JP2019500575A5 - - Google Patents
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- JP2019500575A5 JP2019500575A5 JP2018515037A JP2018515037A JP2019500575A5 JP 2019500575 A5 JP2019500575 A5 JP 2019500575A5 JP 2018515037 A JP2018515037 A JP 2018515037A JP 2018515037 A JP2018515037 A JP 2018515037A JP 2019500575 A5 JP2019500575 A5 JP 2019500575A5
- Authority
- JP
- Japan
- Prior art keywords
- output frequency
- integrated circuit
- aro1
- aro2
- value
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
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- 238000000034 method Methods 0.000 claims 48
- 230000007257 malfunction Effects 0.000 claims 5
- 230000000977 initiatory effect Effects 0.000 claims 1
- 239000000758 substrate Substances 0.000 claims 1
Applications Claiming Priority (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201562232486P | 2015-09-25 | 2015-09-25 | |
| US62/232,486 | 2015-09-25 | ||
| US15/015,547 US10191106B2 (en) | 2015-09-25 | 2016-02-04 | Techniques to identify a process corner |
| US15/015,547 | 2016-02-04 | ||
| PCT/US2016/049028 WO2017053006A1 (en) | 2015-09-25 | 2016-08-26 | Techniques to identify a process corner |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2019500575A JP2019500575A (ja) | 2019-01-10 |
| JP2019500575A5 true JP2019500575A5 (enExample) | 2019-09-12 |
Family
ID=56990952
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2018515037A Ceased JP2019500575A (ja) | 2015-09-25 | 2016-08-26 | プロセスコーナーを識別する技法 |
Country Status (9)
| Country | Link |
|---|---|
| US (1) | US10191106B2 (enExample) |
| EP (1) | EP3353561B1 (enExample) |
| JP (1) | JP2019500575A (enExample) |
| KR (1) | KR20180056761A (enExample) |
| CN (1) | CN108027402B (enExample) |
| BR (1) | BR112018006092A2 (enExample) |
| CA (1) | CA2997532A1 (enExample) |
| TW (1) | TW201721163A (enExample) |
| WO (1) | WO2017053006A1 (enExample) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US10394982B2 (en) | 2014-02-26 | 2019-08-27 | International Business Machines Corporation | Partial parameters and projection thereof included within statistical timing analysis |
| CN114639610B (zh) * | 2020-12-15 | 2024-06-07 | 长鑫存储技术有限公司 | 工艺角检测电路与工艺角检测方法 |
| CN114138726B (zh) * | 2021-11-12 | 2025-09-09 | 国微集团(深圳)有限公司 | 一种针对存在相邻边均相互垂直的多边形的gdsii版图数据的处理方法 |
| CN114414999A (zh) * | 2022-02-28 | 2022-04-29 | 北京智芯微电子科技有限公司 | 一种芯片工艺角检测电路、方法和芯片 |
| TWI829433B (zh) | 2022-11-16 | 2024-01-11 | 創意電子股份有限公司 | 晶片特性量測方法、測試裝置以及非暫態電腦可讀取媒體 |
Family Cites Families (24)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0653843A3 (en) * | 1993-11-17 | 1996-05-01 | Hewlett Packard Co | CMOS circuits with adaptive voltage threshold. |
| US5631596A (en) | 1994-08-09 | 1997-05-20 | Lsi Logic Corporation | Process monitor for CMOS integrated circuits |
| US5486786A (en) | 1994-08-09 | 1996-01-23 | Lsi Logic Corporation | Process monitor for CMOS integrated circuits |
| US6850075B1 (en) * | 2000-12-22 | 2005-02-01 | Cypress Semiconductor Corp. | SRAM self-timed write stress test mode |
| US7126365B2 (en) * | 2002-04-16 | 2006-10-24 | Transmeta Corporation | System and method for measuring negative bias thermal instability with a ring oscillator |
| US6894528B2 (en) * | 2002-09-17 | 2005-05-17 | Sun Microsystems, Inc. | Process monitor based keeper scheme for dynamic circuits |
| JP2006041951A (ja) * | 2004-07-27 | 2006-02-09 | Fujitsu Ltd | プロセスばらつき検知装置およびプロセスばらつき検知方法 |
| US7330080B1 (en) | 2004-11-04 | 2008-02-12 | Transmeta Corporation | Ring based impedance control of an output driver |
| US7627839B1 (en) | 2005-11-14 | 2009-12-01 | National Semiconductor Corporation | Process corner indicator and estimation circuit |
| US20090027131A1 (en) * | 2007-07-25 | 2009-01-29 | Shingo Suzuki | Ring oscillators for cmos transistor beta ratio monitoring |
| JP5452983B2 (ja) * | 2009-06-03 | 2014-03-26 | 株式会社メガチップス | プロセスモニタ回路およびプロセス特性の判定方法 |
| US8674774B2 (en) | 2009-09-07 | 2014-03-18 | Nec Corporation | Aging diagnostic device, aging diagnostic method |
| JP5529555B2 (ja) | 2010-01-20 | 2014-06-25 | ルネサスエレクトロニクス株式会社 | 半導体集積回路、動作電圧制御方法 |
| TWI422847B (zh) * | 2010-09-01 | 2014-01-11 | Univ Nat Chiao Tung | 全晶片上寬工作電壓溫度製程電壓的感測系統 |
| US8441310B2 (en) * | 2010-12-07 | 2013-05-14 | Broadcom Corporation | Power control based on dual loop with multiple process detection circuits |
| JP5226094B2 (ja) * | 2011-02-23 | 2013-07-03 | 株式会社半導体理工学研究センター | 半導体記憶装置 |
| US8954764B2 (en) | 2012-03-05 | 2015-02-10 | Csr Technology Inc. | Method and apparatus for dynamic power management |
| US8801281B1 (en) | 2012-05-24 | 2014-08-12 | Pixelworks, Inc. | On-chip temperature detection using an oscillator |
| KR20140023726A (ko) * | 2012-08-17 | 2014-02-27 | 에스케이하이닉스 주식회사 | 반도체 장치, 반도체 시스템 및 그의 모니터링 방법 |
| US9112484B1 (en) * | 2012-12-20 | 2015-08-18 | Mie Fujitsu Semiconductor Limited | Integrated circuit process and bias monitors and related methods |
| US8976574B2 (en) * | 2013-03-13 | 2015-03-10 | Qualcomm Incorporated | Process corner sensor for bit-cells |
| JP2017079336A (ja) * | 2014-01-31 | 2017-04-27 | 国立大学法人東北大学 | サイドチャネル攻撃の検知装置、サイドチャネル攻撃の検知装置によるサイドチャネル攻撃の検知方法 |
| CN104101827B (zh) * | 2014-06-25 | 2016-08-31 | 东南大学 | 一种基于自定时振荡环的工艺角检测电路 |
| KR102298158B1 (ko) * | 2014-08-25 | 2021-09-03 | 삼성전자주식회사 | 반도체 장치와 이를 포함하는 위상 동기 회로 |
-
2016
- 2016-02-04 US US15/015,547 patent/US10191106B2/en active Active
- 2016-08-26 WO PCT/US2016/049028 patent/WO2017053006A1/en not_active Ceased
- 2016-08-26 CA CA2997532A patent/CA2997532A1/en not_active Abandoned
- 2016-08-26 KR KR1020187011636A patent/KR20180056761A/ko not_active Withdrawn
- 2016-08-26 EP EP16770592.0A patent/EP3353561B1/en active Active
- 2016-08-26 BR BR112018006092-5A patent/BR112018006092A2/pt not_active IP Right Cessation
- 2016-08-26 JP JP2018515037A patent/JP2019500575A/ja not_active Ceased
- 2016-08-26 CN CN201680055568.0A patent/CN108027402B/zh active Active
- 2016-09-10 TW TW105129442A patent/TW201721163A/zh unknown
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