JP2018502967A - ブロックコポリマーの秩序膜中の欠陥を低減させるための方法 - Google Patents
ブロックコポリマーの秩序膜中の欠陥を低減させるための方法 Download PDFInfo
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- JP2018502967A JP2018502967A JP2017537909A JP2017537909A JP2018502967A JP 2018502967 A JP2018502967 A JP 2018502967A JP 2017537909 A JP2017537909 A JP 2017537909A JP 2017537909 A JP2017537909 A JP 2017537909A JP 2018502967 A JP2018502967 A JP 2018502967A
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- Prior art keywords
- todt
- block copolymer
- copolymer
- block
- methacrylate
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- 238000000034 method Methods 0.000 title claims abstract description 40
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- UZNHKBFIBYXPDV-UHFFFAOYSA-N trimethyl-[3-(2-methylprop-2-enoylamino)propyl]azanium;chloride Chemical compound [Cl-].CC(=C)C(=O)NCCC[N+](C)(C)C UZNHKBFIBYXPDV-UHFFFAOYSA-N 0.000 description 4
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- QTKPMCIBUROOGY-UHFFFAOYSA-N 2,2,2-trifluoroethyl 2-methylprop-2-enoate Chemical compound CC(=C)C(=O)OCC(F)(F)F QTKPMCIBUROOGY-UHFFFAOYSA-N 0.000 description 2
- JMIZWXDKTUGEES-UHFFFAOYSA-N 2,2-di(cyclopenten-1-yloxy)ethyl 2-methylprop-2-enoate Chemical compound C=1CCCC=1OC(COC(=O)C(=C)C)OC1=CCCC1 JMIZWXDKTUGEES-UHFFFAOYSA-N 0.000 description 2
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- GOXQRTZXKQZDDN-UHFFFAOYSA-N 2-Ethylhexyl acrylate Chemical compound CCCCC(CC)COC(=O)C=C GOXQRTZXKQZDDN-UHFFFAOYSA-N 0.000 description 2
- HFCUBKYHMMPGBY-UHFFFAOYSA-N 2-methoxyethyl prop-2-enoate Chemical compound COCCOC(=O)C=C HFCUBKYHMMPGBY-UHFFFAOYSA-N 0.000 description 2
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- 125000003903 2-propenyl group Chemical group [H]C([*])([H])C([H])=C([H])[H] 0.000 description 2
- WIYVVIUBKNTNKG-UHFFFAOYSA-N 6,7-dimethoxy-3,4-dihydronaphthalene-2-carboxylic acid Chemical compound C1CC(C(O)=O)=CC2=C1C=C(OC)C(OC)=C2 WIYVVIUBKNTNKG-UHFFFAOYSA-N 0.000 description 2
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- 238000000407 epitaxy Methods 0.000 description 1
- 238000011067 equilibration Methods 0.000 description 1
- 125000001301 ethoxy group Chemical group [H]C([H])([H])C([H])([H])O* 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 230000001747 exhibiting effect Effects 0.000 description 1
- 239000000835 fiber Substances 0.000 description 1
- 229910052732 germanium Inorganic materials 0.000 description 1
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 229910021389 graphene Inorganic materials 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 239000013033 iniferter Substances 0.000 description 1
- 239000011256 inorganic filler Substances 0.000 description 1
- 229910003475 inorganic filler Inorganic materials 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 239000012528 membrane Substances 0.000 description 1
- 125000005397 methacrylic acid ester group Chemical group 0.000 description 1
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 description 1
- LVHBHZANLOWSRM-UHFFFAOYSA-N methylenebutanedioic acid Natural products OC(=O)CC(=C)C(O)=O LVHBHZANLOWSRM-UHFFFAOYSA-N 0.000 description 1
- DJDSLBVSSOQSLW-UHFFFAOYSA-N mono(2-ethylhexyl) phthalate Chemical compound CCCCC(CC)COC(=O)C1=CC=CC=C1C(O)=O DJDSLBVSSOQSLW-UHFFFAOYSA-N 0.000 description 1
- 230000000877 morphologic effect Effects 0.000 description 1
- DNTMQTKDNSEIFO-UHFFFAOYSA-N n-(hydroxymethyl)-2-methylprop-2-enamide Chemical class CC(=C)C(=O)NCO DNTMQTKDNSEIFO-UHFFFAOYSA-N 0.000 description 1
- 239000002086 nanomaterial Substances 0.000 description 1
- 150000002924 oxiranes Chemical class 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- NBIIXXVUZAFLBC-UHFFFAOYSA-K phosphate Chemical compound [O-]P([O-])([O-])=O NBIIXXVUZAFLBC-UHFFFAOYSA-K 0.000 description 1
- 125000005498 phthalate group Chemical class 0.000 description 1
- JQCXWCOOWVGKMT-UHFFFAOYSA-N phthalic acid diheptyl ester Natural products CCCCCCCOC(=O)C1=CC=CC=C1C(=O)OCCCCCCC JQCXWCOOWVGKMT-UHFFFAOYSA-N 0.000 description 1
- 239000004014 plasticizer Substances 0.000 description 1
- 229910052697 platinum Inorganic materials 0.000 description 1
- 229920000058 polyacrylate Polymers 0.000 description 1
- 238000006068 polycondensation reaction Methods 0.000 description 1
- 239000005076 polymer ester Substances 0.000 description 1
- 229920002223 polystyrene Polymers 0.000 description 1
- 150000004032 porphyrins Chemical class 0.000 description 1
- 238000007151 ring opening polymerisation reaction Methods 0.000 description 1
- 230000007017 scission Effects 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 239000002356 single layer Substances 0.000 description 1
- 239000003381 stabilizer Substances 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
- 125000000999 tert-butyl group Chemical group [H]C([H])([H])C(*)(C([H])([H])[H])C([H])([H])[H] 0.000 description 1
- 239000003017 thermal stabilizer Substances 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
- 229920006032 ungrafted co-polymer Polymers 0.000 description 1
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Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/68—Preparation processes not covered by groups G03F1/20 - G03F1/50
- G03F1/72—Repair or correction of mask defects
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G81/00—Macromolecular compounds obtained by interreacting polymers in the absence of monomers, e.g. block polymers
- C08G81/02—Macromolecular compounds obtained by interreacting polymers in the absence of monomers, e.g. block polymers at least one of the polymers being obtained by reactions involving only carbon-to-carbon unsaturated bonds
- C08G81/021—Block or graft polymers containing only sequences of polymers of C08C or C08F
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
- C08L53/00—Compositions of block copolymers containing at least one sequence of a polymer obtained by reactions only involving carbon-to-carbon unsaturated bonds; Compositions of derivatives of such polymers
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/0002—Lithographic processes using patterning methods other than those involving the exposure to radiation, e.g. by stamping
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Health & Medical Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Medicinal Chemistry (AREA)
- Polymers & Plastics (AREA)
- Organic Chemistry (AREA)
- Manufacture Of Macromolecular Shaped Articles (AREA)
- Compositions Of Macromolecular Compounds (AREA)
- Graft Or Block Polymers (AREA)
Abstract
Description
このカウント法は、Tironらによる論文に記載されている(J. Vac. Sci. Technol. B 29(6), 1071-1023, 2011)。
− TODTを有する少なくとも1種のブロックコポリマーとTODTを有さない少なくとも1種の化合物とを溶媒中で混合する工程と、
− この混合物を表面上に成膜する工程と、
− 表面上に成膜した混合物を、ブロックコポリマーの最大のTgと混合物のTODTとの間の温度で硬化させる工程と
を含む方法に関する。
− N.P.Balsaraら、Macromolecules 1992、25、3896−3901。
− N.Sakamotoら、Macromolecules 1997、30、5321−5330、及びMacromolecule 1997、30、1621−1632
− J.K.Kimら、Macromolecules 1998、31、4045−4048。
動的機械分析(dynamical mechanical analysis)による秩序−無秩序転移温度分析
2種の異なる分子量のブロックコポリマーPS−b−PMMAは、従来からのアニオンによる方法によって合成するか、又は市販製品を使用することができる。生成物の特性評価を表1に示す。
ブロックコポリマーの誘導自己組織化に関する厚さ及び欠陥率:
2.5×2.5cmのシリコン基板を、例えばピラニア溶液のような公知の技術によって適切に清浄化し、次いで蒸留水で洗浄した後に使用した。
a) SEC(サイズ排除クロマトグラフィー、ポリスチレン標準)によって決定される場合
b) 1H NMRによって決定される
c) DMA(実施例1に記載するような動的機械分析)によって決定される。コポリマー3及び4のTODTは存在しない。
Claims (12)
- ブロックコポリマーの秩序膜の欠陥の数を低減させるための方法であって、前記秩序膜が、秩序−無秩序転移温度(TODT)及び少なくとも1つのTgを有する少なくとも1種のブロックコポリマーと、TODTを有さない少なくとも1種の化合物との混合物を含み、前記化合物が、ブロックコポリマー、光若しくは熱安定剤、光開始剤、ポリマー若しくは非ポリマーのイオン性化合物、ホモポリマー、又は統計コポリマーの中から選択され、この混合物が、ブロックコポリマー単独のTODTより低いTODTを有し、以下の工程:
− TODTを有する少なくとも1種のブロックコポリマーとTODTを有さない少なくとも1種の化合物とを溶媒中で混合する工程と、
− この混合物を表面上に成膜する工程と、
− 表面上に成膜した混合物を、ブロックコポリマーの最大のTgと混合物のTODTとの間の温度で硬化させる工程と
を含む、方法。 - TODTを有するブロックコポリマーがジブロックコポリマーである、請求項1に記載の方法。
- ジブロックコポリマーのブロックのうち一方がスチレンモノマーを含み、他方のブロックがメタクリル酸モノマーを含む、請求項2に記載の方法。
- ジブロックコポリマーのブロックのうち一方がスチレンを含み、他方のブロックがメタクリル酸メチルを含む、請求項3に記載の方法。
- TODTを有さないブロックコポリマーがジブロックコポリマーである、請求項1に記載の方法。
- ジブロックコポリマーのブロックのうち一方がスチレンモノマーを含み、他方のブロックがメタクリル酸モノマーを含む、請求項5に記載の方法。
- ジブロックコポリマーのブロックのうち一方がスチレンを含み、他方のブロックがメタクリル酸メチルを含む、請求項6に記載の方法。
- 表面がフリーである、請求項1に記載の方法。
- 表面がガイドされる、請求項1に記載の方法。
- TODTを有する少なくとも1種のブロックコポリマーと、TODTを有さない少なくとも1種の化合物とを含む組成物。
- リソグラフィーのマスク又は秩序膜を生成するための、請求項1から9の何れか一項に記載の方法の使用。
- 請求項11によって得られたリソグラフィーのマスク又は秩序膜。
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FR1550470 | 2015-01-21 | ||
FR1550470A FR3031751B1 (fr) | 2015-01-21 | 2015-01-21 | Procede de reduction des defauts dans un film ordonne de copolymere a blocs |
PCT/FR2016/050115 WO2016116707A1 (fr) | 2015-01-21 | 2016-01-21 | Procédé de réduction des défauts dans un film ordonné de copolymère a blocs |
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Free format text: JAPANESE INTERMEDIATE CODE: R250 |