CN105103483A - 脉冲幅度调制（pam）比特错误测试和测量 - Google Patents

脉冲幅度调制（pam）比特错误测试和测量 Download PDF

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Publication number
CN105103483A
CN105103483A CN201580000489.5A CN201580000489A CN105103483A CN 105103483 A CN105103483 A CN 105103483A CN 201580000489 A CN201580000489 A CN 201580000489A CN 105103483 A CN105103483 A CN 105103483A
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CN
China
Prior art keywords
threshold
amplitude
error
channel
reference sequence
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Pending
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CN201580000489.5A
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English (en)
Chinese (zh)
Inventor
K.J.谢恩
J.N.艾伦
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Tektronix Inc
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Tektronix Inc
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Publication of CN105103483A publication Critical patent/CN105103483A/zh
Pending legal-status Critical Current

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    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L1/00—Arrangements for detecting or preventing errors in the information received
    • H04L1/24—Testing correct operation
    • H04L1/242—Testing correct operation by comparing a transmitted test signal with a locally generated replica
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B17/00—Monitoring; Testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31708—Analysis of signal quality
    • G01R31/3171—BER [Bit Error Rate] test
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L27/00—Modulated-carrier systems
    • H04L27/02—Amplitude-modulated carrier systems, e.g. using on-off keying; Single sideband or vestigial sideband modulation
    • H04L27/06—Demodulator circuits; Receiver circuits
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L1/00—Arrangements for detecting or preventing errors in the information received
    • H04L1/20—Arrangements for detecting or preventing errors in the information received using signal quality detector
    • H04L1/203—Details of error rate determination, e.g. BER, FER or WER

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • Nonlinear Science (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Dc Digital Transmission (AREA)
  • Detection And Prevention Of Errors In Transmission (AREA)
CN201580000489.5A 2014-01-17 2015-01-16 脉冲幅度调制（pam）比特错误测试和测量 Pending CN105103483A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US14/158,768 US9136952B2 (en) 2014-01-17 2014-01-17 Pulse amplitude modulation (PAM) bit error test and measurement
US14/158768 2014-01-17
PCT/US2015/011807 WO2015109222A1 (en) 2014-01-17 2015-01-16 Pulse amplitude modulation (pam) bit error test and measurement

Publications (1)

Publication Number Publication Date
CN105103483A true CN105103483A (zh) 2015-11-25

Family

ID=52464573

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201580000489.5A Pending CN105103483A (zh) 2014-01-17 2015-01-16 脉冲幅度调制（pam）比特错误测试和测量

Country Status (5)

Country Link
US (1) US9136952B2 (cg-RX-API-DMAC7.html)
EP (1) EP2949067A1 (cg-RX-API-DMAC7.html)
JP (1) JP2017512017A (cg-RX-API-DMAC7.html)
CN (1) CN105103483A (cg-RX-API-DMAC7.html)
WO (1) WO2015109222A1 (cg-RX-API-DMAC7.html)

Cited By (3)

* Cited by examiner, † Cited by third party
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CN107919997A (zh) * 2017-10-12 2018-04-17 北京遥感设备研究所 一种基于dsp的丢帧检测方法及系统
CN108732398A (zh) * 2017-04-14 2018-11-02 特克特朗尼克公司 模拟转变存储
CN108989000A (zh) * 2018-08-13 2018-12-11 苏州联讯仪器有限公司 一种新型的手持式pam4误码仪

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CN107534628B (zh) * 2015-10-14 2020-06-02 华为技术有限公司 一种获取pam4的解码阈值的电路、方法和光网络单元
JP6250738B2 (ja) * 2016-06-06 2017-12-20 アンリツ株式会社 誤り率測定装置及び誤り率測定方法
JP6250737B2 (ja) * 2016-06-06 2017-12-20 アンリツ株式会社 誤り率測定装置及び誤り率測定方法
US10594523B2 (en) * 2017-12-22 2020-03-17 Tetra Semiconductor Ag Decoder circuit for a broadband pulse amplitude modulation signal
JP6821717B2 (ja) * 2019-01-10 2021-01-27 アンリツ株式会社 誤り検出装置および誤り検出方法
JP6818056B2 (ja) * 2019-01-18 2021-01-20 アンリツ株式会社 誤り率測定装置及び誤り率測定方法
JP6818055B2 (ja) * 2019-01-18 2021-01-20 アンリツ株式会社 誤り率測定装置及び誤り率測定方法
JP6818064B2 (ja) * 2019-02-13 2021-01-20 アンリツ株式会社 誤り率測定装置及び誤り率測定方法
JP6827484B2 (ja) * 2019-02-18 2021-02-10 アンリツ株式会社 誤り率測定装置および誤り率測定方法
JP7739341B2 (ja) 2020-06-11 2025-09-16 テクトロニクス・インコーポレイテッド 画像データ生成システム及び波形分類方法
US11121850B1 (en) 2020-07-02 2021-09-14 Rohde & Schwarz Gmbh & Co. Kg Signal analysis method and signal analysis module
JP7250751B2 (ja) * 2020-12-23 2023-04-03 アンリツ株式会社 誤り率測定装置及びコードワード位置表示方法
JP2024506293A (ja) * 2021-02-03 2024-02-13 テクトロニクス・インコーポレイテッド 人間と機械学習のためのオーバーレイ、コンポジット、ダイナミック・アイ・トリガを備えたアイのクラス・セパレータ
US11907090B2 (en) 2021-08-12 2024-02-20 Tektronix, Inc. Machine learning for taps to accelerate TDECQ and other measurements
US12442852B2 (en) 2022-03-30 2025-10-14 Tektronix, Inc. Tuning a device under test using parallel pipeline machine learning assistance
US11940889B2 (en) 2021-08-12 2024-03-26 Tektronix, Inc. Combined TDECQ measurement and transmitter tuning using machine learning
US11923896B2 (en) 2021-03-24 2024-03-05 Tektronix, Inc. Optical transceiver tuning using machine learning
US11923895B2 (en) 2021-03-24 2024-03-05 Tektronix, Inc. Optical transmitter tuning using machine learning and reference parameters
US12146914B2 (en) 2021-05-18 2024-11-19 Tektronix, Inc. Bit error ratio estimation using machine learning
US12571841B2 (en) 2021-06-04 2026-03-10 Tektronix, Inc. General digital signal processing waveform machine learning control application
US12416662B2 (en) 2022-01-14 2025-09-16 Tektronix, Inc. Machine learning model training using de-noised data and model prediction with noise correction
US12596145B2 (en) 2022-03-30 2026-04-07 Tektronix, Inc. Optical tuning test system using parallel oven pipelines with parallel instrument channels and machine learning assistance
US12431209B2 (en) 2022-05-19 2025-09-30 Samsung Electronics Co., Ltd. Memory devices, operating methods of the memory devices, and test systems including the memory devices
US12093124B2 (en) * 2022-09-29 2024-09-17 Advanced Micro Devices, Inc. Multi-level signal reception
US20240283549A1 (en) * 2023-02-17 2024-08-22 Tektronix, Inc. Methods and systems of phase aligning a replica carrier signal for use in demodulating a subcarrier signal

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US20040086034A1 (en) * 2002-10-31 2004-05-06 Jungerman Roger Lee Mask compliance testing using bit error ratio measurements
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CN101262324A (zh) * 2007-03-09 2008-09-10 联发科技股份有限公司 数字通信系统中计算误差度量的装置和方法
CN101989887A (zh) * 2009-07-31 2011-03-23 清华大学 一种编码调制方法、解调解码方法及系统

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US20040086034A1 (en) * 2002-10-31 2004-05-06 Jungerman Roger Lee Mask compliance testing using bit error ratio measurements
US20080181289A1 (en) * 2007-01-25 2008-07-31 Joachim Moll Digital signal analysis with evaluation of selected signal bits
CN101262324A (zh) * 2007-03-09 2008-09-10 联发科技股份有限公司 数字通信系统中计算误差度量的装置和方法
CN101989887A (zh) * 2009-07-31 2011-03-23 清华大学 一种编码调制方法、解调解码方法及系统

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Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108732398A (zh) * 2017-04-14 2018-11-02 特克特朗尼克公司 模拟转变存储
CN108732398B (zh) * 2017-04-14 2022-04-26 特克特朗尼克公司 模拟转变存储
CN107919997A (zh) * 2017-10-12 2018-04-17 北京遥感设备研究所 一种基于dsp的丢帧检测方法及系统
CN108989000A (zh) * 2018-08-13 2018-12-11 苏州联讯仪器有限公司 一种新型的手持式pam4误码仪

Also Published As

Publication number Publication date
JP2017512017A (ja) 2017-04-27
WO2015109222A1 (en) 2015-07-23
EP2949067A1 (en) 2015-12-02
US20150207574A1 (en) 2015-07-23
US9136952B2 (en) 2015-09-15

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Effective date of abandoning: 20191122