JP2017512017A5 - - Google Patents
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- JP2017512017A5 JP2017512017A5 JP2016553604A JP2016553604A JP2017512017A5 JP 2017512017 A5 JP2017512017 A5 JP 2017512017A5 JP 2016553604 A JP2016553604 A JP 2016553604A JP 2016553604 A JP2016553604 A JP 2016553604A JP 2017512017 A5 JP2017512017 A5 JP 2017512017A5
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- JP
- Japan
- Prior art keywords
- threshold
- error
- detection channel
- amplitude
- error detection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- 238000012360 testing method Methods 0.000 claims description 119
- 238000000034 method Methods 0.000 claims description 104
- 238000013507 mapping Methods 0.000 claims description 52
- 238000001514 detection method Methods 0.000 claims description 43
- 238000012545 processing Methods 0.000 claims description 23
- 238000012937 correction Methods 0.000 claims description 10
- 230000008878 coupling Effects 0.000 claims description 6
- 238000010168 coupling process Methods 0.000 claims description 6
- 238000005859 coupling reaction Methods 0.000 claims description 6
- 238000005070 sampling Methods 0.000 claims description 3
- 230000000875 corresponding effect Effects 0.000 description 13
- 230000005540 biological transmission Effects 0.000 description 4
- 238000010586 diagram Methods 0.000 description 4
- 230000007704 transition Effects 0.000 description 3
- 238000013459 approach Methods 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 230000006835 compression Effects 0.000 description 1
- 238000007906 compression Methods 0.000 description 1
- 230000002596 correlated effect Effects 0.000 description 1
- 239000010432 diamond Substances 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 230000011664 signaling Effects 0.000 description 1
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US14/158,768 US9136952B2 (en) | 2014-01-17 | 2014-01-17 | Pulse amplitude modulation (PAM) bit error test and measurement |
| US14/158,768 | 2014-01-17 | ||
| PCT/US2015/011807 WO2015109222A1 (en) | 2014-01-17 | 2015-01-16 | Pulse amplitude modulation (pam) bit error test and measurement |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2017512017A JP2017512017A (ja) | 2017-04-27 |
| JP2017512017A5 true JP2017512017A5 (cg-RX-API-DMAC7.html) | 2018-03-01 |
Family
ID=52464573
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2016553604A Pending JP2017512017A (ja) | 2014-01-17 | 2015-01-16 | パルス振幅変調（ｐａｍ）ビット・エラーの試験及び測定 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US9136952B2 (cg-RX-API-DMAC7.html) |
| EP (1) | EP2949067A1 (cg-RX-API-DMAC7.html) |
| JP (1) | JP2017512017A (cg-RX-API-DMAC7.html) |
| CN (1) | CN105103483A (cg-RX-API-DMAC7.html) |
| WO (1) | WO2015109222A1 (cg-RX-API-DMAC7.html) |
Families Citing this family (28)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107534628B (zh) * | 2015-10-14 | 2020-06-02 | 华为技术有限公司 | 一种获取pam4的解码阈值的电路、方法和光网络单元 |
| JP6250738B2 (ja) * | 2016-06-06 | 2017-12-20 | アンリツ株式会社 | 誤り率測定装置及び誤り率測定方法 |
| JP6250737B2 (ja) * | 2016-06-06 | 2017-12-20 | アンリツ株式会社 | 誤り率測定装置及び誤り率測定方法 |
| EP3388844B1 (en) * | 2017-04-14 | 2019-12-25 | Tektronix, Inc. | Analog transitional storage |
| CN107919997A (zh) * | 2017-10-12 | 2018-04-17 | 北京遥感设备研究所 | 一种基于dsp的丢帧检测方法及系统 |
| US10594523B2 (en) * | 2017-12-22 | 2020-03-17 | Tetra Semiconductor Ag | Decoder circuit for a broadband pulse amplitude modulation signal |
| CN108989000A (zh) * | 2018-08-13 | 2018-12-11 | 苏州联讯仪器有限公司 | 一种新型的手持式pam4误码仪 |
| JP6821717B2 (ja) * | 2019-01-10 | 2021-01-27 | アンリツ株式会社 | 誤り検出装置および誤り検出方法 |
| JP6818056B2 (ja) * | 2019-01-18 | 2021-01-20 | アンリツ株式会社 | 誤り率測定装置及び誤り率測定方法 |
| JP6818055B2 (ja) * | 2019-01-18 | 2021-01-20 | アンリツ株式会社 | 誤り率測定装置及び誤り率測定方法 |
| JP6818064B2 (ja) * | 2019-02-13 | 2021-01-20 | アンリツ株式会社 | 誤り率測定装置及び誤り率測定方法 |
| JP6827484B2 (ja) * | 2019-02-18 | 2021-02-10 | アンリツ株式会社 | 誤り率測定装置および誤り率測定方法 |
| JP7739341B2 (ja) | 2020-06-11 | 2025-09-16 | テクトロニクス・インコーポレイテッド | 画像データ生成システム及び波形分類方法 |
| US11121850B1 (en) | 2020-07-02 | 2021-09-14 | Rohde & Schwarz Gmbh & Co. Kg | Signal analysis method and signal analysis module |
| JP7250751B2 (ja) * | 2020-12-23 | 2023-04-03 | アンリツ株式会社 | 誤り率測定装置及びコードワード位置表示方法 |
| JP2024506293A (ja) * | 2021-02-03 | 2024-02-13 | テクトロニクス・インコーポレイテッド | 人間と機械学習のためのオーバーレイ、コンポジット、ダイナミック・アイ・トリガを備えたアイのクラス・セパレータ |
| US11907090B2 (en) | 2021-08-12 | 2024-02-20 | Tektronix, Inc. | Machine learning for taps to accelerate TDECQ and other measurements |
| US12442852B2 (en) | 2022-03-30 | 2025-10-14 | Tektronix, Inc. | Tuning a device under test using parallel pipeline machine learning assistance |
| US11940889B2 (en) | 2021-08-12 | 2024-03-26 | Tektronix, Inc. | Combined TDECQ measurement and transmitter tuning using machine learning |
| US11923896B2 (en) | 2021-03-24 | 2024-03-05 | Tektronix, Inc. | Optical transceiver tuning using machine learning |
| US11923895B2 (en) | 2021-03-24 | 2024-03-05 | Tektronix, Inc. | Optical transmitter tuning using machine learning and reference parameters |
| US12146914B2 (en) | 2021-05-18 | 2024-11-19 | Tektronix, Inc. | Bit error ratio estimation using machine learning |
| US12571841B2 (en) | 2021-06-04 | 2026-03-10 | Tektronix, Inc. | General digital signal processing waveform machine learning control application |
| US12416662B2 (en) | 2022-01-14 | 2025-09-16 | Tektronix, Inc. | Machine learning model training using de-noised data and model prediction with noise correction |
| US12596145B2 (en) | 2022-03-30 | 2026-04-07 | Tektronix, Inc. | Optical tuning test system using parallel oven pipelines with parallel instrument channels and machine learning assistance |
| US12431209B2 (en) | 2022-05-19 | 2025-09-30 | Samsung Electronics Co., Ltd. | Memory devices, operating methods of the memory devices, and test systems including the memory devices |
| US12093124B2 (en) * | 2022-09-29 | 2024-09-17 | Advanced Micro Devices, Inc. | Multi-level signal reception |
| US20240283549A1 (en) * | 2023-02-17 | 2024-08-22 | Tektronix, Inc. | Methods and systems of phase aligning a replica carrier signal for use in demodulating a subcarrier signal |
Family Cites Families (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5879171A (ja) * | 1981-11-05 | 1983-05-12 | Nec Corp | 論理機能試験装置 |
| GB2354412A (en) * | 1999-09-18 | 2001-03-21 | Marconi Comm Ltd | Receiver which optimises detection thresholds in response to the error rates of each data level |
| CA2442922A1 (en) * | 2001-04-04 | 2002-10-17 | Quellan, Inc. | Method and system for decoding multilevel signals |
| JP2003098230A (ja) * | 2001-09-26 | 2003-04-03 | Toshiba Microelectronics Corp | 半導体試験装置 |
| US7606297B2 (en) | 2002-03-15 | 2009-10-20 | Synthesys Research, Inc. | Method and system for creating an eye diagram using a binary data bit decision mechanism |
| US7154944B2 (en) | 2002-10-31 | 2006-12-26 | Agilent Technologies, Inc. | Mask compliance testing using bit error ratio measurements |
| US20040268190A1 (en) * | 2003-05-19 | 2004-12-30 | International Business Machines Corporation | Adjusting parameters of a serial link |
| US20060020412A1 (en) * | 2004-07-23 | 2006-01-26 | Bruensteiner Matthew M | Analog waveform information from binary sampled measurements |
| JP4105181B2 (ja) * | 2005-06-09 | 2008-06-25 | 日本電信電話株式会社 | 無線通信システム及び方法 |
| US7890847B2 (en) * | 2007-03-09 | 2011-02-15 | Mediatek Inc. | Apparatus and method for calculating error metrics in a digital communication system |
| EP1863214A1 (en) * | 2007-01-25 | 2007-12-05 | Agilent Technologies, Inc. | Digital signal analysis with evaluation of selected signal bits |
| CN101989887B (zh) * | 2009-07-31 | 2013-06-12 | 清华大学 | 一种编码调制方法、解调解码方法及系统 |
| WO2011062823A2 (en) * | 2009-11-19 | 2011-05-26 | Rambus Inc. | Receiver with time-varying threshold voltage |
-
2014
- 2014-01-17 US US14/158,768 patent/US9136952B2/en active Active
-
2015
- 2015-01-16 JP JP2016553604A patent/JP2017512017A/ja active Pending
- 2015-01-16 EP EP15703665.8A patent/EP2949067A1/en not_active Withdrawn
- 2015-01-16 CN CN201580000489.5A patent/CN105103483A/zh active Pending
- 2015-01-16 WO PCT/US2015/011807 patent/WO2015109222A1/en not_active Ceased
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