |
| JP3832615B2 (ja) * | 1999-08-26 | 2006-10-11 | 株式会社島津製作所 | 放射線検出装置 |
| GB2370960A (en) * | 2001-01-05 | 2002-07-10 | Spectral Fusion Technologies L | Partially shielded photodiode array |
| JP2001340324A (ja) * | 2001-03-16 | 2001-12-11 | Toshiba Medical System Co Ltd | Ｘ線検出器及びそれを使ったｘ線診断装置 |
| JP4723767B2 (ja) * | 2001-09-13 | 2011-07-13 | 株式会社東芝 | Ｘ線画像診断装置 |
| JP2003209665A (ja) | 2002-01-16 | 2003-07-25 | Fuji Photo Film Co Ltd | 画像読取方法および画像記録読取装置 |
| CN101488507B (zh) * | 2002-08-09 | 2011-04-06 | 浜松光子学株式会社 | 光电二极管阵列、其制造方法和放射线检测器 |
| DE602005019622D1 (de) | 2005-01-06 | 2010-04-08 | Philips Intellectual Property | Pixel-realisierter stromverstärker |
| BRPI0610720B1 (pt) * | 2005-04-22 | 2018-01-16 | Koninklijke Philips N. V. | pixel detector para uso em conjunto com um cintilador que converte uma partícula de radiação para uma rajada de luz, detector de radiação, sistema de geração de imagem de tomografia por emissão de pósitron de duração de trajetória (tof-pet), 5 método executado em conjunto com um cintilador que converte uma partícula de radiação para uma rajada de luz, e detector de radiação que inclui um cintilador e circuitos |
| JP4555785B2 (ja) | 2006-02-10 | 2010-10-06 | シャープ株式会社 | 固定パターン雑音除去装置、固体撮像装置、電子機器、及び固定パターン雑音除去プログラム |
| JP5458260B2 (ja) | 2006-09-25 | 2014-04-02 | コーニンクレッカ フィリップス エヌ ヴェ | 直接型ｘ線変換に基づく積分検出器に関する漏れ電流及び残留信号の補償 |
| US7829860B2 (en) | 2006-10-31 | 2010-11-09 | Dxray, Inc. | Photon counting imaging detector system |
| JP4462299B2 (ja) * | 2007-07-17 | 2010-05-12 | ソニー株式会社 | 撮像装置、および画像処理方法、並びにコンピュータ・プログラム |
| US8873703B2 (en) * | 2008-05-08 | 2014-10-28 | Arineta Ltd. | X ray imaging system with scatter radiation correction and method of using same |
| JP2009284424A (ja) | 2008-05-26 | 2009-12-03 | Sony Corp | 撮像装置、撮像方法及びプログラム |
| WO2010007544A1 (en) * | 2008-07-14 | 2010-01-21 | Koninklijke Philips Electronics N.V. | Anti-scatter grid |
| CN102209912B (zh) * | 2008-11-10 | 2014-03-05 | 皇家飞利浦电子股份有限公司 | 用于辐射探测器的转换器元件 |
| EP2376942B1 (en) | 2008-12-15 | 2013-03-27 | Koninklijke Philips Electronics N.V. | Temperature compensation circuit for silicon photomultipliers and other single photon counters |
| EP2404196B1 (en) * | 2009-03-06 | 2013-10-16 | Koninklijke Philips N.V. | Temperature compensation and control circuit for single photon counters |
| JP2012045044A (ja) * | 2010-08-24 | 2012-03-08 | Fujifilm Corp | 放射線画像検出装置 |
| CN103314307B (zh) | 2011-01-10 | 2016-04-13 | 皇家飞利浦电子股份有限公司 | 用于探测由辐射源发射的光子的探测装置 |
| KR20140010553A (ko) * | 2012-07-13 | 2014-01-27 | 삼성전자주식회사 | 픽셀 어레이, 이를 포함하는 이미지 센서, 및 상기 이미지 센서의 로컬 다크 전류 보상 방법 |
| JP2014048171A (ja) * | 2012-08-31 | 2014-03-17 | Tele Systems:Kk | 放射線検出器に駆動用のバイアス電圧を供給する装置及びその方法 |
| US9510792B2 (en) * | 2013-05-17 | 2016-12-06 | Toshiba Medical Systems Corporation | Apparatus and method for collimating X-rays in spectral computer tomography imaging |
| JP2015021843A (ja) * | 2013-07-19 | 2015-02-02 | 株式会社島津製作所 | 放射線検出器、放射線検出装置及び放射線分析装置 |
-
2016
- 2016-11-23 WO PCT/EP2016/078481 patent/WO2017089363A1/en active Application Filing
- 2016-11-23 CN CN201680069127.6A patent/CN108291973B/zh not_active Expired - Fee Related
- 2016-11-23 US US15/776,096 patent/US10267928B2/en active Active
- 2016-11-23 EP EP16801180.7A patent/EP3380870A1/en not_active Withdrawn
- 2016-11-23 RU RU2018122963A patent/RU2734452C2/ru active
- 2016-11-23 JP JP2018526916A patent/JP6924755B2/ja not_active Expired - Fee Related
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