JP2019074323A - ディスプレイパネル検査装置およびディスプレイパネル検査方法 - Google Patents

ディスプレイパネル検査装置およびディスプレイパネル検査方法 Download PDF

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Publication number
JP2019074323A
JP2019074323A JP2017198329A JP2017198329A JP2019074323A JP 2019074323 A JP2019074323 A JP 2019074323A JP 2017198329 A JP2017198329 A JP 2017198329A JP 2017198329 A JP2017198329 A JP 2017198329A JP 2019074323 A JP2019074323 A JP 2019074323A
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JP
Japan
Prior art keywords
image
display panel
marker
indirect
captured
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Pending
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JP2017198329A
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English (en)
Japanese (ja)
Inventor
邦広 水野
Kunihiro Mizuno
邦広 水野
池内　秀樹
Hideki Ikeuchi
秀樹 池内
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Micronics Japan Co Ltd
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Micronics Japan Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Micronics Japan Co Ltd filed Critical Micronics Japan Co Ltd
Priority to JP2017198329A priority Critical patent/JP2019074323A/ja
Priority to TW107133859A priority patent/TWI661191B/zh
Priority to KR1020180120347A priority patent/KR102123488B1/ko
Priority to CN201811191856.6A priority patent/CN109655230B/zh
Publication of JP2019074323A publication Critical patent/JP2019074323A/ja
Pending legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
    • H10K71/70—Testing, e.g. accelerated lifetime tests
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass

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  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Manufacturing & Machinery (AREA)
  • Nonlinear Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Signal Processing (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
JP2017198329A 2017-10-12 2017-10-12 ディスプレイパネル検査装置およびディスプレイパネル検査方法 Pending JP2019074323A (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2017198329A JP2019074323A (ja) 2017-10-12 2017-10-12 ディスプレイパネル検査装置およびディスプレイパネル検査方法
TW107133859A TWI661191B (zh) 2017-10-12 2018-09-26 顯示面板檢查裝置及顯示面板檢查方法
KR1020180120347A KR102123488B1 (ko) 2017-10-12 2018-10-10 디스플레이 패널 검사 장치 및 디스플레이 패널 검사 방법
CN201811191856.6A CN109655230B (zh) 2017-10-12 2018-10-12 显示面板检查装置和显示面板检查方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2017198329A JP2019074323A (ja) 2017-10-12 2017-10-12 ディスプレイパネル検査装置およびディスプレイパネル検査方法

Publications (1)

Publication Number Publication Date
JP2019074323A true JP2019074323A (ja) 2019-05-16

Family

ID=66110289

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2017198329A Pending JP2019074323A (ja) 2017-10-12 2017-10-12 ディスプレイパネル検査装置およびディスプレイパネル検査方法

Country Status (4)

Country Link
JP (1) JP2019074323A (ko)
KR (1) KR102123488B1 (ko)
CN (1) CN109655230B (ko)
TW (1) TWI661191B (ko)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111442906A (zh) * 2020-04-14 2020-07-24 深圳市华星光电半导体显示技术有限公司 显示面板检测方法及装置
CN111487795A (zh) * 2020-05-13 2020-08-04 Tcl华星光电技术有限公司 漏光亮度检测系统及检测方法
DE102019132712A1 (de) * 2019-12-02 2021-06-02 Instrument Systems Optische Messtechnik Gmbh System zur Vermessung von Messobjekten

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111025701B (zh) * 2019-12-30 2022-06-07 凌云光技术股份有限公司 一种曲面液晶屏幕检测方法
CN114235812B (zh) * 2021-11-26 2022-10-21 江苏凡润电子有限公司 显示器背板高精密制造检测过程中的智能视觉系统
CN114298254B (zh) * 2021-12-27 2024-03-15 亮风台（上海）信息科技有限公司 一种获取光学设备的显示参数测试信息的方法与设备

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4309181B2 (ja) 2003-06-11 2009-08-05 株式会社日本マイクロニクス パネルの外観検査装置
JP4949928B2 (ja) * 2006-06-20 2012-06-13 Ｈｏｙａ株式会社 パターン欠陥検査方法、パターン欠陥検査装置、フォトマスク製品の製造方法、及び表示デバイス用基板の製造方法
JP4652301B2 (ja) 2006-09-08 2011-03-16 株式会社日本マイクロニクス カラー表示板の画質検査方法および画質検査装置
FR2915591A1 (fr) * 2007-04-27 2008-10-31 Thomson Licensing Sas Procede de detection d'une flexion exercee sur un ecran flexible, et appareil dote d'un tel ecran pour la mise en oeuvre du procede
JPWO2010146733A1 (ja) * 2009-06-18 2012-11-29 シャープ株式会社 表示パネルの欠陥検査方法および欠陥検査装置
JPWO2010146732A1 (ja) * 2009-06-18 2012-11-29 シャープ株式会社 表示パネルの欠陥検査方法および欠陥検査装置
JP5335614B2 (ja) * 2009-08-25 2013-11-06 株式会社日本マイクロニクス 欠陥画素アドレス検出方法並びに検出装置
KR20110137069A (ko) * 2010-06-16 2011-12-22 주식회사 디네트웍스 평판 디스플레이 패널 검사 시스템 및 방법
TW201326777A (zh) * 2011-12-28 2013-07-01 Ind Tech Res Inst 光學特性擷取裝置以及可撓式顯示器之光學特性的量測方法
JP6104016B2 (ja) * 2013-04-01 2017-03-29 株式会社日本マイクロニクス 液晶パネル検査装置
JP5730978B2 (ja) * 2013-11-08 2015-06-10 日立アロカメディカル株式会社 超音波診断装置、及び方法
KR20160040044A (ko) * 2014-10-02 2016-04-12 삼성전자주식회사 패널 검사장치 및 검사방법
CN105784723A (zh) * 2014-12-24 2016-07-20 日东电工株式会社 透射式缺陷检查装置和透射式缺陷检查方法
KR102229651B1 (ko) * 2015-01-15 2021-03-18 삼성디스플레이 주식회사 디스플레이 패널 검사 장치 및 검사 방법
KR102296317B1 (ko) * 2015-03-19 2021-09-02 삼성디스플레이 주식회사 표시 패널 검사 장치 및 표시 패널 검사 방법
CN105444992B (zh) * 2015-11-24 2018-06-15 深圳市华星光电技术有限公司 曲面显示面板的测量方法、测量探头及测量系统

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102019132712A1 (de) * 2019-12-02 2021-06-02 Instrument Systems Optische Messtechnik Gmbh System zur Vermessung von Messobjekten
CN111442906A (zh) * 2020-04-14 2020-07-24 深圳市华星光电半导体显示技术有限公司 显示面板检测方法及装置
CN111442906B (zh) * 2020-04-14 2021-08-24 深圳市华星光电半导体显示技术有限公司 显示面板检测方法及装置
US11841627B2 (en) 2020-04-14 2023-12-12 Shenzhen China Star Optoelectronics Semiconductor Display Technology Co., Ltd. Display panel test method comprising the step of automatically searching for an alignment mark by obtaining position information of the display panel and display panel test device
CN111487795A (zh) * 2020-05-13 2020-08-04 Tcl华星光电技术有限公司 漏光亮度检测系统及检测方法

Also Published As

Publication number Publication date
CN109655230B (zh) 2021-01-05
TWI661191B (zh) 2019-06-01
TW201923336A (zh) 2019-06-16
CN109655230A (zh) 2019-04-19
KR102123488B1 (ko) 2020-06-16
KR20190041418A (ko) 2019-04-22

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