TWI661191B - 顯示面板檢查裝置及顯示面板檢查方法 - Google Patents

顯示面板檢查裝置及顯示面板檢查方法 Download PDF

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Publication number
TWI661191B
TWI661191B TW107133859A TW107133859A TWI661191B TW I661191 B TWI661191 B TW I661191B TW 107133859 A TW107133859 A TW 107133859A TW 107133859 A TW107133859 A TW 107133859A TW I661191 B TWI661191 B TW I661191B
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TW
Taiwan
Prior art keywords
image
display panel
indirect
direct
captured
Prior art date
Application number
TW107133859A
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English (en)
Chinese (zh)
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TW201923336A (zh
Inventor
Kunihiro Mizuno
水野邦広
Hideki Ikeuti
池内秀樹
Original Assignee
Kabushiki Kaisha Nihon Micronics
日商日本麥克隆尼股份有限公司
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Application filed by Kabushiki Kaisha Nihon Micronics, 日商日本麥克隆尼股份有限公司 filed Critical Kabushiki Kaisha Nihon Micronics
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Publication of TWI661191B publication Critical patent/TWI661191B/zh
Publication of TW201923336A publication Critical patent/TW201923336A/zh

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    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
    • H10K71/70—Testing, e.g. accelerated lifetime tests
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Biochemistry (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Nonlinear Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Signal Processing (AREA)
  • Optics & Photonics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
TW107133859A 2017-10-12 2018-09-26 顯示面板檢查裝置及顯示面板檢查方法 TWI661191B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2017198329A JP2019074323A (ja) 2017-10-12 2017-10-12 ディスプレイパネル検査装置およびディスプレイパネル検査方法
JP2017-198329 2017-10-12

Publications (2)

Publication Number Publication Date
TWI661191B true TWI661191B (zh) 2019-06-01
TW201923336A TW201923336A (zh) 2019-06-16

Family

ID=66110289

Family Applications (1)

Application Number Title Priority Date Filing Date
TW107133859A TWI661191B (zh) 2017-10-12 2018-09-26 顯示面板檢查裝置及顯示面板檢查方法

Country Status (4)

Country Link
JP (1) JP2019074323A (ko)
KR (1) KR102123488B1 (ko)
CN (1) CN109655230B (ko)
TW (1) TWI661191B (ko)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102019132712A1 (de) * 2019-12-02 2021-06-02 Instrument Systems Optische Messtechnik Gmbh System zur Vermessung von Messobjekten
CN111025701B (zh) * 2019-12-30 2022-06-07 凌云光技术股份有限公司 一种曲面液晶屏幕检测方法
CN111442906B (zh) * 2020-04-14 2021-08-24 深圳市华星光电半导体显示技术有限公司 显示面板检测方法及装置
CN111487795B (zh) * 2020-05-13 2022-10-04 Tcl华星光电技术有限公司 漏光亮度检测系统及检测方法
CN114235812B (zh) * 2021-11-26 2022-10-21 江苏凡润电子有限公司 显示器背板高精密制造检测过程中的智能视觉系统
CN114298254B (zh) * 2021-12-27 2024-03-15 亮风台（上海）信息科技有限公司 一种获取光学设备的显示参数测试信息的方法与设备

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI366668B (en) * 2006-06-20 2012-06-21 Hoya Corp Method of inspecting a pattern defect, pattern defect inspecting apparatus, method of producing a photomask, and method of producing a substrate for a display device
EP2881041A1 (en) * 2013-11-08 2015-06-10 Hitachi Aloka Medical, Ltd. Apparatus and method for ultrasonic diagnosis
TW201623947A (zh) * 2014-12-24 2016-07-01 日東電工股份有限公司 透射型缺陷檢查裝置及缺陷檢查方法

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JP4309181B2 (ja) 2003-06-11 2009-08-05 株式会社日本マイクロニクス パネルの外観検査装置
JP4652301B2 (ja) 2006-09-08 2011-03-16 株式会社日本マイクロニクス カラー表示板の画質検査方法および画質検査装置
FR2915591A1 (fr) * 2007-04-27 2008-10-31 Thomson Licensing Sas Procede de detection d'une flexion exercee sur un ecran flexible, et appareil dote d'un tel ecran pour la mise en oeuvre du procede
JPWO2010146733A1 (ja) * 2009-06-18 2012-11-29 シャープ株式会社 表示パネルの欠陥検査方法および欠陥検査装置
JPWO2010146732A1 (ja) * 2009-06-18 2012-11-29 シャープ株式会社 表示パネルの欠陥検査方法および欠陥検査装置
JP5335614B2 (ja) * 2009-08-25 2013-11-06 株式会社日本マイクロニクス 欠陥画素アドレス検出方法並びに検出装置
KR20110137069A (ko) * 2010-06-16 2011-12-22 주식회사 디네트웍스 평판 디스플레이 패널 검사 시스템 및 방법
TW201326777A (zh) * 2011-12-28 2013-07-01 Ind Tech Res Inst 光學特性擷取裝置以及可撓式顯示器之光學特性的量測方法
JP6104016B2 (ja) * 2013-04-01 2017-03-29 株式会社日本マイクロニクス 液晶パネル検査装置
KR20160040044A (ko) * 2014-10-02 2016-04-12 삼성전자주식회사 패널 검사장치 및 검사방법
KR102229651B1 (ko) * 2015-01-15 2021-03-18 삼성디스플레이 주식회사 디스플레이 패널 검사 장치 및 검사 방법
KR102296317B1 (ko) * 2015-03-19 2021-09-02 삼성디스플레이 주식회사 표시 패널 검사 장치 및 표시 패널 검사 방법
CN105444992B (zh) * 2015-11-24 2018-06-15 深圳市华星光电技术有限公司 曲面显示面板的测量方法、测量探头及测量系统

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI366668B (en) * 2006-06-20 2012-06-21 Hoya Corp Method of inspecting a pattern defect, pattern defect inspecting apparatus, method of producing a photomask, and method of producing a substrate for a display device
EP2881041A1 (en) * 2013-11-08 2015-06-10 Hitachi Aloka Medical, Ltd. Apparatus and method for ultrasonic diagnosis
TW201623947A (zh) * 2014-12-24 2016-07-01 日東電工股份有限公司 透射型缺陷檢查裝置及缺陷檢查方法

Also Published As

Publication number Publication date
KR20190041418A (ko) 2019-04-22
KR102123488B1 (ko) 2020-06-16
JP2019074323A (ja) 2019-05-16
CN109655230B (zh) 2021-01-05
TW201923336A (zh) 2019-06-16
CN109655230A (zh) 2019-04-19

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